STP4N90K5
N-channel 900 V, 1.90 Ω typ.,3 A MDmesh™ K5
Power MOSFET in a TO-220 package
Datasheet - production data
Features
TAB
1
2
3
TO-220
Order code
VDS
RDS(on) max.
ID
STP4N90K5
900 V
2.10 Ω
3A
Industry’s lowest RDS(on) x area
Industry’s best FoM (figure of merit)
Ultra-low gate charge
100% avalanche tested
Zener-protected
Applications
Figure 1: Internal schematic diagram
Switching applications
Description
This very high voltage N-channel Power
MOSFET is designed using MDmesh™ K5
technology based on an innovative proprietary
vertical structure. The result is a dramatic
reduction in on-resistance and ultra-low gate
charge for applications requiring superior power
density and high efficiency.
Table 1: Device summary
Order code
Marking
Package
Packing
STP4N90K5
4N90K5
TO-220
Tube
November 2016
DocID029953 Rev 1
This is information on a product in full production.
1/13
www.st.com
Contents
STP4N90K5
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 8
4
Package information ....................................................................... 9
4.1
5
2/13
TO-220 package information ........................................................... 10
Revision history ............................................................................ 12
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STP4N90K5
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
Parameter
VGS
Gate-source voltage
Value
Unit
± 30
V
ID
Drain current (continuous) at TC = 25 °C
3
A
ID
Drain current (continuous) at TC = 100 °C
1.9
A
Drain current (pulsed)
12
A
W
ID(1)
PTOT
Total dissipation at TC = 25 °C
60
dv/dt
(2)
Peak diode recovery voltage slope
4.5
dv/dt
(3)
MOSFET dv/dt ruggedness
50
Tj
Operating junction temperature range
Tstg
Storage temperature range
V/ns
- 55 to 150
°C
Notes:
(1)Pulse
(2)I
SD
(3)V
width limited by safe operating area
≤ 3 A, di/dt ≤ 100 A/μs; VDS peak < V(BR)DSS, VDD = 450 V.
DS
≤ 720 V
Table 3: Thermal data
Symbol
Parameter
Value
Unit
Rthj-case
Thermal resistance junction-case
2.08
°C/W
Rthj-amb
Thermal resistance junction-ambient
62.5
°C/W
Table 4: Avalanche characteristics
Symbol
Parameter
Value
Unit
IAR
Avalanche current, repetitive or not repetitive (pulse width limited by T jmax)
1
A
EAS
Single pulse avalanche energy (starting Tj = 25 °C, ID = IAR, VDD = 50 V)
160
mJ
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Electrical characteristics
2
STP4N90K5
Electrical characteristics
TC = 25 °C unless otherwise specified
Table 5: On/off-state
Symbol
V(BR)DSS
Parameter
Drain-source breakdown voltage
Test conditions
Min.
VGS = 0 V, ID = 1 mA
900
Typ.
Max.
Unit
V
VGS = 0 V, VDS = 900 V
1
µA
IDSS
Zero gate voltage drain current
VGS = 0 V, VDS = 900 V
TC = 125 °C(1)
50
µA
IGSS
Gate body leakage current
VDS = 0 V, VGS = ±20 V
±10
µA
VGS(th)
Gate threshold voltage
VDD = VGS, ID = 100 µA
4
5
V
RDS(on)
Static drain-source on-resistance
VGS = 10 V, ID = 1.5 A
1.90
2.10
Ω
Min.
Typ.
Max.
Unit
-
173
-
pF
-
17.9
-
pF
-
1
-
pF
-
29
-
pF
-
11
-
pF
3
Notes:
(1)
Defined by design, not subject to production test.
Table 6: Dynamic
Symbol
Ciss
Parameter
Test conditions
Input capacitance
VDS = 100 V, f = 1 MHz,
VGS = 0 V
Coss
Output capacitance
Crss
Reverse transfer capacitance
Co(tr)(1)
Equivalent capacitance time
related
Co(er)(2)
Equivalent capacitance energy
related
VDS = 0 to 720 V,
VGS = 0 V
Rg
Intrinsic gate resistance
f = 1 MHz, ID = 0 A
-
15.5
-
Ω
Qg
Total gate charge
-
5.3
-
nC
Qgs
Gate-source charge
-
1.45
-
nC
Qgd
Gate-drain charge
VDD = 720 V, ID = 3 A
VGS= 10 V
(see Figure 15: "Test
circuit for gate charge
behavior")
-
2.8
-
nC
Notes:
(1)
Time related is defined as a constant equivalent capacitance giving the same charging time as C oss when VDS
increases from 0 to 80% VDSS.
(2)
Energy related is defined as a constant equivalent capacitance giving the same stored energy as Coss when
VDS increases from 0 to 80% VDSS.
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STP4N90K5
Electrical characteristics
Table 7: Switching times
Symbol
td(on)
Parameter
Test conditions
Turn-on delay time
tr
VDD= 450 V, ID = 1.50 A,
RG = 4.7 Ω, VGS = 10 V
(see Figure 14: "Test circuit for
resistive load switching times"
and Figure 19: "Switching time
waveform")
Rise time
td(off)
Turn-off delay time
tf
Fall time
Min.
Typ.
Max.
Unit
-
10.5
-
ns
-
11.8
-
ns
-
26.4
-
ns
-
25.5
-
ns
Min.
Typ.
Max.
Unit
Table 8: Source-drain diode
Symbol
Parameter
Test conditions
ISD
Source-drain current
-
3
A
ISDM(1)
Source-drain current
(pulsed)
-
12
A
VSD(2)
Forward on voltage
-
1.5
V
ISD = 3 A, VGS = 0 V
trr
Reverse recovery time
Qrr
Reverrse recovery
charge
IRRM
Reverse recovery
current
trr
Reverse recovery time
Qrr
Reverse recovery
charge
IRRM
Reverse recovery
current
ISD = 3 A, di/dt = 100 A/µs,VDD =
60 V
(see Figure 16: "Test circuit for
inductive load switching and
diode recovery times")
ISD = 3 A, di/dt = 100 A/µs VDD =
60 V, Tj = 150 °C
(see Figure 16: "Test circuit for
inductive load switching and
diode recovery times")
-
289
ns
-
1.56
µC
-
10.8
A
-
494
ns
-
2.45
µC
-
9.9
A
Min.
Typ.
Max.
Unit
30
-
-
V
Notes:
(1)Pulse
width limited by safe operating area
(2)Pulsed:
pulse duration = 300 µs, duty cycle 1.5%
Table 9: Gate-source Zener diode
Symbol
V(BR)GSO
Parameter
Gate-source breakdown voltage
Test conditions
IGS = ± 1 mA,ID = 0 A
The built-in back-to-back Zener diodes are specifically designed to enhance the ESD
performance of the device. The Zener voltage facilitates efficient and cost-effective device
integrity protection, thus eliminating the need for additional external componentry.
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Electrical characteristics
2.1
STP4N90K5
Electrical characteristics (curves)
Figure 3: Thermal impedance
Figure 2: Safe operating area
CG20930
K
δ = 0.5
δ = 0.2
δ = 0.1
-1
10
Z
Zthth == kk R
Rthj-C
thj-C
δδ == ttp // Ƭ
Ƭ
p
δ = 0.05
δ = 0.02
δ = 0.01
tp
SINGLE PULSE
10-2
10-5
10-4
10-3
10-2
ƬƬ
10-1
tp(s)
Figure 4: Output characteristics
Figure 5: Transfer characteristics
Figure 6: Gate charge vs gate-source voltage
Figure 7: Static drain-source on-resistance
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STP4N90K5
Electrical characteristics
Figure 8: Capacitance variations
Figure 10: Normalized on-resistance vs temperature
Figure 12: Maximum avalanche energy vs starting TJ
Figure 9: Normalized gate threshold voltage vs
temperature
Figure 11: Normalized V(BR)DSS vs temperature
Figure 13: Source-drain diode forward
characteristics
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7/13
Test circuits
3
STP4N90K5
Test circuits
Figure 14: Test circuit for resistive load
switching times
Figure 15: Test circuit for gate charge
behavior
VDD
RL
IG= CONST
VGS
+
pulse width
2200
μF
100 Ω
D.U.T.
2.7 kΩ
VG
47 kΩ
1 kΩ
AM01469v10
Figure 16: Test circuit for inductive load
switching and diode recovery times
Figure 17: Unclamped inductive load test
circuit
Figure 18: Unclamped inductive waveform
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DocID029953 Rev 1
Figure 19: Switching time waveform
STP4N90K5
4
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK ®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
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Package information
4.1
STP4N90K5
TO-220 package information
Figure 20: TO-220 type A package outline
10/13
DocID029953 Rev 1
STP4N90K5
Package information
Table 10: TO-220 type A mechanical data
mm
Dim.
Min.
Typ.
Max.
A
4.40
4.60
b
0.61
0.88
b1
1.14
1.55
c
0.48
0.70
D
15.25
15.75
D1
1.27
E
10.00
10.40
e
2.40
2.70
e1
4.95
5.15
F
1.23
1.32
H1
6.20
6.60
J1
2.40
2.72
L
13.00
14.00
L1
3.50
3.93
L20
16.40
L30
28.90
øP
3.75
3.85
Q
2.65
2.95
DocID029953 Rev 1
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Revision history
5
STP4N90K5
Revision history
Table 11: Document revision history
12/13
Date
Revision
02-Nov-2016
1
DocID029953 Rev 1
Changes
First release.
STP4N90K5
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