STM32C562xx
Datasheet
Arm® Cortex®-M33 32-bit MCU with FPU, 144 MHz, 593 CoreMark®,
512‑Kbyte dual‑bank flash memory, 128-Kbyte RAM, cryptography
Features
Includes ST state-of-the-art patented technology.
LQFP32 (7 x 7 mm)
LQFP48 (7 x 7 mm)
LQFP64 (10 x 10 mm)
LQFP80 (12 x 12 mm)
LQFP100 (14 x 14 mm)
UFQFPN32
(5 x 5 mm)
UFQFPN48
(7 x 7 mm)
Core
•
32-bit Arm® Cortex®-M33 CPU with FPU, frequency up to 144 MHz, MPU, and
DSP instructions
Benchmarks
•
Product status
STM32C562xx
STM32C562CE,
STM32C562KE,
STM32C562ME,
STM32C562RE,
STM32C562VE
593 CoreMark® (4.12 CoreMark®/MHz)
ART Accelerator
•
8-Kbyte instruction cache enables 0-wait-state execution from flash memory at
the CPU's maximum speed
Memories
•
•
•
•
512‑Kbyte flash memory with ECC, 2 banks read-while-write
128-Kbyte SRAM including 64-Kbyte with ECC
64-Kbyte flash memory area for software EEPROM emulation
4.5-Kbyte OTP (one-time programmable)
Clock, reset, and supply management
•
•
•
•
•
•
2.7 V to 3.6 V application supply and I/O
POR, PDR, and PVD
Embedded regulator (LDO)
Internal oscillators:
144 MHz HSI (with +/- 1% accuracy over temperature range [-20 °C : 130°C]),
160/144/100 MHz PSI,
32 kHz LSI
External oscillators:
4 to 50 MHz HSE,
32.768 kHz LSE
Low-power modes: Sleep, Stop, and Standby
DMA controller to offload the CPU
•
2 x LPDMA with 12 channels (8 + 4)
Analog
•
•
•
2 × 12-bit ADC (19 external channels and 2 internal), up to 2.25 MSPS, or up
to 4.5 MSPS in dual interleaved mode
1 × 12-bit DAC (with output buffer)
1 × comparator (with configurable set of inputs)
Up to 15 timers
•
9 × 16-bit (including 2 × 16-bit advanced motor control, 1 × low-power 16-bit
timer available in Stop mode) and 2 × 32-bit timers
DS14927 - Rev 1 - February 2026
For further information, contact your local STMicroelectronics sales office.
www.st.com
STM32C562xx
•
•
•
2 × watchdogs
1 × SysTick timer
RTC with hardware calendar, alarms, and calibration
Communication interfaces
•
•
•
•
•
•
Up to 2 × I2C FM + interfaces (SMBus/PMBus)
1 × I3C
Up to 3 × USARTs (ISO7816 interface, LIN, IrDA, modem control, SPI mode), 2 × UARTs, and 1 × LPUART
Up to 3 × SPIs with muxed with full‑duplex I2S for audio class accuracy via external clock and up to
3 × additional SPIs from 3 × USARTs when configured in synchronous mode
1 × FDCAN
1 × USB 2.0 full-speed host and device
Low-power modes
•
Sleep, Stop, and Standby modes
Up to 86 I/O ports with interrupt capability
HASH (SHA-1, SHA-224, SHA-256), HMAC
AES accelerator
•
128-bit and 256-bit key length
Mathematical coprocessor
•
CORDIC for trigonometric functions acceleration
1 × True random number generator
Bootloader support on USART, FDCAN, USB, and SPI interfaces
Flexible life-cycle scheme with RDP and password-protected regression
96-bit unique ID
All packages are ECOPACK2 compliant.
DS14927 - Rev 1
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STM32C562xx
Introduction
1
Introduction
This document provides information on STM32C562xx devices, such as description, functional overview, pin
assignment and definition, electrical characteristics, packaging and ordering information.
For information on the Arm® Cortex®-M33 core, refer to the Arm® Cortex®-M33 Processor Technical Reference
Manual, available from the www.arm.com website.
Note:
DS14927 - Rev 1
Arm and Cortex are registered trademarks of Arm Limited (or its subsidiaries or affiliates) in the US and/or
elsewhere.
The Arm word and logo are trademarks of Arm Limited (or its subsidiaries) in the US and/or elsewhere. All rights
reserved.
page 3/130
STM32C562xx
Description
2
Description
The STM32C562xx devices are general purpose microcontrollers family (STM32C5 Series) based on the
high‑performance Arm® Cortex®-M33 32-bit RISC core. They operate at a frequency of up to 144 MHz.
The Cortex®-M33 core features a single‑precision floating‑point unit (FPU), that supports all the Arm®
single‑precision data‑processing instructions and all the data types.
The Cortex®-M33 core also implements a full set of digital signal processing (DSP) instructions and a memory
protection unit (MPU) that enhances the application security.
The devices embed high‑speed memories (512‑Kbyte flash memory and 128‑Kbyte SRAM), and an extensive
range of enhanced I/Os, peripherals connected to three APB buses, three AHB buses, and a 32‑bit multi‑AHB bus
matrix.
The devices feature several protection mechanisms for embedded flash memory and SRAM: readout protection,
write protection, and hide protection areas.
The devices embed several peripherals reinforcing security:
•
•
•
HASH hardware accelerator
True random number generator
AES coprocessor
The devices offer two 12‑bit ADCs, one DAC channel, one comparator, a low‑power RTC, two 32‑bit
general‑purpose timers, two 16‑bit PWM timers dedicated to motor control, four 16‑bit general‑purpose timers,
two 16‑bit basic timers, and one 16‑bit low‑power timer.
The devices also feature standard and advanced communication interfaces such as:
•
Two I2Cs
•
•
•
•
•
One I3C shared with I2C
Three SPIs with muxed full-duplex I2S
Three USARTs, two UARTs, and one low‑power UART
One FDCAN
One USB full‑speed
The devices operate in the –40 to +125 °C (+140 °C junction) temperature ranges from a 2.7 to 3.6 V power
supply.
A comprehensive set of power‑saving modes allows the design of low‑power applications.
The devices offer multiple packages from 32 to 100 pins.
See Table 1 for the list of peripherals available for each part number.
Flash memory (Kbytes)
SRAM (Kbytes)
STM32C562VET
128 (including 64 with ECC)
8
Flash memory area for EEPROM
Emulation (Kbytes)
64
One-time-programmable (Kbytes)
4.5
DS14927 - Rev 1
STM32C562MET
512
ICACHE (Kbytes)
Timers
STM32C562RET
STM32C562CEU
STM32C562CET
STM32C562KEU
Peripherals
STM32C562KET
Table 1. Device features and peripheral counts
General purpose
6
Advanced‑control
2
Basic
2
page 4/130
STM32C562xx
Timers
Low‑power
1
SysTick
1
Window watchdog
STM32C562VET
3 (3)
I2C
2
I3C
1
USART
3
UART
2
LPUART
1
USB
1
FDCAN
1
TRACE
No
Yes
CORDIC
Yes
RTC
Yes (without LSE)
Yes
2
3
Tamper pins
True random number generator (RNG)
Yes
HASH
Yes
AES
Yes
GPIOs
25
Wake-up pins
27
3
12-bit ADC
channels
External
9
10
Internal
2
2
2
38
52
66
86
4
6
6
7
11
17
18
19
2
2
2
LQFP80
LQFP100
2
12-bit DAC channels
1
Analog comparator
1
Maximum CPU frequency (MHz)
144
Operating voltage
2.7 V - 3.6 V
Operating temperature
Packages
STM32C562MET
2
SPI (with I2S)
Communication
interfaces
STM32C562RET
STM32C562CEU
STM32C562CET
STM32C562KET
Peripherals
STM32C562KEU
Description
Junction temperature range: −40 to +140 °C
LQFP32
UFQFPN32
LQFP48
UFQFPN48
LQFP64
Figure 1 shows the general block diagram of the device family.
DS14927 - Rev 1
page 5/130
STM32C562xx
Description
Figure 1. STM32C562xx block diagram
MPU
ETM
NVIC
Arm Cortex-M33 C-BUS
144 MHz
FPU
S-BUS
RNG
AES
Flash memory
(up to 512 Kbytes)
HASH
@VDDA
AHB bus-matrix
SRAM1 (64 Kbytes)
LPDMA1
LPDMA2
ITF
RAMCFG
ITF
CRC
VDD
@VDD
PB[15:0]
GPIO port B
PC[15:0]
GPIO port C
PD[15:0]
GPIO port D
PE[15:0]
GPIO port E
Reset
TIM1/PWM
3 compl. channels
(TIM8_CH[1:3]N),
6 channels (TIM8_CH[1:4]),
ETR, BKIN, BKIN2 as AF
TIM8/PWM
VDD, VSS, NRST
IWDG
PSI
XTAL OSC
4- 50 MHz
Reset and clock control
PCLKx
HCLKx
OSC_IN
OSC_OUT
Standby
interface
CRS
TIM2
32b
TIM5
32b
WKUPx (x=1 to 7)
4 channels, ETR as AF
4 channels, ETR as AF
16b
EXTI
16b
1 channel,
1 compl. channel, BKIN as AF
TIM16
16b
1 channel,
1 compl. channel, BKIN as AF
TIM17
16b
AHB/APB1
APB2 144 MHz
TIM15
AHB/APB2
smcard
USART1
irDA
WWDG
SPI1/I2S1
IWDG
APB1 144 MHz (max)
16b
2 channels,
1 compl. channel, BKIN as AF
MOSI, MISO, SCK,
NSS as AF
VDD = 2.7 to 3.6 V
VSS
PVD
Int
LSI
FCLK
3 compl. channels
(TIM1_CH[1:3]N),
6 channels (TIM1_CH[1:4]),
ETR, BKIN, BKIN2 as AF
RX, TX, CK,CTS, RTS as AF
@VDD
Supply supervision
GPIO port H
PH[15:0]
19xIN
@VDD
Power management
HSI
AHB3 144 MHz
AHB1 144 MHz
GPIO port A
@VDDA
ADC1
Voltage regulator LDO
EXT IT. WKP
PA[15:0]
DAC1_OUT1
ADC2
AHB2 144 MHz
CORDIC
16 AF
DAC1
SRAM2 (64 Kbytes)
smcard
USART2 irDA
RX, TX, CK, CTS,
RTS as AF
smcard
USART3 irDA
RX, TX, CK, CTS,
RTS as AF
UART4
RX, TX, CTS, RTS as AF
UART5
RX, TX, CTS, RTS as AF
SPI2/I2S2
MOSI, MISO, SCK,
NSS as AF
SPI3/I2S3
MOSI, MISO, SCK,
NSS as AF
I2C1/SMBUS
SCL, SDA, SMBA as AF
I2C2/SMBUS
SCL, SDA, SMBA as AF
FIFO
TRACECLK,
TRACED[3:0]
JTAG/ SW
ICACHE
(8 Kbytes)
NJTRST, JTDI, JTCK/SWCLK,
JTMS/SWDIO, JTDO
TX, RX as AF
TIM6 16b
AHB/APB3
TIM7 16b
Temperature
monitoring
TAMP_IN[1:3]
IN1, IN2, CH1, CH2,
ETR as AF
RX, TX, CTS, RTS_DE as
AF
@VRTC
XTAL 32k
RTC
TAMP
LPTIM1
SBS
APB3 144 MHz
RTC_OUT1, RTC_OUT2,
RTC_REFIN, RTC_TS
VDDUSB power
domain
FDCAN1
TIM12
16b
I3C1
2 channels, ETR as AF
SCL, SDA
VDDA power
domain
@VDDA
ITF COMP1
INPx, INMx, OUTx
VDD power domain
DT76077V1
USB FS
FIFO
DP
DM
PHY
@VDDUSB
LPUART1
VRTC power
domain
DS14927 - Rev 1
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STM32C562xx
Functional overview
3
Functional overview
3.1
Arm® Cortex®-M33 with FPU
The Cortex®-M33 is a highly energy-efficient processor designed for microcontrollers and deeply embedded
applications, especially those requiring efficient security.
The Cortex® processor delivers a high‑computational performance with low‑power consumption and an advanced
response to interrupts.
It features:
•
•
Memory protection units (MPUs) supporting eight regions
Floating-point arithmetic functionality with support for single-precision arithmetic
The processor supports a set of DSP instructions that allows an efficient signal processing and a complex
algorithm execution.
The Cortex®-M33 processor features:
•
•
System AHB bus:
The system AHB (S-AHB) bus interface is used for any instruction fetch and data access to the
memory‑mapped SRAM, peripheral, or Vendor_SYS regions of the Armv8‑M memory map.
Code AHB bus:
The code AHB (C-AHB) bus interface is used for any instruction fetch and data access to the code region
of the Armv8‑M memory map.
Refer to Figure 1. STM32C562xx block diagram for more details.
DS14927 - Rev 1
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STM32C562xx
Functional overview
3.2
Instruction cache (ICACHE)
The instruction cache (ICACHE) is introduced on the C-AHB code bus of the Cortex®‑M33 processor to improve
performance when fetching instructions and data from internal memories. Some specific features, like
hit‑under‑miss and critical-word‑first refill policy, allow close to zero‑wait‑state performance in most use cases.
The ICACHE main features are:
•
Bus interface:
One 32-bit AHB slave port, the execution port (input from Cortex®‑M33 C‑AHB code interface)
One 128-bit AHB master port: master1 port (output to Fast bus of the main AHB bus matrix)
One 32-bit AHB slave port for control (input from AHB peripherals interconnect, for ICACHE registers
access)
Cache access:
–
–
–
•
–
–
•
Zero wait-state on hits
Hit-under-miss capability: ability to serve processor requests (access to cached data) during an
ongoing line refill due to a previous cache miss
–
Optimal cache line refill thanks to WRAPw bursts of the size of the cache line (32-bit word size, w,
aligned on cache line size)
–
n-way set-associative default configuration with the possibility to configure as 1‑way, meaning
direct‑mapped cache, for applications needing a very‑low‑power consumption profile
Memory address remap:
–
•
Possibility to remap input addresses falling into up to four memory regions (used to remap aliased
code in SRAM memories to the code region, for execution from the C‑AHB code interface)
Replacement and refill:
–
•
•
pLRU-t replacement policy (pseudo-least-recently-used, based on binary tree), algorithm with the
best complexity/performance balance
–
Critical-word-first refill policy, minimizing processor stalls
–
Possibility to configure burst type of AHB memory transaction for remapped regions: INCRw or
WRAPw (size w aligned on cache line size)
Performance counters:
The ICACHE implements two performance counters:
–
Hit monitor counter (32-bit)
–
Miss monitor counter (16-bit)
Error management:
–
•
Possibility to detect an unexpected cacheable write access, to flag an error, and optionally to raise an
interrupt
Maintenance operation:
–
3.3
Cache invalidate: full cache invalidation, fast command, noninterruptible
Memory protection unit
The memory protection unit (MPU) is used to manage the CPU accesses to the memory. It also prevents one task
to accidentally corrupt the memory or the resources used by any other active task. This memory area is organized
into up to eight protected areas.
The MPU is especially helpful for applications where some critical or certified code must be protected against the
misbehavior of other tasks. An RTOS (real-time operating system) usually manages the MPU.
If a program accesses a memory location that is prohibited by the MPU, the RTOS can detect it and take action.
In an RTOS environment, the kernel can dynamically update the MPU area setting based on the process to be
executed.
3.4
3.4.1
Memories
Embedded flash memory
The devices feature 512 Kbytes embedded flash memory that is available for storing programs and data.
DS14927 - Rev 1
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STM32C562xx
Functional overview
The flash memory interface features:
•
•
Dual-bank operating modes
Read-while-write (RWW)
This allows a read operation to be performed from one bank while an erase or program operation is performed to
the other bank. Each bank contains 32 pages of 8 Kbytes.
The flash memory embeds 4.5-Kbyte OTP (one-time programmable) for user data.
Enhanced flash memory protection mechanisms are available. These mechanisms can be activated by option
bytes:
•
•
•
RDP states for protecting memory content from debug access
Page group write-protection (WRPG)
One hide protection area (HDP) per bank that provides temporal isolation for startup code
The whole nonvolatile memory embeds the error correction code (ECC) feature supporting:
•
•
•
Single-error detection and correction
Double-error detection
ECC fail address report
3.4.1.1
User data flash memory
The device features 64 Kbytes of user data flash memory split in two banks of 16 × 2‑Kbyte sectors offering
perfect space for storing EEPROM emulation data.
3.4.2
Embedded SRAMs
Two SRAMs are embedded in the STM32C562xx devices.
These SRAMs are made of several blocks that can be powered down in Stop mode to reduce consumption:
•
•
3.5
SRAM1: 64 Kbytes
SRAM2: 64 Kbytes with optional ECC
Boot modes
At startup, the BOOT0 pin allows the system to boot either from the user Flash or from the bootloader.
When boot from user Flash is selected, BOOTADD defines the boot address. This address can be locked thanks
to BOOT_LOCK.
The embedded bootloader is located in the system memory, programmed by STMicroelectronics during
production. It is used to reprogram the flash memory by using USART, SPI, FDCAN, or USB in device mode
through the device firmware upgrade (DFU).
Refer to the application note STM32 microcontroller system memory boot mode (AN2606) for more details.
3.6
Power supply management
The power controller (PWR) main features are:
DS14927 - Rev 1
•
Power supplies and supply domains
•
–
Core domain (VCORE)
–
VDD domain
–
RTC domain
–
Analog domain (VDDA)
System supply voltage regulation
•
–
Voltage regulator (LDO)
Power supply supervision
•
–
POR/PDR monitor
–
PVD monitor
Power management
•
–
Low-power modes
Privileged protection
page 9/130
STM32C562xx
Functional overview
3.6.1
Power supply schemes
The devices require a 2.7 V to 3.6 V VDD operating voltage supply.
•
•
•
VDD = 2.7 V to 3.6 V
VDD is the external power supply for the I/Os, the internal regulator, and the system analog such as reset,
power management, and internal clocks. It is provided externally through the VDD pins.
VDDA = VDD
VDDA is the analog power supply for ADCs, DACs, and comparator.
VREF-, VREF+
VREF+ is the input reference voltage for ADCs and DAC.
VREF+ can be grounded when ADCs and DAC are not active.
VREF- and VREF+ pins are not available on all packages. When not available, they are bonded to VSSA
and VDDA, respectively.
The STM32C562xx devices embed a LDO regulator to provide the VCORE supply for digital peripherals, SRAM1,
SRAM2, and embedded flash memory. The LDO generates this voltage on VCAP pin connected to an external
capacitor of 2.2 μF typical.
The LDO regulator can operate in Stop modes where it may provide two different voltages (voltage scaling).
Figure 2. STM32C562xx power supply overview
VDDA domain
A/D converters
D/A converter
Comparator
USB transceiver
VDD domain
VDDIO
I/O ring
Core domain
Reset block
Internal RC oscillators
VSS
VDD
Core
Standby circuitry
(Wake-up logic, IWDG)
SRAM1
SRAM2
Voltage regulator
VCORE
VCAP
Digital
peripherals
LDO regulator
Flash memory
DS14927 - Rev 1
DT74255V2
RTC domain (VRTC)
LSE crystal 32 kHz oscillator
Backup registers
RCC_RTC register
RTC
TAMP
page 10/130
STM32C562xx
Functional overview
3.6.2
Power supply supervisor
The devices have an integrated power‑on reset (POR) / power‑down reset (PDR) circuitry:
•
Power-on reset (POR)
The POR supervisor monitors the VDD power supply and compares it to a fixed threshold. The devices
remain in reset mode when VDD is below this threshold.
•
Power-down reset (PDR)
The PDR supervisor monitors the VDD power supply. A reset is generated when VDD drops below a fixed
threshold.
Programmable voltage detector (PVD)
The PVD monitors the VDD power supply by comparing it with a threshold fixed by hardware.
An interrupt can be generated when VDD drops below the VPVD threshold and/or when VDD is higher than
the VPVD threshold. The interrupt service routine can then generate a warning message and/or put the
device into a safe state. The software enables the PVD.
•
3.6.3
Low-power modes
By default, the microcontroller is in Run mode after a system or a power reset. It is up to the user to select one of
the low‑power modes described below:
•
Sleep mode
In Sleep mode, only the CPU is stopped. All peripherals continue to operate and can wake up the CPU
when an interrupt/event occurs.
•
Stop mode
Stop mode achieves the lowest power consumption while retaining the content of SRAM and registers. All
clocks in the VCORE domain are stopped, the PSI, the HSI, and the HSE crystal oscillators are disabled.
The LSE or LSI is still running.
The RTC can remain active (Stop mode with RTC, Stop mode without RTC).
The system clock when exiting Stop mode is HSI 144 MHz.
Stop 0 mode maintains the regulator output at a nominal voltage of 1.2 V.
Stop 1 mode reduces power consumption by lowering VCORE to 0.95 V, which results in a longer wake-up
time and fewer wake-up sources compared to Stop 0 mode.
•
Standby mode
The Standby mode is used to achieve the lowest power consumption with BOR.
The PSI, the HSI, and the HSE crystal oscillators are also switched off.
The RTC can remain active (Standby mode with RTC, Standby mode without RTC).
The state of each I/O during Standby mode can be retained.
After entering Standby mode, SRAMs and register contents are lost except for registers in the RTC domain
and Standby circuitry.
The device exits Standby mode in the following cases:
–
–
–
–
An external reset with NRST pin
An IWDG reset
A WKUP pin event (configurable rising or falling edge)
An RTC event occurs (alarm, periodic wake-up, timestamp), or in a tamper detection. The tamper
detection can be raised either due to external pins or due to an internal failure detection.
The system clock after wake-up is HSI at 144 MHz.
3.6.4
Reset mode
To improve the consumption under reset, the I/O state under and after reset is “analog state” (the I/O Schmitt
trigger is disabled).
3.7
Peripheral interconnect matrix
Several peripherals have direct connections between them. These connections allow autonomous communication
between them and support the saving of CPU resources (thus power supply consumption). In addition, these
hardware connections allow fast and predictable latency.
Depending on the peripherals, these interconnections can operate in Run and Sleep modes.
DS14927 - Rev 1
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STM32C562xx
Functional overview
3.8
Reset and clock controller (RCC)
The clock controller distributes the clocks coming from the different oscillators to the core and to the peripherals. It
also manages the clock gating for low‑power modes and ensures the clock robustness.
It features:
•
•
•
•
Clock prescaler: in order to get the best trade‑off between speed and current consumption, the clock
frequency to the CPU and peripherals can be adjusted by a programmable prescaler.
Clock security system: clock sources can be changed safely on the fly in Run mode through a
configuration register.
Clock management: in order to reduce the power consumption, the clock controller can stop the clock to
the core, individual peripherals, or memory.
System clock source: four different clock sources can be used to drive the master clock SYSCLK:
–
•
4 to 50 MHz high-speed external crystal or ceramic resonator (HSE). The HSE can also be
configured in bypass mode for an external clock.
–
144 MHz or 48 MHz on high-speed internal RC oscillator (HSI), trimmable by software
–
144 MHz programmable-speed internal oscillator (PSI)
Auxiliary clock source: two ultra‑low‑power clock sources that can be used to drive the real-time clock:
–
•
•
•
•
32.768 kHz low-speed external crystal (LSE), supporting four drive capability modes. The LSE can
also be configured in bypass mode for an external clock.
–
32 kHz low-speed internal RC (LSI), also used to drive the independent watchdog.
Peripheral clock sources: several peripherals have their own independent clock whatever the system
clock. Two dividers, each with a large scale of configurable division factors, can generate independent
clocks for the ADCS, USARTx, UARTx, SPIx, I2Cx, I3C1, and FDCANx.
Startup clock: after reset, the microcontroller restarts by default with an internal 144 MHz clock (HSI). The
prescaler ratio and clock source can be changed by the application program as soon as the code execution
starts.
Clock security system (CSS): this feature can be enabled by software. If an HSE clock failure occurs, the
master clock automatically switches to HSI and a software interrupt is generated if enabled. LSE failure can
also be detected and generates an interrupt.
Clock-out capability:
–
–
MCO (microcontroller clock output): it outputs one of the internal clocks for external use by the
application.
LSCO (low-speed clock output): it outputs LSI or LSE in all low-power modes.
Several prescalers allow AHB and APB frequencies configuration. The maximum frequency of the AHB and the
APB clock domains is 144 MHz.
3.9
Clock recovery system (CRS)
The devices embed a special block that allows automatic trimming of the internal 144 MHz oscillator to guarantee
its optimal accuracy over the whole device‑operational range. This automatic trimming is based on the external
synchronization signal. This signal is either derived from USB_SOF signalization, from an LSE oscillator, from an
external signal on the CRS_SYNC pin or generated by user software. For faster lock-in during startup,
automatic‑trimming and manual‑trimming action can be combined.
3.10
General-purpose inputs/outputs (GPIOs)
Each of the GPIO pins can be configured by software as output (push‑pull or open‑drain), as input (with or without
pull‑up or pull‑down) or as peripheral alternate function. Most of the GPIO pins are shared with digital or analog
alternate functions.
After reset, all GPIOs are in Analog mode to reduce power consumption.
The I/Os alternate function configuration can be locked if needed following a specific sequence in order to avoid
spurious writing to the I/Os registers.
3.11
Multi-AHB bus matrix
A 32-bit multi-AHB bus matrix interconnects all the masters (CPU, LPDMA1, LPDMA2) and the slave peripherals
(flash memory, SRAMs, AHB, and APB). It also ensures a seamless and efficient operation even when several
high-speed peripherals work simultaneously.
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STM32C562xx
Functional overview
3.12
Low-power direct memory access controller (LPDMA)
The low-power direct memory access (LPDMA) controller is a bus master and system peripheral. The LPDMA is
used to perform programmable data transfers between memory‑mapped peripherals and/or memories via
linked‑lists, under the control of an off‑loaded CPU.
The LPDMA main features are:
•
•
Single bidirectional AHB master
Memory-mapped data transfers from a source to a destination:
•
–
Peripheral to memory
–
Memory to peripheral
–
Memory to memory
–
Peripheral to peripheral
Transfers arbitration based on a 4-grade programmed priority at the channel level:
–
–
•
•
One high-priority traffic class for time-sensitive channels (queue 3)
Three low-priority traffic classes with a weighted round‑robin allocation for non‑time‑sensitive
channels (queues 0, 1, 2)
Per channel event generation on any of the following events: transfer complete, half transfer complete,
data transfer error, user setting error, link transfer error, completed suspension, and trigger overrun
12 concurrent LPDMA channels (8‑channel LPDMA1, 4‑channel LPDMA2):
–
•
Intrachannel LPDMA transfers chaining via programmable linked‑list into memory, supporting two
execution modes: run‑to‑completion and link step mode
–
Intrachannel and interchannel LPDMA transfers chaining via programmable LPDMA input triggers
connection to LPDMA task completion events
Per linked-list item within a channel:
–
–
•
Separately programmed source and destination transfers
Programmable data handling between source and destination: byte‑based padding or truncation, sign
extension, and left/right realignment
–
Programmable number of data bytes to be transferred from the source, defining the block level
–
Linear source and destination addressing: either fixed or contiguously incremented addressing,
programmed at a block level, between successive single transfers
–
Programmable LPDMA request and trigger selection
–
Programmable LPDMA half-transfer and transfer-complete events generation
–
Pointer to the next linked-list item and its data structure in memory, with automatic update of the
LPDMA linked-list control registers
Debug:
•
–
Channel suspend and resume support
–
Channel status reporting and event flags
Privileged/unprivileged support:
–
–
Support for privileged and unprivileged LPDMA transfers, independently at the channel level
Privileged-aware AHB slave port
Table 2. LPDMA1 channels implementation and usage
Channel x
Hardware parameters
Features
dma_fifo_size[x] dma_addressing[x]
Channel x (x = 0 to 7) is implemented with:
x = 0 to 7
0
0
•
•
DS14927 - Rev 1
no FIFO. Only a single source transfer cell is internally
registered.
fixed/contiguously incremented addressing
page 13/130
STM32C562xx
Functional overview
Table 3. LPDMA2 channels implementation and usage
Hardware parameters
Channel x
dma_fifo_size[
x]
Features
dma_addressi
ng[x]
Channel x (x = 0 to 3) is implemented with:
x = 0 to 3
0
0
•
•
no FIFO. Only a single source transfer cell is internally
registered.
fixed/contiguously incremented addressing
Table 4. LPDMA1 and LPDMA2 autonomous mode and wake-up in low-power modes
Feature
Low-power modes
Wake-up
LPDMA1/2 in Sleep mode
3.13
Interrupts and events
3.13.1
Nested vectored interrupt controller (NVIC)
•
•
•
•
•
81 maskable interrupt channels (not including the 16 Cortex®‑M33 with FPU interrupt lines)
16 programmable priority levels (4 bits of interrupt priority used)
Low-latency exception and interrupt handling
Power management control
Implementation of system control registers
The NVIC and the processor core interface are closely coupled, enabling low‑latency interrupt processing and
efficient processing of late‑arriving interrupts. All interrupts, including the core exceptions, are managed by the
NVIC.
3.13.2
Extended interrupt and event controller (EXTI)
The extended interrupts and event controller (EXTI) manages the individual CPU and system wake‑up through
configurable and direct event inputs. It provides wake‑up requests to the power control and generates an interrupt
request to the CPU NVIC and events to the CPU event input. For the CPU, an additional event generation block
(EVG) is needed to generate the CPU event signal.
The EXTI wake-up requests allow the system to wake up from Stop modes.
The interrupt request and event request generation can also be used in Run modes.
The EXTI also includes the EXTI mux I/O port selection.
The EXTI main features are the following:
•
•
•
•
35 input events are supported.
All event inputs allow the possibility to wake up the system.
Events that do not have an associated wake‑up flag in the peripheral have a flag in the EXTI and generate
an interrupt to the CPU from the EXTI.
Events can be used to generate a CPU wake‑up event.
The asynchronous event inputs are classified into two groups:
DS14927 - Rev 1
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STM32C562xx
Functional overview
•
Configurable events (signals from I/Os or peripherals able to generate a pulse), with the following features:
–
–
–
•
Selectable active trigger edge
Interrupt pending status register bits independent for the rising and falling edge
Individual interrupt and event generation mask, used for conditioning the CPU wake‑up, interrupt, and
event generation
–
Software trigger possibility
–
EXTI I/O port selection
Direct events (interrupt and wake-up sources from peripherals having an associated flag which requires to
be cleared in the peripheral), with the following features:
–
–
–
–
3.14
Fixed rising edge active trigger
No interrupt pending status register bit in the EXTI (the interrupt pending status flag is provided by
the peripheral generating the event)
Individual interrupt and event generation mask, used to condition the CPU wake‑up and event
generation
No software trigger possibility
Cyclic redundancy check calculation unit (CRC)
The cyclic redundancy check calculation unit (CRC) calculation unit is used to get a CRC code from 8‑, 16‑, or
32‑bit data word and a generator polynomial.
Among other applications, CRC‑based techniques are used to verify data transmission or storage integrity. In the
scope of the functional safety standards, they offer a means of verifying the flash memory integrity. The CRC
calculation unit helps compute a signature of the software during runtime, to be compared with a reference
signature generated at link time and stored at a given memory location.
3.15
Analog-to-digital converter (ADC)
The devices embed up to two analog-to-digital converters (ADC).
•
ADC1 and ADC2 are tightly coupled and can operate in dual mode (ADC1 is the master).
Each ADC consists of one 12-bit successive approximation analog-to-digital converter. Each ADC has up to 14
multiplexed channels. A/D conversion of the various channels can be performed in single, continuous, scan, or
discontinuous mode. The result of the ADC is stored in a left‑aligned or right‑aligned (default configuration) 32‑bit
data register.
The ADCs are mapped on the AHB bus to allow fast data handling. The analog watchdog features allow the
application to detect if the input voltage goes outside the user‑defined high or low thresholds.
A built-in hardware oversampler improves analog performance while off‑loading the related computational burden
from the CPU. An efficient low‑power mode is implemented to allow very low consumption at low frequency.
The ADC main features are:
DS14927 - Rev 1
page 15/130
STM32C562xx
Functional overview
•
High-performance features:
–
•
Up to two ADCs which can operate in dual mode
◦
ADC1 is connected to 12 external channels and two internal channels.
◦
ADC2 is connected to 14 external channels.
–
12, 10, 8, or 6-bit configurable resolution
–
ADC conversion time independent from the AHB bus clock frequency
–
Faster conversion time by lowering resolution
–
AHB slave bus interface to allow fast data handling
–
Channel-wise programmable sampling time
–
Flexible sampling time control
–
Fixed latency for a trigger to start of sampling
–
Up to four injected channels (analog inputs assignment to regular or injected channels is fully
configurable)
–
Data alignment with in-built data coherency
–
Data can be managed by DMA for regular channel conversions
–
Four dedicated data registers for the injected channels
Low-power features:
–
–
–
•
Speed adaptive low-power mode to reduce ADC consumption when operating at low frequency
Allows slow bus frequency application while keeping optimum ADC performance
Provides automatic control to avoid ADC overrun in low AHB bus clock frequency application
(autodelayed mode)
Oversampler:
•
–
32-bit data register
–
Oversampling ratio adjustable from 2 to 1024
–
Programmable data right and left shifts
Data preconditioning:
•
–
Gain compensation
–
Offset compensation
Analog input channels:
•
–
–
External analog inputs (per ADC): up to 14 GPIO pads
One channel for the internal reference voltage (VREFINT)
–
One channel for the internal temperature sensor (VSENSE)
Start-of-conversion can be initiated:
–
–
•
•
•
•
DS14927 - Rev 1
By software for both regular and injected conversions
By hardware triggers with configurable polarity (internal timer events or GPIO input events) for both
regular and injected conversions
Conversion modes:
–
Each ADC can convert a single channel or can scan a sequence of channels
–
Single mode converts selected inputs once per trigger
–
Continuous mode converts selected inputs continuously
–
Discontinuous mode
Interrupt generation at ADC ready, the end of sampling, the end of conversion (regular or injected), end of
sequence conversion (regular or injected), analog watchdog 1, 2, or 3, or overrun events
Three analog watchdogs per ADC
ADC input range: VSSA ≤ VIN ≤ VREF+
page 16/130
STM32C562xx
Functional overview
Table 5. ADC features
ADC modes/features
Resolution
3.15.1
ADC1
ADC2
12 bits
Maximum sampling-speed
2.25 Msps
Hardware-offset calibration
X
Single-ended inputs
X
Injected channel conversion
X
Oversampling
up to x1024
Data register
32 bits
DMA support
X
Offset compensation
X
Gain compensation
X
Number of analog watchdogs
3
Analog temperature sensor
The STM32C562xx embed an analog temperature sensor that generates a voltage VSENSE that varies linearly
with temperature. The temperature sensor is internally connected to the ADC input channel that is used to convert
the sensor output voltage into a digital value.
The sensor provides good linearity but it must be calibrated to obtain a good accuracy of the temperature
measurement. As the offset of the temperature sensor varies from chip to chip due to process variation, the
uncalibrated internal temperature sensor is suitable for applications that detect temperature changes only.
To improve the accuracy of the temperature sensor measurement, each device is individually factory‑calibrated by
STMicroelectronics. The temperature sensor factory calibration data are stored by STMicroelectronics in the
system memory area, accessible in read‑only mode.
3.15.2
Internal voltage reference (VREFINT)
The VREFINT provides a stable (bandgap) voltage output for the ADC and the comparator. It is internally
connected to ADC input channel.
The precise voltage of VREFINT is individually measured for each part by STMicroelectronics during production
test and stored in the system memory area. It is accessible in read‑only mode.
3.16
Digital to analog converter (DAC)
The DAC module is a 12‑bit, voltage output digital‑to‑analog converter. The DAC can be configured in 8‑ or 12‑bit
mode and can be used in conjunction with the DMA controller. In 12‑bit mode, the data may be left‑aligned or
right‑aligned.
An input reference pin, VREF+ (shared with others analog peripherals) is available for better resolution.
The DAC_OUT1 pin can be used as general-purpose input/output (GPIO) when the DAC output is disconnected
from the output pad and connected to the on chip peripheral. The DAC output buffer can be optionally enabled to
allow a high drive output current. An individual calibration can be applied DAC output channel. The DAC output
channels support a low-power mode, the sample and hold mode.
DS14927 - Rev 1
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STM32C562xx
Functional overview
The DAC main features are::
•
•
•
•
•
•
•
•
•
•
•
•
3.17
Left or right data alignment in 12-bit mode
Synchronized update capability
Noise-wave and triangular-wave generation
DMA capability for each channel including DMA underrun error detection
Double-data DMA capability to reduce the bus activity
External triggers for conversion
DAC output-channel buffered/unbuffered modes
Buffer offset calibration
DAC output can be disconnected from the DAC_OUTx output pin
DAC output connection to on chip peripherals
Sample and hold mode for low-power operation in Stop mode
Voltage reference input from VREF+ pin
Low-power comparator (COMP)
The device embeds a low-power comparator (COMP). It can be used for a variety of functions including:
•
•
•
Wake-up from low-power mode triggered by an analog signal
Analog signal conditioning
Cycle-by-cycle current control loop when combined with a PWM output from a timer
The COMP main features are:
•
Selectable inverting analog inputs:
–
–
–
3.18
•
•
•
•
•
I/O pins
DAC channel output
Internal reference voltage and three submultiple values (1/4, 1/2, 3/4) provided by the scaler
(buffered voltage divider)
I/O pins selectable as noninverting analog inputs
Programmable hysteresis
Programmable speed/consumption
Mapping of outputs to I/Os
Redirection of outputs to timer inputs for triggering:
•
•
•
–
Capture events
–
OCREF_CLR events (for cycle-by-cycle current control)
–
Break events for fast PWM shutdowns
Blanking of comparator outputs
Interrupt generation capability with wake-up from Sleep and Stop modes (through the EXTI controller)
Direct interrupt output to the CPU
True random number generator (RNG)
The RNG is a true random number generator that provides full entropy outputs to the application as 32‑bit
samples. It is composed of a live entropy source (analog) and an internal conditioning component.
The RNG is a NIST SP 800-90B compliant entropy source that can be used to construct a nondeterministic
random bit generator (NDRBG).
The RNG can be certified NIST SP800-90B. It has also been tested using the German BSI statistical tests of
AIS-31 (T0 to T8).
The RNG main features are the following:
DS14927 - Rev 1
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STM32C562xx
Functional overview
•
•
•
•
•
•
3.19
The RNG delivers 32-bit true random numbers, produced by an analog entropy source conditioned by a
NIST SP800-90B approved conditioning stage.
It can be used as the entropy source to construct a nondeterministic random bit generator (NDRBG).
In the default configuration, it produces four 32-bit random samples every 412 AHB clock cycles if
fAHB < fthreshold (256 RNG clock cycles otherwise).
It embeds startup and NIST SP800-90B approved continuous health tests (repetition count and adaptive
proportion tests), associated with specific error management.
It can be disabled to reduce power consumption, or enabled with an automatic low power mode (default
configuration).
It has an AMBA® AHB slave peripheral, accessible through 32-bit word single accesses only (else an AHB
bus error is generated, and the write accesses are ignored).
AES hardware accelerator (AES)
The AES hardware accelerator (AES) encrypts or decrypts data in compliance with the advanced encryption
standard (AES) defined by NIST.
AES supports ECB, CBC, CTR, GCM, GMAC, and CCM chaining modes for key sizes of 128 or 256 bits.
The peripheral supports DMA single transfers for incoming and outgoing data (two DMA channels are required).
The AES main features are:
•
•
Compliant with NIST FIPS publication 197 “Advanced encryption standard (AES)” (November 2001)
Encryption and decryption with multiple chaining modes:
•
–
Electronic codebook (ECB) mode
–
Cipher block chaining (CBC) mode
–
Counter (CTR) mode
–
Galois counter mode (GCM)
–
Galois message authentication code (GMAC) mode
–
Counter with CBC-MAC (CCM) mode
128-bit data block processing, supporting cipher key lengths of 128‑bit and 256‑bit
–
•
•
•
•
•
•
•
•
51 or 75 clock cycle latency in ECB mode for processing one 128‑bit block with, respectively, 128‑bit
or 256‑bit key
Integrated key scheduler to compute the last round key for ECB/CBC decryption
256-bit write-only registers for storing cryptographic keys (eight 32‑bit registers)
128-bit registers for storing initialization vectors (four 32‑bit registers)
32-bit buffer for data input and output
Automatic data flow control supporting two direct memory access (DMA) channels, one for incoming data,
one for processed data. Only single transfers are supported.
Data-swapping logic to support 1-, 8-, 16-, or 32-bit data
AMBA AHB slave peripheral, accessible through 32-bit word single accesses only. Other access types
generate an AHB error, and other than 32‑bit writes may corrupt the register content.
Software (in CPU mode only, not in DMA mode) can suspend a message if AES needs to process another
message with a higher priority, then resume the original message.
Table 6. AES features
Modes or features(1)
ECB, CBC chaining
X
CTR, CCM, GCM chaining
X
AES 128-bit ECB encryption in cycles
51
DHUK and BHK key selection
-
Resistant to side-channel attacks
-
Shared key between SAES and AES
X
Key sizes in bits
DS14927 - Rev 1
AES
128/256
page 19/130
STM32C562xx
Functional overview
1. X = supported.
3.20
HASH processor (HASH)
The hash processor is a fully compliant implementation of the secure hash algorithm (SHA‑1, SHA‑2 family) and
the HMAC (keyed‑hash message authentication code) algorithm. HMAC is suitable for applications requiring
message authentication.
The hash processor computes FIPS (Federal Information Processing Standards) approved digests of lengths of
160, 224, and 256 bits for messages of any length less than 2 × 64 bits (for SHA‑1, SHA‑224, and SHA‑256).
The HASH main features are:
•
Suitable for data authentication applications, compliant with:
–
•
Federal Information Processing Standards Publication FIPS PUB 180‑4, Secure Hash Standard
(SHA‑1 and SHA‑2 family)
–
Federal Information Processing Standards Publication FIPS PUB 186-4, Digital Signature Standard
(DSS)
–
Internet Engineering Task Force (IETF) Request For Comments RFC 2104, HMAC: Keyed-Hashing
for Message Authentication and Federal Information Processing Standards Publication FIPS PUB
198-1, The Keyed-Hash Message Authentication Code (HMAC)
Fast computation of SHA-1, SHA2-224, SHA2-256:
–
•
•
82 (respectively 66) clock cycles for processing one 512-bit block of data using SHA‑1 (respectively
SHA‑256) algorithm
Support for HMAC mode with all supported algorithms
Corresponding 32-bit words of the digest from consecutive message blocks are added to each other to
form the digest of the whole message.
–
•
•
•
•
•
•
•
Automatic 32-bit word swapping to comply with the internal little‑endian representation of the input
bit‑string
–
Supported word swapping format: bits, bytes, half-words, and 32-bit words
Single 32-bit, write-only, input register associated with an internal input FIFO, corresponding to a 64‑byte
block size (16 × 32 bits)
Automatic padding to complete the input bit string to fit the digest minimum block size
AHB slave peripheral, accessible by 32-bit words only (else an AHB error is generated)
8 × 32-bit words (H0 to H15) for output message digest
Automatic data flow control supporting direct memory access (DMA) using one channel
Support for both single and fixed DMA burst transfers of four words
Interruptible message digest computation, on a per‑block basis
–
–
DS14927 - Rev 1
Reloadable digest registers
Hashing computation suspend/resume mechanism, including DMA
page 20/130
STM32C562xx
Functional overview
3.21
Timers and watchdogs
The devices include two advanced control timers, up to eleven general‑purpose timers, two basic timers, two
low‑power timers, two watchdog timers, and one SysTick timer.
The table below compares the features of the advanced control, general‑purpose and basic timers.
Table 7. Timer feature comparison
Timer type
Timer
Counter
resolution
Counter type
Prescaler factor
DMA request
generation
Capture /
compare
channels
Complementary
outputs
Advanced
control
TIM1,
TIM8
16 bits
Up, down, Up/
down
Any integer between
1 and 65536
Yes
4
4
TIM2,
TIM5
32 bits
Up, down, Up/
down
Yes
4
No
TIM12
16 bits
Up
No
2
No
TIM15
16 bits
Up, down, Up/
down
2
1
1
No
0
No
Generalpurpose
Basic
3.21.1
TIM16,
TIM17
16 bits
Up, down, Up/
down
TIM6,
TIM7
16 bits
Up
Any integer between
1 and 65536
Yes
Any integer between
1 and 65536
Yes
Advanced-control timers (TIM1/TIM8)
The advanced-control timers (TIM1/TIM8) consist of a 16-bit autoreload counter driven by a programmable
prescaler.
They may be used for various purposes, including measuring the pulse lengths of input signals (input capture) or
generating output waveforms (output compare, PWM, complementary PWM with dead-time insertion).
Pulse lengths and waveform periods can be modulated from a few microseconds to several milliseconds using
the timer prescaler and the RCC clock controller prescalers.
TIM1/TIM8 timer features include:
•
•
DS14927 - Rev 1
•
16-bit up, down, up/down autoreload counter
16-bit programmable prescaler allowing dividing (also “on the fly”) the counter clock frequency by any
factor from 1 to 65536
Seven independent channels for:
•
•
•
•
•
–
Input capture (except channels 5, 6, and 7)
–
Output compare
–
PWM generation (edge- and center-aligned mode)
–
One-pulse mode output
Complementary outputs with programmable dead-time
Synchronization circuit to control the timer with external signals and to interconnect several timers together
Repetition counter to update the timer registers only after a given number of cycles of the counter
Two break inputs to put the timer’s output signals in a safe user‑selectable configuration
Interrupt/DMA generation on the following events:
•
•
•
–
Update: counter overflow/underflow, counter initialization (by software or internal/external trigger)
–
Trigger event (counter start, stop, initialization, or count by internal/external trigger)
–
Input capture
–
Output compare
Incremental encoders, quadrature encoders, and hall‑sensors support
Trigger input for external clock or cycle-by-cycle current management
ADC synchronization for jitter-free sampling points
page 21/130
STM32C562xx
Functional overview
3.21.2
General-purpose timers (TIM2/TIM5/TIM12/TIM15/TIM16/TIM17)
The general-purpose timers (TIMx) consist of a 16-bit or 32-bit autoreload counter driven by a programmable
prescaler.
They can be used for various purposes, including measuring the pulse lengths of input signals (input capture) or
generating output waveforms (output compare and PWM).
Pulse lengths and waveform periods can be modulated from a few microseconds to several milliseconds using
the timer prescaler and the RCC clock controller prescalers.
General-purpose TIMx timer features include:
•
•
3.21.3
•
16-bit or 32-bit up, down, up/down autoreload counter
16-bit programmable prescaler used to divide (also “on the fly”) the counter clock frequency by any factor
between 1 and 65535
Up to four independent channels for:
•
•
–
Input capture
–
Output compare
–
PWM generation (edge- and center-aligned modes)
–
One-pulse mode output
Synchronization circuit to control the timer with external signals and to interconnect several timers
Interrupt/DMA generation on the following events:
•
•
•
–
Update: counter overflow/underflow, counter initialization (by software or internal/external trigger)
–
Trigger event (counter start, stop, initialization, or count by internal/external trigger)
–
Input capture
–
Output compare
Supports incremental (quadrature) encoder and hall-sensor circuitry for positioning purposes
Trigger input for external clock or cycle-by-cycle current management
ADC synchronization for jitter-free sampling points
Basic timers (TIM6/TIM7)
The basic timers (TIM6/TIM7) consist of a 16-bit autoreload counter driven by a programmable prescaler.
They can be used as generic timers for time-base generation.
The basic timer can also be used for triggering the digital-to-analog converter. This is done with the trigger output
of the timer.
The timers are completely independent and do not share any resources.
Basic timer (TIM6/TIM7) features include:
•
•
•
•
•
3.21.4
16-bit autoreload upcounter
16-bit programmable prescaler used to divide (also “on the fly”) the counter clock frequency by any factor
between 1 and 65535
Synchronization circuit to trigger the DAC
Interrupt/DMA generation on the update event: counter overflow
ADC synchronization for jitter-free sampling points
Low-power timers (LPTIM1)
The LPTIM is a 16-bit timer that benefits from the ultimate developments in power consumption reduction. Thanks
to its diversity of clock sources, the LPTIM can keep running in all power modes except for Standby mode. Given
its capability to run even with no internal clock source, the LPTIM can be used as a pulse counter, which can be
useful in some applications. The LPTIM capability to wake up the system from low‑power modes makes it suitable
to realize timeout functions with extremely low-power consumption.
DS14927 - Rev 1
page 22/130
STM32C562xx
Functional overview
The low-power timer supports the following features:
•
•
•
16-bit up counter with 16-bit auto reload register
3-bit prescaler with eight possible dividing factors (1, 2, 4, 8, 16, 32, 64, 128)
Selectable clock
–
–
•
•
•
•
•
•
•
•
•
•
Internal clock sources: LSE, LSI, HSI, or APB clock
External clock source over LPTIM input (working with no LP oscillator running, used by pulse counter
application)
16-bit ARR auto reload register
16-bit capture/compare register
Continuous/one-shot mode
Selectable software/hardware input trigger
Programmable digital glitch filter
Configurable output: pulse, PWM
Configurable I/O polarity
Encoder mode
Repetition counter
Up to two independent channels for:
•
•
–
Input capture
–
PWM generation (edge-aligned mode)
–
One-pulse mode output
Interrupt generation on ten events
DMA request generation on the following events:
–
–
3.21.5
Update event
Input capture
Independent watchdog (IWDG)
The independent watchdog (IWDG) peripheral offers a high safety level due to its capability to detect malfunctions
caused by software or hardware failures.
The IWDG is clocked by an independent clock and remains active even if the main clock fails.
Additionally, the watchdog function is performed in the VDD voltage domain, allowing the IWDG to remain
functional even in low‑power modes.
The IWDG main features are:
•
•
•
•
•
12-bit down-counter
Dual voltage domain, thus enabling operation in low-power modes
Independent clock
Early wake-up interrupt generation
Reset generation:
–
–
3.21.6
In case of timeout
In case of refresh outside the expected window
Window watchdog (WWDG)
The system window watchdog (WWDG) is used to detect the occurrence of a software fault, usually generated by
external interference or unforeseen logical conditions, which causes the application program to abandon its
normal sequence.
The watchdog circuit generates a reset on the expiry of a programmed time period unless the program refreshes
the contents of the down-counter before the T6 bit is cleared. A reset is also generated if the 7‑bit down‑counter
value (in the control register) is refreshed before the down-counter reaches the window register value. This
implies that the counter must be refreshed in a limited window.
The WWDG clock is prescaled from the APB clock and has a configurable time window that can be programmed
to detect abnormally late or early application behavior.
The WWDG is best suited for applications requiring the watchdog to react within an accurate timing window.
The WWDG main features are:
DS14927 - Rev 1
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STM32C562xx
Functional overview
•
•
•
3.21.7
Programmable free-running down-counter
Conditional reset:
–
Reset (if watchdog activated) when the down-counter value becomes lower than 0x40
–
Reset (if watchdog activated) if the down-counter is reloaded outside the window
Early wake-up interrupt (EWI): triggered (if enabled and the watchdog activated) when the down‑counter is
equal to 0x40
SysTick timer
The Cortex®-M33 embeds one SysTick timer.
This timer is dedicated to real‑time operating systems, but can also be used as a standard down counter. It
features:
•
•
•
•
3.22
3.22.1
A 24-bit down counter
Auto reload capability
Maskable system interrupt generation when the counter reaches 0
Programmable clock source
Real-time clock (RTC), tamper and backup registers
Real-time clock (RTC)
The real-time clock (RTC) supports the following features:
•
•
•
•
•
•
•
•
•
•
Calendar with subsecond, seconds, minutes, hours (12 or 24 format), weekday, date, month, year, in BCD
(binary‑coded decimal) format
Binary mode with 32-bit free-running counter
Automatic correction for 28, 29 (leap year), 30, and 31 days of the month
Two programmable alarms
On-the-fly correction from 1 to 32767 RTC clock pulses. This can be used to synchronize it with a controller
clock.
Reference clock detection: a more precise second source clock (50 or 60 Hz) can be used to enhance the
calendar precision.
Digital calibration circuit with 0.95 ppm resolution, to compensate for quartz crystal inaccuracy
Timestamp feature that can be used to save the calendar content. This function can be triggered by an
event on the timestamp pin, or by a tamper event.
17-bit auto-reload wake-up timer (WUT) for periodic events with programmable resolution and period
Privilege protection support:
–
Alarm A, alarm B, wake-up timer, and timestamp individual privileged protection
The RTC is functional in all low-power modes when it is clocked by the LSE.
All RTC events (alarm, wake-up timer, timestamp) can generate an interrupt and wake up the device from the
low‑power modes.
3.22.2
Tamper and backup registers (TAMP)
The antitamper detection circuit is used to protect sensitive data from external attacks. Thirty-two 32‑bit backup
registers are retained in all low-power modes. The backup registers, as well as other secrets in the device, are
protected by this antitamper detection circuit with three tamper pins and six internal tampers. The external tamper
pins can be configured for edge detection or level detection with or without filtering.
The TAMP main features are:
DS14927 - Rev 1
page 24/130
STM32C562xx
Functional overview
•
3.23
•
•
A tamper detection can optionally erase the backup registers, SRAM2, ICACHE, and cryptographic
peripherals. The device resources protected by tamper are named “device secrets”.
32 × 32‑bit backup registers
Up to three tamper pins for three external tamper detection events:
•
•
–
Passive tampers: Ultralow-power edge or level detection with internal pull-up hardware management
–
Configurable digital filter
Six internal tamper events to protect against transient attacks
Each tamper can be configured in two modes:
•
•
–
Confirmed mode: immediate erase of secrets on tamper detection, including backup registers erase
–
Potential mode: most of the secrets erase following a tamper detection are launched by software
Any tamper detection can generate an RTC timestamp event
Tamper configuration and backup registers privilege protection
Inter-integrated circuit interface (I2C)
The device embeds two I2C interfaces. Refer to Table 8 for feature implementation.
The I2C bus interface handles communications between the microcontroller and the serial I2C bus. It controls all
I2C bus‑specific sequencing, protocol, arbitration, and timing.
It supports Standard-mode (Sm), Fast-mode (Fm), and Fast-mode Plus (Fm+).
The I2C peripheral is also system management bus (SMBus) and power management bus (PMBus®) compatible.
It can use DMA to reduce the CPU load.
The I²C peripheral supports:
•
I²C-bus specification rev03 compatibility:
•
•
•
–
Controller and target modes
–
Multicontroller capability
–
Standard-mode (up to 100 kHz)
–
Fast-mode (up to 400 kHz)
–
Fast-mode Plus (up to 1 MHz)
–
7-bit and 10-bit addressing mode
–
Multiple 7-bit target addresses (2 addresses, 1 with configurable mask)
–
All 7-bit addresses acknowledge mode
–
General call
–
Programmable setup and hold times
–
Easy-to-use event management
–
Clock stretching (optional)
1-byte buffer with DMA capability
Programmable analog and digital noise filters
SMBus specification rev 3.0 compatibility:
•
•
•
–
Hardware PEC (packet error checking) generation and verification with ACK control
–
Command and data acknowledge control
–
Address resolution protocol (ARP) support
–
Host and device support – SMBus alert
–
Timeouts and idle condition detection
PMBus rev 1.3 standard compatibility
Independent clock
Wake-up from Stop mode on address match
Table 8. I2C implementation
Features(1)
Standard-mode (up to 100 Kbit/s)
DS14927 - Rev 1
I2C1
I2C2
X
X
page 25/130
STM32C562xx
Functional overview
Features(1)
I2C1
I2C2
Fast mode (up to 400 Kbit/s)
X
X
Fast mode plus (Fm+) with 20 mA output drive I/Os (up to 1 Mbit/s)
X
X
Programmable analog and digital noise filters
X
X
SMBus/PMBus hardware support
X
X
Independent clock
X
X
Wake-up capability
X
X
1. X = supported.
3.24
Improved inter-integrated circuit interface (I3C)
The I3C interface handles communication between this device and others, such as sensors and the host
processor, connected on an I3C bus.
An I3C bus is a two-wire, serial single-ended, multidrop bus, intended to improve a legacy I2C bus.
The I3C SDR-only peripheral implements all the features required by the MIPI® I3C specification v1.1. It can
control all I3C bus-specific sequencing, protocol, arbitration, and timing, and can act as a controller (formerly
known as master) or as a target (formerly known as slave). When acting as a controller, the I3C peripheral
improves the features of the I2C interface while preserving some backward compatibility: it allows an I2C target to
operate on an I3C bus in legacy I2C fast mode (Fm) or legacy I2C fast mode plus (Fm+), provided that the latter
does not perform clock stretching. The I3C peripheral can be used with DMA to offload the CPU.
The I3C peripheral supports:
DS14927 - Rev 1
page 26/130
STM32C562xx
Functional overview
•
MIPI® I3C specification v1.1, as:
•
•
•
–
I3C SDR-only primary controller
–
I3C SDR-only secondary controller
–
I3C SDR-only target
I3C SCL bus clock frequency up to 12.5 MHz
Registers configuration from the host application via the APB target port
Queued data transfers:
•
–
Transmit FIFO (TX-FIFO) for data bytes/words to be transmitted on the I3C bus
–
Receive FIFO (RX-FIFO) for received data bytes/words on the I3C bus
–
For each FIFO, optional DMA mode with a dedicated DMA channel
Queued control/status transfers, when controller:
•
–
Control FIFO (C-FIFO) for control words to be sent on the I3C bus
–
Optional status FIFO (S-FIFO) for status words as received on the I3C bus
–
For each FIFO, optional DMA mode with a dedicated DMA channel
Messages:
•
–
Legacy I²C read/write messages to legacy I2C targets in Fm/Fm+
–
I3C SDR read/write private messages
–
I3C SDR broadcast CCC messages
–
I3C SDR read/write direct CCC messages
Frame-level management, when controller:
•
–
Optional C-FIFO and TX-FIFO preload
–
Multiple messages encapsulation
–
Optional arbitrable header generation on the I3C bus
–
HDR exit pattern generation on the I3C bus for error recovery
Programmable bus timing, when controller:
•
–
SCL high and low period
–
SDA hold time
–
Bus free (minimum) time
–
Bus available/idle condition time
–
Clock stall time
Target-initiated requests management:
–
–
•
•
Simultaneous support up to four targets, when controller
In-band interrupts, with programmable IBI payload (up to four bytes), with pending read notification
support
–
Bus control request, with recovery flow support and hand-off delay
–
Hot-join mechanism
HDR exit pattern detection, when target
Bus error management:
•
–
CEx with x = 0, 1, 2, 3 when controller
–
TEx with x = 0, 1, ... , 6 when target
–
Bus control switch error and recovery
–
Target reset
Individual programmable event-based management:
–
–
–
DS14927 - Rev 1
Per-event identification with flag reporting and clear control
Host application notification via flag polling, and/or via interrupt with a per-event programmable
enable
Error type identification
page 27/130
STM32C562xx
Functional overview
•
Wake-up from Stop mode(s), as controller:
•
–
On an in-band interrupt without payload
–
On a hot-join request
–
On a controller-role request
Wake-up from Stop mode(s), as target:
•
–
On a reset pattern
–
On a missed start
Multiclock domain management:
–
–
Separate APB clock and kernel clock, driven from independently programmed clock sources via the
RCC, in addition to SCL clock
Minimum operating frequency for the kernel clock and the APB clock vs. the application-driven SCL
clock
Table 9. I3C peripheral controller/target features versus MIPI® v1.1
Features(1)
I3CSDR message
I2C
MIPI® I3C v1.1
I3C
peripheral when
controller
I3C
peripheral when
target
X
X
X
Mandatory when controller and
the I3C bus is mixed with
(external) legacy I2C target(s).
Optional in MIPI v1.1 when target.
Comments
X
X
-
HDR DDR message
X
-
-
HDR-TSL/TSP, HDR-BT
X
-
-
Dynamic address assignment
X
X
X
-
Static address
X
X
-
No (intended) support of I3C
peripheral as a target on an I2C
bus.
Grouped addressing
X
X
-
Optional in MIPI v1.1
CCCs
X
X
X
Mandatory CCCs and some
optional CCCs are supported.
Error detection and recovery
X
X
X
-
In-band interrupt (with MDB)
X
X
X
-
Secondary controller
X
X
X
-
Hot-join mechanism
X
X
X
-
Target reset
X
X
X
-
Synchronous timing control
X
X
-
Asynchronous timing control 0
X
X
-
Asynchronous timing control 1, 2, 3
X
-
-
Device-to-device tunneling
X
X
-
Multilane data transfer
X
X
-
Monitoring device early termination
X
-
-
Legacy
message (Fm/Fm+)
Optional in MIPI v1.1
Optional in MIPI v1.1
1. X = supported.
DS14927 - Rev 1
page 28/130
STM32C562xx
Functional overview
3.25
Universal synchronous/asynchronous receiver transmitter (USART/UART) and
low-power universal asynchronous receiver transmitter (LPUART)
The devices have four embedded universal synchronous receiver transmitters (USART1/2/3), three universal
asynchronous receiver transmitters (UART4/5), and one low‑power universal asynchronous receiver transmitter
(LPUART1).
Table 10. USART, UART, and LPUART features
Features(1)
USART1/2/3
UART4/5
LPUART1
Hardware flow control for modem
X
X
X
Continuous communication using DMA
X
X
X
Multiprocessor communication
X
X
X
Synchronous mode (controller/target)
X
-
-
Smartcard mode
X
-
-
Single-wire half-duplex communication
X
X
X
IrDA SIR ENDEC block
X
X
-
LIN mode
X
X
-
X(2)
X(2)
X(2)
Receiver timeout interrupt
X
X
X
Modbus communication
X
X
X
Autobaud rate detection
X
X
X
Driver enable
X
X
X
Dual-clock domain and wake-up from Stop mode
USART data length
Tx/Rx FIFO
Tx/Rx FIFO size
7, 8, and 9 bits
X
X
X
8 bytes
1. X = supported.
2. Wake‑up supported from Stop mode.
3.25.1
Universal synchronous/asynchronous receiver transmitter (USART/UART)
The USART offers a flexible means to perform full‑duplex data exchange with external equipment requiring an
industry standard NRZ asynchronous serial data format. A very wide range of baud rates can be achieved
through a fractional baud rate generator.
The USART supports both synchronous one-way and half-duplex single-wire communications, as well as LIN
(local interconnection network), Smartcard protocol, IrDA (infrared data association) SIR ENDEC specifications,
and modem operations (CTS/RTS). Multiprocessor communications are also supported.
High-speed data communications are possible by using the DMA (direct memory access) for multibuffer
configuration.
The USART main features are:
DS14927 - Rev 1
page 29/130
STM32C562xx
Functional overview
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
Full-duplex asynchronous communication
NRZ standard format (mark/space)
Configurable oversampling method by 16 or 8 to achieve the best compromise between speed and clock
tolerance
Baud rate generator systems
Two internal FIFOs for transmit and receive data
Each FIFO can be enabled/disabled by software and come with a status flag.
A common programmable transmit and receive baud rate
Dual-clock domain with dedicated kernel clock for peripherals independent from PCLK
Auto baud rate detection
Programmable data word length (7, 8, or 9 bits)
Programmable data order with MSB-first or LSB-first shifting
Configurable stop bits (one or two stop bits)
Synchronous controller/target mode and clock output/input for synchronous communications
SPI controller transmission underrun error flag
Single-wire half-duplex communications
Continuous communications using DMA
Received/transmitted bytes are buffered in reserved SRAM using centralized DMA
Separate enable bits for transmitter and receiver
Separate signal polarity control for transmission and reception
Swappable Tx/Rx pin configuration
Hardware flow control for modem and RS-485 transceiver
Communication control/error detection flags
Parity control:
•
•
•
•
–
Transmits parity bit
–
Checks parity of received data byte
Interrupt sources with flags
Multiprocessor communications: wake-up from Mute mode by idle line detection or address mark detection
Wake-up from Stop capability
LIN controller synchronous break send capability and LIN target break detection capability
•
•
–
13-bit break generation and 10/11-bit break detection when USART is hardware configured for LIN
IrDA SIR encoder decoder supporting 3/16-bit duration for Normal mode
Smartcard mode
–
•
Supports the T = 0 and T = 1 asynchronous protocols for smartcards as defined in the ISO/
IEC 7816‑3 standard
–
0.5 and 1.5 stop bits for Smartcard operation
Support for Modbus communication
–
–
3.25.2
Timeout feature
CR/LF character recognition
Low-power universal asynchronous receiver transmitter (LPUART)
The LPUART is a UART, which enables bidirectional UART communications with a limited power consumption.
Only a 32.768 kHz LSE clock is required to enable UART communications up to 9600 bauds. Higher baud rates
can be reached when the LPUART is clocked by clock sources different from the LSE clock.
Even when the microcontroller is in low-power mode, the LPUART can wait for an incoming UART frame while
having an extremely low energy consumption. The LPUART includes all necessary hardware support to make
asynchronous serial communications possible with minimum power consumption.
It supports half-duplex single-wire communications and modem operations (CTS/RTS).
It also supports multiprocessor communications. The direct memory access (DMA) can be used for data
transmission/reception.
The LPUART main features are:
DS14927 - Rev 1
page 30/130
STM32C562xx
Functional overview
•
•
•
•
•
•
3.26
•
•
•
•
•
•
•
•
•
•
•
•
Full-duplex asynchronous communications
NRZ standard format (mark/space)
Programmable baud rate
From 300 bauds to 9600 bauds using a 32.768 kHz clock source
Higher baud rates can be achieved by using a higher frequency clock source
Two internal FIFOs to transmit and receive data
Each FIFO can be enabled/disabled by software and come with status flags for FIFOs states.
Dual-clock domain with dedicated kernel clock for peripherals independent from PCLK
Programmable data word length (7 or 8 or 9 bits)
Programmable data order with MSB‑first or LSB‑first shifting
Configurable stop bits (one or two stop bits)
Single-wire half-duplex communications
Continuous communications using DMA
Received/transmitted bytes are buffered in reserved SRAM using centralized DMA
Separate enable bits for transmitter and receiver
Separate signal polarity control for transmission and reception
Swappable Tx/Rx pin configuration
Hardware flow control for modem and RS‑485 transceiver
Transfer detection flags:
•
–
Receive buffer full
–
Transmit buffer empty
–
Busy and end of transmission flags
Parity control:
•
–
Transmits parity bit
–
Checks parity of received data byte
Four error detection flags:
•
•
•
–
Overrun error
–
Noise detection
–
Frame error
–
Parity error
Interrupt sources with flags
Multiprocessor communications: wake-up from Mute mode by idle line detection or address mark detection
Wake-up from Stop mode
Serial peripheral interface (SPI)/Inter-integrated sound interfaces (I2S)
The devices embed three serial peripheral interfaces (SPI) that can be used to communicate with external
devices while using the specific synchronous protocol. The SPI protocol supports half‑duplex, full‑duplex, and
simplex synchronous, serial communication with external devices.
Table 11. SPI features
SPI2S1, SPI2S2, SPI2S3
(full feature set instances)
SPI feature
DS14927 - Rev 1
Data size
Configurable from 4 to 32-bit
CRC computation
CRC polynomial length configurable from 5 to 32‑bit
Size of FIFOs
16 × 8-bit
Number of transferred data
Unlimited, expandable
I2S feature
Yes
page 31/130
STM32C562xx
Functional overview
The serial peripheral interface (SPI) can be used to communicate with external devices while using the specific
synchronous protocol. The SPI protocol supports half-duplex, full-duplex, and simplex synchronous, serial
communication with external devices. The interface can be configured as master or slave and can operate in
multimaster or multislave configurations. The device configured as master provides a communication clock (SCK)
to the slave device. The slave select (SS) and ready (RDY) signals can be applied optionally just to set up
communication with a specific slave and to ensure it handles the data flow properly. The Motorola® data format is
used by default, but some other specific modes are supported as well.
The SPI main features are:
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
Full-duplex synchronous transfers on three lines
Half-duplex synchronous transfer on two lines (with bidirectional data line)
Simplex synchronous transfers on two lines (with unidirectional data line)
From 4-bit up to 32-bit data size selection
Multimaster or multislave mode capability
Dual clock domain, the peripheral kernel clock is independent from the APB bus clock
Baud rate prescaler up to kernel frequency/2 or bypass from RCC in master mode
Protection of configuration and setting
Hardware or software management of SS for both master and slave
Adjustable minimum delays between data and between SS and data flow
Configurable SS signal polarity and timing, MISO × MOSI swap capability
Programmable clock polarity and phase
Programmable data order with MSB-first or LSB-first shifting
Programmable number of data within a transaction to control SS and CRC
Dedicated transmission and reception flags with interrupt capability
SPI Motorola and TI format support
Hardware CRC can verify the integrity of the communication at the end of a transaction by:
–
Adding CRC value in Tx mode
–
Automatic CRC error checking for Rx mode
Error detection with interrupt capability in case of data overrun, CRC error, data underrun, mode fault, and
frame error, depending on the operating mode
Two 8-bit width embedded Rx and Tx FIFOs (FIFO size depends on instance)
Configurable FIFO thresholds (data packing)
Capability to handle data streams by system DMA controller
Configurable behavior at slave underrun condition (support of cascaded circular buffers)
Optional status pin RDY signaling that the slave device is ready to handle the data flow
The I2S main features are:
DS14927 - Rev 1
page 32/130
STM32C562xx
Functional overview
•
•
•
•
•
•
•
•
•
•
Full duplex communication
Simplex communication (only transmitter or receiver)
Master or slave operations
8-bit programmable linear prescaler
Data length can be 16, 24, or 32 bits
Channel length can be 16 or 32 in master, any value in slave
Programmable clock polarity
Error flags signaling for improved reliability: Underrun, overrun, and frame errors
Embedded Rx and Tx FIFOs
Supported I2S protocols:
•
•
•
–
I2S Philips standard
–
MSB-justified standard (left-justified)
–
LSB-justified standard (right-justified)
–
PCM standard (with short and long frame synchronization)
Data ordering programmable (LSB or MSB first)
DMA capability for transmission and reception
Master clock can be output to drive an external audio component:
–
–
3.27
FMCK = 256 × FWS for all I2S modes
FMCK = 128 × FWS for all PCM modes
Controller area network (FDCAN)
The controller area network (CAN) subsystem consists of one CAN module, a shared message RAM memory,
and a configuration block.
The modules (FDCAN) are compliant with ISO 11898-1: 2015 (CAN protocol specification version 2.0 part A, B)
and CAN FD protocol specification version 1.0.
A 0.8-Kbyte message RAM implements filters, receives FIFOs, transmits event FIFOs, and transmits FIFOs.
The FDCAN main features are:
•
•
•
•
•
•
•
•
•
•
•
•
•
3.28
Conform with CAN protocol version 2.0 part A, B, and ISO 11898-1: 2015, -4
CAN FD with maximum 64 data bytes supported
CAN error logging
AUTOSAR and J1939 support
Improved acceptance filtering
Two receive FIFOs of three payloads each (up to 64 bytes per payload)
Separate signaling on reception of high priority messages
Configurable transmit FIFO/queue of three payloads (up to 64 bytes per payload)
Configurable transmit event FIFO
Programmable loop-back test mode
Maskable module interrupts
Two clock domains: APB bus interface and CAN core kernel clock
Power-down support
Universal serial bus full-speed host/device interface (USB)
The USB peripheral implements an interface between a full‑speed USB 2.0 bus and the APB2 bus. USB suspend
and resume are supported, which permits stopping the device clocks for low‑power consumption.
The USB main features are:
DS14927 - Rev 1
page 33/130
STM32C562xx
Functional overview
•
•
•
•
•
•
•
•
•
•
•
•
USB specification version 2.0 full-speed compliant
Supports both host and device modes
Configurable number of endpoints from 1 to 8
Dedicated packet buffer memory (SRAM) of 2048 bytes
Cyclic redundancy check (CRC) generation/checking, non-return-to-zero inverted (NRZI) encoding/
decoding, and bit‑stuffing
Isochronous transfers support
Double-buffered bulk/isochronous endpoint/channel support
USB suspend and resume operations
Frame-locked clock pulse generation
USB 2.0 link power management support (device mode only)
Battery charging specification revision 1.2 support (device mode only)
USB connect/disconnect capability (controllable embedded pull-up resistor on USB_DP line)
3.29
Development support
3.29.1
Serial-wire/JTAG debug port (SWJ-DP)
The Arm® SWJ-DP interface is embedded and is a combined JTAG and serial‑wire debug port that enables either
a serial wire debug or a JTAG probe to be connected to the target.
Debug is performed using two pins only instead of five required by the JTAG (JTAG pins can be reused as GPIO
with alternate function): the JTAG TMS and TCK pins are shared with SWDIO and SWCLK, respectively, and a
specific sequence on the TMS pin is used to switch between JTAG‑DP and SW‑DP.
3.29.2
Embedded Trace Macrocell™
The Arm® Embedded Trace Macrocell™ (ETM) provides a greater visibility of the instruction and data flow inside
the CPU core by streaming compressed data at a very high rate from the devices through a small number of ETM
pins to an external hardware trace port analyzer (TPA) device.
Real-time instruction and data flow activity be recorded and then formatted for display on the host computer that
runs the debugger software. TPA hardware is commercially available from common development tool vendors.
The ETM operates with third party debugger software tools.
DS14927 - Rev 1
page 34/130
STM32C562xx
Pinouts/ballouts, pin description, and alternate functions
4
Pinouts/ballouts, pin description, and alternate functions
4.1
Pinout/ballout schematics
Figure 3. LQFP32 pinout
VSS
PB8-BOOT0
PB7
PB6
PB5
PB4
PB3
PA15
32
31
30
29
28
27
26
25
Package top view
VDD
1
24
PA14
PH0-OSC_IN/PC14
2
23
PA13
PH1-OSC_OUT
3
22
PA12
NRST
4
21
PA11
VREF+
5
20
PA9
PA0
6
19
PA8
PA1
7
18
PB15
PA2
8
17
VDD
11
12
13
14
15
16
PA5
PA6
PA7
PB0
VCAP
VSS
DT74257V2
10
9
PA3
PA4
LQFP32
Figure 4. UFQFPN32 pinout
PB8
PH2-BOOT0
PB7
PB6
PB5
PB4
PB3
PA15
32
31
30
29
28
27
26
25
Package top view
VDD
1
24
PA14
PH0-OSC_IN/PC14
2
23
PA13
PH1-OSC_OUT
3
22
PA12
NRST
4
21
PA11
VREF+
5
20
PA9
PA0
6
19
PA8
PA1
7
18
PB15
PA2
8
17
VDD
Note:
DS14927 - Rev 1
16
VSS
DT74256V2
VCAP
15
PB1
14
PB0
13
PA7
12
PA6
11
PA5
10
PA4
PA3
9
UFQFPN32
There is an exposed die pad on the underside of the UFQFPN package. This backside pad must
be connected and soldered to PCB ground.
page 35/130
STM32C562xx
Pinouts/ballouts, pin description, and alternate functions
Figure 5. LQFP48 pinout
VDD
VSS
PB9
PB8
PH2-BOOT0
PB7
PB6
PB5
PB4
PB3
PA15
PA14
48
47
46
45
44
43
42
41
40
39
38
37
Package top view
PE2
1
36
VDD
PC13
2
35
VSS
PC14-OSC32_IN
3
34
PA13
PC15-OSC32_OUT
4
33
PA12
PH0-OSC_IN
5
32
PA11
PH1-OSC_OUT
6
31
PA10
NRST
7
30
PA9
VREF-
8
29
PA8
VREF+
9
28
PB15
PA0
10
27
PB14
PA1
11
26
PB13
PA2
12
25
PB12
14
15
16
17
18
19
20
21
22
23
24
PA4
PA5
PA6
PA7
PB0
PB1
PB2
PB10
VCAP
VSS
VDD
DT74258V1
13
PA3
LQFP48
Figure 6. UFQFPN48 pinout
VDD
VSS
PB9
PB8
PH2-BOOT0
PB7
PB6
PB5
PB4
PB3
PA15
PA14
48
47
46
45
44
43
42
41
40
39
38
37
Package top view
PE2
1
36
VDD
PC13
2
35
VSS
PC14-OSC32_IN
3
34
PA13
PC15-OSC32_OUT
4
33
PA12
PH0-OSC_IN
5
32
PA11
PH1-OSC_OUT
6
31
PA10
NRST
7
30
PA9
VREF-
8
29
PA8
VREF+
9
28
PB15
PA0
10
27
PB14
PA1
11
26
PB13
PA2
12
25
PB12
24
23
22
21
20
19
18
17
16
15
14
13
UFQFPN48
Note:
DS14927 - Rev 1
DT74259V1
VDD
VSS
VCAP
PB10
PB2
PB1
PB0
PA7
PA6
PA5
PA4
PA3
VSS
There is an exposed die pad on the underside of the UFQFPN package. This backside pad must
be connected and soldered to PCB ground.
page 36/130
STM32C562xx
Pinouts/ballouts, pin description, and alternate functions
Figure 7. LQFP64 pinout
PC11
PC10
PA15
PA14
52
51
50
49
PD2
PC12
PB3
55
53
PB4
56
54
PB6
PB5
57
59
58
PH2-BOOT0
PB7
60
PB9
PB8
61
VSS
63
62
VDD
64
Package top view
PE2
1
48
VDD
PC13
2
47
VSS
PC14-OSC32_IN
3
46
PA13
PC15-OSC32_OUT
4
45
PA12
PH0-OSC_IN
5
44
PA11
PH1-OSC_OUT
6
43
PA10
NRST
7
42
PA9
PC0
8
41
PA8
PC1
9
40
PC9
PC2
10
39
PC8
PC3
11
38
PC7
VREF-
12
37
PC6
VREF+
13
36
PB15
PA0
14
35
PB14
PA1
15
34
PB13
PA2
16
33
PB12
DT74260V1
32
31
VSS
VDD
30
29
PB10
VCAP
28
PB2
27
PB1
25
26
PB0
PC5
24
23
PA7
PC4
22
20
PA4
21
19
VDD
PA5
18
PA6
17
PA3
VSS
LQFP64
Figure 8. LQFP80 pinout
DS14927 - Rev 1
PB9
PB8
PH2-BOOT0
PB7
PB6
PB5
PB4
PB3
PD2
PD1
PD0
PC12
PC11
PC10
PA15
PA14
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
PE2
1
60
VDD
PE3
2
59
VSS
PC13
3
58
PA13
PC14-OSC32_IN
4
57
PA12
PC15-OSC32_OUT
5
56
PA11
VSS
6
55
PA10
PA9
VDD
7
54
PH0-OSC_IN
8
53
PA8
PH1-OSC_OUT
9
52
PC9
NRST
10
PC0
11
LQFP80
51
PC8
50
PC7
35
36
37
38
39
40
PE9
PB10
VCAP
VSS
VDD
34
PE8
PE10
33
PB12
PE7
41
32
20
31
PB13
PA2
PB2
42
PB1
19
30
PB14
PA1
29
43
PB0
18
PC5
PB15
PA0
28
44
27
17
PA7
PD12
PH5
PC4
45
26
16
PA6
PD13
VREF+
25
46
PA5
15
24
PD14
VREF-
PA4
47
23
14
VDD
PD15
PC3
22
PC6
48
21
49
13
PA3
12
VSS
PC1
PC2
DT74261V1
PE1
PE0
77
VSS
79
78
VDD
80
Package top view
page 37/130
STM32C562xx
Pinouts/ballouts, pin description, and alternate functions
Figure 9. LQFP100 pinout
DS14927 - Rev 1
VSS
PE1
PE0
PB9
PB8
PH2-BOOT0
PB7
PB6
PB5
PB4
PB3
PD7
PD6
PD5
PD4
PD3
PD2
PD1
PD0
PC12
PC11
PC10
PA15
PA14
99
98
97
96
95
94
93
92
91
90
89
88
87
86
85
84
83
82
81
80
79
78
77
76
PE2
1
75
VDD
PE3
2
74
VSS
PE4
3
73
PH3
PE5
4
72
PA13
PE6
5
71
PA12
PH15
6
70
PA11
PC13
7
69
PA10
PC14-OSC32_IN
8
68
PA9
PC15-OSC32_OUT
9
67
PA8
VSS
10
66
PC9
VDD
11
65
PC8
PH0-OSC_IN
12
64
PC7
PH1-OSC_OUT
13
63
PC6
NRST
14
62
PD15
PC0
15
61
PD14
PC1
16
60
PD13
PC2
17
59
PD12
PC3
18
58
PD11
PH4
19
57
PD10
VREF-
20
56
PD9
VREF+
21
55
PD8
PH5
22
54
PB15
PA0
23
53
PB14
PA1
24
52
PB13
PA2
25
51
PB12
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
PA3
VSS
VDD
PA4
PA5
PA6
PA7
PC4
PC5
PB0
PB1
PB2
PE7
PE8
PE9
PE10
PE11
PE12
PE13
PE14
PE15
PB10
VCAP
VSS
VDD
LQFP100
DT74262V1
VDD
100
Package top view
page 38/130
DS14927 - Rev 1
4.2
Pin description
Table 12. Legend/abbreviations used in the pinout table
Name
Abbreviation
Pin name
Unless otherwise specified in brackets below the pin name, the pin function during and after reset is the same as the actual pin name.
I
Pin type
I/O
Input-only pin
Input/output pin
S
Supply pin
FT
5 V-tolerant I/O
TT
3.6 V-tolerant I/O
RST
Bidirectional reset pin with embedded weak pull‑up resistor
Options for TT and FT I/Os(1)
I/O structure
Notes
_a
I/O with analog switch function supplied by VDDA
_t
Tamper I/O
_f
I/O fm+ capable
_u
I/O with USB function
Unless otherwise specified by a note, all I/Os are set as floating inputs during and after reset.
Alternate functions
Functions selected through GPIOx_AFR registers
Additional functions Functions directly selected/enabled through peripheral registers
1. The related I/O structures in the table below are a concatenation of various options. Examples: FT, TT_a.
STM32C562xx
page 39/130
Pinouts/ballouts, pin description, and alternate functions
Pin functions
Definition
Pin number
UFQFPN32
LQFP48
UFQFPN48
LQFP64
LQFP80
LQFP100
Pin name
(function after
reset)
LQFP32
DS14927 - Rev 1
Table 13. STM32C562xx pin/ball definition
-
-
1
1
1
1
1
PE2
I/O
FT
-
TRACECLK, LPTIM1_IN2,
SPI3_SCK/I2S3_CK, EVENTOUT
-
-
-
-
-
-
2
2
PE3
I/O
FT
-
TRACED0, TIM15_BKIN,
USART1_RX, EVENTOUT
-
-
-
-
-
-
-
3
PE4
I/O
FT
-
TRACED1, TIM15_CH1N,
SPI3_NSS/I2S3_WS, USART1_TX,
EVENTOUT
-
-
-
-
-
-
-
4
PE5
I/O
FT
-
TRACED2, TIM15_CH1,
SPI3_MISO/I2S3_SDI, USART1_CK,
EVENTOUT
-
WKUP3
Pin type I/O structure Notes
Alternate functions
Additional
functions
-
-
-
-
5
PE6
I/O
FT
-
-
-
-
-
-
-
6
PH15
I/O
FT
-
USART1_RTS, EVENTOUT
-
-
-
2
2
2
3
7
PC13
I/O
FT_t
(1)(2)
FDCAN1_TX, EVENTOUT
TAMP_IN1,
RTC_OUT1/
RTC_TS, WKUP4
2
2
3
3
3
4
8
PC14-OSC32_IN
(OSC32_IN)
I/O
FT
(1)
TIM12_CH1, FDCAN1_RX,
EVENTOUT
OSC32_IN
-
-
4
4
4
5
9
PC15OSC32_OUT
(OSC32_OUT)
I/O
FT
(1)
TIM12_CH2, EVENTOUT
OSC32_OUT
-
-
-
-
-
6
10
VSS
S
-
-
-
-
-
-
-
-
-
7
11
VDD
S
-
-
-
-
2
2
5
5
5
8
12
PH0-OSC_IN
(PH0)
I/O
FT_f
-
I2C1_SDA, EVENTOUT
OSC_IN
3
3
6
6
6
9
13
PH1-OSC_OUT
(PH1)
I/O
FT_f
-
I2C1_SCL, EVENTOUT
OSC_OUT
4
4
7
7
7
10
14
NRST
I/O
RST
-
-
-
-
-
-
-
8
11
15
PC0
I/O
FT_a
-
SPI2_RDY, TIM16_BKIN,
EVENTOUT
ADC1_IN8
STM32C562xx
-
Pinouts/ballouts, pin description, and alternate functions
page 40/130
-
TRACED3, TIM1_BKIN2,
TIM15_CH2, SPI3_MOSI/
I2S3_SDO, USART1_CTS/
USART1_NSS, EVENTOUT
LQFP48
UFQFPN48
LQFP64
LQFP80
LQFP100
-
-
-
-
9
12
16
PC1
I/O
FT_ta
-
TRACED0, SPI2_MOSI/ I2S2_SDO,
EVENTOUT
ADC1_IN9,
ADC2_IN9,
TAMP_IN2,
WKUP6
-
-
-
-
10
13
17
PC2
I/O
FT_a
-
PWR_CSLEEP, TIM17_CH1,
SPI2_MISO/I2S2_SDI, EVENTOUT
ADC1_IN10,
ADC2_IN10
-
-
-
-
11
14
18
PC3
I/O
FT_a
-
PWR_CSTOP, LPUART1_TX,
SPI2_MOSI/I2S2_SDO, EVENTOUT
ADC1_IN11,
ADC2_IN11
-
-
-
-
-
-
19
PH4
I/O
FT_a
-
EVENTOUT
ADC2_IN12
-
-
8
8
12
15
20
VREF-
S
-
-
-
-
5
5
9
9
13
16
21
VREF+
S
-
-
-
-
-
-
-
-
-
17
22
PH5
I/O
FT_a
-
EVENTOUT
ADC2_IN13
-
TIM2_CH1, TIM5_CH1, TIM8_ETR,
TIM15_BKIN, SPI2_RDY, SPI3_RDY,
USART2_CTS/USART2_NSS,
UART4_TX, SPI2_NSS/I2S2_WS,
TIM2_ETR, EVENTOUT
ADC1_IN0,
ADC2_IN0,
COMP1_INP1,
TAMP_IN2,
WKUP1
-
TIM2_CH2, TIM5_CH2, TIM8_BKIN,
TIM15_CH1N, LPTIM1_IN1,
USART2_RTS, UART4_RX,
EVENTOUT
ADC1_IN1,
ADC2_IN1,
TAMP_IN3
-
TIM2_CH3, TIM5_CH3,
LPUART1_RX, TIM15_CH1,
LPTIM1_IN2, USART2_TX,
EVENTOUT
ADC1_IN2,
ADC2_IN2,
TAMP_IN3,
WKUP2
ADC1_IN3,
ADC2_IN3
6
7
8
6
7
8
10
11
12
10
11
12
14
15
16
18
19
20
23
24
25
PA0
PA1
PA2
Pin type I/O structure Notes
I/O
I/O
I/O
FT_ta
FT_ta
FT_ta
Alternate functions
Additional
functions
9
13
13
17
21
26
PA3
I/O
FT_a
-
-
-
-
-
18
22
27
VSS
S
-
-
-
-
-
-
-
-
19
23
28
VDD
S
-
-
-
-
-
TIM5_ETR, SPI3_MOSI/ I2S3_SDO,
SPI1_NSS/I2S1_WS, SPI3_NSS/
I2S3_WS, USART2_CK,
EVENTOUT
ADC1_IN4,
DAC1_OUT1
10
10
14
14
20
24
29
PA4
I/O
TT_a
STM32C562xx
page 41/130
9
TIM2_CH4, TIM5_CH4,
LPUART1_TX, TIM15_CH2,
SPI2_NSS/I2S2_WS, SPI3_MOSI/
I2S3_SDO, USART2_RX,
COMP1_OUT, EVENTOUT
Pinouts/ballouts, pin description, and alternate functions
UFQFPN32
Pin name
(function after
reset)
LQFP32
DS14927 - Rev 1
Pin number
11
12
11
12
15
16
15
16
21
22
25
26
LQFP100
LQFP80
LQFP64
UFQFPN48
LQFP48
UFQFPN32
LQFP32
DS14927 - Rev 1
Pin number
30
31
Pin name
(function after
reset)
PA5
PA6
Alternate functions
Additional
functions
-
TIM2_CH1, TIM1_CH3,
TIM8_CH1N, SPI1_SCK/I2S1_CK,
SPI2_SCK/I2S2_CK, USART1_CTS/
USART1_NSS, TIM2_ETR,
EVENTOUT
ADC1_IN5,
COMP1_INM3
-
TIM1_BKIN, TIM5_CH1, TIM8_BKIN,
SPI1_MISO/ I2S1_SDI,
USART1_TX, LPUART1_RTS,
EVENTOUT
ADC1_IN6
ADC1_IN7
Pin type I/O structure Notes
I/O
I/O
FT_a
FT_a
13
17
17
23
27
32
PA7
I/O
FT_a
-
-
-
-
-
24
28
33
PC4
I/O
FT_a
-
TIM2_CH4, TIM8_BKIN, I2S1_MCK,
USART3_RX, TIM16_CH1,
EVENTOUT
ADC2_IN4,
COMP1_INM1
-
-
-
-
25
29
34
PC5
I/O
FT_a
-
TIM1_CH4N, TIM8_BKIN2,
TIM16_CH1N, COMP1_OUT,
EVENTOUT
ADC2_IN5
14
14
18
18
26
30
35
PB0
I/O
FT_a
-
TIM1_CH2N, TIM5_CH3,
TIM8_CH2N, SPI3_MISO/ I2S3_SDI,
USART2_TX, UART4_CTS,
EVENTOUT
ADC2_IN6,
COMP1_INP2
-
15
19
19
27
31
36
PB1
I/O
FT_a
-
TIM1_CH3N, TIM5_CH4,
TIM8_CH3N, SPI3_SCK/I2S3_CK,
SPI2_NSS/I2S2_WS, USART3_RX,
COMP1_OUT, EVENTOUT
ADC2_IN7,
COMP1_INM2
ADC2_IN8,
COMP1_INP3,
LSCO
-
20
20
28
32
37
PB2
I/O
FT_a
-
-
-
-
-
-
33
38
PE7
I/O
FT
-
TIM1_ETR, EVENTOUT
-
-
-
-
-
-
34
39
PE8
I/O
FT
-
TIM1_CH1N, EVENTOUT
-
-
-
-
-
-
35
40
PE9
I/O
FT
-
TIM1_CH1, EVENTOUT
-
-
-
-
-
-
36
41
PE10
I/O
FT
-
TIM1_CH2N, EVENTOUT
-
-
-
-
-
-
-
42
PE11
I/O
FT
-
TIM1_CH2, SPI1_RDY, EVENTOUT
-
STM32C562xx
page 42/130
-
RTC_OUT2, TIM8_CH4N,
SPI1_RDY, LPTIM1_CH1,
SPI2_SCK/I2S2_CK, SPI3_MOSI/
I2S3_SDO, EVENTOUT
Pinouts/ballouts, pin description, and alternate functions
13
TIM1_CH1N, TIM5_CH2,
TIM8_CH1N, TIM15_CH1,
SPI1_MOSI/I2S1_SDO, SPI2_MISO/
I2S2_SDI, USART1_RX,
LPUART1_CTS, EVENTOUT
LQFP48
UFQFPN48
LQFP64
LQFP80
LQFP100
-
-
-
-
-
43
PE12
I/O
FT
-
TIM1_CH3N, COMP1_OUT,
EVENTOUT
-
-
-
-
-
-
-
44
PE13
I/O
FT
-
TIM1_CH3, EVENTOUT
-
-
-
-
-
-
-
45
PE14
I/O
FT
-
TIM1_CH4, EVENTOUT
-
-
-
-
-
-
-
46
PE15
I/O
FT
-
TIM1_BKIN, TIM1_CH4N,
EVENTOUT
-
-
-
21
21
29
37
47
PB10
I/O
FT_f
-
TIM2_CH3, TIM8_CH1,
LPTIM1_IN1, I2C2_SCL, SPI2_SCK/
I2S2_CK, USART3_TX, EVENTOUT
-
15
16
22
22
30
38
48
VCAP
S
-
-
-
-
16
-
23
23
31
39
49
VSS
S
-
-
-
-
17
17
24
24
32
40
50
VDD
S
-
-
-
-
-
TIM1_BKIN, TIM8_CH3, I2C2_SDA,
SPI2_NSS/I2S2_WS, USART3_CK,
FDCAN1_RX, UART5_RX,
EVENTOUT
-
-
TIM1_CH1N, TIM8_CH2,
LPTIM1_CH1, I2C2_SMBA,
SPI2_SCK/I2S2_CK, USART3_CTS/
USART3_NSS, LPUART1_RX,
FDCAN1_TX, UART5_TX,
EVENTOUT
-
-
TIM1_CH2N, TIM12_CH1,
TIM8_CH2N, USART1_TX,
SPI2_MISO/I2S2_SDI,
USART3_RTS, UART4_RTS,
EVENTOUT
-
-
-
-
-
-
-
-
25
26
27
25
26
27
33
34
35
41
42
43
51
52
53
PB12
PB13
PB14
I/O
I/O
I/O
FT_f
FT
FT
Alternate functions
Additional
functions
page 43/130
18
18
28
28
36
44
54
PB15
I/O
FT
-
RTC_REFIN, TIM1_CH3N,
TIM12_CH2, TIM8_CH3N,
USART1_RX, SPI2_MOSI/
I2S2_SDO, SPI1_MOSI/ I2S1_SDO,
SPI3_MOSI/ I2S3_SDO,
UART4_CTS, UART5_RX,
EVENTOUT
-
-
-
-
-
-
55
PD8
I/O
FT
-
USART3_TX, EVENTOUT
-
-
-
-
-
-
-
56
PD9
I/O
FT
-
USART3_RX, EVENTOUT
-
STM32C562xx
-
Pin type I/O structure Notes
Pinouts/ballouts, pin description, and alternate functions
UFQFPN32
Pin name
(function after
reset)
LQFP32
DS14927 - Rev 1
Pin number
LQFP48
UFQFPN48
LQFP64
LQFP80
LQFP100
-
-
-
-
-
57
PD10
I/O
FT
-
MCO2, LPTIM1_CH2, USART3_CK,
EVENTOUT
-
-
-
-
-
-
-
58
PD11
I/O
FT
-
LPTIM1_IN2, USART3_CTS/
USART3_NSS, UART4_RX,
EVENTOUT
-
-
-
-
-
-
45
59
PD12
I/O
FT
-
LPTIM1_IN1, TIM8_CH1N,
I3C1_SCL, USART3_RTS,
UART4_TX, EVENTOUT
-
-
-
-
-
-
46
60
PD13
I/O
FT
-
LPTIM1_CH1, TIM8_CH2N,
I3C1_SDA, EVENTOUT
-
-
-
-
-
-
47
61
PD14
I/O
FT
-
TIM8_CH3N, EVENTOUT
-
-
-
-
-
-
48
62
PD15
I/O
FT
-
TIM8_CH4N, EVENTOUT
-
-
-
-
-
37
49
63
PC6
I/O
FT
-
TIM5_CH1, TIM8_CH1, I2S2_MCK,
EVENTOUT
-
-
-
-
-
38
50
64
PC7
I/O
FT
-
TIM5_CH2, TIM8_CH2, I2S3_MCK,
EVENTOUT
-
-
-
-
-
39
51
65
PC8
I/O
FT
-
TRACED1, TIM5_CH3, TIM8_CH3,
UART5_RTS, EVENTOUT
-
-
-
-
-
40
52
66
PC9
I/O
FT_f
-
MCO2, TIM5_CH4, TIM8_CH4,
AUDIOCLK, UART5_CTS,
I2C1_SDA, EVENTOUT
-
-
MCO1, TIM1_CH1, I3C1_SDA,
TIM8_BKIN2, TIM15_CH2,
SPI1_RDY, SPI2_MOSI/ I2S2_SDO,
USART1_CK, TIM5_CH4,
I2C1_SCL, TIM2_CH4, EVENTOUT
-
-
-
19
19
29
29
41
53
67
PA8
I/O
FT_f
Alternate functions
Additional
functions
20
20
30
30
42
54
68
PA9
I/O
FT
-
MCO2, TIM1_CH2, I3C1_SCL,
LPUART1_TX, TIM15_CH1N,
SPI2_SCK/I2S2_CK, USART1_TX,
TIM5_ETR, I2C1_SMBA,
TIM8_CH2N, EVENTOUT
-
-
31
31
43
55
69
PA10
I/O
FT
-
TIM1_CH3, LPUART1_RX,
USART1_RX, EVENTOUT
page 44/130
STM32C562xx
-
Pin type I/O structure Notes
Pinouts/ballouts, pin description, and alternate functions
UFQFPN32
Pin name
(function after
reset)
LQFP32
DS14927 - Rev 1
Pin number
21
21
32
32
44
56
LQFP100
LQFP80
LQFP64
UFQFPN48
LQFP48
UFQFPN32
LQFP32
DS14927 - Rev 1
Pin number
70
Pin name
(function after
reset)
PA11
Alternate functions
Additional
functions
-
TIM1_CH4, LPUART1_CTS,
USART2_TX, SPI2_NSS/ I2S2_WS,
UART4_RX, USART1_CTS/
USART1_NSS, I2C2_SCL,
FDCAN1_RX, EVENTOUT
USB_DM
USB_DP
Pin type I/O structure Notes
I/O
FT_fu
22
33
33
45
57
71
PA12
I/O
FT_fu
-
23
23
34
34
46
58
72
PA13 (JTMS/
SWDIO)
I/O
FT
(3)
JTMS/SWDIO, COMP1_OUT,
EVENTOUT
-
-
-
-
-
-
-
73
PH3
I/O
FT
-
EVENTOUT
-
-
-
35
35
47
59
74
VSS
S
-
-
-
-
-
-
36
36
48
60
75
VDD
S
-
-
-
-
24
24
37
37
49
61
76
PA14 (JTCK/
SWCLK)
I/O
FT
(3)
JTCK/SWCLK, EVENTOUT
-
-
25
38
38
50
62
77
PA15(JTDI)
I/O
FT
(3)
-
-
-
-
51
63
78
PC10
I/O
FT
-
TIM8_CH1N, I3C1_SCL, SPI3_SCK/
I2S3_CK, USART3_TX, UART4_TX,
EVENTOUT
-
-
-
-
-
52
64
79
PC11
I/O
FT
-
TIM8_CH2N, I3C1_SDA,
SPI3_MISO/I2S3_SDI, USART3_RX,
UART4_RX, EVENTOUT
-
-
-
-
-
53
65
80
PC12
I/O
FT
-
TRACED3, TIM15_CH1,
TIM8_CH3N, SPI3_MOSI/
I2S3_SDO, USART3_CK,
UART5_TX, EVENTOUT
-
-
-
-
-
-
66
81
PD0
I/O
FT
-
TIM8_CH4N, UART4_RX,
FDCAN1_RX, EVENTOUT
-
STM32C562xx
page 45/130
25
JTDI, TIM2_CH1, TIM1_CH2N,
LPTIM1_ETR, I2C2_SMBA,
SPI1_NSS/I2S1_WS, SPI3_NSS/
I2S3_WS, USART2_CK,
UART4_RTS, USART1_TX,
TIM8_CH4N, TIM2_ETR,
EVENTOUT
Pinouts/ballouts, pin description, and alternate functions
22
TIM1_ETR, LPUART1_RTS,
USART2_RX, SPI2_SCK/I2S2_CK,
UART4_TX, USART1_RTS,
I2C2_SDA, FDCAN1_TX,
EVENTOUT
LQFP48
UFQFPN48
LQFP64
LQFP80
LQFP100
-
-
-
-
67
82
PD1
I/O
FT
-
UART4_TX, FDCAN1_TX,
EVENTOUT
-
-
-
-
-
54
68
83
PD2
I/O
FT
-
TRACED2, TIM15_BKIN,
UART5_RX, EVENTOUT
WKUP7
-
-
-
-
-
-
84
PD3
I/O
FT
-
SPI2_SCK/I2S2_CK, USART2_CTS/
USART2_NSS, EVENTOUT
-
-
-
-
-
-
-
85
PD4
I/O
FT
-
USART2_RTS, EVENTOUT
-
-
-
-
-
-
-
86
PD5
I/O
FT
-
TIM1_CH4N, SPI2_RDY,
USART2_TX, FDCAN1_TX,
EVENTOUT
-
-
-
-
-
-
-
87
PD6
I/O
FT
-
SPI3_MOSI/I2S3_SDO,
USART2_RX, EVENTOUT
-
-
-
-
-
-
-
88
PD7
I/O
FT
-
SPI1_MOSI/I2S1_SDO, SPI3_MISO/
I2S3_SDI, USART2_CK,
EVENTOUT
-
(3)
JTDO/TRACESWO, TIM2_CH2,
TIM5_CH3, I2C2_SDA, SPI1_SCK/
I2S1_CK, SPI3_SCK/I2S3_CK,
LPUART1_TX, I2C2_SCL,
CRS_SYNC, USART3_TX,
TIM8_CH1, UART5_RTS,
EVENTOUT
-
(3)
NJTRST, TIM5_CH1, I3C1_SCL,
LPTIM1_CH2, SPI1_MISO/
I2S1_SDI, SPI3_MISO/I2S3_SDI,
SPI2_NSS/I2S2_WS,
LPUART1_CTS, I2C2_SDA,
TIM16_BKIN, USART3_RX,
TIM8_CH2, UART5_CTS,
EVENTOUT
-
-
TIM17_BKIN, TIM5_CH2,
I3C1_SDA, I2C1_SMBA,
SPI1_MOSI/I2S1_SDO, SPI3_MOSI/
I2S3_SDO, LPUART1_RTS,
FDCAN1_RX, USART3_CK,
TIM8_CH3, UART5_RX, EVENTOUT
-
26
27
28
26
27
28
39
40
41
39
40
41
55
56
57
69
70
71
89
90
91
PB3 (JTDO/
TRACESWO)
PB4 (NJTRST)
PB5
I/O
I/O
I/O
FT_f
FT_f
FT
Alternate functions
Additional
functions
page 46/130
STM32C562xx
-
Pin type I/O structure Notes
Pinouts/ballouts, pin description, and alternate functions
UFQFPN32
Pin name
(function after
reset)
LQFP32
DS14927 - Rev 1
Pin number
29
29
42
42
58
72
LQFP100
LQFP80
LQFP64
UFQFPN48
LQFP48
UFQFPN32
LQFP32
DS14927 - Rev 1
Pin number
92
Pin name
(function after
reset)
PB6
Alternate functions
Additional
functions
-
I3C1_SCL, I2C1_SCL, SPI3_MISO/
I2S3_SDI, USART1_TX,
LPUART1_TX, FDCAN1_TX,
TIM16_CH1N, USART3_CTS/
USART3_NSS, TIM8_CH4,
UART5_TX, EVENTOUT
-
WKUP5
Pin type I/O structure Notes
I/O
FT_f
30
43
43
59
73
93
PB7
I/O
FT_f
-
-
31
44
44
60
74
94
PH2-BOOT0
I/O
FT
-
MCO1, TIM17_CH1N, LPTIM1_IN2,
FDCAN1_RX, EVENTOUT
-
31
-
-
-
-
-
-
PB8-BOOT0
I/O
FT_f
-
TIM17_CH1, I3C1_SCL, I2C1_SCL,
SPI3_NSS/I2S3_WS, UART4_RX,
FDCAN1_RX, EVENTOUT
-
-
32
45
45
61
75
95
PB8
I/O
FT_f
-
TIM17_CH1, I3C1_SCL, I2C1_SCL,
SPI3_NSS/I2S3_WS, UART4_RX,
FDCAN1_RX, EVENTOUT
-
-
-
-
46
46
62
76
96
PB9
I/O
FT
-
I3C1_SDA, I2C1_SDA, SPI2_NSS/
I2S2_WS, SPI3_SCK/I2S3_CK,
UART4_TX, FDCAN1_TX,
EVENTOUT
-
-
-
-
-
77
97
PE0
I/O
FT
-
LPTIM1_ETR, SPI3_RDY,
FDCAN1_RX, EVENTOUT
-
-
-
-
-
-
78
98
PE1
I/O
FT
-
LPTIM1_IN2, FDCAN1_TX,
EVENTOUT
-
32
-
47
47
63
79
99
VSS
S
-
-
-
-
1
1
48
48
64
80
100
VDD
S
-
-
-
-
1. After a RTC domain reset, PC13, PC14, and PC15 operate as GPIOs. Their function depends on the content of the RTC registers that are not reset by the system reset. For details on
how to manage these GPIOs, refer to the backup domain and RTC register descriptions in the product reference manual
3. After reset, this pin is configured as JTAG/SWD alternate functions. The internal pull-up on PA15, PA13, PB4 pins and the internal pull-down on PA14 pin are activated.
page 47/130
STM32C562xx
2. PC13 port toggling might disturbs low speed crystal connected on LSE PC14 and PC15. Refer to product Errata for more details.
Pinouts/ballouts, pin description, and alternate functions
30
TIM17_CH1N, I3C1_SDA,
I2C1_SDA, SPI3_SCK/I2S3_CK,
USART1_RX, LPUART1_RX,
FDCAN1_TX, TIM16_CH1,
USART3_RTS, EVENTOUT
DS14927 - Rev 1
4.3
Alternate functions
Table 14. Alternate functions
AF0
AF3
AF4
AF5
AF6
AF7
AF8
AF9
AF10
AF11
AF12
AF13
AF14
AF15
I3C1/LPTIM1/
SPI1/I2S1/
SPI2/I2S2/
SPI3/
I2S3/SYS
SPI1/I2S1/
SPI2/I2S2/
SPI3/I2S3/
UART4
SPI2/I2S2/
SPI3/I2S3/
USART1/2/3
I2C2/
LPUART1/
TIM5/UART4/5
FDCAN1/
I2C1/2/
SPI2/I2S2
CRS/TIM8/16
USART1/3
-
TIM8
COMP/
TIM2/UART5
SYS
SYS
LPTIM1/
TIM1/2/17
I3C1/
TIM1/5/8/12/15
I3C1/LPTIM1/
LPUART1/
TIM1/5/8
PA0
-
TIM2_CH1
TIM5_CH1
TIM8_ETR
TIM15_BKIN
SPI2_RDY
SPI3_RDY
USART2_CTS/
USART2_NSS
UART4_TX
SPI2_NSS/
I2S2_WS
-
-
-
-
TIM2_ETR
EVENTOUT
PA1
-
TIM2_CH2
TIM5_CH2
TIM8_BKIN
TIM15_CH1N
LPTIM1_IN1
-
USART2_RTS
UART4_RX
-
-
-
-
-
-
EVENTOUT
PA2
-
TIM2_CH3
TIM5_CH3
LPUART1_RX
TIM15_CH1
LPTIM1_IN2
-
USART2_TX
-
-
-
-
-
-
-
EVENTOUT
LPUART1_TX
TIM15_CH2
SPI2_NSS/
I2S2_WS
SPI3_MOSI/
I2S3_SDO
USART2_RX
-
-
-
-
-
-
COMP1_OUT
EVENTOUT
SPI1_NSS/
I2S1_WS
SPI3_NSS/
I2S3_WS
USART2_CK
-
-
-
-
-
-
-
EVENTOUT
PA3
Port A
AF2
I2C1/2/I3C1/
LPTIM1/SPI1/
I2S1/SPI3/
I2S3/
TIM15/
USART1/2
Port
-
TIM2_CH4
TIM5_CH4
PA4
-
-
TIM5_ETR
-
SPI3_MOSI/
I2S3_SDO
PA5
-
TIM2_CH1
TIM1_CH3
TIM8_CH1N
-
SPI1_SCK/
I2S1_CK
SPI2_SCK/
I2S2_CK
USART1_CTS/
USART1_NSS
-
-
-
-
-
-
TIM2_ETR
EVENTOUT
-
USART1_TX
LPUART1_RTS
-
-
-
-
-
-
EVENTOUT
-
TIM1_BKIN
TIM5_CH1
TIM8_BKIN
-
PA7
-
TIM1_CH1N
TIM5_CH2
TIM8_CH1N
TIM15_CH1
SPI1_MOSI/
I2S1_SDO
SPI2_MISO/
I2S2_SDI
USART1_RX
LPUART1_CTS
-
-
-
-
-
-
EVENTOUT
PA8
MCO1
TIM1_CH1
I3C1_SDA
TIM8_BKIN2
TIM15_CH2
SPI1_RDY
SPI2_MOSI/
I2S2_SDO
USART1_CK
TIM5_CH4
I2C1_SCL
-
-
-
-
TIM2_CH4
EVENTOUT
PA9
MCO2
TIM1_CH2
I3C1_SCL
LPUART1_TX
TIM15_CH1N
SPI2_SCK/
I2S2_CK
-
USART1_TX
TIM5_ETR
I2C1_SMBA
-
-
-
TIM8_CH2N
-
EVENTOUT
PA10
-
TIM1_CH3
-
LPUART1_RX
-
-
-
USART1_RX
-
-
-
-
-
-
-
EVENTOUT
UART4_RX
USART1_CTS/
USART1_NSS
I2C2_SCL
FDCAN1_RX
-
-
-
-
-
EVENTOUT
PA11
-
TIM1_CH4
-
LPUART1_CTS
USART2_TX
SPI2_NSS/
I2S2_WS
PA12
-
TIM1_ETR
-
LPUART1_RTS
USART2_RX
SPI2_SCK/
I2S2_CK
UART4_TX
USART1_RTS
I2C2_SDA
FDCAN1_TX
-
-
-
-
-
EVENTOUT
PA13
JTMS/SWDIO
-
-
-
-
-
-
-
-
-
-
-
-
-
COMP1_OUT
EVENTOUT
PA14
JTCK/SWCLK
-
-
-
-
-
-
-
-
-
-
-
-
-
-
EVENTOUT
I2C2_SMBA
SPI1_NSS/
I2S1_WS
SPI3_NSS/
I2S3_WS
USART2_CK
UART4_RTS
-
-
USART1_TX
-
TIM8_CH4N
TIM2_ETR
EVENTOUT
-
USART2_TX
UART4_CTS
-
-
-
-
-
-
EVENTOUT
JTDI
TIM2_CH1
TIM1_CH2N
LPTIM1_ETR
PB0
-
TIM1_CH2N
TIM5_CH3
TIM8_CH2N
-
SPI3_MISO/
I2S3_SDI
PB1
-
TIM1_CH3N
TIM5_CH4
TIM8_CH3N
SPI3_SCK/
I2S3_CK
SPI2_NSS/
I2S2_WS
-
USART3_RX
-
-
-
-
-
-
COMP1_OUT
EVENTOUT
SPI3_MOSI/
I2S3_SDO
-
-
-
-
-
-
-
EVENTOUT
RTC_OUT2
-
-
TIM8_CH4N
SPI1_RDY
LPTIM1_CH1
PB3
JTDO/
TRACESWO
TIM2_CH2
-
TIM5_CH3
I2C2_SDA
SPI1_SCK/
I2S1_CK
SPI3_SCK/
I2S3_CK
-
LPUART1_TX
I2C2_SCL
CRS_SYNC
USART3_TX
-
TIM8_CH1
UART5_RTS
EVENTOUT
SPI3_MISO/
I2S3_SDI
SPI2_NSS/
I2S2_WS
LPUART1_CTS
I2C2_SDA
TIM16_BKIN
USART3_RX
-
TIM8_CH2
UART5_CTS
EVENTOUT
page 48/130
PB4
NJTRST
-
TIM5_CH1
I3C1_SCL
LPTIM1_CH2
SPI1_MISO/
I2S1_SDI
PB5
-
TIM17_BKIN
TIM5_CH2
I3C1_SDA
I2C1_SMBA
SPI1_MOSI/
I2S1_SDO
-
SPI3_MOSI/
I2S3_SDO
LPUART1_RTS
FDCAN1_RX
-
USART3_CK
-
TIM8_CH3
UART5_RX
EVENTOUT
PB6
-
-
-
I3C1_SCL
I2C1_SCL
-
SPI3_MISO/
I2S3_SDI
USART1_TX
LPUART1_TX
FDCAN1_TX
TIM16_CH1N
USART3_CTS/
USART3_NSS
-
TIM8_CH4
UART5_TX
EVENTOUT
PB7
-
TIM17_CH1N
-
I3C1_SDA
I2C1_SDA
-
SPI3_SCK/
I2S3_CK
USART1_RX
LPUART1_RX
FDCAN1_TX
TIM16_CH1
USART3_RTS
-
-
-
EVENTOUT
STM32C562xx
PB2
SPI2_SCK/
I2S2_CK
Pinouts/ballouts, pin description, and alternate functions
PA6
SPI1_MISO/
I2S1_SDI
PA15
Port B
AF1
DS14927 - Rev 1
AF0
Port B
AF3
AF4
AF5
AF6
AF7
AF8
AF9
AF10
AF11
AF12
AF13
AF14
AF15
I3C1/LPTIM1/
SPI1/I2S1/
SPI2/I2S2/
SPI3/
I2S3/SYS
SPI1/I2S1/
SPI2/I2S2/
SPI3/I2S3/
UART4
SPI2/I2S2/
SPI3/I2S3/
USART1/2/3
I2C2/
LPUART1/
TIM5/UART4/5
FDCAN1/
I2C1/2/
SPI2/I2S2
CRS/TIM8/16
USART1/3
-
TIM8
COMP/
TIM2/UART5
SYS
SYS
LPTIM1/
TIM1/2/17
I3C1/
TIM1/5/8/12/15
I3C1/LPTIM1/
LPUART1/
TIM1/5/8
PB8
-
TIM17_CH1
-
I3C1_SCL
I2C1_SCL
-
SPI3_NSS/
I2S3_WS
-
UART4_RX
FDCAN1_RX
-
-
-
-
-
EVENTOUT
PB9
-
-
-
I3C1_SDA
I2C1_SDA
SPI2_NSS/
I2S2_WS
SPI3_SCK/
I2S3_CK
-
UART4_TX
FDCAN1_TX
-
-
-
-
-
EVENTOUT
-
USART3_TX
-
-
-
-
-
-
-
EVENTOUT
PB10
-
TIM2_CH3
TIM8_CH1
LPTIM1_IN1
I2C2_SCL
SPI2_SCK/
I2S2_CK
PB12
-
TIM1_BKIN
TIM8_CH3
-
I2C2_SDA
SPI2_NSS/
I2S2_WS
-
USART3_CK
-
FDCAN1_RX
-
-
-
-
UART5_RX
EVENTOUT
PB13
-
TIM1_CH1N
TIM8_CH2
LPTIM1_CH1
I2C2_SMBA
SPI2_SCK/
I2S2_CK
-
USART3_CTS/
USART3_NSS
LPUART1_RX
FDCAN1_TX
-
-
-
-
UART5_TX
EVENTOUT
PB14
-
TIM1_CH2N
TIM12_CH1
TIM8_CH2N
USART1_TX
SPI2_MISO/
I2S2_SDI
-
USART3_RTS
UART4_RTS
-
-
-
-
-
-
EVENTOUT
PB15
RTC_REFIN
TIM1_CH3N
TIM12_CH2
TIM8_CH3N
USART1_RX
SPI2_MOSI/
I2S2_SDO
SPI1_MOSI/
I2S1_SDO
SPI3_MOSI/
I2S3_SDO
UART4_CTS
-
-
-
-
-
UART5_RX
EVENTOUT
PC0
-
-
-
-
-
-
-
SPI2_RDY
-
-
TIM16_BKIN
-
-
-
-
EVENTOUT
PC1
TRACED0
-
-
-
-
SPI2_MOSI/
I2S2_SDO
-
-
-
-
-
-
-
-
-
EVENTOUT
PC2
PWR_CSLEEP
TIM17_CH1
-
-
-
SPI2_MISO/
I2S2_SDI
-
-
-
-
-
-
-
-
-
EVENTOUT
LPUART1_TX
-
SPI2_MOSI/
I2S2_SDO
-
-
-
-
-
-
-
-
-
EVENTOUT
PC3
PWR_CSTOP
-
-
PC4
PC5
-
TIM2_CH4
-
TIM8_BKIN
-
I2S1_MCK
-
USART3_RX
-
-
TIM16_CH1
-
-
-
-
EVENTOUT
-
TIM1_CH4N
-
TIM8_BKIN2
-
-
-
-
-
-
TIM16_CH1N
-
-
-
COMP1_OUT
EVENTOUT
PC6
-
-
TIM5_CH1
TIM8_CH1
-
I2S2_MCK
-
-
-
-
-
-
-
-
-
EVENTOUT
PC7
-
-
TIM5_CH2
TIM8_CH2
-
-
I2S3_MCK
-
-
-
-
-
-
-
-
EVENTOUT
PC8
TRACED1
-
TIM5_CH3
TIM8_CH3
-
-
-
-
UART5_RTS
-
-
-
-
-
-
EVENTOUT
PC9
MCO2
-
TIM5_CH4
TIM8_CH4
-
AUDIOCLK
-
-
UART5_CTS
I2C1_SDA
-
-
-
-
-
EVENTOUT
-
SPI3_SCK/
I2S3_CK
USART3_TX
UART4_TX
-
-
-
-
-
-
EVENTOUT
USART3_RX
UART4_RX
-
-
-
-
-
-
EVENTOUT
PC10
-
-
-
TIM8_CH1N
I3C1_SCL
-
-
-
TIM8_CH2N
I3C1_SDA
-
PC12
TRACED3
-
TIM15_CH1
TIM8_CH3N
-
-
SPI3_MOSI/
I2S3_SDO
USART3_CK
UART5_TX
-
-
-
-
-
-
EVENTOUT
PC13
-
-
-
-
-
-
-
-
-
FDCAN1_TX
-
-
-
-
-
EVENTOUT
PC14
-
-
TIM12_CH1
-
-
-
-
-
-
FDCAN1_RX
-
-
-
-
-
EVENTOUT
PC15
-
-
TIM12_CH2
-
-
-
-
-
-
-
-
-
-
-
-
EVENTOUT
PD0
-
-
-
TIM8_CH4N
-
-
-
-
UART4_RX
FDCAN1_RX
-
-
-
-
-
EVENTOUT
PD1
-
-
-
-
-
-
-
-
UART4_TX
FDCAN1_TX
-
-
-
-
-
EVENTOUT
PD2
TRACED2
-
-
-
TIM15_BKIN
-
-
-
UART5_RX
-
-
-
-
-
-
EVENTOUT
SPI2_SCK/
I2S2_CK
-
USART2_CTS/
USART2_NSS
-
-
-
-
-
-
-
EVENTOUT
page 49/130
PD3
-
PD4
PD5
PD6
-
-
-
-
-
-
-
-
-
-
-
USART2_RTS
-
-
-
-
-
-
-
EVENTOUT
-
TIM1_CH4N
-
-
-
SPI2_RDY
-
USART2_TX
-
FDCAN1_TX
-
-
-
-
-
EVENTOUT
-
SPI3_MOSI/
I2S3_SDO
-
USART2_RX
-
-
-
-
-
-
-
EVENTOUT
-
-
-
-
STM32C562xx
PC11
SPI3_MISO/
I2S3_SDI
Pinouts/ballouts, pin description, and alternate functions
Port C
AF2
I2C1/2/I3C1/
LPTIM1/SPI1/
I2S1/SPI3/
I2S3/
TIM15/
USART1/2
Port
Port D
AF1
DS14927 - Rev 1
AF0
Port D
AF3
AF4
AF5
AF6
AF7
AF8
AF9
AF10
AF11
AF12
AF13
AF14
AF15
I3C1/LPTIM1/
SPI1/I2S1/
SPI2/I2S2/
SPI3/
I2S3/SYS
SPI1/I2S1/
SPI2/I2S2/
SPI3/I2S3/
UART4
SPI2/I2S2/
SPI3/I2S3/
USART1/2/3
I2C2/
LPUART1/
TIM5/UART4/5
FDCAN1/
I2C1/2/
SPI2/I2S2
CRS/TIM8/16
USART1/3
-
TIM8
COMP/
TIM2/UART5
SYS
USART2_CK
-
-
-
-
-
-
-
EVENTOUT
SYS
LPTIM1/
TIM1/2/17
I3C1/
TIM1/5/8/12/15
I3C1/LPTIM1/
LPUART1/
TIM1/5/8
PD7
-
-
-
-
-
SPI1_MOSI/
I2S1_SDO
SPI3_MISO/
I2S3_SDI
PD8
-
-
-
-
-
-
-
USART3_TX
-
-
-
-
-
-
-
EVENTOUT
PD9
-
-
-
-
-
-
-
USART3_RX
-
-
-
-
-
-
-
EVENTOUT
PD10
MCO2
LPTIM1_CH2
-
-
-
-
-
USART3_CK
-
-
-
-
-
-
-
EVENTOUT
PD11
-
LPTIM1_IN2
-
-
-
-
-
USART3_CTS/
USART3_NSS
UART4_RX
-
-
-
-
-
-
EVENTOUT
PD12
-
LPTIM1_IN1
-
TIM8_CH1N
-
I3C1_SCL
-
USART3_RTS
UART4_TX
-
-
-
-
-
-
EVENTOUT
PD13
-
LPTIM1_CH1
-
TIM8_CH2N
-
I3C1_SDA
-
-
-
-
-
-
-
-
-
EVENTOUT
PD14
-
-
-
TIM8_CH3N
-
-
-
-
-
-
-
-
-
-
-
EVENTOUT
PD15
-
-
-
TIM8_CH4N
-
-
-
-
-
-
-
-
-
-
-
EVENTOUT
PE0
-
LPTIM1_ETR
-
-
-
-
SPI3_RDY
-
-
FDCAN1_RX
-
-
-
-
-
EVENTOUT
PE1
-
LPTIM1_IN2
-
-
-
-
-
-
-
FDCAN1_TX
-
-
-
-
-
EVENTOUT
SPI3_SCK/
I2S3_CK
-
-
-
-
-
-
-
-
-
EVENTOUT
PE2
TRACECLK
LPTIM1_IN2
-
-
-
PE3
TRACED0
-
-
-
TIM15_BKIN
-
-
USART1_RX
-
-
-
-
-
-
-
EVENTOUT
TIM15_CH1N
SPI3_NSS/
I2S3_WS
-
USART1_TX
-
-
-
-
-
-
-
EVENTOUT
-
USART1_CK
-
-
-
-
-
-
-
EVENTOUT
PE4
Port E
AF2
I2C1/2/I3C1/
LPTIM1/SPI1/
I2S1/SPI3/
I2S3/
TIM15/
USART1/2
Port
TRACED1
-
-
-
TRACED2
-
-
-
TIM15_CH1
PE6
TRACED3
TIM1_BKIN2
-
-
TIM15_CH2
SPI3_MOSI/
I2S3_SDO
-
USART1_CTS/
USART1_NSS
-
-
-
-
-
-
-
EVENTOUT
PE7
-
TIM1_ETR
-
-
-
-
-
-
-
-
-
-
-
-
-
EVENTOUT
PE8
-
TIM1_CH1N
-
-
-
-
-
-
-
-
-
-
-
-
-
EVENTOUT
PE9
-
TIM1_CH1
-
-
-
-
-
-
-
-
-
-
-
-
-
EVENTOUT
PE10
-
TIM1_CH2N
-
-
-
-
-
-
-
-
-
-
-
-
-
EVENTOUT
PE11
-
TIM1_CH2
-
-
SPI1_RDY
-
-
-
-
-
-
-
-
-
-
EVENTOUT
PE12
-
TIM1_CH3N
-
-
-
-
-
-
-
-
-
-
-
-
COMP1_OUT
EVENTOUT
PE13
-
TIM1_CH3
-
-
-
-
-
-
-
-
-
-
-
-
-
EVENTOUT
PE14
-
TIM1_CH4
-
-
-
-
-
-
-
-
-
-
-
-
-
EVENTOUT
PE15
-
TIM1_BKIN
-
TIM1_CH4N
-
-
-
-
-
-
-
-
-
-
-
EVENTOUT
PH0
-
-
-
-
I2C1_SDA
-
-
-
-
-
-
-
-
-
-
EVENTOUT
PH1
-
-
-
-
I2C1_SCL
-
-
-
-
-
-
-
-
-
-
EVENTOUT
PH2
MCO1
TIM17_CH1N
-
LPTIM1_IN2
-
-
-
-
-
FDCAN1_RX
-
-
-
-
-
EVENTOUT
PH3
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
EVENTOUT
PH4
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
EVENTOUT
PH5
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
EVENTOUT
PH15
-
-
-
-
-
-
-
USART1_RTS
-
-
-
-
-
-
-
EVENTOUT
page 50/130
STM32C562xx
PE5
SPI3_MISO/
I2S3_SDI
Pinouts/ballouts, pin description, and alternate functions
Port H
AF1
STM32C562xx
Electrical characteristics
5
Electrical characteristics
5.1
Parameter conditions
Unless otherwise specified, all voltages are referenced to VSS.
5.1.1
Minimum and maximum values
Unless otherwise specified the minimum and maximum values are guaranteed in the worst conditions of junction
temperature, supply voltage and frequencies by tests in production on 100 % of the devices with an junction
temperature at TJ = 25 °C and TJ = TJmax (given by the selected temperature range).
Data based on characterization results, design simulation and/or technology characteristics are indicated in the
table footnotes. Based on characterization, the minimum and maximum values refer to sample tests and
represent the mean value plus or minus three times the standard deviation (mean ± 3σ).
5.1.2
Typical values
Unless otherwise specified, typical data are based on TJ = 25 °C, VDD = 3.3 V (for the 2.7 V ≤ VDD ≤ 3.6 V voltage
range). They are given only as design guidelines and are not tested.
Typical ADC accuracy values are determined by characterization of a batch of samples from a standard diffusion
lot over the full temperature range, where 95% of the devices have an error less than or equal to the value
indicated (mean ± 2σ).
5.1.3
Typical curves
Unless otherwise specified, all typical curves are given only as design guidelines and are not tested.
5.1.4
Loading capacitor
The loading conditions used for pin parameter measurement are shown in Figure 10.
5.1.5
Pin input voltage
The input voltage measurement on a pin of the device is described in Figure 11.
Figure 10. Pin loading conditions
Figure 11. Pin input voltage
Device pin
Device pin
VIN
DS14927 - Rev 1
DT47494V1
DT47493V1
C = 50 pF
page 51/130
STM32C562xx
Electrical characteristics
5.1.6
Power supply scheme
Each power supply pair must be decoupled with filtering ceramic capacitors as shown in the following figures.
These capacitors must be placed as close as possible to, or below, the appropriate pins on the underside of the
PCB to ensure the proper functionality of the device.
Figure 12. STM32C562xx power supply scheme
Backup circuitry
(LSE, RTC, TAMP
backup registers)
VCAP
2.2 µF
VDD
VCORE
n x VDD
LDO
regulator
OUT
GPIOs
4.7 μF + n x 100 nF
IN
VREF
100 nF
I/O
logic
Kernel logic
(CPU, digital
and
memories)
VDDA
VREF+
VREF-
ADCs/
DAC/
COMP
VSSA
DT76076V2
n x VSS
Level shifter
VDDIO1
VCORE
The external capacitor on VCAP pin requires the following characteristics:
•
•
•
DS14927 - Rev 1
COUT = 2.2 μF
COUT ESR < 20 mΩ at 3 MHz
COUT rated voltage ≥ 10 V
page 52/130
STM32C562xx
Electrical characteristics
5.2
Absolute maximum ratings
Stresses above the absolute maximum ratings listed in Table 15, Table 16, and Table 17 may damage
permanently the device. These are stress ratings only and the functional operation of the device at these
conditions is not implied. Exposure to maximum rating conditions for extended periods may affect device
reliability. Device mission profile (application conditions) is compliant with JEDEC JESD47 qualification standard.
Extended mission profiles are available on demand.
Table 15. Voltage characteristics
All main power (VDD) and ground (VSS) pins must always be connected to the external power supply, in the permitted range.
The I/O structure options listed in this table can be a concatenation of options including the option explicitly listed. For instance, TT_a refers to
any TT I/O with _a option. TT_xx refers to any TT I/O and FT_xx refers to any FT I/O.
Symbols
VDDX - VSS
VIN(1)
VREF+-VDDA
|∆VDDX|
|VSSx-VSS|
Ratings
Min
Max
Unit
−0.3
4.0
V
Input voltage on FT_xxx pins
VSS−0.3
MIN (VDD + 4.0V , 6.0 V)(2)
V
Input voltage on TT_xx pins
VSS−0.3
4.0
V
Allowed voltage difference for VREF+ > VDDA
-
0.4
V
Variations between different VDDX power pins of the same domain
-
50.0
mV
Variations between all the different ground pins
-
50.0
mV
External main supply voltage (including VDD, VDDA and VREF+)
1. VIN maximum must always be respected. Refer to Table 16 for the maximum allowed injected current values.
2. When the analog option is selected by enabling analog peripheral or the pull-up/pull-down resistors are enabled on a given pin, VIN must not
exceed 4 V.
Table 16. Current characteristics
Symbol
Ratings
Max
∑IVDD
Total current into sum of all VDD power lines
(source)(1)
200
∑IVSS
Total current out of sum of all VSS ground lines (sink)(1)
200
IVDD
Maximum current into each VDD power pin (source)(1)
100
IVSS
(sink)(1)
100
IIO
∑I(PIN)
IINJ(PIN)(3)(4)
∑IINJ(PIN)
Maximum current out of each VSS ground pin
Output current sunk by any I/O and control pin
20
Output current sourced by any I/O and control pin
20
Total output current sunk by sum of all I/Os and control pins(2)
140
Total output current sourced by sum of all I/Os and control pins(2)
140
Injected current on FT_xx, TT_xx, RST pins
-5/0
Total injected current (sum of all I/Os and control pins)(5)
±25
Unit
mA
1. All main power (VDD) and ground (VSS) pins must always be connected to the external power supplies, in the permitted range.
2. This current consumption must be correctly distributed over all I/Os and control pins. The total output current must not be sunk/sourced
between two consecutive power supply pins, referring to high pin count QFP packages.
3. A negative injection is induced by VIN < VSS. IINJ(PIN) must never be exceeded. Refer also to Table 15 for the minimum allowed input voltage
values.
4. Positive injection (when VIN > VDDIOx) is not possible on these I/Os and does not occur for input voltages lower than the specified maximum
value.
5. When several inputs are submitted to a current injection, the maximum ∑IINJ(PIN) is the absolute sum of the negative injected currents
(instantaneous values).
DS14927 - Rev 1
page 53/130
STM32C562xx
Electrical characteristics
Table 17. Thermal characteristics
Symbol
TSTG
Ratings
Value
Storage temperature range
TJ
Unit
-65 to +150
Maximum junction temperature
°C
150
5.3
Operating conditions
5.3.1
General operating conditions
Table 18. General operating conditions
Symbol
Parameter
Operating
conditions
Min
Typ
Max
VDD/VDDA
Standard operating voltage
-
2.7(1)
-
3.6
I/O Input voltage
All I/O except
TT_xx
VSS−0.3
-
MIN (VDD + 3.6V ,
5.5 V)(2)
TT_xx I/O
VSS−0.3
-
VDD + 0.3
RUN, SLEEP,
STOP0 Modes
1.15
1.20
1.26
STOP1 Mode
0.9
0.95
1.0
VIN
VCAP
Internal regulator ON
fHCLK
AHB clock frequency
-
-
-
144
fPCLK
APB clock frequency
-
-
-
144
PD
Power dissipation at TA = 85 °C for
suffix 6(3)
Power dissipation at TA = 125 °C for
suffix 3(3)
V
MHz
See Section 6.9: Package thermal characteristics for application
appropriate thermal resistance and package. Power dissipation
is then calculated according ambient temperature (TA) and
maximum junction temperature (TJ) and selected thermal
resistance.
Ambient temperature for suffix 3
version
-
-40
-
125
Ambient temperature for suffix 6
version
-
-40
-
85
Junction temperature range for suffix 3
version
-
-40
-
140
Junction temperature range for suffix 6
version.
-
-40
-
105
TA
TJ
-
Unit
mW
°C
°C
1. When RESET is released, the functionality is guaranteed down to PDR minimum voltage.
2. For operation with voltage higher than VDD + 0.3 V, the internal pull‑up and pull‑down resistors must be disabled. The minimum and
maximum input voltage (Vin) must comply with the selected peripheral enabled on the given GPIOs. Refer to the respective peripheral
characteristics for details.
3. If TA is lower, higher PD values are allowed as long as TJ does not exceed TJmax (see Section 6.9: Package thermal characteristics).
DS14927 - Rev 1
page 54/130
STM32C562xx
Electrical characteristics
5.3.2
Operating conditions at power-up/power-down
The parameters given in the table below are derived from tests performed under the ambient temperature
condition summarized in Table 18.
Table 19. Operating conditions at power-up/power-down
Symbol
tVDD
5.3.3
Parameter
Min
Max
Unit
VDD rise‑time rate
0
∞
µs/V
VDD fall‑time rate
0
∞
ms/V
Embedded reset and power control block characteristics
The parameters given in the table below are derived from tests performed under the ambient temperature
conditions summarized in Table 18.
Table 20. Embedded reset and power control block characteristics
The values in this table are evaluated by characterization - Not tested in production, unless otherwise specified.
Symbol
Parameter
tRSTTEMPO(1)(2)
VPOR/PDR
Reset temporization after POR released
Power-on/power-down reset threshold (BORH_EN =0)
Conditions
Min
Typ
Max
Unit
VDD rising
-
-
463
µs
Rising edge
2.56
2.61
2.64
Falling edge
2.53
2.58
2.61
Rising edge
3.00
3.04
3.08
Falling edge
2.89
2.93
2.96
VPVD
Programmable Voltage Detector threshold
Vhyst_POR_PDR
Hysteresis for power-on/power-down reset
-
-
30
-
Vhyst_PVD
Hysteresis voltage of PVD
-
-
110
-
IDD_PVD(2)
PVD consumption from VDD
-
-
-
0.63
V
mV
µA
1. Specified by design - Not tested in production.
2. From POR threshold crossing to NRST pull-up resistor activation.
5.3.4
Inrush current and inrush electric charge characteristics
The parameters provided in the following table are specified by design simulation and are not tested in
production.
Table 21. Embedded internal voltage reference
The typical values are provided for VDD = 3.3V and for a typical decoupling capacitor value .
The product consumption on VDDCORE is not included in the inrush current and inrush electric charge
Symbol
Parameter
Typ
Unit
IRUSH
Inrush current during voltage regulator power-on (POR) or wake-up from standby
35
mA
QRUSH
Inrush electric charge during voltage regulator power-on (POR) or wake-up from standby.
2.8
µC
DS14927 - Rev 1
page 55/130
STM32C562xx
Electrical characteristics
5.3.5
Embedded voltage reference
The parameters provided in Table 22. Embedded internal voltage reference are derived from tests performed
under the ambient temperature and supply voltage conditions summarized in Section 5.3.1.
Table 22. Embedded internal voltage reference
The values in this table are specified by design and not tested in production.
Symbol
VREFINT
tS_vrefint(1)(2)
Parameter
Conditions
-40°C < TJ < 140 °C
Internal reference voltages
ADC sampling time when reading the internal reference
voltage
Reference Buffer consumption for ADC
ΔVREFINT (2) Internal reference voltage spread over the temperature range
Tcoeff
VDDcoeff
Average temperature coefficient
Average Voltage coefficient
Typ
Max
Unit
1.180 1.217 1.250
V
-
4.3
-
-
µs
-
-
-
4.4
µs
VDDA = 3.3 V
9
13.5
23
µA
-40 °C < TJ < 140 °C
-
5
15
mV
Average temperature coefficient
-
19
67
ppm/°C
3.0 V < VDD < 3.6 V
-
10
1370
ppm/V
tstart_vrefint (2) Start time of reference voltage buffer when ADC is enable
Irefbuf (2)
Min
1. The shortest sampling time for the application can be determined by multiple iterations.
2. Specified by design - Not tested in production.
Table 23. Internal reference voltage calibration values
Symbol
Parameter
VREFINT_CAL
5.3.6
Raw data acquired at temperature of 30 °C, VDDA = 3.3 V
Memory address
0x08FFF810 - 0x08FFF811
Supply current characteristics
The current consumption is a function of several parameters and factors such as the operating voltage, ambient
temperature, I/O pin loading, device software configuration, operating frequencies, I/O pin switching rate, program
location in memory and executed binary code.
The current consumption is measured as described in Current consumption measurement.
Typical and maximum current consumption
The MCU is placed under the following conditions:
•
•
•
•
All I/O pins are in analog input mode.
All peripherals are disabled except when explicitly mentioned.
The flash memory access time is adjusted with the minimum wait-state number, depending on the fHCLK
frequency (refer to the tables Number of wait states according to CPU clock (HCLK) frequency available in
the product reference manual).
When the peripherals are enabled, fPCLK = fHCLK.
The parameters given in the tables below are derived from tests performed under ambient temperature and
supply voltage conditions summarized in Section 5.3.1: General operating conditions. If not specified otherwise,
typical data are measured with a VDD supply of 3.0 V, and maximum data are measured at 3.6 V.
DS14927 - Rev 1
page 56/130
STM32C562xx
Electrical characteristics
5.3.6.1
Current consumption in Run mode
Table 24. Typical and maximum current consumption in Run mode
Evaluated by characterization - not tested in production, unless otherwise stated.
Clocked by HSI at 144MHz of HSIDIV3 at 48MHz if not otherwise specified.
Symbol
Parameter
Conditions
IDD(Run)(1)
TJ =
30°C
TJ =
90°C
TJ =
110°C
TJ =
130°C
TJ =
140°C
144
11.5
12.00
13.50
14.50
17.00
18.50
48
4.1
4.35
5.75
7.15
9.45
11.00
144
9.4
10.00
11.50
12.50
15.00
16.50
48
4.0
4.35
5.70
7.05
9.35
11.00
144
9.3
9.80
11.00
12.50
15.00
16.50
48
3.4
3.60
5.05
6.40
8.70
10.50
23.5
24.50
25.50
27.00
29.50
31.50
21.0
22.50
23.50
25.00
27.50
29.00
Code in Flash, ICACHE OFF
Code in SRAM2, ICACHE
OFF, FLASH ON
Supply current in Run
mode all peripheral
clocks enabled
unit
Typ
Code in Flash, ICACHE 2Ways
Supply current in Run
mode all peripheral
clocks disabled
Max
fHCLK
(MHz)
Code in Flash, ICACHE 2Ways
144(2)
Code in Flash, ICACHE OFF
mA
1. Measures done with prefetch enabled.
2. Clocked by PSI at 144 MHz with HSE at 16 MHz in bypass mode.
Table 25. Typical current consumption in Run mode with CoreMark running from flash memory and SRAM
Evaluated by characterization - not tested in production, unless otherwise stated.
Symbol
IDD(Run)(1)
Conditions
Parameter
SYSCLK
source
Peripheral
Supply current in Run
mode
fHCLK
(MHz)
Typ
Unit
Typ
Code in Flash, ICACHE 2-WAY, prefetch ON
12.00
82.00
Code in Flash, ICACHE 1-WAY, prefetch ON
9.85
68.50
Code in Flash, ICACHE OFF, prefetch ON
9.45
65.50
Code in Flash, ICACHE OFF, prefetch OFF
PSI (2)
144
8.40
mA
Unit
58.50 µA/ MHz
Code in SRAM2, ICACHE 2-WAY
11.50
78.00
Code in SRAM2, ICACHE 1-WAY
9.35
65.00
Code in SRAM2, ICACHE OFF
9.15
63.50
1. Measures done with prefetch enabled.
2. Clocked by PSI 144MHz with HSE at 16 MHz on bypass mode.
5.3.6.2
Current consumption in Sleep mode
Table 26. Typical and maximum current consumption in Sleep mode
Evaluated by characterization - Not tested in production.
Clocked by HSI at 144MHz of HSIDIV3 at 48MHz.
Symbol
IDD(SLEEP)
Parameter
Supply current in Sleep
mode
DS14927 - Rev 1
Max
fHCLK
(MHz)
Typ
TJ =
30 °C
TJ =
90 °C
TJ =
110 °C
TJ =
130 °C
TJ =
140 °C
All peripheral clocks
disabled
144
2.05
2.35
3.95
5.50
8.05
10.00
48
0.93
1.15
2.80
4.35
6.95
8.85
All peripheral clocks
enabled
144
15.00
15.50
17.00
18.50
21.00
22.50
48
5.30
5.60
7.00
8.40
11.00
12.50
Conditions
Unit
mA
page 57/130
STM32C562xx
Electrical characteristics
5.3.6.3
Current consumption in Stop mode
Table 27. Typical and maximum current consumption in Stop mode
Evaluated by characterization - not tested in production, unless otherwise stated.
Symbol
Parameter
FLASH ON
Conditions
SRAM1/2 ON
IDD(STOP)
SRAM1/2 ON
FLASH IN LOW
POWER
SRAM1/2
Powered Down
Typ
Max
TJ = 30 °C TJ = 90 °C TJ = 110 °C TJ = 130 °C TJ = 140 °C
STOP0 0.19
0.34
1.60
2.80
4.80
6.15
STOP1 0.06
0.14
0.93
1.70
3.05
3.90
STOP0 0.17
0.32
1.60
2.75
4.75
6.10
STOP1 0.05
0.13
0.92
1.70
3.05
3.85
STOP0 0.17
0.31
1.55
2.65
4.55
5.90
STOP1 0.05
0.12
0.82
1.50
2.70
3.55
Unit
mA
Table 28. Typical and maximum HSIKERON current consumption in Stop mode
Evaluated by characterization - not tested in production, unless otherwise stated.
Symbol
IDD(Stop)
Parameter
Conditions
FLASH IN LOW
POWER
5.3.6.4
HSIKERON,
STOP0
Typ
Max
TJ = 30 °C TJ = 90 °C TJ = 110 °C TJ = 130 °C TJ = 140 °C
HSI144 0.49
0.63
1.85
3.00
4.90
6.20
HSI48
0.52
1.75
2.90
4.80
6.10
0.38
Unit
mA
Current consumption in Standby mode
Table 29. Typical and maximum current consumption in Standby mode
Evaluated by characterization - not tested in production, unless otherwise stated.
Symbol
IDD(Standby)
Parameter
RTC and
LSE(1)
Typ
Max
3.3 V
TJ =
30 °C
TJ =
90 °C
TJ =
110 °C
TJ =
130 °C
TJ =
140 °C
Supply current in Standby OFF
mode, IWDG OFF
ON
2.75 2.90 3.00
3.80
9.90
18.00
36.50
51.00
3.10 3.25 3.40
-
-
-
-
-
Supply current in Standby OFF
mode, IWDG ON
ON
3.10 3.25 3.40
5.10
10.00
18.00
37.00
51.00
3.40 3.55 3.75
-
-
-
-
-
2.7 V
3V
Unit
μA
1. LSE is in bypass mode at 32.768 KHz.
DS14927 - Rev 1
page 58/130
STM32C562xx
Electrical characteristics
5.3.6.5
Current consumption from peripherals
Table 30. Peripheral current consumption measured in Sleep mode
Bus
AHB1
AHB2
APB1
APB2
DS14927 - Rev 1
Peripheral
IDD(Typ)
SRAM1
0.22
RAMCFG
0.70
ICACHE
0.20
CRC
0.70
FLASH
6.26
LPDMA1
1.22
LPDMA2
1.09
SRAM2
0.37
RNG
0.78
HASH
0.69
AES
0.92
DAC1
0.92
ADC12
5.51
GPIOA
0.07
GPIOB
0.07
GPIOC
0.09
GPIOD
0.07
GPIOE
0.08
GPIOH
0.06
FDCAN1
4.86
CRS
0.23
I2C1
1.97
I2C2
2.00
I3C1
0.28
UART4
3.47
UART5
3.43
USART2
3.69
USART3
3.62
COMP
0.19
SPI2/I2S2
1.59
SPI3/I2S3
1.50
WWDG
0.14
TIM2
0.28
TIM5
0.31
TIM6
0.26
TIM7
0.29
TIM12
0.27
USB
2.11
Unit
µA/MHz
µA/MHz
µA/MHz
µA/MHz
page 59/130
STM32C562xx
Electrical characteristics
Bus
APB2
APB3
DS14927 - Rev 1
Peripheral
IDD(Typ)
USART1
3.39
SPI1/I2S1
1.50
TIM1
0.30
TIM8
0.32
TIM15
0.33
TIM16
0.31
TIM17
0.34
RTC
3.47
LPTIM1
0.78
LPUART
2.68
SBS
0.32
Unit
µA/MHz
µA/MHz
page 60/130
STM32C562xx
Electrical characteristics
5.3.7
Wake-up time from low-power modes and voltage scaling transition times
The wake-up times given in the table below are the latency between the event and the execution of the first user
instruction.
The device goes in low-power mode after the WFE (wait for event) instruction
Table 31. Wake-up time from low-power modes
1. Evaluated by characterization - Not tested in production.
2. The wakeup times are measured from the wakeup event to the point in which the application code reads the first instruction.
Symbol
twu(Sleep)
Wakeup from Sleep
Wakeup from Stop 0
twu(Stop)
Wakeup from Stop 1(1)
twu(Standby)
Wakeup
clock
fHCLK
(MHz)
Typ Max
Unit
-
-
16
CPU clock
cycles
Flash memory in normal mode
HSI
144
3.6
5
Flash memory in low-power
mode
HSI
144
7.2
11
Flash memory in normal mode
HSIDIV3
48
5.1
7
Flash memory in low-power
mode
HSIDIV3
48
8.6
13.5
Flash memory in normal mode
HSI
144
37.0
49
Flash memory in low-power
mode
HSI
144
40.5
58
Flash memory in normal mode
HSIDIV3
48
39.0
53
Flash memory in low-power
mode
HSIDIV3
48
42.0
61
HSIDIV3
48
445
-
Parameter
Conditions
Instruction cache enabled or
disabled
Wakeup from Standby
mode(1)
-
µs
1. Those parameters depend on VCAP capacitance value and VCAP voltage at the instant of the wake-up event.
Table 32. Wake-up time using USART/LPUART
Symbol
Parameter
Condition
tWUUSART/ Wake-up time needed to calculate the maximum USART/LPUART baudrate allowing to wake
tWULPUART up from Stop mode when USART/LPUART clock source is 48 MHz by HSIDIV3
Stop 0 mode
Stop 1 mode
Typ Max(1) Unit
4.8
6.6
µs
1. Specified by design - Not tested in production.
5.3.8
External clock timing characteristics
5.3.8.1
High-speed external user clock generated from an external source
In bypass mode, the HSE oscillator is switched off and the input pin is a standard GPIO.
The external clock signal has to respect the I/O characteristics in I/O port characteristics. However, the
recommended clock input waveform is shown in the figure below.
Table 33. High-speed external user clock characteristics
Specified by design and not tested in production.
Symbol
Parameter
fHSE_ext
User external clock source frequency
VHSEH
OSC_IN input pin high-level voltage
DS14927 - Rev 1
Conditions
Min
Typ
Max
Digital mode (HSEYBYP = 1, HSEEXT = 1)
-
-
50
Analolog mode (HSEYBYP = 1, HSEEXT = 0)
4
-
50
Digital mode (HSEYBYP = 1, HSEEXT = 1)
0.7 × VDD
-
VDD
Unit
MHz
V
page 61/130
STM32C562xx
Electrical characteristics
Symbol
Parameter
VHSEL
tw(HSEH)(1)
tw(HSEL)(1)
DuCyHSE
VHSE_ext_PP
(2)
VHSE_ext
tr(HSE), tf(HSE)
Conditions
Min
Typ
Max
Unit
OSC_IN input pin low-level voltage
Digital mode (HSEYBYP = 1, HSEEXT = 1)
VSS
-
0.3 × VDD
V
OSC_IN high or low time
Digital mode (HSEYBYP = 1, HSEEXT = 1)
7
-
-
ns
OSC_IN duty cycle
Digital mode (HSEYBYP = 1, HSEEXT = 1)
45
-
55
%
0.2
-
2/3 VDD
0
-
VDD
0.05 / fext_ext
-
0.3 / fext_ext
OSC_IN peak-to-peak amplitude
OSC_IN input range
Analog mode (HSEBYP = 1, HSEEXT = 0)
OSC_IN rise and fall time
V
ns
1. There is no specified rise and fall time for a digital input signal, but the VHSEH and VHSEL conditions must be fulfilled .
2. The DC component of the signal must ensure that the signal peaks are located between VDD and VSS.
Figure 13. AC timing diagram for high-speed external clock source (digital mode)
VHSE
tw(HSEH)
VHSEH
70%
30%
t
tw(HSEL)
THSE
DT67850V3
VHSEL
Figure 14. AC timing diagram for high-speed external clock source (analog mode)
VHSE_ext
90%
VHSE_ext_PP
tf(HSE)
tr(HSE)
tHSE_ext = 1/fHSE_ext
DS14927 - Rev 1
t
DT71538V1
10%
page 62/130
STM32C562xx
Electrical characteristics
5.3.8.2
Low-speed external user clock generated from an external source
In bypass mode, the LSE oscillator is switched off and the input pin is directly connected to the LSE clock detector
(LSECSS). The external clock signal has to respect the parameters specified in Table 34, as shown also by the
waveforms in Figure 15.
Table 34. Low-speed external user clock characteristics
Specified by design and not tested in production.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
fLSE_ext
User external clock source frequency
External digital/analog clock
-
32.768
1000
kHz
VLSEH
Digital OSC_IN input high level
External digital clock
0.7 VDD
-
VDD
VLSEL
OSC32_IN input pin low level voltage
External digital clock
VSS
-
0.3 VDD
OSC32_IN high or low time
External digital clock
250
-
-
tw(LSEH)/tw(LSEL)
Vlsw_H
Analog low swing OSC_IN high level
External analog low swing clock
0.6
1.225
Vlsw_L
Analog low swing OSC_IN low level
External analog low swing clock
0.35
0.8
VlswLSE (VLSEH VLSEL)
Analog low swing OSC_IN peak-topeak amplitude
External analog low swing clock
0.2
0.875
V
ns
V
DuCyLSE
Analog low swing OSC_IN duty cycle
External analog Low Swing
Clock
45
50
55
%
trLSE/tfLSE
Analog low swing OSC_IN rise and
fall time
Externala analog low swing
clock 10 % to 90 %
-
100
200
ns
t W(LSE)
t
Figure 15. Low-speed external clock source AC timing diagram
VLSEH
VLSEL
90 %
10 %
t r(LSE)
t f(LSE)
t W(LSE)
External
clock source
f LSE_ext
OSC32 _IN
IL
STM32
DS14927 - Rev 1
DT17529V1
TLSE
page 63/130
STM32C562xx
Electrical characteristics
5.3.8.3
High-speed external clock generated from a crystal/ceramic resonator
The high-speed external (HSE) clock can be supplied with a 4 to 48 MHz crystal/ceramic resonator oscillator. All
the information given in this paragraph are based on design simulation results obtained with typical external
components specified in the table below.
In the application, the resonator and the load capacitors have to be placed as close as possible to the oscillator
pins, in order to minimize the output distortion and startup stabilization time. Refer to the crystal resonator
manufacturer for more details on the resonator characteristics (frequency, package, accuracy).
Table 35. 4-50 MHz HSE oscillator characteristics
Specified by design and not tested in production.
Symbol
F
RF
Operating conditions(1)
Min
Typ
Max
Unit
Oscillator frequency
-
4
-
50
MHz
Feedback resistor
-
-
200
-
kΩ
startup(2)
-
-
10
VDD = 3 V, Rm = 20 Ω CL=10 pF at 4 MHz
-
0.4
-
VDD=3 V, Rm = 20 Ω CL = 10 pF at 8 MHz
-
0.4
-
VDD = 3 V, Rm = 20 Ω CL = 10 pF at 16 MHz
-
0.6
-
VDD = 3 V, Rm = 20 Ω CL = 10 pF at 32 MHz
-
0.7
-
VDD = 3 V, Rm = 20 Ω CL=10 pF at 48 MHz
-
1.2
-
Startup
-
-
1.5
mA/V
VDD is stabilized
-
2
-
ms
Parameter
During
IDD(HSE)
Gmcritmax
tSU(3)
HSE current consumption
Maximum critical crystal gm
Start-up time
mA
1. Resonator characteristics given by the crystal/ceramic resonator manufacturer.
2. This consumption level occurs during the first 2/3 of the tSU(HSE) startup time.
3. tSU(HSE) is the startup time measured from the moment it is enabled (by software) to a stabilized 8 MHz oscillation is reached. This value is
measured for a standard crystal resonator and it can vary significantly with the crystal manufacturer.
Note:
For information on selecting the crystal, refer to the application note 'Oscillator design guide for STM8AF/AL/S,
STM32 MCUs and MPUs' (AN2867).
Figure 16. Typical application with a 8 MHz crystal
Resonator with integrated
capacitors
CL1
OSC_IN
8 MHz
resonator
REXT (1)
RF
Bias
controlled
gain
OSC_OUT
DT19876V1
CL2
fHSE
(1): REXT value depends on the crystal characteristics.
DS14927 - Rev 1
page 64/130
STM32C562xx
Electrical characteristics
5.3.8.4
Low-speed external clock generated from a crystal resonator
The low-speed external (LSE) clock can be supplied with a 32.768 kHz crystal resonator oscillator. All the
information given in this paragraph are based on design simulation results obtained with typical external
components specified in the table below. In the application, the resonator and the load capacitors have to be
placed as close as possible to the oscillator pins in order to minimize output distortion and startup stabilization
time. Refer to the crystal resonator manufacturer for more details on the resonator characteristics (frequency,
package, accuracy).
Table 36. LSE oscillator characteristics (fLSE = 32.768 kHz)
Specified by design and not tested in production.
Symbol
F
Operating conditions(1)
Min
Typ
Max
Unit
-
-
32.768
-
kHz
LSEDRV[1:0] = 00, Low drive capability
-
246
-
LSEDRV[1:0] = 01, Medium low drive capability
-
333
-
LSEDRV[1:0] = 10, Medium high drive capability
-
462
-
LSEDRV[1:0] = 11, High drive capability
-
747
-
LSEDRV[1:0] = 00, Low drive capability
-
-
0.5
LSEDRV[1:0] = 01, Medium low drive capability
-
-
0.75
LSEDRV[1:0] = 10, Medium high drive capability
-
-
1.7
LSEDRV[1:0] = 11, High drive capability
-
-
2.7
VDD is stabilized
-
2
-
Parameter
Oscillator frequency
LSE current consumption
IDD
Gmcritmax
tSU
(2)
Maximum critical crystal Gm
Startup time
nA
µA/V
s
1. Refer to the following note and caution paragraphs, and to the application note AN2867 “Oscillator design guide for ST microcontrollers.
2. tSU is the startup time measured from the moment it is enabled (by software) to a stabilized 32.768k Hz oscillation is reached. This value is
measured for a standard crystal resonator and it can vary significantly with the crystal manufacturer.
Note:
For information on selecting the crystal, refer to the application note 'Oscillator design guide for STM8AF/AL/S,
STM32 MCUs and MPUs' (AN2867).
Figure 17. Typical application with a 32.768 kHz crystal
Resonator with integrated capacitors
CL1
OSC32_IN
32.768 kHz resonator
Drive
programmable
amplifier
CS
OSC32_OUT
DT70418V1
CL2
fLSE
Note: CL1 and CL2 are external load capacitances. Cs (stray capacitance) is the sum of the device OSC32_IN/OSC32_OUT pins
equivalent parasitic capacitance (CS_PARA), and the PCB parasitic capacitance.
Note:
DS14927 - Rev 1
An external resistor is not required between OSC32_IN and OSC32_OUT and it is forbidden to add one.
page 65/130
STM32C562xx
Electrical characteristics
5.3.9
Internal clock timing characteristics
The parameters given in the tables below are derived from tests performed under ambient temperature and
supply voltage conditions summarized in Table 18. The curves provided are characterization results, not tested in
production.
5.3.9.1
High-speed internal HSI144 oscillator
Table 37. HSI144 oscillator characteristics
Symbol
Parameter
Conditions
Min
Typ
fHSI(1)
HSI frequency
VDD = 3.3 V, TJ = 30
°C
144.07
-
TRIM(2)
USER trimming step
-
-
0.1
0.15
USER TRIM
COVERAGE(2)
USER TRIMMING Coverage positive
80 steps
5.2%
8%
-
USER TRIMMING Coverage negative
48 steps
-3.1%
-4.8%
-
DuCy(HSI)(2)
Duty Cycle
-
45
ΔTEMP (HSI)(3)
HSI oscillator frequency drift over
temperature (the reference is 144 MHz.)
TJ = -20 to 130 °C
-1
-
1
TJ = −40 to TJmax °C
-1.5
-
1.5
ΔVDD(HSI)(2)(4)
HSI oscillator frequency drift with
VDDSection 5.3.9.1: High-speed internal
HSI144 oscillator (5)(the reference is 3.3V)
VDD from 2.7 V to 3.6
V
-
-
- 0.1
HSI oscillator start-up time (PSI Off)
-
-
3
4.5
HSI oscillator start-up time (PSI On)
-
-
0.5
-
-
-
8
-
-
0.7
tsu(HSI)(3)
tstab
stabilization time (PSI OFF from Enable)
(2)
IDD(HSI)(2)(6)
stabilization time (PSI ON from Enable)
55
-
-
91
-
HSI oscillator power consumption
-
-
28
-
-
52
322
-
62
394
Next transition jitter(7).
PT jitter(2)
Paired transition jitter(8)
jitter(2)
Period Jitter standard deviation
Unit
145.08 MHz
HSI supply regulation block oscillator power
consumption
NT jitter(2)
Per
+/-1% of target freq
Max
%
µs
µA
On HSIDIV3
On HSIS
15
On HSIDIV3
26
ps
1. Tested in production.
2. Specified by design - Not tested in production.
3. Evaluated by characterization - Not tested in production.
4. ΔfHSI = ΔTEMP + ΔVDD
5. These values are obtained by using formula: (Freq(3.6 V) - Freq(3.3 V)) / Freq(3.3 V) or (Freq(3.6 V) - Freq(2.7 V)) /
Freq(2.7 V).
6. The supply regulation consumption is common to HSI and PSI. (To be counted once if both oscillators are ON).
7. Jitter measurements are performed without clock source activated in parallel. Typical value is standard deviation, Maximum
is peak measure on TIE-8 over 36 cycles.
8. Jitter measurements are performed without clock source activated in parallel. Typical value is standard deviation, Maximum
is peak measure on TIE-16 over 36 cycles.
DS14927 - Rev 1
page 66/130
STM32C562xx
Electrical characteristics
DT76154V2
Figure 18. HSI frequency versus temperature
DS14927 - Rev 1
page 67/130
STM32C562xx
Electrical characteristics
5.3.9.2
PSI oscillator characteristics
Table 38. PSI oscillator characteristics
Symbol
Parameter
Min(1)
Typ
Max
If reference is HSE
-
100
-
at 8, 16, 24, 32 or 48 MHz
-
144
-
-
160(2)
-
-
100
-
-
141.67
-
-
158.33(2)
-
-
100.008
-
-
144.015
-
-
160.006(2)
-
Conditions
or HSIDIV18
fPSI
PSI potential frequency
If reference is HSE at 25 or 50 MHz
If reference is LSE at 32 KHz
DuCy(PSI)(3) Duty Cycle
tsu(PSI)(4)
IDD(PSI)(3)(5)
-
NT
850
1750
µs
PSI startup time
On 8 MHz
-
25
45
µs
PSI supply regulation bloc
oscillator power consumption
If HSI not ON
-
91
-
PSI oscillator power consumption
100 MHz
-
95
-
PSI oscillator power consumption
144 MHz
-
68
-
PSI oscillator power consumption
160 MHz
-
77
-
-
46.8
264
ps
-
52.6
276
ps
-
54.4
331
ps
-
60.6
367
ps
-
15.5
-
ps
-
27
-
ps
-
14
-
ps
-
24.5
-
ps
-
13.5
-
ps
-
23
-
ps
-
-
-
-
(48 MHz with 32 kHz CK_IN)
Next transition jitter(6)
On PSIDIV3
Paired transition jitter
(7)
(48 MHz with 32 kHz CK_IN)
On PSIDIV3
(48 MHz with 8 MHz CK_IN)
On PSIS
(100 MHz)
On PSIDIV3
(33.33 MHz)
On PSIS
Per
Period Jitter standard deviation
(144 MHz)
On PSIDIV3
(48 MHz)
On PSIS
(160 MHz)
On PSIDIV3
(53.33 MHz)
On PSIS
LT
jitter(3)
Long term jitter ethernet
(100 MHz with 32 kHz CK_IN)
On PSIS
DS14927 - Rev 1
%
-
On PSIDIV3
jitter(3)
55
On 32 KHz
(48 MHz with 8 MHz CK_IN)
PT jitter(3)
MHz
PSI startup time
On PSIDIV3
jitter(3)
45
Unit
µA
13.7 (RMS)
96.7 (peak)
0.79 (RMS)
ns
ns
page 68/130
STM32C562xx
Electrical characteristics
Symbol
Parameter
Conditions
Long term jitter ethernet
(100 MHz with 8 MHz CK_IN )
On PSIK
LT
jitter(3)
Long term jitter FDCAN
(40 MHz with 32 kHz CK_IN)
On PSIK
(40 MHz with 8 MHz CK_IN)
Min(1)
Typ
Max
Unit
6.69 (peak)
-
-
-
-
13.3 (RMS)
83.6 (peak)
0.775 (RMS)
6.16 (peak)
ns
ns
1. Tested in production.
2. Frequencies above the supported product's maximum frequency can only be used once divided through PSIK or PSIDIV4
dividers.
3. Specified by design - Not tested in production.
4. Evaluated by characterization - Not tested in production.
5. The supply regulation consumption is common to HSI and PSI. (To be counted once if both oscillators are ON)
6. Jitter measurements are performed without clock source activated in parallel. The typical value refer to the standard
deviation, while the maximum is the peak measurement of TIE-8 over 36 cycles.
7. Jitter measurements are performed without clock source activated in parallel. The typical value refer to the standard
deviation, while the maximum is the peak measurement of TIE-16 over 36 cycles.
DS14927 - Rev 1
page 69/130
STM32C562xx
Electrical characteristics
5.3.9.3
Low-speed internal (LSI) RC oscillator
Table 39. LSI oscillator characteristics
Symbol
Conditions
Min
VDD = 3.3 V, TJ = 25°C
31.4(1)
TJ = -40 to 130°C
29.4(2)
TJ = -40 to 140°C
28.6(2)
-
33.6(2)
LSI oscillator startup time
-
-
80
130
tstab(LSI)(3)
LSI oscillator stabilization time (5% of final value)
-
-
120
170
IDD(LSI)(3)
LSI oscillator power consumption
-
-
130
280
fLSI
tsu(LSI)(3)
Parameter
LSI frequency
Typ
Max
32
32.6(1)
Unit
33.6(2)
kHz
µs
nA
1. Guaranteed by test production.
2. Evaluated by characterization - Not tested in production.
3. Specified by design - Not tested in production.
5.3.10
Flash memory characteristics
Table 40. Flash memory characteristics
Specified by design and not tested in production.
Symbol
IDD
Parameter
Conditions
Supply current
Min
Typ
Max
Word program
-
1
-
Page erase
-
0.8
-
Mass erase
-
0.8
-
Unit
mA
Table 41. Flash memory programming
Symbol
Conditions
Min(1)
Typ
Max(1)
128 bits (user area)
-
20.0
160.0
16 bits (OTP / EDATA area)
-
20.0
160.0
Parameter
tprog
Word programming time
tERASE 8KB
Page (8 KB) erase time
-
-
2.0
2.1
tERASE 2KB
Page (2 KB) erase time
-
-
2.0
2.1
Bank Mass erase time
-
-
96.0
Mass erase time
-
-
192.0
200.0
Programming voltage
-
2.65
-
3.6
tME
Vprog
Unit
µs
ms
V
1. Evaluated by characterization - Not tested in production.
Table 42. Flash memory user and EDATA endurance and data retention
Symbol
NEND
tRET
Parameter
Endurance
Data retention
Conditions
Min(1)
Unit
TJ = -40 to 140 °C
10
Kcycle
1 Kcycle at TJ = 125 °C
10
1 Kcycle at TJ = 85 °C
30
10 Kcycle at TJ = 55 °C
30
Year
1. Evaluated by characterization - Not tested in production.
DS14927 - Rev 1
page 70/130
STM32C562xx
Electrical characteristics
5.3.11
EMC characteristics
Susceptibility tests are performed on a sample basis during device characterization.
Functional EMS (electromagnetic susceptibility)
While a simple application is executed on the device (toggling two LEDs through the I/O ports), the device is
stressed by two electromagnetic events until a failure occurs. The failure is indicated by the LEDs as follows:
•
•
Electrostatic discharge (ESD) (positive and negative): applied to all device pins until a functional
disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.
FTB (fast transient voltage burst) (positive and negative): applied to VDD and VSS pins through a 100 pF
capacitor, until a functional disturbance occurs. This test is compliant with the IEC 61000-4-4 standard.
A device reset allows normal operations to be resumed.
The test results are given in the table below. They are based on the EMS levels and classes defined in application
note EMC design guide for STM8, STM32 and Legacy MCUs (AN1709).
Table 43. EMS characteristics
Symbol
Parameter
Conditions
Level/
Class
VFESD
Voltage limits to be applied on any I/O pin
to induce a functional disturbance
VDD = 3.3 V, TA = 25°C, fHCLK = 144 MHz, LQFP100 package conforming
to IEC 61000-4-2
2B
VEFTB
Fast transient voltage burst limits to be
applied through 100 pF on VDD and VSS
pins to induce a functional disturbance
VDD = 3.3 V, TA = 25°C, fHCLK = 144 MHz, LQFP100 package conforming
to IEC 61000-4-4
5A
Designing hardened software to avoid noise problems
The EMC characterization and optimization are performed at component level with a typical application
environment and simplified MCU software. Note that good EMC performance is highly dependent on the user
application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and prequalification tests in relation
with the EMC level requested for the application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
•
•
•
Corrupted program counter
Unexpected reset
Critical data corruption (control registers)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be reproduced by manually
forcing a low state on the NRST pin or the oscillator pins for one second.
To complete these trials, ESD stress can be applied directly on the device, over the range of specification values.
When unexpected behavior is detected, the software can be hardened to prevent unrecoverable errors occurring.
See application note Software techniques for improving microcontrollers EMC performance (AN1015) for more
details.
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device is monitored while a simple application is executed (toggling two
LEDs through the I/O ports). This emission test is compliant with IEC 61967-2 standard that specifies the test
board and the pin loading.
DS14927 - Rev 1
page 71/130
STM32C562xx
Electrical characteristics
Table 44. EMI characteristics for fHSE = 16 MHz and fHCLK = 144 MHz
Symbol
SEMI
Parameter
Conditions
Peak(1)
Monitored frequency band
Value
0.1 MHz to 30 MHz
16
30 MHz to 130 MHz
-1
130 MHz to 1 GHz
21
1 GHz to 2 GHz
13
0.1 MHz to 2 GHz
3.5
VDD = 3.6 V, TA = 25 ° C,
LQFP100 package compliant with IEC 61967-2
Level(2)
Unit
dBμV
-
1. Refer to the EMI radiated test section of the application note EMC design guide for STM8, STM32 and Legacy MCUs (AN1709).
2. Refer to the EMI level classification section of the application note EMC design guide for STM8, STM32 and Legacy MCUs (AN1709).
5.3.12
Electrical sensitivity characteristics
Based on three different tests (ESD, latch-up) using specific measurement methods, the device is stressed in
order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of each
sample according to each pin combination. The sample size depends on the number of supply pins in the device
(3 parts × (n+1) supply pins). This test conforms to the ANSI/JEDEC standard.
Table 45. ESD absolute maximum ratings
Specified by design and not tested in production.
Symbol
Ratings
Conditions
Packages
VESD(HBM)
Electrostatic
discharge
voltage (human
body model)
TA = 25°C conforming to
ANSI/ESDA/JEDEC JS001
All
Class
Maximum
value(1)
2
2000
Unit
LQFP 100
LQFP 80
Electrostatic
discharge
voltage (charge
device model)
VESD(CDM)
TA = 25°C conforming to
ANSI/ESDA/JEDEC JS002
V
LQFP 64
LQFP 48
C3
1000
LQFP 32
UFQFPN 48
UFQFPN 32
1. Evaluated by characterization - Not tested in production.
Static latch-up
The following complementary static tests are required on three parts to assess the latch-up performance:
•
•
A supply overvoltage is applied to each power supply pin.
A current injection is applied to each input, output, and configurable I/O pin.
These tests are compliant with EIA/JESD 78E IC latch-up standard.
Table 46. Electrical sensitivities
DS14927 - Rev 1
Symbol
Parameter
Conditions
Class
LU
Static latch-up class
TA = 130°C conforming to
JESD78
Level II A
page 72/130
STM32C562xx
Electrical characteristics
5.3.13
I/O current injection characteristics
As a general rule, the current injection to the I/O pins, due to external voltage below VSS or above VDDIOx (for
standard, 3.3 V‑capable I/O pins) must be avoided during normal product operation. However, in order to give an
indication of the robustness of the microcontroller if abnormal injection accidentally happens, some susceptibility
tests are performed on a sample basis during the device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting current into the I/O pins
programmed in floating-input mode. While this current is injected into the I/O pin, one at a time, the device is
checked for functional failures.
The failure is indicated by an out-of-range parameter, such as an ADC error above a certain limit (higher than
5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out of the 5 µA/+0 µA range),
or other functional failure (for example reset occurrence or oscillator frequency deviation).
The characterization results are given in the table below. The negative induced leakage current is caused by the
negative injection. The positive induced leakage current is caused by the positive injection.
Table 47. I/O current injection susceptibility
The I/O structure options listed in this table can be a concatenation of options including the option explicitly listed. For instance, TT_a refers to
any TT I/O with _a option. TT_xx refers to any TT I/O and FT_xx refers to any FT I/O.
Evaluated by characterization - Not tested in production.
Symbol
IINJ
Description
Functional susceptibility
Negative injection Positive injection
Injected current on PA4 pins
0
0
Injected current on PB13, PB14, PB15, PD8, PD9, PD10, PD11, PD12, PD13, PE0,
and PE1 pins
0
N/A
Injected current on all other pins
5
N/A
DS14927 - Rev 1
Unit
mA
page 73/130
STM32C562xx
Electrical characteristics
5.3.14
I/O port characteristics
General input/output characteristics
Unless otherwise specified, the parameters given in Table 48 are derived from tests performed under the
conditions summarized in Table 18. All I/Os are designed as CMOS and TTL-compliant.
Note:
For information on GPIO configuration, refer to the application note STM32 GPIO configuration for hardware
settings and low‑power consumption (AN4899).
Table 48. I/O static characteristics
The I/O structure options listed in this table can be a concatenation of options including the option explicitly listed. For instance, TT_a refers to
any TT I/O with _a option. TT_xx refers to any TT I/O and FT_xx refers to any FT I/O.
All I/Os are CMOS- and TTL-compliant (no software configuration required). Their characteristics cover more than the strict CMOS-technology
or TTL parameters. The coverage of these requirements is shown in the figure below.
The minimum and maximum values are specified for a junction temperature (TJ) of 125°C.
Symbol
VIL
Parameter
I/O input low level voltage
I/O input low level voltage
Condition
Min
Typ
Max
-
-
0.3VDD (1)
-
-
0.4 VDD - 0.1(2)
0.7VDD (1)
-
-
2.7 V < VDDIOx < 3.6 V
0.52VDD +
0.18(2)
-
-
2.7 V < VDDIOx < 3.6 V
-
300
-
0 < VIN ≤ Max(VDDXXX)(4)
-
-
±-200
2.7 V 200 mV with 100 mV
overdrive only on positive inputs
High-speed mode
-
50
120
ns
Medium mode
-
0.5
1.2
µs
Comparator offset error
Full common mode range
-
-
±20
mV
No hysteresis
-
0
-
Low hysteresis
-
10
-
Medium hysteresis
-
20
-
High hysteresis
-
30
-
Static
-
5
9
With 50 kHz ±100 mV
overdrive square signal
-
6
-
Static
-
70
110
With 50 kHz ±100 mV
overdrive square signal
-
75
-
tD(2)
Voffset
Vhys
Comparator hysteresis
Medium mode
IDDA(COMP)
Comparator consumption from VDDA
High-speed mode
µA
µs
µs
mV
µA
1. Refer to Section 5.3.5: Embedded voltage reference.
2. Evaluated by characterization - Not tested in production.
5.3.21
Timer characteristics
The parameters given in Section 5.3.21, Table 62, and Section 5.3.21 are specified by design, not tested in
production.
Refer to Table 48. I/O static characteristics for details on the input/output alternate function characteristics (output
compare, input capture, external clock, PWM output).
Table 61. TIMx characteristics
Symbol
tres(TIM)
fEXT
ResTIM
tCOUNTER
tMAX_COUNT
Parameter
Timer resolution time
Timer external clock frequency on CH1 to CH4
Timer resolution
16-bit counter clock period
Maximum possible count with 32‑bit counter
Conditions
Min
Max
Unit(1)
-
1
-
tTIMxCLK
6.9
-
ns
0
fTIMxCLK/2
fTIMxCLK = 144 MHz
0
72
TIMx (except TIM2/TIM5)
-
16
TIM2/TIM5
-
32
1
65536
tTIMxCLK
0.007
455.1
µs
-
4, 294, 967, 296
tTIMxCLK
-
29.826
s
fTIMxCLK = 144 MHz
-
fTIMxCLK = 144 MHz
fTIMxCLK = 144 MHz
MHz
bit
1. TIMx, is used as a general term in which x stands for 1, 2, 5, 6, 7, 8, 12, 15, 16, 17.
DS14927 - Rev 1
page 88/130
e:
STM32C562xx
Electrical characteristics
Table 62. IWDG min/max timeout period at 32 kHz (LSI)
For the values in this table, the exact timings still depend on the phasing of the APB interface clock versus the LSI clock, so that there is
always a full RC period of uncertainty.
Prescaler divider
PR[2:0] bits
Min timeout RL[11:0] = 0x000
Max timeout RL[11:0] = 0xFFF
/4
0
0.125
512
/8
1
0.250
1024
/16
2
0.500
2048
/32
3
1.0
4096
/64
4
2.0
8192
/128
5
4.0
16384
/256
6 or 7
8.0
32768
Unit
ms
Table 63. WWDG min/max timeout value at 144 MHz (PCLK)
Prescaler
WDGTB
Min timeout values
Max timeout value
1
0
0.0284
1.820
2
1
0.0569
3.641
4
2
0.1138
7.282
8
3
0.2276
14.564
16
4
0.4551
29.127
32
5
0.9102
58.254
64
6
1.820
116.508
128
7
3.641
233.017
5.3.22
Unit
ms
I3C interface characteristics
The I3C interface meets the timing requirements of the MIPI® I3C specification v1.1.
The I3C peripheral supports:
•
•
•
I3C SDR-only as controller
I3C SDR-only as target
I3C SCL bus clock frequency up to 12.5 MHz
The parameters given in Table 64 below are obtained with the following configuration:
•
•
•
Output speed is set to OSPEEDRy[1:0] = 10
I/O Compensation cell activated
Voltage scaling range 1
The I3C timings are in line with the MIPI specification, except for the ones given in Table 64, I3C open-drain
measured timing. For tSU_OD, this can be mitigated by increasing the corresponding SCL low duration in the
I3C_TIMINGR0 register. For further details refer to AN5879.
Table 64. Open drain timing measurements
Evaluated by characterization - Not tested in production.
Symbol
Parameter
Conditions
Min
Unit
tSU_OD
SDA data setup time in open drain mode
Controller
2.7 V ≤ VDDIOX ≤ 3.6 V
22(1)
ns
1. The minimum SDA data setup time during open-drain-mode is 3 ns, as specified in the MIPI Alliance specification for I3C.
DS14927 - Rev 1
page 89/130
STM32C562xx
Electrical characteristics
5.3.23
I²C interface characteristics
The I²C interface meets the timing requirements of the I2C-bus specification and user manual rev. 03 for:
•
•
•
Standard mode (Sm): Bit rate up to 100 kbit/s.
Fast mode (Fm): Bit rate up to 400 kbit/s.
Fast mode plus (Fm+): Bit rate up to 1 Mbit/s.
The I²C timing requirements are specified by design, not tested in production, when the I²C peripheral is properly
configured (refer to the product reference manual).
The SDA and SCL I/O requirements are met with the following restrictions:
•
The SDA and SCL I/O pins are not true open-drain. When configured as open-drain, the PMOS connected
between the I/O pin and VDDIOx is disabled but remains present.
•
Only FT_f I/O pins support Fm+ low level output current maximum requirement. Refer to
Section 5.3.14: I/O port characteristics for the I²C I/Os characteristics.
Al I²C SDA and SCL I/Os embed an analog filter. Refer to the table below for the analog filter characteristics.
Table 65. I²C analog filter characteristics
Evaluated by characterization - Not tested in production.
Measurement points are taken at 50% VDD.
Symbol
tAF
Parameter
Min
Max
Unit
Maximum pulse width of spikes that are suppressed by analog filter
50(1)
160(2)
ns
1. Spikes with widths below tAF(min) are filtered.
2. Spikes with widths above tAF(max) are not filtered.
5.3.24
USART characteristics
Unless otherwise specified, the parameters given in Table 66 are derived from tests performed under the ambient
temperature, fPCLKx frequency and VDD supply voltage conditions summarized in not found, with the following
configuration:
•
•
Output speed set to OSPEEDRy[1:0] = 10
Capacitive load CL = 30 pF
•
Measurement points done at 0.5 × VDD level
I/O compensation cell activated
•
Refer to I/O port characteristics for more details on the input/output alternate function characteristics (NSS, CK,
TX, RX for USART).
Table 66. USART (SPI mode) characteristics
Evaluated by characterization - Not tested in production.
Symbol
fCK
USART clock frequency
Conditions
Min
Typ
Max
Master transmitter mode,
2.7 V ≤ VDD ≤ 3.6 V
-
-
18
Slave receiver mode,
2.7 V ≤ VDD ≤ 3.6 V
-
-
48
Slave transmitter mode,
2.7 V ≤ VDD ≤ 3.6 V
-
-
27
Unit
tsu(NSS)
NSS setup time
Slave mode
tker(1) + 2
-
-
th(NSS)
NSS hold time
Slave mode
2
-
-
CK high and low time
Master mode
1/ fCK /2-1
1/ fCK /2
1/ fCK /2+1
Data input setup time
Master mode
18
-
-
tw(CKH)
tw(CKL)
tsu(RX)
DS14927 - Rev 1
Parameter
ns
page 90/130
STM32C562xx
Electrical characteristics
Symbol
tsu(RX)
th(RX)
th(RX)
Parameter
Conditions
Data input setup time
Data input hold time
tv(TX)
Data output valid time
th(TX)
Data output hold time
th(TX)
Data output hold time
Min
Typ
Max
Slave mode
2.5
-
-
Master mode
0.5
-
-
Slave mode
1
-
-
Slave mode
2.7 V ≤ VDD ≤ 3.6 V
-
13.5
18
Master mode
2.7 V ≤ VDD ≤ 3.6 V
-
2
2.5
Slave mode
9
-
-
Master mode
0.5
-
-
Unit
ns
1. Tker is the usart_ker_ck_pres clock period.
Figure 29. USART timing diagram in SPI master mode
1/fCK
CPHA=0
CPOL=0
CPHA=0
CPOL=1
tw(CKL)
CPHA=1
CPOL=0
CPHA=1
CPOL=1
tsu(RX)
th(RX)
RX input
MSB IN
TX output
MSB OUT
tv(TX)
LSB IN
BIT6 IN
LSB OUT
BIT1 OUT
DT65386V2
CK output
CK output
tw(CKH)
th(TX)
Figure 30. USART timing diagram in SPI slave mode
NSS input
th(NSS)
1/fCK
tsu(NSS)
tw(CKH)
CK input
CPHA=0
CPOL=0
CPHA=0
CPOL=1
tv(TX)
tw(CKL)
First bit OUT
tsu(RX)
RX input
DS14927 - Rev 1
Next bits OUT
Last bit OUT
th(RX)
First bit IN
Next bits IN
Last bit IN
DT65387V5
TX output
th(TX)
page 91/130
STM32C562xx
Electrical characteristics
5.3.25
SPI characteristics
Unless otherwise specified, the parameters given in Table 67 are derived from tests performed under the ambient
temperature, fPCLKx frequency and supply voltage conditions summarized in Table 18.
•
•
Output speed set to OSPEEDRy[1:0] = 11
Capacitive load CL = 30 pF
•
Measurement points done at 0.5 × VDD level
I/O compensation cell activated
•
Refer to Table 48. I/O static characteristics for more details on the input/output alternate function characteristics
(NSS, SCK, MOSI, MISO for SPI).
Evaluated by characterization - Not tested in production.
Table 67. SPI characteristics
Evaluated by characterization - Not tested in production.
Symbol
Parameter
Conditions
Min
Typ
Master mode
fSCK
SPI clock frequency
NSS setup time
th(NSS)
NSS hold time
tw(SCKH), tw(SCKL)
SCK high and low time
tsu(MI)
Slave receiver mode
Data input setup time
tsu(SI)
th(MI)
Slave mode
Master mode
-
-
th(SI)
3
-
-
1
-
-
TPLCK - 1
TPLCK
TPLCK + 1
DDRS = 1
10-TSCK/2
-
-
2
-
-
DDRS = 0
1
-
-
DDRS = 1
(TSCK/2)-7
-
-
Slave mode
1.5
-
-
Master mode
ta(SO)
Data output access time
Slave mode
12
13.5
15.5
tdis(SO)
Data output disable time
Slave mode
6.5
8.5
10.5
tv(SO)
Data output valid time
Slave mode
-
12
15.5
Master mode
-
2
2.5
Slave mode,
8
-
-
Master mode
0
-
-
th(SO)
th(MO)
DS14927 - Rev 1
Data output hold time
MHz
32
2.5
Slave mode
Data input hold time
100
DDRS = 0
Master mode
Unit
72
Slave mode transmitter/full duplex
tsu(NSS)
Max
ns
page 92/130
STM32C562xx
Electrical characteristics
Figure 31. SPI timing diagram - slave mode and CPHA = 0
NSS input
th(NSS)
tc(SCK)
tsu(NSS)
tw(SCKH)
SCK input
CPHA=0
CPOL=0
CPHA=0
CPOL=1
tv(SO)
tw(SCKL)
MISO output
First bit OUT
tsu(SI)
MOSI input
tdis(SO)
th(SO)
Next bits OUT
Last bit OUT
th(SI)
First bit IN
Next bits IN
DT40458V2
ta(SO)
Last bit IN
Figure 32. SPI timing diagram - slave mode and CPHA = 1
NSS input
th(NSS)
tc(SCK)
tsu(NSS)
SCK input
CPHA=1
CPOL=0
tw(SCKH)
CPHA=1
CPOL=1
tw(SCKL)
MISO output
Note:
DS14927 - Rev 1
th(SO)
Next bits OUT
First bit OUT
tsu(SI)
MOSI input
tv(SO)
tdis(SO)
Last bit OUT
th(SI)
First bit IN
Next bits IN
Last bit IN
DT40459V2
ta(SO)
Measurement points are done at 0.3 VDD and 0.7 VDD levels.
page 93/130
STM32C562xx
Electrical characteristics
Figure 33. SPI timing diagram - master mode
High
NSS input
tc(SCK)
CPHA=0
CPOL=0
CPHA=0
CPOL=1
tw(SCKL)
CPHA=1
CPOL=0
CPHA=1
CPOL=1
th(MI)
tsu(MI)
MISO input
MOSI output
First bit IN
First bit OUT
tv(MO)
Note:
5.3.26
Next bits IN
Next bits OUT
th(MO)
Last bit IN
Last bit OUT
DT14136V4
SCK output
SCK output
tw(SCKH)
Measurement points are done at 0.3 VDD and 0.7 VDD levels.
I2S interface characteristics
Unless otherwise specified, the parameters given in Table xx for I2S are derived from tests performed under the
ambient temperature, fPCLKx frequency and VDD supply voltage conditions summarized in Table 68. I2S
characteristics, with the following configuration:
DS14927 - Rev 1
•
•
•
Output speed is set to OSPEEDRy[1:0] = 10
Capacitive load C = 30 pF
Measurement points are done at CMOS levels: 0.5 × VDD
•
IO Compensation cell activated
page 94/130
STM32C562xx
Electrical characteristics
Refer to Section 5.3.14: I/O port characteristics: I/O port characteristics for more details on the input/output
alternate function characteristics (CK, SDO, SDI, WS).
Table 68. I2S characteristics
Evaluated by characterization – Not tested in production.
Symbol
fMCK
Conditions
Min
Max
Unit
-
-
50
MHz
Master Tx or RX, slave Rx
-
50
Slave Tx
-
19
I2S main clock output
fCK
I2S clock frequency
tv(WS)
WS valid time
Master mode
-
3
th(WS)
WS hold time
Master mode
1
-
tsu(WS)
WS setup time
Slave mode
2
-
th(WS)
WS hold time
Slave mode
0.5
-
tsu(SD_MR)
Data input setup time
Master receiver
2.5
-
tsu(SD_SR)
Data input setup time
Slave receiver
1
-
Master receiver
1.5
-
Slave receiver
2.5
-
th(SD_MR)
th(SD_SR)
5.3.27
Parameter
Data input hold time
MHz
ns
tv(SD_ST)
Data output valid time
Slave transmitter (after enable edge)
-
15.5
th(SD_ST)
Data output hold time
Slave transmitter (after enable edge)
8
-
tv(SD_MT)
Data output valid time
Master transmitter (after enable edge)
-
2
th(SD_MT)
Data output hold time
Master transmitter (after enable edge)
0.5
-
ns
USB_FS characteristics
Table 69. USB_FS characteristics
Symbol
Conditions
Min
Typ
Max
Unit
USB transceiver operating supply voltage
-
3.0(1)
-
3.6
V
RPUI
Embedded USB_DP pullup value during idle
-
900
-
1575
RPUR
Embedded USB_DP pullup value during reception
-
1425
-
3090
28
36
44
VDDUSB
ZDRV
Parameter
Output driver
impedance(2)
High and low driver
Ω
1. USB functionality is ensured down to 2.7 V, but some USB electrical characteristics are degraded in 2.7 to 3.0 V range.
2. No external termination series resistors are required on USB_DP (D+) and USB_DM (D-). The matching impedance is already included in
the embedded driver.
5.3.28
JTAG/SWD interface characteristics
Unless otherwise specified, the parameters given in Table 70 and Table 71 are derived from tests performed
under the ambient temperature, fHCLKx frequency and VDD supply voltage conditions summarized in Table 18,
with the following configuration:
•
•
Output speed set to OSPEEDRy[1:0] = 10
Capacitive load CL = 30 pF
•
Measurement points done at 0.5 × VDD level
Refer to Table 48. I/O static characteristics for more details on the input/output characteristics.
DS14927 - Rev 1
page 95/130
STM32C562xx
Electrical characteristics
Table 70. JTAG characteristics
Evaluated by characterization - Not tested in production.
Symbol
Parameter
Min
Typ
Max
Unit
MHz
FTCK
TCK clock frequency
-
-
34
tisu(TMS)
TMS input setup time
2
-
-
tih(TMS)
TMS input hold time
0.5
-
-
tisu(TDI)
TDI input setup time
1.5
-
-
tih(TDI)
TDI input hold time
0.5
-
-
tov(TDO)
TDO output valid time
-
11
14.5
toh(TDO)
TDO output hold time
7.5
-
-
ns
Figure 34. JTAG timing diagram
NSS input
th(NSS)
tc(SCK)
tsu(NSS)
tw(SCKH)
SCK input
CPHA=0
CPOL=0
CPHA=0
CPOL=1
First bit OUT
tsu(SI)
tdis(SO)
th(SO)
Next bits OUT
Last bit OUT
th(SI)
First bit IN
Next bits IN
DT40458V2
MISO output
MOSI input
tv(SO)
tw(SCKL)
ta(SO)
Last bit IN
Table 71. SWD characteristics
Evaluated by characterization - Not tested in production.
Symbol
Parameter
Min
Typ
Max
Unit
MHz
FSWCLK
SWCLK clock frequency
-
-
71
tisu(SWDIO)
SWDIO input setup time
3
-
-
tih(SWDIO)
SWDIO input hold time
0.5
-
-
tov(SWDIO)
SWDIO output valid time
-
11.5
14
toh(SWDIO)
SWDIO output hold time
9.5
-
-
DS14927 - Rev 1
ns
page 96/130
STM32C562xx
Electrical characteristics
Figure 35. SWD timing diagram
NSS input
th(NSS)
tc(SCK)
tsu(NSS)
SCK input
CPHA=1
CPOL=0
tw(SCKH)
CPHA=1
CPOL=1
tw(SCKL)
MISO output
First bit OUT
tsu(SI)
MOSI input
DS14927 - Rev 1
tv(SO)
th(SO)
Next bits OUT
tdis(SO)
Last bit OUT
th(SI)
First bit IN
Next bits IN
Last bit IN
DT40459V2
ta(SO)
page 97/130
STM32C562xx
Package information
6
Package information
To meet environmental requirements, ST offers these devices in different grades of ECOPACK packages,
depending on their level of environmental compliance. ECOPACK specifications, grade definitions and product
status are available at: www.st.com. ECOPACK is an ST trademark.
6.1
Device marking
Refer to technical note "Reference device marking schematics for STM32 microcontrollers and microprocessors"
(TN1433) available on www.st.com, for the location of pin 1 / ball A1 as well as the location and orientation of the
marking areas versus pin 1 / ball A1.
Parts marked as "ES", "E" or accompanied by an engineering sample notification letter, are not yet qualified and
therefore not approved for use in production. ST is not responsible for any consequences resulting from such use.
In no event will ST be liable for the customer using any of these engineering samples in production. ST’s Quality
department must be contacted prior to any decision to use these engineering samples to run a qualification
activity.
A WLCSP simplified marking example (if any) is provided in the corresponding package information subsection.
DS14927 - Rev 1
page 98/130
STM32C562xx
Package information
6.2
LQFP32 package information (5V)
This LQFP is a 32-pin, 7 x 7 mm, low-profile quad flat package.
Note:
Figure 36 is not to scale.
Refer to the notes section for the list of notes on Figure 36 and Table 72.
Figure 36. LQFP32- Outline
BOTTOM VIEW
2
1
(2)
(6)
D 1/4
R1
R2
TI
O
N
B-
B
H
SE
C
E 1/4
B
S
bbb H A-B D 4x
aaa C A-B D
N
3
GAUGE PLANE
0.25
4x N/4 TIPS
B
L
(L1)
(1) (11)
SECTION A-A
(N – 4)x e
(13)
C
A
A1
b
(12)
0.05
ddd
C A-B D
D
(2) (5)
ccc C
(4)
b
D1
(11) c
1
A
E 1/4
2
E1
(6)
(3)
A
(Section A-A)
DS14927 - Rev 1
c1(11)
B
3
D 1/4
TOP VIEW
WITH PLATING
D (3)
(10)
(3)
(9) (11)
A
(2)
(5)
E
(4)
b1
(11)
SECTION B-B
BASE METAL
5V_LQFP32_ME_V1
A2
page 99/130
STM32C562xx
Package information
Table 72. LQFP32 - Mechanical data
Symbol
Inches(14.)
Millimeters
Min
Typ
Max
Min
Typ
Max
θ
0°
3.5°
7°
0°
3.5°
7°
θ1
0°
-
-
0°
-
-
θ2
10°
12°
14°
10°
12°
14°
θ3
10°
12°
14°
10°
12°
14°
A
-
-
1.60
-
-
0.0630
A1(12.)
0.05
-
0.15
0.0020
-
0.0059
A2
1.35
1.40
1.45
0.0531
0.0551
0.0571
b(9.)(11.)
0.30
0.37
0.45
0.0118
0.0146
0.0177
b1(11.)
0.30
0.35
0.40
0.0118
0.0128
0.0157
c(11.)
0.09
-
0.20
0.0035
-
0.0079
c1(11.)
0.09
-
0.16
0.0035
-
0.0063
D(4.)
9.00 BSC
0.3543 BSC
D1(2.)(5.)
7.00 BSC
0.2756 BSC
e
0.80 BSC
0.0315 BSC
E(4.)
9.00 BSC
0.3543 BSC
E1(2.)(5.)
7.00 BSC
0.2756 BSC
L
0.45
L1
0.60
0.75
1.00 REF
0.0236
0.0295
0.0394 REF
N(13.)
DS14927 - Rev 1
0.0177
32
R1
0.08
-
-
0.0031
-
-
R2
0.08
-
0.20
0.0031
-
0.0079
S
0.20
-
-
0.0079
-
-
aaa(1.)(7.)(15.)
0.20
0.0079
bbb(1.)(7.)(15.)
0.20
0.0079
ccc(1.)(7.)(15.)
0.10
0.0039
ddd(1.)(7.)(15.)
0.20
0.0079
page 100/130
STM32C562xx
Package information
Notes:
1.
2.
3.
4.
5.
Dimensioning and tolerancing schemes conform to ASME Y14.5M-1994.
The top package body size may be smaller than the bottom package size by as much as 0.15 mm.
Datums A-B and D to be determined at datum plane H.
To be determined at the seating datum plane C.
Dimensions D1 and E1 do not include mold flash or protrusions. Allowable mold flash or protrusions is “0.25
mm” per side. D1 and E1 are maximum plastic body size dimensions including mold mismatch.
6. Details of pin 1 identifier are optional but must be located within the zone indicated.
7. All dimensions are in millimeters.
8. No intrusion is allowed inwards the leads.
9. Dimension b does not include a dambar protrusion. Allowable dambar protrusion shall not cause the lead
width to exceed the maximum “b” dimension by more than 0.08 mm. Dambar cannot be located on the lower
radius or the foot. The minimum space between the protrusion and an adjacent lead is 0.07 mm for 0.4 mm
and 0.5 mm pitch packages.
10. The exact shape of each corner is optional.
11. These dimensions apply to the flat section of the lead between 0.10 mm and 0.25 mm from the lead tip.
12. A1 is defined as the distance from the seating plane to the lowest point on the package body.
13. N is the number of terminal positions for the specified body size.
14. Values in inches are converted from mm and rounded to four decimal digits.
15. Recommended values and tolerances.
Figure 37. LQFP32 - Footprint example
0.45
0.8
32
25
24
8
17
7.4
1
9
9.8
1.2 REF
16
9.8
Soldering area
Solder resist opening
5V_LQFP32_FP_V4
7.4
1. Dimensions are expressed in millimeters.
DS14927 - Rev 1
page 101/130
STM32C562xx
Package information
6.3
UFQFPN32 package information (A0B8)
This UFQFPN is a 32-pin, 5 x 5 mm, 0.5 mm pitch ultra-thin fine pitch quad flat package.
Figure 38. UFQFPN32 - Outline
D2
fff
C A B
EXPOSED PAD
b
fff
bbb
ddd
C A B
C A B
C
E2
e
PIN 1 identifier
Chamfer or
Circular arc shape
L
e
BOTTOM VIEW
R0.20
A
ccc
C
eee
C
A3
A1
SEATING PLANE
C
DETAIL A
FRONT VIEW
A3
SEATING PLANE
A1
ddd C
C
B
PIN 1 IDENTIFIER
LASER MARKING AREA
DETAIL A
D
TOP VIEW
A
A0B8_UFQFPN32_ME_V4
E
1. Drawing is not to scale.
2. All leads/pads should also be soldered to the PCB to improve the lead/pad solder joint life.
3. There is an exposed die pad on the underside of the UFQFPN package. It is recommended to connect and
solder this backside pad to PCB ground.
DS14927 - Rev 1
page 102/130
STM32C562xx
Package information
Table 73. UFQFPN32 - Mechanical data
Symbol
Millimeters(1)
Inches(2)
Min
Typ
Max
Min
Typ
Max
A(3)(4)
0.50
0.55
0.60
0.0197
0.0217
0.0236
A1(5)
0.00
-
0.05
0.000
-
0.0020
A3(6)
-
0.15
-
-
0.0060
-
b(7)
0.18
0.25
0.30
0.0071
0.010
0.0118
D(8)(9)
D2
5.00 BSC
3.50
E(8)(9)
3.60
0.1969 BSC
3.70
0.139
0.143
5.00 BSC
0.147
0.1969 BSC
E2
3.50
3.60
3.70
0.139
0.143
0.147
e(9)
-
0.50
-
-
0.02
-
N(10)
32
K
0.15
-
-
0.006
-
-
L
0.30
-
0.50
0.0119
-
0.0199
R
0.09
-
-
0.004
-
-
1. All dimensions are in millimeters. Dimensioning and tolerancing schemes are conform to ASME Y14.5M-2018 except
European .
2. Values in inches are converted from mm and rounded to 4 decimal digits.
3. UFQFPN stands for Ultra thin Fine pitch Quad Flat Package No lead: A ≤ 0.60mm / Fine pitch e ≤ 1.00mm.
4. The profile height, A, is the distance from the seating plane to the highest point on the package. It is measured
perpendicular to the seating plane.
5. A1 is the vertical distance from the bottom surface of the plastic body to the nearest metallized package feature.
6. A3 is the distance from the seating plane to the upper surface of the terminals.
7. Dimension b applies to metallized terminal. If the terminal has the optional radius on the other end of the terminal, the
dimension b must not be measured in that radius area.
8. Dimensions D and E do not include mold protrusion, not to exceed 0,15mm.
9. BSC stands for BASIC dimensions. It corresponds to the nominal value and has no tolerance. For tolerances refer to
Table 74
10. N represents the total number of terminals.
Table 74. Tolerance of form and position
Tolerance of form and position(2)
Tolerance of form and position(3)
In millimeters
In inches
aaa
0.15
0.006
bbb
0.10
0.004
ccc
0.10
0.004
ddd
0.05
0.002
eee
0.10
0.004
fff
0.10
0.004
Symbol(1)
1. For the tolerance of form and position definitions see Table 75.
2. All dimensions are in millimetres. Dimensioning and tolerancing schemes are conform to ASME Y14.5M-2018 except
European .
3. Values in inches are converted from mm and rounded to 4 decimal digits.
DS14927 - Rev 1
page 103/130
STM32C562xx
Package information
Table 75. Tolerance of form and position symbol definition
Symbol
Definition
aaa
The bilateral profile tolerance that controls the position of the plastic body sides. The centres of the profile zones are
defined by the basic dimensions D and E.
bbb
The tolerance that controls the position of the terminals with respect to Datums A and B. The centre of the tolerance
zone for each terminal is defined by basic dimension e as related to datums A and B.
ccc
The tolerance located parallel to the seating plane in which the top surface of the package must be located.
ddd
The tolerance that controls the position of the terminals to each other. The centres of the profile zones are defined
by basic dimension e.
eee
The unilateral tolerance located above the seating plane wherein the bottom surface of all terminals must be located
= coplanarity
fff
The tolerance that controls the position of the exposed metal heat feature. The centre of the tolerance zone is the
data defined by the centrelines of the package body
Figure 39. UFQFPN32 - Footprint example
5.50
3.75
0.65
3.60
3.60
0.50
0.25
3.75
A0B8_FP_V2
A0B8_UFQFPN32_FP_V1
3.75
5.50
1. Dimensions are expressed in millimeters.
DS14927 - Rev 1
page 104/130
STM32C562xx
Package information
6.4
LQFP48 package information (5B)
This LQFP is a 48-pins, 7 x 7 mm, low-profile quad flat package.
Note:
See list of notes in the notes section.
Figure 40. LQFP48- Outline(15.)
BOTTOM VIEW
Package LQFP48 (package code 5B)
4x N/4 TIPS
aaa C A-B D
2
1
(2)
R1
R2
O
N
C
TI
(6)
SE
D 1/4
BB
H
B
S
B
bbb H A-B D 4x
3
0.05
A
(13)
(N – 4)x e
A2
A1
(12)
C
ddd
b
(10)
(3) A
(L1)
(1) (11)
SECTION A-A
(4)
D1
D (3)
N
1
2
3
L
ccc C
C A-B D
D
(2) (5)
GAUGE PLANE
0.25
E 1/4
b
(9) (11)
WITH PLATING
E 1/4
D 1/4
B (3)
(6)
c
E1
(2)
(5)
A
(Section A-A)
A
E
c1
(11)
(11)
(4)
b1
(11)
BASE METAL
SECTION B-B
TOP VIEW
DS14927 - Rev 1
page 105/130
STM32C562xx
Package information
Table 76. LQFP48 - Mechanical data
Symbol
inches(14.)
millimeters
Min
Typ
Max
Min
Typ
Max
A
-
-
1.60
-
-
0.0630
A1(12.)
0.05
-
0.15
0.0020
-
0.0059
A2
1.35
1.40
1.45
0.0531
0.0551
0.0571
b(9.)(11.)
0.17
0.22
0.27
0.0067
0.0087
0.0106
b1(11.)
0.17
0.20
0.23
0.0067
0.0079
0.0090
c(11.)
0.09
-
0.20
0.0035
-
0.0079
c1(11.)
0.09
-
0.16
0.0035
-
0.0063
D(4.)
9.00 BSC
0.3543 BSC
D1(4.)(5.)
7.00 BSC
0.2756 BSC
E(4.)
9.00 BSC
0.3543 BSC
E1(4.)(5.)
7.00 BSC
0.2756 BSC
e
0.50 BSC
0.1970 BSC
L
0.45
L1
0.60
0.75
0.0177
1.00 REF
0.0236
0.0295
0.0394 REF
N(13.)
48
θ
0°
3.5°
7°
0°
3.5°
7°
θ1
0°
-
-
0°
-
-
θ2
10°
12°
14°
10°
12°
14°
θ3
10°
12°
14°
10°
12°
14°
R1
0.08
-
-
0.0031
-
-
R2
0.08
-
0.20
0.0031
-
0.0079
S
0.20
-
-
0.0079
-
-
aaa(1.)(7.)
0.20
0.0079
bbb(1.)(7.)
0.20
0.0079
ccc(1.)(7.)
0.08
0.0031
ddd(1.)(7.)
0.08
0.0031
Notes:
1. Dimensioning and tolerancing schemes conform to ASME Y14.5M-1994.
2. The Top package body size may be smaller than the bottom package size by as much as 0.15 mm.
3. Datums A-B and D to be determined at datum plane H.
4. To be determined at seating datum plane C.
5. Dimensions D1 and E1 do not include mold flash or protrusions. Allowable mold flash or protrusions is “0.25
mm” per side. D1 and E1 are Maximum plastic body size dimensions including mold mismatch.
6. Details of pin 1 identifier are optional but must be located within the zone indicated.
7. All Dimensions are in millimeters.
8. No intrusion allowed inwards the leads.
9. Dimension “b” does not include dambar protrusion. Allowable dambar protrusion shall not cause the lead width
to exceed the maximum “b” dimension by more than 0.08 mm. Dambar cannot be located on the lower radius
or the foot. Minimum space between protrusion and an adjacent lead is 0.07 mm for 0.4 mm and 0.5 mm pitch
packages.
DS14927 - Rev 1
page 106/130
STM32C562xx
Package information
10. Exact shape of each corner is optional.
11. These dimensions apply to the flat section of the lead between 0.10 mm and 0.25 mm from the lead tip.
12. A1 is defined as the distance from the seating plane to the lowest point on the package body.
13. “N” is the number of terminal positions for the specified body size.
14. Values in inches are converted from mm and rounded to 4 decimal digits
15. Drawing is not to scale.
Figure 41. LQFP48 - Footprint example
0.50
1.20
36
25
37
24
0.30
0.20
9.70 7.30
48
13
12
1
5.80
9.70
5B_LQFP48_FP_V1
1. Dimensions are expressed in millimeters.
DS14927 - Rev 1
page 107/130
STM32C562xx
Package information
6.5
UFQFPN48 package information (A0B9)
This UFQFPN is a 48-lead, 7 x 7 mm, 0.5 mm pitch, ultra thin fine pitch quad flat package.
Figure 42. UFQFPN48 - Outline
D2
K
fff
fff
M CAB
DETAIL C
M CAB
ddd M C
2xR
14
E2
e
15
C
(see FIG.2)
fff
Terminal 1 idenfier
M CAB
e
BOTTOM VIEW
ccc C
A3
A
SEATING PLANE
eee C
C
FRONT VIEW
D
A
SECTION A-A
B
A1
Terminal 1
Index area
Seating
plane
10
C
9
A
(see FIG.2)
A
aaa C
x4
TOP VIEW
DT_A0B9_UFQFPN48_ME_V4
E
1. Drawing is not to scale.
2. All leads/pads should also be soldered to the PCB to improve the lead/pad solder joint life.
3. There is an exposed die pad on the under side of the UFQFPN48 package. It is recommended to connect and
solder this back-side pad to PCB ground.
DS14927 - Rev 1
page 108/130
STM32C562xx
Package information
Table 77. UFQFPN48 - Mechanical data
Symbol
Inches (1)
Millimeters
Min
Typ
Max
Min
Typ
Max
A
0.50
0.55
0.60
0.0197
0.0217
0.0236
A1
0.00
-
0.05
0.0000
-
0.0020
b
0.18
0.25
0.30
0.0071
0.0098
0.0118
D(2)
D2(3)
7.00 BSC
5.50
E(2)
E2(3)
0.2756 BSC
5.60
5.70
0.2165
0.2205
7.00 BSC
5.50
e
0.2244
0.2756 BSC
5.60
5.70
0.2165
0.2205
0.50 BSC
0.2244
0.0197 BSC
N
48
L
0.30
-
0.50
0.0118
-
0.0197
R
0.10
-
-
0.0039
-
-
aaa
0.15
0.0059
bbb
0.10
0.0039
ccc
0.10
0.0039
ddd
0.05
0.0020
eee
0.08
0.0031
fff
0.10
0.0039
1. Values in inches are converted from mm and rounded to four decimal digits.
2. Dimensions D and E do not include mold protrusion, not exceed 0.15 mm.
3. Dimensions D2 and E2 are not in accordance with JEDEC.
Figure 43. UFQFPN48 - Footprint example
7.30
6.20
48
37
1
36
5.80
6.20
5.60
0.30
12
25
13
0.55
24
0.50
5.80
0.75
DT_A0B9_UFQFPN48_FP_V3
5.60
0.20
7.30
1. Dimensions are expressed in millimeters.
DS14927 - Rev 1
page 109/130
STM32C562xx
Package information
6.6
LQFP64 package information (5W)
This is a 64-pin, 10 x 10 mm low-profile quad flat package.
Figure 44. LQFP64 - Outline(15.)
BOTTOM VIEW
2
1
(2)
R1
R2
SE
C
TI
O
N
B-
B
H
(6)
S
E 1/4
4x N/4 TIPS
aaa C A-B D
3
GAUGE PLANE
0.25
B
D 1/4
B
L
(L1)
(1) (11)
bbb H A-B D 4x
SECTION A-A
(13) (N – 4)x e
C
A
A2 A1
(12)
b
ddd
C A-B D
ccc C
D
(10)
(9) (11)
D (3)
N
(11)
c
D 1/4
B (3)
(6)
A
(Section A-A)
DS14927 - Rev 1
WITH PLATING
(11)
A
c1
(5)
(2)
E1
TOP VIEW
b
(4)
E 1/4
1
2
3
(3) A
(4)
D1
(5) (2)
E
b1
(11)
BASE METAL
SECTION B-B
5W_LQFP64_ME_V1
0.05
page 110/130
STM32C562xx
Package information
Table 78. LQFP64 - Mechanical data
Symbol
inches(14.)
millimeters
Min
Typ
Max
Min
Typ
Max
A
-
-
1.60
-
-
0.0630
A1(12.)
0.05
-
0.15
0.0020
-
0.0059
A2
1.35
1.40
1.45
0.0531
0.0551
0.0571
b(9.)(11.)
0.17
0.22
0.27
0.0067
0.0087
0.0106
b1(11.)
0.17
0.20
0.23
00067
0.0079
0.0091
c(11.)
0.09
-
0.20
0.0035
-
0.0079
c1(11.)
0.09
-
0.16
0.0035
-
0.0063
D(4.)
12.00 BSC
0.4724 BSC
D1(2.)(5.)
10.00 BSC
0.3937 BSC
E(4.)
12.00 BSC
0.4724 BSC
E1(2.)(5.)
10.00 BSC
0.3937 BSC
e
0.50 BSC
0.0197 BSC
L
0.45
L1
0.60
0.75
1.00 REF
0.0236
0.0295
0.0394 REF
N(13.)
DS14927 - Rev 1
0.0177
64
Θ
0°
3.5°
7°
0°
3.5°
7°
Θ1
0°
-
-
0°
-
-
Θ2
10°
12°
14°
10°
12°
14°
Θ3
10°
12°
14°
10°
12°
14°
R1
0.08
-
-
0.0031
-
-
R2
0.08
-
0.20
0.0031
-
0.0079
S
0.20
-
-
0.0079
-
-
aaa(1.)
0.20
0.0079
bbb(1.)
0.20
0.0079
ccc(1.)
0.08
0.0031
ddd(1.)
0.08
0.0031
page 111/130
STM32C562xx
Package information
Notes
1. Dimensioning and tolerancing schemes conform to ASME Y14.5M-1994.
2. The top package body size may be smaller than the bottom package size by as much as 0.15 mm.
3. Datums A-B and D to be determined at datum plane H.
4. To be determined at seating datum plane C.
5. Dimensions D1and E1 do not include mold flash or protrusions. Allowable mold flash or protrusions is “0.25
mm” per side. D1 and E1 are Maximum plastic body size dimensions including mold mismatch.
6. Details of pin 1 identifier are optional but must be located within the zone indicated.
7. All dimensions are in millimeters.
8. No intrusion allowed inwards the leads.
9. Dimension “b” does not include dambar protrusion. Allowable dambar protrusion shall not cause the lead width
to exceed the maximum “b” dimension by more than 0.08 mm. Dambar cannot be located on the lower radius
or the foot. Minimum space between protrusion and an adjacent lead is 0.07 mm for 0.4 mm and 0.5 mm pitch
packages.
10. Exact shape of each corner is optional.
11. These dimensions apply to the flat section of the lead between 0.10 mm and 0.25 mm from the lead tip.
12. A1 is defined as the distance from the seating plane to the lowest point on the package body.
13. N is the number of terminal positions for the specified body size.
14. Values in inches are converted from mm and rounded to 4 decimal digits.
15. Drawing is not to scale.
DS14927 - Rev 1
page 112/130
STM32C562xx
Package information
6.7
LQFP80 package information (9X)
This is a 80-pins, 12 x 12 mm, low-profile quad flat package.
Note:
See list of notes in the notes section.
Figure 45. LQFP80 - Outline(15.)
BOTTOM VIEW
2
1
(2)
R1
SE
C
TI
O
N
B-
B
R2
H
D 1/4
S
(6)
(L1)
E 1/4
bbb H A-B D 4x
e
(13)
C
A
A2 A1(12)
b
ddd
C A-B D
D
(2) (5)
(9) (11)
WITH
PLATING
(4)
D (3)
(11)
N
(4)
E 1/4
D 1/4
(11)
c
c1
b1
(3)
B
(6)
(2)
(5)
A
(Section A-A)
A
(11)
BASE METAL
SECTION B-B
E1
TOP VIEW
b
E
9X_LQFP80_ME_V2
e
1
2
3
(3) A
ccc C
D1
(10)
DS14927 - Rev 1
(1) (11)
SECTION A-A
4x N/4 TIPS
aaa C A-B D
0.05
B
L
3
(N – 4)x
GAUGE PLANE
0.25
B
page 113/130
STM32C562xx
Package information
Table 79. LQFP80 - Mechanical data
Symbol
inches(14.)
millimeters
Min
Typ
Max
Min
Typ
Max
A
-
-
1.60
-
-
0.0630
A1(12.)
0.05
-
0.15
0.0020
-
0.0059
A2
1.35
1.40
1.45
0.0531
0.0551
0.0571
b(9.)(11.)
0.17
0.22
0.27
0.0067
0.0087
0.0106
b1(11.)
0.17
0.20
0.23
00067
0.0079
0.0091
c(11.)
0.09
-
0.20
0.0035
-
0.0079
c1(11.)
0.09
-
0.16
0.0035
-
0.0063
D(4.)
14.00 BSC
0.5512 BSC
D1(2.)(5.)
12.00 BSC
0.4724 BSC
E(4.)
14.00 BSC
0.5512 BSC
E1(2.)(5.)
12.00 BSC
0.4724 BSC
e
0.50 BSC
0.0197 BSC
L
0.45
0.60
0.75
0.0177
0.0236
0.0295
L1
-
1.00
-
-
0.0394
-
N(13.)
DS14927 - Rev 1
80
Θ
0°
3.5°
7°
0°
3.5°
7°
Θ1
0°
-
-
0°
-
-
Θ2
10°
12°
14°
10°
12°
14°
Θ3
10°
12°
14°
10°
12°
14°
R1
0.08
-
-
0.0031
-
-
R2
0.08
-
0.20
0.0031
-
0.0079
S
0.20
-
-
0.0079
-
-
aaa(1.)
0.20
0.0079
bbb(1.)
0.20
0.0079
ccc(1.)
0.08
0.0031
ddd(1.)
0.08
0.0031
page 114/130
STM32C562xx
Package information
Notes
1. Dimensioning and tolerancing schemes conform to ASME Y14.5M-1994.
2. The top package body size may be smaller than the bottom package size by as much as 0.15 mm.
3. Datums A-B and D to be determined at datum plane H.
4. To be determined at seating datum plane C.
5. Dimensions D1and E1 do not include mold flash or protrusions. Allowable mold flash or protrusions is “0.25
mm” per side. D1 and E1 are Maximum plastic body size dimensions including mold mismatch.
6. Details of pin 1 identifier are optional but must be located within the zone indicated.
7. All dimensions are in millimeters.
8. No intrusion allowed inwards the leads.
9. Dimension “b” does not include dambar protrusion. Allowable dambar protrusion shall not cause the lead width
to exceed the maximum “b” dimension by more than 0.08 mm. Dambar cannot be located on the lower radius
or the foot. Minimum space between protrusion and an adjacent lead is 0.07 mm for 0.4 mm and 0.5 mm pitch
packages.
10. Exact shape of each corner is optional.
11. These dimensions apply to the flat section of the lead between 0.10 mm and 0.25 mm from the lead tip.
12. A1 is defined as the distance from the seating plane to the lowest point on the package body.
13. “N” is the number of terminal positions for the specified body size.
14. Values in inches are converted from mm and rounded to 4 decimal digits.
15. Drawing is not to scale.
Figure 46. LQFP80 - Footprint example
1.25
0.3
1.2
9.80
14.70
9X_LQFP80_FP_V1
12.30
14.70
0.5
1. Dimensions are expressed in millimeters.
DS14927 - Rev 1
page 115/130
STM32C562xx
Package information
6.8
LQFP100 package information (1L)
This LQFP is a 100-pin, 14 x 14 mm, low-profile quad flat package.
Note:
See list of notes in the notes section.
Figure 47. LQFP100 - Outline(15.)
Package LQFP100 (Package code 1L)
θ1
θ2
(2)
R1
R2
O
N
B-
B
H
SE
C
TI
(6)
D1/4
B
S
E1/4
L
4x
aaa C A-B D
(L1)
bbb H A-B D
(1) (11)
SECTION A-A
BOTTOM VIEW
(N-4) x e
(13)
C
A
0.05
θ
B
θ3
4x N/4 TIPS
GAUGE PLANE
(9) (11)
b
A2 A1
(12)
aaa
b
ccc C
C A-BD
WITH PLATING
SIDE VIEW
D
D1
(2) (5)
(4)
(11)
D (3)
(10)
c
c1
(4)
N
b1
(11)
1
2
3
E1/4
D1/4
A
(11)
BASE METAL
SECTION B-B
(6)
B
(2)
(5)
E1
E
SECTION A-A
TOP VIEW
DS14927 - Rev 1
A
1L_LQFP100_ME_DT_V5
A
page 116/130
STM32C562xx
Package information
Table 80. LQFP100 - Mechanical data
Symbol
inches(14.)
millimeters
Min
Typ
Max
Min
Typ
Max
A
-
1.50
1.60
-
0.0590
0.0630
A1(12.)
0.05
-
0.15
0.0020
-
0.0059
A2
1.35
1.40
1.45
0.0531
0.0551
0.0571
b(9.)(11.)
0.17
0.22
0.27
0.0067
0.0087
0.0106
b1(11.)
0.17
0.20
0.23
0.0067
0.0079
0.0090
c(11.)
0.09
-
0.20
0.0035
-
0.0079
c1(11.)
0.09
-
0.16
0.0035
-
0.0063
D(4.)
16.00 BSC
0.6299 BSC
D1(2.)(5.)
14.00 BSC
0.5512 BSC
E(4.)
16.00 BSC
0.6299 BSC
E1(2.)(5.)
14.00 BSC
0.5512 BSC
e
0.50 BSC
0.0197 BSC
L
0.45
0.60
0.75
0.0177
0.0236
0.0295
L1(1.)(11.)
-
1.00
-
-
0.0394
-
3.5°
7°
N(13.)
Θ
DS14927 - Rev 1
100
0°
3.5°
7°
0°
Θ1
0°
-
-
0°
-
-
Θ2
10°
12°
14°
10°
12°
14°
Θ3
10°
12°
14°
10°
12°
14°
R1
0.08
-
-
0.0031
-
-
R2
0.08
-
0.20
0.0031
-
0.0079
S
0.20
-
-
0.0079
-
-
aaa(1.)
0.20
0.0079
bbb(1.)
0.20
0.0079
ccc(1.)
0.08
0.0031
ddd(1.)
0.08
0.0031
page 117/130
STM32C562xx
Package information
Notes
1. Dimensioning and tolerancing schemes conform to ASME Y14.5M-1994.
2. The top package body size may be smaller than the bottom package size by as much as 0.15 mm.
3. Datums A-B and D to be determined at datum plane H.
4. To be determined at seating datum plane C.
5. Dimensions D1 and E1 do not include mold flash or protrusions. Allowable mold flash or protrusions is “0.25
mm” per side. D1 and E1 are maximum plastic body size dimensions including mold mismatch.
6. Details of pin 1 identifier are optional but must be located within the zone indicated.
7. All dimensions are in millimeters.
8. No intrusion is allowed inwards the leads.
9. Dimension “b” does not include a dambar protrusion. Allowable dambar protrusion shall not cause the lead
width to exceed the maximum “b” dimension by more than 0.08 mm. Dambar cannot be located on the lower
radius or the foot. The minimum space between the protrusion and an adjacent lead is 0.07 mm for 0.4 mm
and 0.5 mm pitch packages.
10. The exact shape of each corner is optional.
11. These dimensions apply to the flat section of the lead between 0.10 mm and 0.25 mm from the lead tip.
12. A1 is defined as the distance from the seating plane to the lowest point on the package body.
13. “N” is the number of terminal positions for the specified body size.
14. Values in inches are converted from mm and rounded to 4 decimal digits.
15. Drawing is not to scale.
Figure 48. LQFP100 - Footprint example
75
76
51
50
0.5
0.3
14.3
100
26
1
25
12.3
16.7
1L_LQFP100_FP_DT_V1
16.7
1. Dimensions are expressed in millimeters.
DS14927 - Rev 1
page 118/130
STM32C562xx
Package information
6.9
Package thermal characteristics
The maximum chip-junction temperature, TJ max, in degrees Celsius, can be calculated using the following
equation:
T J max = TA max + PD max × Θ JA
Where:
•
TA max is the maximum ambient temperature in °C.
•
ΘJA is the package junction-to-ambient thermal resistance in °C/W.
•
PD max is the sum of PINT max and PI/O max:
PD max = PINT max + PI/O max
•
PINT max is the product of IDD and VDD, expressed in Watts. This is the maximum chip internal power.
PI/O max represents the maximum power dissipation on output pins:
PI/O max =
VOL × IOL +
VDDIOx − VOH
× IOH
taking into account the actual VOL/IOL and VOH/IOH of the I/Os at low and high level in the application.
Table 81. Package thermal characteristics
Symbol
Θ
6.9.1
Thermal Resistance
Parameter
Value
Junction-ambient ΘJA
Junction-board ΘJB
Junction-case ΘJC
LQFP100
39.2
25.1
11.4
LQFP80
42.8
27.1
13.1
LQFP64
44.3
26.6
13.5
LQFP48
51.4
28.7
16.1
LQFP32
51.4
28.7
16.1
UFQFPN48
29.9
14.2
12
UFQFPN32
40.4
22.3
20.5
Unit
°C/W
Reference documents
•
•
DS14927 - Rev 1
Definition
JESD51-2 Integrated Circuits Thermal Test Method Environment Conditions - Natural Convection (Still Air)
available on www.jedec.org.
For information on thermal management, refer to application note "Guidelines for thermal management on
STM32 applications" (AN5036) available on www.st.com.
page 119/130
STM32C562xx
Ordering information
7
Ordering information
Example:
STM32
C
562
K
E
T
6
TR
Device family
STM32 = Arm-based 32-bit microcontroller
Product type
C = General purpose
Device subfamily
562 = STM32C562xx with FDCAN
Pin count
K = 32 pins
C = 48 pins
R = 64 pins
M = 80 pins
V = 100 pins
Flash memory size
E = 512 Kbytes
Package
U = UFQFPN
T = LQFP
Temperature range
6 = Temperature range, -40 to +85 °C (+105 °C junction)
3 = Temperature range, -40 to +125 °C (+140 °C junction)
Packing
TR = Tape and reel
xxx = Programmed parts
Note:
DS14927 - Rev 1
For a list of available options (such as speed and package) or for further information on any aspect of this
device, contact your nearest ST sales office.
page 120/130
STM32C562xx
Ordering information
Important security notice
The STMicroelectronics group of companies (ST) places a high value on product security, which is why the ST
product(s) identified in this documentation may be certified by various security certification bodies and/or may
implement our own security measures as set forth herein. However, no level of security certification and/or built-in
security measures can guarantee that ST products are resistant to all forms of attacks. As such, it is the
responsibility of each of ST's customers to determine if the level of security provided in an ST product meets the
customer needs both in relation to the ST product alone, as well as when combined with other components and/or
software for the customer end product or application. In particular, take note that:
•
•
•
•
•
DS14927 - Rev 1
ST products may have been certified by one or more security certification bodies, such as Platform
Security Architecture (www.psacertified.org) and/or Security Evaluation standard for IoT Platforms
(www.trustcb.com). For details concerning whether the ST product(s) referenced herein have received
security certification along with the level and current status of such certification, either visit the relevant
certification standards website or go to the relevant product page on www.st.com for the most up to date
information. As the status and/or level of security certification for an ST product can change from time to
time, customers should re-check security certification status/level as needed. If an ST product is not shown
to be certified under a particular security standard, customers should not assume it is certified.
Certification bodies have the right to evaluate, grant and revoke security certification in relation to ST
products. These certification bodies are therefore independently responsible for granting or revoking
security certification for an ST product, and ST does not take any responsibility for mistakes, evaluations,
assessments, testing, or other activity carried out by the certification body with respect to any ST product.
Industry-based cryptographic algorithms (such as AES, DES, or MD5) and other open standard
technologies which may be used in conjunction with an ST product are based on standards which were not
developed by ST. ST does not take responsibility for any flaws in such cryptographic algorithms or open
technologies or for any methods which have been or may be developed to bypass, decrypt or crack such
algorithms or technologies.
While robust security testing may be done, no level of certification can absolutely guarantee protections
against all attacks, including, for example, against advanced attacks which have not been tested for,
against new or unidentified forms of attack, or against any form of attack when using an ST product outside
of its specification or intended use, or in conjunction with other components or software which are used by
customer to create their end product or application. ST is not responsible for resistance against such
attacks. As such, regardless of the incorporated security features and/or any information or support that
may be provided by ST, each customer is solely responsible for determining if the level of attacks tested for
meets their needs, both in relation to the ST product alone and when incorporated into a customer end
product or application.
All security features of ST products (inclusive of any hardware, software, documentation, and the like),
including but not limited to any enhanced security features added by ST, are provided on an "AS IS"
BASIS. AS SUCH, TO THE EXTENT PERMITTED BY APPLICABLE LAW, ST DISCLAIMS ALL
WARRANTIES, EXPRESS OR IMPLIED, INCLUDING BUT NOT LIMITED TO THE IMPLIED
WARRANTIES OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE, unless the
applicable written and signed contract terms specifically provide otherwise.
page 121/130
STM32C562xx
Revision history
Table 82. Document revision history
DS14927 - Rev 1
Date
Revision
18-Feb-2026
1
Changes
Initial release.
page 122/130
STM32C562xx
Contents
Contents
1
Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3
2
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4
3
Functional overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
3.1
Arm® Cortex®-M33 with FPU. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
3.2
Instruction cache (ICACHE). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
3.3
Memory protection unit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
3.4
Memories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
3.4.1
Embedded flash memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
3.4.2
Embedded SRAMs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.5
Boot modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.6
Power supply management . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.6.1
Power supply schemes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
3.6.2
Power supply supervisor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
3.6.3
Low-power modes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
3.6.4
Reset mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
3.7
Peripheral interconnect matrix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
3.8
Reset and clock controller (RCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.9
Clock recovery system (CRS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.10
General-purpose inputs/outputs (GPIOs). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.11
Multi-AHB bus matrix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.12
Low-power direct memory access controller (LPDMA). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
3.13
Interrupts and events . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
3.13.1
Nested vectored interrupt controller (NVIC). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
3.13.2
Extended interrupt and event controller (EXTI) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
3.14
Cyclic redundancy check calculation unit (CRC). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
3.15
Analog-to-digital converter (ADC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
3.15.1
Analog temperature sensor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
3.15.2
Internal voltage reference (VREFINT) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
3.16
Digital to analog converter (DAC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
3.17
Low-power comparator (COMP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
3.18
True random number generator (RNG) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
3.19
AES hardware accelerator (AES) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
3.20
HASH processor (HASH) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
3.21
Timers and watchdogs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
3.21.1
DS14927 - Rev 1
Advanced-control timers (TIM1/TIM8) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
page 123/130
STM32C562xx
Contents
3.22
4
5
3.21.2
General-purpose timers (TIM2/TIM5/TIM12/TIM15/TIM16/TIM17) . . . . . . . . . . . . . . . . . . 22
3.21.3
Basic timers (TIM6/TIM7) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
3.21.4
Low-power timers (LPTIM1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
3.21.5
Independent watchdog (IWDG) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
3.21.6
Window watchdog (WWDG) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
3.21.7
SysTick timer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Real-time clock (RTC), tamper and backup registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
3.22.1
Real-time clock (RTC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
3.22.2
Tamper and backup registers (TAMP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
3.23
Inter-integrated circuit interface (I2C) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
3.24
Improved inter-integrated circuit interface (I3C) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
3.25
Universal synchronous/asynchronous receiver transmitter (USART/UART) and lowpower universal asynchronous receiver transmitter (LPUART) . . . . . . . . . . . . . . . . . . . . . . . . 29
3.25.1
Universal synchronous/asynchronous receiver transmitter (USART/UART) . . . . . . . . . . . 29
3.25.2
Low-power universal asynchronous receiver transmitter (LPUART) . . . . . . . . . . . . . . . . . 30
3.26
Serial peripheral interface (SPI)/Inter-integrated sound interfaces (I2S) . . . . . . . . . . . . . . . . 31
3.27
Controller area network (FDCAN) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
3.28
Universal serial bus full-speed host/device interface (USB) . . . . . . . . . . . . . . . . . . . . . . . . . . 33
3.29
Development support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
3.29.1
Serial-wire/JTAG debug port (SWJ-DP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
3.29.2
Embedded Trace Macrocell™ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Pinouts/ballouts, pin description, and alternate functions . . . . . . . . . . . . . . . . . . . . . . . . .35
4.1
Pinout/ballout schematics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
4.2
Pin description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
4.3
Alternate functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
Electrical characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .51
5.1
Parameter conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
5.1.1
Minimum and maximum values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
5.1.2
Typical values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
5.1.3
Typical curves . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
5.1.4
Loading capacitor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
5.1.5
Pin input voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
5.1.6
Power supply scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52
5.2
Absolute maximum ratings. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
5.3
Operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
DS14927 - Rev 1
5.3.1
General operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
5.3.2
Operating conditions at power-up/power-down . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
page 124/130
STM32C562xx
Contents
6
5.3.3
Embedded reset and power control block characteristics . . . . . . . . . . . . . . . . . . . . . . . . . 55
5.3.4
Inrush current and inrush electric charge characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 55
5.3.5
Embedded voltage reference . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
5.3.6
Supply current characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
5.3.7
Wake-up time from low-power modes and voltage scaling transition times . . . . . . . . . . . . 61
5.3.8
External clock timing characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
5.3.9
Internal clock timing characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66
5.3.10
Flash memory characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70
5.3.11
EMC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71
5.3.12
Electrical sensitivity characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72
5.3.13
I/O current injection characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73
5.3.14
I/O port characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
5.3.15
NRST pin characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78
5.3.16
Extended interrupt and event controller input (EXTI) characteristics . . . . . . . . . . . . . . . . . 79
5.3.17
12-bit analog-to-digital converter ADC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79
5.3.18
Temperature sensor characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84
5.3.19
Digital-to-analog converter characteristics (DAC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84
5.3.20
Comparator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 87
5.3.21
Timer characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88
5.3.22
I3C interface characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89
5.3.23
I²C interface characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
5.3.24
USART characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
5.3.25
SPI characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 92
5.3.26
I2S interface characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94
5.3.27
USB_FS characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95
5.3.28
JTAG/SWD interface characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95
Package information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .98
6.1
Device marking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 98
6.2
LQFP32 package information (5V) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99
6.3
UFQFPN32 package information (A0B8) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 102
6.4
LQFP48 package information (5B) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 105
6.5
UFQFPN48 package information (A0B9) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108
6.6
LQFP64 package information (5W). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110
6.7
LQFP80 package information (9X) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 113
6.8
LQFP100 package information (1L) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116
6.9
Package thermal characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119
6.9.1
DS14927 - Rev 1
Reference documents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119
page 125/130
STM32C562xx
Contents
7
Ordering information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120
Important security notice . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 122
List of tables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 127
List of figures. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 129
DS14927 - Rev 1
page 126/130
STM32C562xx
List of tables
List of tables
Table 1.
Table 2.
Table 3.
Table 4.
Table 5.
Table 6.
Table 7.
Table 8.
Device features and peripheral counts . . . . . . . . . . . . . . . . . . . . . . . . . . .
LPDMA1 channels implementation and usage . . . . . . . . . . . . . . . . . . . . . .
LPDMA2 channels implementation and usage . . . . . . . . . . . . . . . . . . . . . .
LPDMA1 and LPDMA2 autonomous mode and wake-up in low-power modes
ADC features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AES features. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Timer feature comparison . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I2C implementation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
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. 4
13
14
14
17
19
21
25
Table 9.
Table 10.
Table 11.
Table 12.
Table 13.
Table 14.
Table 15.
Table 16.
Table 17.
Table 18.
Table 19.
Table 20.
Table 21.
Table 22.
Table 23.
Table 24.
Table 25.
Table 26.
Table 27.
Table 28.
Table 29.
Table 30.
Table 31.
Table 32.
Table 33.
Table 34.
Table 35.
Table 36.
Table 37.
Table 38.
Table 39.
Table 40.
Table 41.
Table 42.
Table 43.
Table 44.
Table 45.
Table 46.
Table 47.
Table 48.
Table 49.
Table 50.
Table 51.
Table 52.
I3C peripheral controller/target features versus MIPI® v1.1 . . . . . . . . . . . . . . . . . . . . . . . . . . .
USART, UART, and LPUART features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SPI features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Legend/abbreviations used in the pinout table . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
STM32C562xx pin/ball definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Alternate functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltage characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Current characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Thermal characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
General operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating conditions at power-up/power-down. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Embedded reset and power control block characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Embedded internal voltage reference . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Embedded internal voltage reference . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Internal reference voltage calibration values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Typical and maximum current consumption in Run mode . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Typical current consumption in Run mode with CoreMark running from flash memory and SRAM .
Typical and maximum current consumption in Sleep mode . . . . . . . . . . . . . . . . . . . . . . . . . . .
Typical and maximum current consumption in Stop mode . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Typical and maximum HSIKERON current consumption in Stop mode . . . . . . . . . . . . . . . . . . .
Typical and maximum current consumption in Standby mode . . . . . . . . . . . . . . . . . . . . . . . . .
Peripheral current consumption measured in Sleep mode . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Wake-up time from low-power modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Wake-up time using USART/LPUART. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
High-speed external user clock characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Low-speed external user clock characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
4-50 MHz HSE oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LSE oscillator characteristics (fLSE = 32.768 kHz). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
HSI144 oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
PSI oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LSI oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Flash memory characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Flash memory programming . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Flash memory user and EDATA endurance and data retention. . . . . . . . . . . . . . . . . . . . . . . . .
EMS characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
EMI characteristics for fHSE = 16 MHz and fHCLK = 144 MHz . . . . . . . . . . . . . . . . . . . . . . . . . .
ESD absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Electrical sensitivities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I/O current injection susceptibility . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I/O static characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output voltage characteristics (all I/Os except PC14 and PC15). . . . . . . . . . . . . . . . . . . . . . . .
Output voltage characteristics for PC14 and PC15 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output AC characteristics (all I/Os except PC13) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
NRST pin characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
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28
29
31
39
40
48
53
53
54
54
55
55
55
56
56
57
57
57
58
58
58
59
61
61
61
63
64
65
66
68
70
70
70
70
71
72
72
72
73
74
76
76
77
78
DS14927 - Rev 1
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page 127/130
STM32C562xx
List of tables
Table 53.
Table 54.
Table 55.
Table 56.
Table 57.
Table 58.
Table 59.
Table 60.
Table 61.
Table 62.
Table 63.
Table 64.
Table 65.
Table 66.
Table 67.
Table 68.
Table 69.
Table 70.
Table 71.
Table 72.
Table 73.
Table 74.
Table 75.
Table 76.
Table 77.
Table 78.
Table 79.
Table 80.
Table 81.
Table 82.
EXTI input characteristics . . . . . . . . . . . . . . . . . .
12-bit ADC characteristics. . . . . . . . . . . . . . . . . .
12-bit ADC accuracy . . . . . . . . . . . . . . . . . . . . .
Temperature sensor characteristics . . . . . . . . . . .
Temperature sensor calibration values . . . . . . . . .
DAC characteristics . . . . . . . . . . . . . . . . . . . . . .
DAC accuracy . . . . . . . . . . . . . . . . . . . . . . . . . .
COMP characteristics. . . . . . . . . . . . . . . . . . . . .
TIMx characteristics . . . . . . . . . . . . . . . . . . . . . .
IWDG min/max timeout period at 32 kHz (LSI) . . . .
WWDG min/max timeout value at 144 MHz (PCLK)
Open drain timing measurements. . . . . . . . . . . . .
I²C analog filter characteristics. . . . . . . . . . . . . . .
USART (SPI mode) characteristics. . . . . . . . . . . .
SPI characteristics . . . . . . . . . . . . . . . . . . . . . . .
I2S characteristics . . . . . . . . . . . . . . . . . . . . . . .
USB_FS characteristics . . . . . . . . . . . . . . . . . . .
JTAG characteristics . . . . . . . . . . . . . . . . . . . . .
SWD characteristics . . . . . . . . . . . . . . . . . . . . . .
LQFP32 - Mechanical data . . . . . . . . . . . . . . . . .
UFQFPN32 - Mechanical data . . . . . . . . . . . . . . .
Tolerance of form and position . . . . . . . . . . . . . . .
Tolerance of form and position symbol definition . .
LQFP48 - Mechanical data . . . . . . . . . . . . . . . . .
UFQFPN48 - Mechanical data . . . . . . . . . . . . . . .
LQFP64 - Mechanical data . . . . . . . . . . . . . . . . .
LQFP80 - Mechanical data . . . . . . . . . . . . . . . . .
LQFP100 - Mechanical data . . . . . . . . . . . . . . . .
Package thermal characteristics. . . . . . . . . . . . . .
Document revision history . . . . . . . . . . . . . . . . . .
DS14927 - Rev 1
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. 79
. 79
. 80
. 84
. 84
. 84
. 87
. 87
. 88
. 89
. 89
. 89
. 90
. 90
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. 95
. 95
. 96
. 96
100
103
103
104
106
109
.111
.114
.117
.119
122
page 128/130
STM32C562xx
List of figures
List of figures
Figure 1.
Figure 2.
Figure 3.
Figure 4.
Figure 5.
Figure 6.
Figure 7.
Figure 8.
Figure 9.
Figure 10.
Figure 11.
Figure 12.
Figure 13.
Figure 14.
Figure 15.
Figure 16.
Figure 17.
Figure 18.
Figure 19.
Figure 20.
Figure 21.
Figure 22.
Figure 23.
Figure 24.
Figure 25.
Figure 26.
Figure 27.
Figure 28.
Figure 29.
Figure 30.
Figure 31.
Figure 32.
Figure 33.
Figure 34.
Figure 35.
Figure 36.
Figure 37.
Figure 38.
Figure 39.
STM32C562xx block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
STM32C562xx power supply overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LQFP32 pinout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
UFQFPN32 pinout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LQFP48 pinout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
UFQFPN48 pinout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LQFP64 pinout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LQFP80 pinout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LQFP100 pinout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Pin loading conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Pin input voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
STM32C562xx power supply scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AC timing diagram for high-speed external clock source (digital mode) . . . . . . . . . . . . . . . . . . .
AC timing diagram for high-speed external clock source (analog mode) . . . . . . . . . . . . . . . . . . .
Low-speed external clock source AC timing diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Typical application with a 8 MHz crystal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Typical application with a 32.768 kHz crystal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
HSI frequency versus temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I/O input characteristics (all I/Os) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output AC characteristics definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Recommended NRST pin protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Minimum sampling time versus RAIN for 12 bits resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Minimum sampling time versus RAIN for 10 bits resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Minimum sampling time versus RAIN for 8 bits resolution. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Minimum sampling time versus RAIN for 6 bits resolution. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
ADC accuracy characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Typical connection diagram when using the ADC with FT/TT pins featuring analog switch function
12-bit buffered/non-buffered DAC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
USART timing diagram in SPI master mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
USART timing diagram in SPI slave mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SPI timing diagram - slave mode and CPHA = 0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SPI timing diagram - slave mode and CPHA = 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SPI timing diagram - master mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
JTAG timing diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SWD timing diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LQFP32- Outline. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LQFP32 - Footprint example . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
UFQFPN32 - Outline . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
UFQFPN32 - Footprint example . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
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.. 6
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101
102
104
Figure 40.
Figure 41.
Figure 42.
Figure 43.
LQFP48- Outline(15.) . . . . . . . .
LQFP48 - Footprint example . .
UFQFPN48 - Outline . . . . . . . .
UFQFPN48 - Footprint example
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105
107
108
109
Figure 44.
LQFP64 - Outline(15.). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .110
Figure 45.
Figure 46.
LQFP80 - Outline(15.). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .113
LQFP80 - Footprint example . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .115
Figure 47.
Figure 48.
LQFP100 - Outline(15.) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .116
LQFP100 - Footprint example. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .118
DS14927 - Rev 1
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page 129/130
STM32C562xx
IMPORTANT NOTICE – READ CAREFULLY
STMicroelectronics NV and its subsidiaries (“ST”) reserve the right to make changes, corrections, enhancements, modifications, and improvements to ST
products and/or to this document at any time without notice.
In the event of any conflict between the provisions of this document and the provisions of any contractual arrangement in force between the purchasers and
ST, the provisions of such contractual arrangement shall prevail.
The purchasers should obtain the latest relevant information on ST products before placing orders. ST products are sold pursuant to ST’s terms and
conditions of sale in place at the time of order acknowledgment.
The purchasers are solely responsible for the choice, selection, and use of ST products and ST assumes no liability for application assistance or the design of
the purchasers’ products.
No license, express or implied, to any intellectual property right is granted by ST herein.
Resale of ST products with provisions different from the information set forth herein shall void any warranty granted by ST for such product.
If the purchasers identify an ST product that meets their functional and performance requirements but that is not designated for the purchasers' market
segment, the purchasers shall contact ST for more information.
ST and the ST logo are trademarks of ST. For additional information about ST trademarks, refer to www.st.com/trademarks. All other product or service names
are the property of their respective owners.
Information in this document supersedes and replaces information previously supplied in any prior versions of this document.
© 2026 STMicroelectronics – All rights reserved
DS14927 - Rev 1
page 130/130