STL4LN80K5
N-channel 800 V, 2.1 Ω typ., 2 A MDmesh™ K5
Power MOSFET in a PowerFLAT™ 5x6 VHV package
Datasheet - production data
Features
1
2
3
4
PowerFLAT™ 5x6 VHV
Order code
VDS
RDS(on) max.
ID
STL4LN80K5
800 V
2.6 Ω
2A
Industry’s lowest RDS(on) * area
Industry’s best FoM (figure of merit)
Ultra low-gate charge
100 % avalanche tested
Zener-protected
Applications
Figure 1: Internal schematic diagram
D(5, 6, 7, 8)
8
7
6
5
Switching applications
Description
This very high voltage N-channel Power
MOSFET is designed using MDmesh™ K5
technology based on an innovative proprietary
vertical structure. The result is a dramatic
reduction in on-resistance and ultra-low gate
charge for applications requiring superior power
density and high efficiency.
G(4)
1
2
3
4
Top View
S(1, 2, 3)
Table 1: Device summary
Order code
Marking
Package
Packing
STL4LN80K5
4LN80K5
PowerFLAT™ 5x6 VHV
Tape and reel
October 2017
DocID027815 Rev 2
This is information on a product in full production.
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www.st.com
Contents
STL4LN80K5
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 8
4
Package information ....................................................................... 9
5
2/16
4.1
PowerFLAT™ 5x6 VHV package information ................................. 10
4.2
PowerFLAT™ 5x6 packing information ........................................... 13
Revision history ............................................................................ 15
DocID027815 Rev 2
STL4LN80K5
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
VGS
Parameter
Unit
± 30
V
ID
Drain current (continuous) at TC = 25 °C
2
A
ID
Drain current (continuous) at TC = 100 °C
1.2
A
Drain current (pulsed)
8
A
W
IDM
Gate-source voltage
Value
(1)
PTOT
Total dissipation at TC = 25 °C
38
dv/dt
(2)
Peak diode recovery voltage slope
4.5
dv/dt
(3)
MOSFET dv/dt ruggedness
50
Tj
Operating junction temperature range
Tstg
V/ns
- 55 to 150
°C
Value
Unit
Thermal resistance junction-case
3.3
°C/W
Thermal resistance junction-pcb
59
°C/W
Value
Unit
Storage temperature range
Notes:
(1)Pulse
(2)I
SD
(3)V
width limited by safe operating area
≤ 2 A, dv/dt ≤ 100 A/μs; VDS peak < V(BR)DSS
DS
≤ 640 V
Table 3: Thermal data
Symbol
Rthj-case
Rthj-pcb
(1)
Parameter
Notes:
(1)When
mounted on FR-4 board of 1 inch², 2 oz Cu
Table 4: Avalanche characteristics
Symbol
Parameter
IAR
Avalanche current, repetitive or not repetitive
(pulse width limited by Tjmax)
0.8
A
EAS
Single pulse avalanche energy
(starting Tj = 25 °C, ID = IAR, VDD = 50 V)
160
mJ
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Electrical characteristics
2
STL4LN80K5
Electrical characteristics
TC = 25 °C unless otherwise specified
Table 5: On/off-state
Symbol
V(BR)DSS
Parameter
Test conditions
Drain-source breakdown
voltage
VGS = 0 V, ID = 1 mA
Min.
Typ.
Max.
Unit
800
V
VGS = 0 V, VDS = 800 V
1
µA
IDSS
Zero gate voltage drain current
VGS = 0 V, VDS = 800 V
TC = 125 °C(1)
50
µA
IGSS
Gate body leakage current
VDS = 0 V, VGS = ±20 V
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 100 µA
RDS(on)
Static drain-source onresistance
VGS = 10 V, ID = 1.25 A
±10
µA
4
5
V
2.1
2.6
Ω
Min.
Typ.
Max.
Unit
-
110
-
pF
-
9.5
-
pF
-
0.4
-
pF
-
23
-
pF
-
9
-
pF
3
Notes:
(1)Defined
by design, not subject to production test.
Table 6: Dynamic
Symbol
Ciss
Parameter
Test conditions
Input capacitance
VDS = 100 V, f = 1 MHz,
VGS = 0 V
Coss
Output capacitance
Crss
Reverse transfer capacitance
Co(tr)(1)
Equivalent capacitance time
related
Co(er)(2)
Equivalent capacitance energy
related
VDS = 0 to 640 V,
VGS = 0 V
Rg
Intrinsic gate resistance
f = 1 MHz, ID = 0 A
-
18
-
Ω
VDD = 640 V, ID = 2.5 A
VGS = 0 to 10 V,
see Figure 15: "Test circuit
for gate charge behavior"
-
3.7
-
nC
-
1
-
nC
-
2.2
-
nC
Qg
Total gate charge
Qgs
Gate-source charge
Qgd
Gate-drain charge
Notes:
(1)Time
related is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS
increases from 0 to 80 % VDSS.
(2)Energy
related is defined as a constant equivalent capacitance giving the same stored energy as Coss when
VDS increases from 0 to 80 % VDSS.
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DocID027815 Rev 2
STL4LN80K5
Electrical characteristics
Table 7: Switching times
Symbol
td(on)
Parameter
Turn-on delay time
tr
Rise time
td(off)
Turn-off delay time
tf
Fall time
Test conditions
Min.
Typ.
Max.
Unit
VDD= 400 V, ID = 1.25 A, RG = 4.7 Ω
VGS = 10 V
(See Figure 14: "Test circuit for
resistive load switching times" and
Figure 19: "Switching time
waveform")
-
7
-
ns
-
9
-
ns
-
31
-
ns
-
25
-
ns
Min.
Typ.
Max.
Unit
Table 8: Source-drain diode
Symbol
Parameter
Test conditions
ISD
Source-drain current
-
2
A
ISDM(1)
Source-drain current
(pulsed)
-
8
A
VSD(2)
Forward on voltage
ISD = 2 A, VGS = 0 V
-
1.6
V
trr
Reverse recovery
time
ISD = 2.5 A, di/dt = 100 A/µs,
Qrr
Reverse recovery
charge
IRRM
Reverse recovery
current
trr
-
230
ns
VDD = 60 V, (see Figure 16: "Test
circuit for inductive load switching
and diode recovery times")
-
1.04
µC
-
9
A
Reverse recovery
time
ISD = 2.5 A, di/dt = 100 A/µs,
-
368
ns
Qrr
Reverse recovery
charge
-
1.53
µC
IRRM
Reverse recovery
current
VDD = 60 V, Tj = 150 °C
(see Figure 16: "Test circuit for
inductive load switching and diode
recovery times")
-
8
A
Min.
Typ.
Max.
Unit.
30
-
-
V
Notes:
(1)Pulse
width limited by safe operating area
(2)Pulsed:
pulse duration = 300 µs, duty cycle 1.5%
Table 9: Gate source-Zener diode
Symbol
V(BR)GS0
Parameter
Gate-source
breakdown voltage
Test condition
IGS= ± 1mA, ID= 0 A
The built-in back-to-back Zener diodes have specifically been designed to enhance the
device's ESD capability. In this respect the Zener voltage is appropriate to achieve an
efficient and cost-effective intervention to protect the device's integrity. These integrated
Zener diodes thus avoid the usage of external components.
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Electrical characteristics
2.1
STL4LN80K5
Electrical characteristics (curves)
Figure 2: Safe operating area
Figure 3: Thermal impedance
K
ZthPowerFlat_5x6_19
d=0.5
0.2
10-1
0.1
10-2
10-3 -6
10
0.05
0.02
0.01
Single pulse
10-5 10-4
10-3
10-2 10-1 100 tp(s)
Figure 4: Output characteristics
Figure 5: Transfer characteristics
Figure 6: Gate charge vs gate-source voltage
Figure 7: Static drain-source on-resistance
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DocID027815 Rev 2
STL4LN80K5
Electrical characteristics
Figure 8: Capacitance variations
Figure 9: Normalized gate threshold voltage vs
temperature
Figure 10: Normalized on-resistance vs temperature
Figure 11: Normalized V(BR)DSS vs temperature
Figure 12: Maximum avalanche energy vs starting TJ
Figure 13: Source-drain diode forward
characteristics
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Test circuits
3
STL4LN80K5
Test circuits
Figure 14: Test circuit for resistive load
switching times
Figure 15: Test circuit for gate charge
behavior
VDD
RL
IG= CONST
VGS
+
pulse width
2200
μF
100 Ω
D.U.T.
2.7 kΩ
VG
47 kΩ
1 kΩ
AM01469v10
8/16
Figure 16: Test circuit for inductive load
switching and diode recovery times
Figure 17: Unclamped inductive load test
circuit
Figure 18: Unclamped inductive waveform
Figure 19: Switching time waveform
DocID027815 Rev 2
STL4LN80K5
4
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK ®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
DocID027815 Rev 2
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Package information
4.1
STL4LN80K5
PowerFLAT™ 5x6 VHV package information
Figure 20: PowerFLAT™ 5x6 VHV package outline
1
2
3
4
6
5
Bottom view
Pin 1
identification
8
7
Side view
Pin 1
identification
10/16
8
7
6
5
1
2
3
4
DocID027815 Rev 2
Top view
STL4LN80K5
Package information
Table 10: PowerFLAT™ 5x6 VHV package mechanical data
mm
Dim.
Min.
Typ.
Max.
A
0.80
1.00
A1
0.02
0.05
A2
0.25
b
0.30
D
5.00
5.20
5.40
E
5.95
6.15
6.35
D2
4.30
4.40
4.50
E2
2.40
2.50
2.60
e
0.50
1.27
L
0.50
0.55
0.60
K
2.60
2.70
2.80
DocID027815 Rev 2
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Package information
STL4LN80K5
Figure 21: PowerFLAT™ 5x6 VHV recommended footprint (dimensions are in mm)
8368144_REV_3_footprint
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DocID027815 Rev 2
STL4LN80K5
4.2
Package information
PowerFLAT™ 5x6 packing information
Figure 22: PowerFLAT™ 5x6 tape (dimensions are in mm)
(I) Measured from centreline of sprocket hole
to centreline of pocket.
(II) Cumulative tolerance of 10 sprocket
holes is ±0.20.
Base and bulk quantity 3000 pcs
All dimensions are in millimeters
(III) Measured from centreline of sprocket
hole to centreline of pocket
8234350_ Tape_rev_C
Figure 23: PowerFLAT™ 5x6 package orientation in carrier tape
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Package information
STL4LN80K5
Figure 24: PowerFLAT™ 5x6 reel
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STL4LN80K5
5
Revision history
Revision history
Table 11: Document revision history
Date
Revision
29-May-2015
1
First release.
2
Updated title and features in cover page.
Updated Section 1: "Electrical ratings", Section 2: "Electrical
characteristics".
Added Section 2.1: "Electrical characteristics (curves)".
Minor text changes.
02-Oct-2017
Changes
DocID027815 Rev 2
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STL4LN80K5
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