STP35N65DM2
N-channel 650 V, 0.093 Ω typ., 32 A MDmesh™ DM2
Power MOSFET in a TO-220 package
Datasheet - production data
Features
Order code
VDS
RDS(on)
max.
ID
PTOT
STP35N65DM2
650
V
0.110 Ω
32
A
250
W
TAB
1
2
3
TO-220
Figure 1: Internal schematic diagram
Fast-recovery body diode
Extremely low gate charge and input
capacitance
Low on-resistance
100% avalanche tested
Extremely high dv/dt ruggedness
Zener-protected
Applications
Switching applications
Description
This high voltage N-channel Power MOSFET is
part of the MDmesh™ DM2 fast recovery diode
series. It offers very low recovery charge (Qrr)
and time (trr) combined with low RDS(on), rendering
it suitable for the most demanding high efficiency
converters and ideal for bridge topologies and
ZVS phase-shift converters.
Table 1: Device summary
Order code
Marking
Package
Packing
STP35N65DM2
35N65DM2
TO-220
Tube
December 2017
DocID030872 Rev 2
This is information on a product in full production.
1/13
www.st.com
Contents
STP35N65DM2
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 8
4
Package information ....................................................................... 9
4.1
5
2/13
TO-220 type A package information................................................ 10
Revision history ............................................................................ 12
DocID030872 Rev 2
STP35N65DM2
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
Value
Unit
Gate-source voltage
±25
V
Drain current (continuous) at Tcase = 25 °C
32
Drain current (continuous) at Tcase = 100 °C
20
IDM(1)
Drain current (pulsed)
90
A
PTOT
W
VGS
ID
Parameter
Total dissipation at Tcase = 25 °C
250
dv/dt(2)
Peak diode recovery voltage slope
50
dv/dt(3)
MOSFET dv/dt ruggedness
50
Tstg
Storage temperature range
Tj
Operating junction temperature range
A
V/ns
-55 to 150
°C
Notes:
(1)Pulse
(2)I
SD
(3)V
width is limited by safe operating area.
≤ 32 A, di/dt=900 A/μs, VDS peak < V(BR)DSS, VDD = 80% V(BR)DSS
DS
≤ 520 V
Table 3: Thermal data
Symbol
Parameter
Value
Rthj-case
Thermal resistance junction-case
0.5
Rthj-amb
Thermal resistance junction-ambient
62.5
Unit
°C/W
Table 4: Avalanche characteristics
Symbol
IAR
EAS(1)
Parameter
Avalanche current, repetitive or non-repetitive
Single pulse avalanche energy
Value
Unit
4
A
1150
mJ
Notes:
(1)Starting
Tj = 25 °C, ID = IAR, VDD = 50 V.
DocID030872 Rev 2
3/13
Electrical characteristics
2
STP35N65DM2
Electrical characteristics
(Tcase = 25 °C unless otherwise specified)
Table 5: Static
Symbol
Parameter
Test conditions
V(BR)DSS
Drain-source breakdown
voltage
VGS = 0 V, ID = 1 mA
Min.
Typ.
Max.
650
Unit
V
VGS = 0 V, VDS = 650 V
1
VGS = 0 V, VDS = 650 V,
Tcase = 125 °C(1)
100
Gate-body leakage
current
VDS = 0 V, VGS = ±25 V
±5
µA
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 250 µA
4
5
V
RDS(on)
Static drain-source onresistance
VGS = 10 V, ID = 16 A
0.093
0.110
Ω
Min.
Typ.
Max.
Unit
-
2540
-
-
115
-
-
2.5
-
IDSS
Zero gate voltage drain
current
IGSS
3
µA
Notes:
(1)Defined
by design, not subject to production test.
Table 6: Dynamic
Symbol
Parameter
Test conditions
Ciss
Input capacitance
Coss
Output capacitance
Crss
Reverse transfer
capacitance
Coss eq.(1)
Equivalent output
capacitance
VDS = 0 to 520 V, VGS = 0 V
-
204
-
pF
RG
Intrinsic gate resistance
f = 1 MHz, ID = 0 A
-
4.2
-
Ω
Qg
Total gate charge
-
56.3
-
Qgs
Gate-source charge
-
12.7
-
Qgd
Gate-drain charge
VDD = 520 V, ID = 32 A, VGS = 0
to 10 V (see Figure 15: "Test
circuit for gate charge behavior")
-
27.6
-
VDS = 100 V, f = 1 MHz,
VGS = 0 V
pF
nC
Notes:
(1)C
oss eq.
is defined as a constant equivalent capacitance giving the same charging time as C oss when VDS
increases from 0 to 80% VDSS.
Table 7: Switching times
Symbol
td(on)
tr
td(off)
tf
4/13
Parameter
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Test conditions
Min.
Typ.
Max.
VDD = 325 V, ID = 16 A, RG = 4.7 Ω,
VGS = 10 V (see Figure 14: "Test
circuit for resistive load switching
times" and Figure 19: "Switching
time waveform")
-
23.4
-
-
23
-
-
72
-
-
10.4
-
DocID030872 Rev 2
Unit
ns
STP35N65DM2
Electrical characteristics
Table 8: Source-drain diode
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
ISD
Source-drain current
-
32
A
ISDM(1)
Source-drain current
(pulsed)
-
90
A
VSD(2)
Forward on voltage
-
1.6
V
trr
VGS = 0 V, ISD = 32 A
Reverse recovery time
Qrr
Reverse recovery
charge
IRRM
Reverse recovery
current
ISD = 32 A, di/dt = 100 A/µs,
VDD = 60 V (see Figure 16: "Test
circuit for inductive load switching
and diode recovery times")
trr
Reverse recovery time
Qrr
Reverse recovery
charge
IRRM
Reverse recovery
current
ISD = 32 A, di/dt = 100 A/µs,
VDD = 60 V, Tj = 150 °C (see
Figure 16: "Test circuit for
inductive load switching and diode
recovery times")
-
100
ns
-
0.42
µC
-
8.4
A
-
205
ns
-
1.8
µC
-
17.6
A
Notes:
(1)Pulse
width is limited by safe operating area.
(2)Pulse
test: pulse duration = 300 µs, duty cycle 1.5%
DocID030872 Rev 2
5/13
Electrical characteristics
2.1
STP35N65DM2
Electrical characteristics (curves)
Figure 2: Safe operating area
Figure 3: Thermal impedance
Figure 4: Output characteristics
Figure 5: Transfer characteristics
Figure 6: Gate charge vs gate-source voltage
Figure 7: Static drain-source on-resistance
6/13
DocID030872 Rev 2
STP35N65DM2
Electrical characteristics
Figure 8: Capacitance variations
Figure 9: Normalized gate threshold voltage vs
temperature
Figure 10: Normalized on-resistance vs temperature
Figure 11: Normalized V(BR)DSS vs temperature
Figure 12: Output capacitance stored energy
Figure 13: Source- drain diode forward
characteristics
DocID030872 Rev 2
7/13
Test circuits
3
8/13
STP35N65DM2
Test circuits
Figure 14: Test circuit for resistive load
switching times
Figure 15: Test circuit for gate charge
behavior
Figure 16: Test circuit for inductive load
switching and diode recovery times
Figure 17: Unclamped inductive load test
circuit
Figure 18: Unclamped inductive waveform
Figure 19: Switching time waveform
DocID030872 Rev 2
STP35N65DM2
4
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK ®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
DocID030872 Rev 2
9/13
Package information
4.1
STP35N65DM2
TO-220 type A package information
Figure 20: TO-220 type A package outline
10/13
DocID030872 Rev 2
STP35N65DM2
Package information
Table 9: TO-220 type A package mechanical data
mm
Dim.
Min.
Typ.
Max.
A
4.40
4.60
b
0.61
0.88
b1
1.14
1.55
c
0.48
0.70
D
15.25
15.75
D1
1.27
E
10.00
10.40
e
2.40
2.70
e1
4.95
5.15
F
1.23
1.32
H1
6.20
6.60
J1
2.40
2.72
L
13.00
14.00
L1
3.50
3.93
L20
16.40
L30
28.90
øP
3.75
3.85
Q
2.65
2.95
DocID030872 Rev 2
11/13
Revision history
5
STP35N65DM2
Revision history
Table 10: Document revision history
Date
Revisi
on
21-Jul-2017
1
Initial release
2
Document status changed from preliminary to production data.
Updated Table 2: "Absolute maximum ratings" and Table 8: "Sourcedrain diode".
Updated Figure 2: "Safe operating area" .
Minor text changes.
6-Dec-2017
12/13
Changes
DocID030872 Rev 2
STP35N65DM2
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DocID030872 Rev 2
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