STL3N65M2
N-channel 650 V, 1.6 Ω typ., 2.3 A MDmesh™ M2 Power
MOSFET in a PowerFLAT™ 3.3x3.3 HV package
Datasheet - production data
Features
12
87
6
3
4
56
5
7
8
Order code
VDS
RDS(on) max.
ID
STL3N65M2
650 V
1.8 Ω
2.3 A
Extremely low gate charge
Excellent output capacitance (COSS) profile
100% avalanche tested
Zener-protected
Application
PowerFLAT™ 3.3x3.3 HV
Switching applications
Figure 1: Internal schematic diagram
Description
This device is an N-channel Power MOSFET
developed using MDmesh™ M2 technology.
Thanks to its strip layout and an improved vertical
structure, the device exhibits low on-resistance
and optimized switching characteristics,
rendering it suitable for the most demanding high
efficiency converters.
Table 1: Device summary
April 2016
Order code
Marking
Package
Packing
STL3N65M2
3N65M2
PowerFLAT™
3.3x3.3 HV
Tape and
reel
DocID027894 Rev 3
This is information on a product in full production.
1/12
www.st.com
Contents
STL3N65M2
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 8
4
Package information ....................................................................... 9
4.1
5
2/12
Power FLAT™ 3.3x3.3 HV package information ............................... 9
Revision history ............................................................................ 11
DocID027894 Rev 3
STL3N65M2
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
Parameter
Value
Unit
VDS
Drain-source voltage
650
V
VGS
Gate-source voltage
± 25
V
ID(1)
Drain current (continuous) at TC = 25 °C
2.3
A
ID
(1)
Drain current (continuous) at TC= 100 °C
1.45
A
ID
(2)
Drain current (continuous) at Tamb = 25 °C
0.7
A
ID
(2)
Drain current (continuous) at Tamb = 100 °C
0.43
A
Drain current (pulsed)
2.8
A
2
W
IDM(2)(3)
PTOT
(2)
Total dissipation at Tamb = 25 °C
PTOT
(1)
Total dissipation at TC = 25 °C
22
W
Avalanche current, repetitive or not-repetitive(3)
0.3
A
70
mJ
15
V/ns
-55 to 150
°C
IAS
Single pulse avalanche energy
EAS
dv/dt
(5)
(4)
Peak diode recovery voltage slope
TJ
Tstg
Operating junction temperature range
Storage temperature range
Notes:
(1)The
value is rated according Rthj-case.
(2)
When mounted on FR-4 board of 1 inch², 2 oz Cu, t < 10 s.
(3)Pulse
width limited by Tjmax.
(4)Starting
(5)I
SD
Tj = 25 °C, ID = IAS, VDD = 50 V.
≤ 2.3 A, dv/dt ≤ 400 A/µs,VDS peak ≤ V(BR)DSS, VDD = 80% V(BR)DSS.
Table 3: Thermal resistance
Symbol
Rthj-case
Rthj-amb
(1)
Parameter
Value
Unit
Thermal resistance junction-case max.
5.6
°C/W
Thermal resistance junction-amb max.
62.5
°C/W
Notes:
(1)When
mounted on FR-4 board of 1 inch², 2 oz Cu, t < 10 s.
DocID027894 Rev 3
3/12
Electrical characteristics
2
STL3N65M2
Electrical characteristics
(TCASE = 25 °C unless otherwise specified)
Table 4: On/off-states
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
Drain-source breakdown voltage
(VGS = 0 V)
ID = 1 mA
IDSS
Zero-gate voltage drain current
(VGS = 0 V)
VDS = 650 V
1
µA
IGSS
Gate body leakage current
(VDS = 0 V)
VGS = ± 25 V
±10
µA
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 250 µA
3
4
V
RDS(on)
Static drain-source on-resistance
VGS = 10 V, ID = 1 A
1.6
1.8
Ω
Min.
Typ.
Max.
Unit
-
155
-
pF
-
8
-
pF
-
0.2
-
pF
V(BR)DSS
650
2
V
Table 5: Dynamic
Symbol
Parameter
Test conditions
Ciss
Input capacitance
Coss
Output capacitance
Crss
Reverse transfer
capacitance
Coss eq.
VDS = 100 V, f = 1 MHz, VGS= 0 V
Output equivalent
capacitance
VGS = 0, VDS = 0 V to 520 V
-
18
-
pF
Rg
Gate input resistance
f = 1 MHz gate DC bias = 0
test signal level = 20 mV
open drain
-
8.5
-
Ω
Qg
Total gate charge
-
5
-
nC
Qgs
Gate-source charge
-
1
-
nC
Qgd
Gate-drain charge
-
1.7
-
nC
(1)
VDD = 520 V, ID = 2.3 A
VGS = 10 V
(see Figure 15: "Test circuit for
gate charge behavior")
Notes:
(1)C
oss eq.
is defined as a constant equivalent capacitance giving the same charging time as C oss when VDS
increases from 0 to 80% VDSS.
Table 6: Switching times
Symbol
td(on)
tr
td(off)
tf
4/12
Parameter
Turn-on delay
time
Rise time
Turn-off delay
time
Test conditions
VDD = 325 V, ID = 1.15 A,
RG = 4.7 Ω, VGS = 10 V
(see Figure 14: "Test circuit for resistive
load switching times")
Fall time
DocID027894 Rev 3
Min.
Typ.
Max.
Unit
-
6
-
ns
-
3.4
-
ns
-
17
-
ns
-
21.5
-
ns
STL3N65M2
Electrical characteristics
Table 7: Source-drain diode
Symbol
Parameter
Test conditions
Min
Typ.
Max
Unit
Source-drain
current
-
2.3
A
ISDM (1)
Source-drain
current (pulsed)
-
9.2
A
VSD(2)
Forward on
voltage
ISD = 2.3 A, VGS = 0
-
1.6
V
ISD = 2.3 A,
di/dt = 100 A/µs,
VDD = 60 V
(see Figure 16: "Test circuit for inductive
load switching and diode recovery
times")
-
184
ns
-
0.7
µC
-
7.6
A
ISD = 2.3 A,
di/dt = 100 A/µs,
VDD = 60 V, Tj = 150 °C
(see Figure 16: "Test circuit for inductive
load switching and diode recovery
times")
-
300
ns
-
1.1
µC
-
7.4
A
ISD
trr
Reverse recovery
time
Qrr
Reverse recovery
charge
IRRM
Reverse recovery
current
trr
Reverse recovery
time
Qrr
Reverse recovery
charge
IRRM
Reverse recovery
current
Notes:
(1)Pulse
width limited by safe operating area.
(2)Pulsed:
pulse duration = 300 µs, duty cycle 1.5%.
DocID027894 Rev 3
5/12
Electrical characteristics
2.1
STL3N65M2
Electrical characteristics (curves)
Figure 2: Safe operating area
Figure 3: Thermal impedance
Figure 4: Output characteristics
Figure 5: Transfer characteristics
Figure 6: Gate charge vs gate-source voltage
Figure 7: Static drain-source on-resistance
6/12
DocID027894 Rev 3
STL3N65M2
Electrical characteristics
Figure 8: Capacitance variations
Figure 9: Normalized gate threshold voltage
vs temperature
Figure 10: Normalized on-resistance vs
temperature
Figure 11: Normalized V(BR)DSS vs temperature
Figure 12: Source-drain diode forward
characteristics
Figure 13: Output capacitance stored energy
DocID027894 Rev 3
7/12
Test circuits
3
STL3N65M2
Test circuits
Figure 15: Test circuit for gate charge
behavior
Figure 14: Test circuit for resistive load
switching times
Figure 16: Test circuit for inductive load
switching and diode recovery times
Figure 17: Unclamped inductive load test
circuit
Figure 18: Unclamped inductive waveform
8/12
DocID027894 Rev 3
Figure 19: Switching time waveform
STL3N65M2
4
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK ®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
4.1
Power FLAT™ 3.3x3.3 HV package information
Figure 20: PowerFLAT™ 3.3x3.3 HV package outline
.
DocID027894 Rev 3
9/12
Package information
STL3N65M2
Table 8: PowerFLAT™ 3.3x3.3 HV package mechanical data
mm
Dim.
Min.
Typ.
Max.
A
0.80
0.90
1.00
A1
0
0.02
0.05
b
0.25
0.30
0.40
D
D2
3.30
2.50
2.65
e
0.65
E
3.30
2.75
E2
1.15
1.30
1.40
L
0.20
0.30
0.40
aaa
0.10
bbb
0.10
ccc
0.10
ddd
0.05
eee
0.08
Figure 21: PowerFLAT™ 3.3x3.3 HV recommended footprint (dimensions are in mm)
8374983_footprint
10/12
DocID027894 Rev 3
STL3N65M2
5
Revision history
Revision history
Table 9: Document revision history
Date
Revision
19-May-2015
1
First release.
2
Updated title in cover page.
Updated electrical characteristic section.
Added electrical characteristic curves.
Minor text changes.
3
Updated Section "Features".
Updated Table 2: "Absolute maximum ratings" and Table 5: "Dynamic".
Changed Figure 6: "Gate charge vs gate-source voltage".
Document status promoted from preliminary to production data.
17-Dec-2015
12-Apr-2016
Changes
DocID027894 Rev 3
11/12
STL3N65M2
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© 2016 STMicroelectronics – All rights reserved
12/12
DocID027894 Rev 3
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