STL3NK40
N-channel 400 V, 4.5 Ω typ., 0.43 A, SuperMESH™
Power MOSFET in a PowerFLAT™ 5x5 package
Datasheet - production data
Features
Figure 1: Internal schematic diagram
PTOT
Order code
VDS
RDS(on) max.
ID
STL3NK40
400 V
5.5 Ω
0.43 A
2.5 W
Extremely high dv/dt capability
100% avalanche tested
Gate charge minimized
Applications
Switching applications
Description
This high voltage device is an N-channel Power
MOSFET developed using the SuperMESH™
technology by STMicroelectronics, an
optimization of the well-established
PowerMESH™. In addition to a significant
reduction in on-resistance, this device is
designed to ensure a high level of dv/dt capability
for the most demanding applications.
Table 1: Device summary
Order code
Marking
Package
Packing
STL3NK40
3NK40
PowerFLAT™ 5x5
Tape and reel
February 2017
DocID16246 Rev 3
This is information on a product in full production.
1/13
www.st.com
Contents
STL3NK40
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 8
4
Package information ....................................................................... 9
4.1
5
2/13
PowerFLAT™ 5x5 package information .......................................... 10
Revision history ............................................................................ 12
DocID16246 Rev 3
STL3NK40
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
Parameter
Value
Unit
VDS
Drain-source voltage
400
V
VDGR
Drain-gate voltage (RGS = 20 kΩ)
400
V
VGS
Gate-source voltage
± 20
V
Drain current (continuous) at Tpcb = 25 °C
0.43
A
Drain current (continuous) at Tpcb = 100 °C
0.27
A
Drain current (pulsed)
1.72
A
Total dissipation at Tpcb = 25 °C
2.5
W
Peak diode recovery voltage slope
4.5
V/ns
- 55 to 150
°C
Value
Unit
50
°C/W
ID(1)
IDM(2)
PTOT
(1)
dv/dt
(3)
Tj
Operating junction temperature range
Tstg
Storage temperature range
Notes:
(1)When
mounted on FR-4 board of 1 inch², 2 oz Cu (t < 100 s).
(2)Pulse
width limited by safe operating area.
(3)I
SD
≤ 0.43 A, di/dt ≤ 200 A/μs; VDD< 320 V.
Table 3: Thermal data
Symbol
Rthj-pcb
(1)
Parameter
Thermal resistance junction-pcb
Notes:
(1)When
mounted on 1 inch² FR-4 board, 2 oz Cu (t < 100 s).
Table 4: Avalanche characteristics
Symbol
Parameter
IAR
Avalanche current, repetitive or non-repetitive (pulse
width limited by Tjmax.)
EAS
Single pulse avalanche energy (starting Tj = 25 °C,
ID = IAR, VDD = 50 V)
DocID16246 Rev 3
Value
Unit
0.43
A
60
mJ
3/13
Electrical characteristics
2
STL3NK40
Electrical characteristics
TC = 25 °C unless otherwise specified
Table 5: On/off-state
Symbol
V(BR)DSS
Parameter
Drain-source breakdown voltage
Test conditions
Min.
VGS = 0 V, ID = 1 mA
400
Typ.
Max.
Unit
V
VGS = 0 V, VDS = 400 V
1
µA
IDSS
Zero-gate voltage drain current
VGS = 0 V, VDS = 400 V
TC = 125 °C(1)
50
µA
IGSS
Gate body leakage current
VDS = 0 V, VGS = ±20 V
±10
µA
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 50 µA
1.6
2
V
RDS(on)
Static drain-source on-resistance
VGS = 10 V, ID = 0.22 A
4.5
5.5
Ω
Min.
Typ.
Max.
Unit
-
128
200
pF
-
16
30
pF
-
4
6
pF
-
12
-
8.7
13
nC
-
0.9
-
nC
-
3.8
-
nC
Min.
Typ.
Max.
Unit
-
3
-
ns
-
4
-
ns
-
18
-
ns
-
16
-
ns
0.8
Notes:
(1)Defined
by design, not subject to production test.
Table 6: Dynamic
Symbol
Ciss
Parameter
Test conditions
Input capacitance
VDS = 25 V, f = 1 MHz,
VGS = 0 V
Coss
Output capacitance
Crss
Reverse transfer capacitance
RG
Gate input resistance
Qg
Total gate charge
Qgs
Gate-source charge
Qgd
Gate-drain charge
f = 1 MHz gate
DC bias = 0 test signal
level = 20 mV opendrain
VDD = 320 V, ID = 1.4 A
VGS = 0 to 10 V
(see Figure 13: "Test
circuit for gate charge
behavior")
pF
Table 7: Switching times
Symbol
td(on)
tr
td(off)
tf
4/13
Parameter
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Test conditions
VDD= 200 V, ID = 0.7 A,
RG = 4.7 Ω
VGS = 10 V
(see Figure 12: "Test
circuit for resistive load
switching times" and
Figure 17: "Switching
time waveform")
DocID16246 Rev 3
STL3NK40
Electrical characteristics
Table 8: Source-drain diode
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
Source-drain
current
-
0.43
A
ISDM(1)
Source-drain
current (pulsed)
-
1.72
A
VSD(2)
Forward on
voltage
-
1.2
V
ISD
Reverse recovery
time
trr
Qrr
Reverse recovery
charge
IRRM
Reverse recovery
current
trr
Reverse recovery
time
Qrr
Reverse recovery
charge
IRRM
Reverse recovery
current
ISD = 0.43 A, VGS = 0 V
ISD = 1.4 A, di/dt = 100 A/µs,VDD = 20 V
(see Figure 14: "Test circuit for
inductive load switching and diode
recovery times")
ISD = 1.4 A, di/dt = 100 A/µs VDD = 20 V,
Tj = 150 °C
(see Figure 14: "Test circuit for
inductive load switching and diode
recovery times")
-
166
ns
-
300
nC
-
3.6
A
-
176
ns
-
340
nC
-
3.8
A
Notes:
(1)Pulse
width limited by safe operating area.
(2)Pulsed:
pulse duration = 300 µs, duty cycle 1.5%.
DocID16246 Rev 3
5/13
Electrical characteristics
2.1
6/13
STL3NK40
Electrical characteristics (curves)
Figure 2: Safe operating area
Figure 3: Thermal impedance
Figure 4: Output characteristics
Figure 5: Transfer characteristics
Figure 6: Static drain-source on-resistance
Figure 7: Gate charge vs. gate-source voltage
DocID16246 Rev 3
STL3NK40
Electrical characteristics
Figure 8: Capacitance variations
Figure 9: Normalized V(BR)DSS vs. temperature
Figure 10: Normalized gate threshold voltage vs.
temperature
Figure 11: Normalized on-resistance vs.
temperature
DocID16246 Rev 3
7/13
Test circuits
3
STL3NK40
Test circuits
Figure 12: Test circuit for resistive load
switching times
Figure 13: Test circuit for gate charge
behavior
VDD
RL
IG= CONST
VGS
+
pulse width
2200
μF
100 Ω
D.U.T.
2.7 kΩ
VG
47 kΩ
1 kΩ
AM01469v10
Figure 14: Test circuit for inductive load
switching and diode recovery times
Figure 16: Unclamped inductive waveform
8/13
DocID16246 Rev 3
Figure 15: Unclamped inductive load test
circuit
Figure 17: Switching time waveform
STL3NK40
4
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK ®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
DocID16246 Rev 3
9/13
Package information
4.1
STL3NK40
PowerFLAT™ 5x5 package information
Figure 18: PowerFLAT™ 5x5 package outline
7
10
4
10
1
9
8
7
11
6
12
5
1
2
3
4
Pin 1
identification
10/13
DocID16246 Rev 3
8365434_A_type_S
STL3NK40
Package information
Table 9: PowerFLAT 5x5 package mechanical data
mm
Dim.
Min.
Typ.
Max.
A
0.80
1.0
A1
0.02
0.05
A2
b
0.25
0.30
D
0.50
5.00
D1
4.05
E
4.25
5.00
E1
0.64
0.79
E2
2.25
2.45
e
L
1.27
0.45
0.75
Figure 19: PowerFLAT™ 5x5 recommended footprint (dimensions are in mm)
8365434_ A
DocID16246 Rev 3
11/13
Revision history
5
STL3NK40
Revision history
Table 10: Document revision history
Date
Revision
18-Sep-2009
1
First release.
29-Aug-2013
2
Updated: Section 4: Package mechanical data
Minor text changes
3
Removed PowerFLAT™ 5x5 type C package information and cover
image.
Updated Table 6: "Dynamic" and Table 8: "Source-drain diode".
Updated Section 2.1: "Electrical characteristics (curves)".
Minor text changes.
20-Feb-2017
12/13
Changes
DocID16246 Rev 3
STL3NK40
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DocID16246 Rev 3
13/13
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