STTS424BDN3F

STTS424BDN3F

  • 厂商:

    STMICROELECTRONICS(意法半导体)

  • 封装:

    WFDFN8_EP

  • 描述:

    IC MEMORY MOD TEMP SENSOR 8-TDFN

  • 数据手册
  • 价格&库存
STTS424BDN3F 数据手册
STTS424 Memory module temperature sensor Features ■ Temperature sensor compliant with JEDEC JC42.4 ) s ( ct Temperature sensor ■ Temperature sensor resolution: 0.25°C (typ)/LSB ■ Temperature sensor accuracy: – ± 1°C from +75°C to +95°C – ± 2°C from +40°C to +125°C – ± 3°C from –40°C to +125°C ■ ADC conversion time: 125 ms (max) ■ Supply voltage: 2.7 V to 3.6 V ■ Maximum operating supply current: 200 µA ■ Hysteresis selectable set points from: 0, 1.5, 3, 6.0°C ■ Ambient temperature sensing range: –40°C to 125°C ■ Supports bus timeout u d o r P e t e l o TDFN8 (DN) 2 mm x 3 mm (max height 0.80 mm) ) (s Two-wire bus s b O t c u d o r P e ■ 2-wire SMBus/I2C - compatible serial interface ■ Supports up to 400 kHz transfer rate ■ Does not initiate clock stretching t e l o s b O Packages ■ 2 mm x 3 mm TDFN8, height: 0.80 mm (max)(a) ■ RoHS compliant, halogen-free a. Compliant to JEDEC MO-229, WCED-3 April 2009 Rev 6 1/36 www.st.com 1 Contents STTS424 Contents 1 Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 2 Serial communications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 3 2.1 Device type identifier (DTI) code . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 2.2 Pin descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 2.2.1 A0, A1, A2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 2.2.2 VSS (ground) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 2.2.3 SDA (open drain) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 2.2.4 SCL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 2.2.5 EVENT (open drain) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 2.2.6 VDD (power) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 u d o r P e t e l o Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 4 3.1 SMBus/I2C 3.2 SMBus/I2 3.3 SMBus/I2C AC timing consideration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 3.4 SMBus timeout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 communications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 s b O C slave sub-address decoding . . . . . . . . . . . . . . . . . . . . . . . . . 12 ) (s t c u Temperature sensor registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 4.1 o s b d o r Capability register (read-only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 P e let 4.2 O 4.3 4.1.1 Alarm window trip . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 4.1.2 Critical trip . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Configuration register (read/write) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 4.2.1 Event thresholds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 4.2.2 Interrupt mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 4.2.3 Comparator mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 4.2.4 Shutdown mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 4.2.5 Event output pin functionality . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Temperature register (read-only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 4.3.1 2/36 ) s ( ct Temperature format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 4.4 Temperature trip point registers (r/w) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 4.5 Manufacturer ID register (read-only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 4.6 Device ID and device revision ID register (read-only) . . . . . . . . . . . . . . . 25 STTS424 Contents 5 Maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 6 DC and AC parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 7 Package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 8 Part numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 9 Package marking information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 10 Landing pattern . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 11 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 ) s ( ct u d o r P e t e l o ) (s s b O t c u d o r P e t e l o s b O 3/36 List of tables STTS424 List of tables Table 1. Table 2. Table 3. Table 4. Table 5. Table 6. Table 7. Table 8. Table 9. Table 10. Table 11. Table 12. Table 13. Table 14. Table 15. Table 16. Table 17. Table 18. Table 19. Table 20. Table 21. Table 22. Table 23. Table 24. Table 25. Table 26. Signal names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 AC SMBus and I2C compatibility timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 Temperature sensor registers summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 Pointer register format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 Pointer register select bits (type, width, and default values). . . . . . . . . . . . . . . . . . . . . . . . 15 Capability register format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Capability register bit definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Configuration register format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Configuration register bit definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Hysteresis as applied to temperature movement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Legend for Figure 9: Event output boundary timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Temperature register format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 Temperature register bit definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 Temperature trip point register format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 Alarm temperature upper boundary register format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 Alarm temperature lower boundary register format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 Critical temperature register format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 Manufacturer ID register format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 Device ID and device revision ID register format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Operating and AC measurement conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 DC and AC characteristics - temperature sensor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 TDFN8 – 8-lead thin dual flat, no-lead (2 mm x 3 mm) mechanical data (DN) . . . . . . . . . . 30 Ordering information scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 Parameters for landing pattern - TDFN package (DN) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 Document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 ) s ( ct u d o r P e t e l o ) (s t c u d o r P e t e l o s b O 4/36 s b O STTS424 List of figures List of figures Figure 1. Figure 2. Figure 3. Figure 4. Figure 5. Figure 6. Figure 7. Figure 8. Figure 9. Figure 10. Figure 11. Figure 12. Logic diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 TDFN8 connections (top view) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 SMBus/I2C write to pointer register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 SMBus/I2C write to pointer register, followed by a read data word. . . . . . . . . . . . . . . . . . . 11 SMBus/I2C write to pointer register, followed by a write data word . . . . . . . . . . . . . . . . . . 12 SMBus/I2C timing diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 Hysteresis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Event output boundary timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 TDFN8 – 8-lead thin dual flat, no-lead (2 mm x 3 mm) package outline (DN) . . . . . . . . . . 30 Device topside marking information (TDFN-8L) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 Landing pattern - TDFN package (DN) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 ) s ( ct u d o r P e t e l o ) (s s b O t c u d o r P e t e l o s b O 5/36 Description 1 STTS424 Description The STTS424 is targeted for DIMM modules in mobile personal computing platforms (laptops), server memory modules, and other industrial applications. The thermal sensor (TS) in the STTS424 is fully compliant with the JEDEC specification which defines memory module thermal sensors requirements for mobile platforms. The TS provides space as well as cost savings for mobile and server platform dual inline memory modules (DIMM) manufacturers as it is packaged in the compact 2 mm x 3 mm (height 0.80 mm) 8-lead TDFN package which is compliant to JEDEC MO-229, variation WCED-3. ) s ( ct The temperature sensor includes a band gap-based temperature sensor and 10-bit analogto-digital converter (ADC) which monitor and digitize the temperature to a resolution of up to 0.25°C. The typical accuracies over these temperature ranges are: u d o ● ±3°C (max) over the full temperature measurement range of –40°C to 125°C ● ±2°C in the +40°C to +125°C temperature range and ● ±1°C in the +75°C to +95°C temperature range r P e The temperature sensor in the STTS424 is specified for operating at supply voltages from 2.7 V to 3.6 V. Operating at 3.3 V, the supply current is 100 µA (typ). t e l o The on-board sigma delta ADC converts the measured temperature to a digital value that is calibrated in °C. For Fahrenheit applications, a lookup table or conversion routine is required. The STTS424 is factory-calibrated and requires no external components to measure temperature. ) (s s b O The digital temperature sensor component has user-programmable registers that provide the capabilities for DIMM temperature-sensing applications. The open drain event output pin is active when the monitoring temperature exceeds a programmable limit, or it falls above or below an alarm window. The user has the option to set the event output as a critical temperature output. This pin can be configured to operate in either a comparator mode for thermostat operation or in interrupt mode. t c u d o r P e t e l o s b O 6/36 STTS424 2 Serial communications Serial communications The STTS424 has a simple 2-wire SMBus/I2C-compatible digital serial interface which allows the user to access the data in the temperature register at any time. It communicates via the serial interface with a master controller which operates at speeds of up to 400 kHz. It also gives the user easy access to all of the STTS424 registers in order to customize device operation. 2.1 Device type identifier (DTI) code The JC42.4 temperature sensor has its own unique I2C address, which ensures that there are no compatibility or data translation issues. The DTI code is the unique 4-bit address, '0011'. ) s ( ct u d o The full I2C address consists of the unique DTI code and 3 bits determined by the A0, A1, and A2 pins. This allows up to 8 unique addresses, hence 8 STTS424 devices may be connected on the same bus. Figure 1. Logic diagram t e l o VDD bs SDA(1) r P e EVENT(1) O ) SCL A2 A1 A0 STTS424 s ( t c u d o e t e ol Pr VSS AI12947 1. SDA and EVENT are open drain. Table 1. O bs Signal names Pin Symbol Description 1 A0 Serial bus address selection pin. Can be tied to VSS or VDD. Input 2 A1 Serial bus address selection pin. Can be tied to VSS or VDD. Input 3 A2 Serial bus address selection pin. Can be tied to VSS or VDD. Input 4 VSS Supply ground 5 SDA(1) Serial data Input/output 6 SCL Serial clock Input Event output pin. Open drain and active-low. Output 7 EVENT 8 VDD (1) Direction Supply power (2.7 V to 3.6 V) 1. SDA and EVENT are open drain. See Section 2.2: Pin descriptions on page 9 for details. 7/36 Serial communications Figure 2. STTS424 TDFN8 connections (top view) A0 A1 A2 GND 8 7 6 5 1 2 3 4 VDD EVENT(1) SCL SDA(1) AI12262 1. SDA and EVENT are open drain. Figure 3. Block diagram ) s ( ct 8 VDD u d o r P e Temperature Sensor Logic Control Comparator Timing )- s b O s ( t c Configuration Register u d o ete Pr b O Upper Register Lower Register Temperature Register Critical Register Manufacturer ID Address Pointer Register l o s 7 t e l o ADC Capability Register EVENT Device ID/ Revision 1 2 3 SCL A0 A1 A2 6 SMBus/I2C Interface SDA 5 VSS 4 AI12948 8/36 STTS424 Serial communications 2.2 Pin descriptions 2.2.1 A0, A1, A2 A2, A1, and A0 are selectable address pins for the 3 LSBs of the I2C interface address. They can be set to VDD or GND to provide 8 unique address selections. 2.2.2 VSS (ground) This is the reference for the power supply. It must be connected to system ground. 2.2.3 SDA (open drain) ) s ( ct This is the serial data input/output pin. 2.2.4 u d o SCL This is the serial clock input pin. 2.2.5 r P e EVENT (open drain) t e l o This output pin is open drain and active-low and functions as an alert interrupt. 2.2.6 VDD (power) s b O This is the supply voltage pin, and ranges from +2.7 V to +3.6 V. ) (s t c u d o r P e t e l o s b O 9/36 Operation 3 STTS424 Operation The STTS424 TS continuously monitors the ambient temperature and updates the temperature data registers at least eight times per second. Temperature data is latched internally by the device and may be read by software from the bus host at any time. The SMBus/I2C slave address selection pins allow up to 8 such devices to co-exist on the same bus. This means that up to 8 memory modules can be supported, given that each module has one such slave device address slot. After initial power-on, the configuration registers are set to the default values. The software can write to the configuration register to set bits per the bit definitions in Section 3.1: SMBus/I2C communications. ) s ( ct SMBus/I2C communications 3.1 u d o The registers in this device are selected by the pointer register. At power-up, the pointer register is set to “00”, which is the capability register location. The pointer register latches the last location it was set to. Each data register falls into one of three types of user accessibility: 1. r P e t e l o Read-only 2. Write-only and 3. WRITE/READ same address. ) (s s b O A WRITE to this device will always include the address byte and the pointer byte. A WRITE to any register other than the pointer register, requires two data bytes. t c u Reading this device is achieved in one of two ways: ● ● Note: 10/36 d o r P e t e l o s b O If the location latched in the pointer register is correct (most of the time it is expected that the pointer register will point to one of the read temperature registers because that will be the data most frequently read), then the READ can simply consist of an address byte, followed by retrieval of the two data bytes. If the pointer register needs to be set, then an address byte, pointer byte, repeat start, and another address byte will accomplish a READ. The data byte transfers the MSB first. At the end of a READ, this device can accept either an acknowledge (ACK) or no acknowledge (No ACK) status from the master. The No ACK status is typically used as a signal for the slave that the master has read its last byte. This device subsequently takes up to 125 ms to measure the temperature. STTS424 does not initiate clock stretching which is an optional I2C bus feature. STTS424 Figure 4. Operation SMBus/I2C write to pointer register 1 SCL 9 1 9 SDA 0 0 Start by Master 1 1 A2 A1 A0 R/W 0 0 0 0 0 D2 D1 D0 Pointer Byte Address Byte ACK by STTS424 ACK by STTS424 AI12264 Figure 5. 1 SCL 9 1 0 0 Start by Master 1 1 A2 A1 A0 R/W SDA (continued) Repeat Start by Master e t e ol 0 1 0 1 du o r P )- 1 s ( t c A2 A1 A0 R/W t e l o 0 0 D2 D1 D0 s b O ACK by STTS424 9 0 0 r P e Pointer Byte Address Byte 1 SCL (continued) 0 u d o 9 SDA s b O ) s ( ct SMBus/I2C write to pointer register, followed by a read data word D15 Address Byte D14 D13 D12 D11 D10 D9 9 D8 MSB Data Byte ACK by STTS424 ACK by STTS424 1 D7 9 D6 D5 D4 D3 D2 LSB Data Byte ACK by Master D1 D0 Stop Cond. No ACK by by Master Master AI12265 11/36 Operation STTS424 SMBus/I2C write to pointer register, followed by a write data word Figure 6. 1 SCL 9 1 9 SDA 0 0 1 Start by Master 1 A2 A1 A0 R/W SDA (continued) 0 0 0 0 D2 D1 D0 Pointer Byte Address Byte ACK by STTS424 ACK by STTS424 1 SCL (continued) 0 D15 9 D14 D13 D12 D11 D10 D9 D8 1 D7 9 D6 MSB Data Byte D5 D4 D2 LSB Data Byte u d o D1 r P e ACK by STTS424 t e l o ) (s D3 ) s ( ct D0 Stop Cond. No ACK by by Master STTS424 AI14012 s b O SMBus/I2C slave sub-address decoding 3.2 The physical address for the TS is binary 0 0 1 1 A2 A1 A0 RW, whereas A2, A1, and A0 are the three slave sub-address pins, and the LSB “RW” is the READ/WRITE flag. t c u d o r SMBus/I2C AC timing consideration 3.3 P e In order for this device to be both SMBus- and I2C-compatible, it complies to a subset of each specification. These interoperability requirements which will enable this device to coexist with devices on either an SMBus or an I2C bus: t e l o bs O Note: 12/36 ● The SMBus minimum clock frequency is required. ● The 300 ns SMBus data hold time (THD:DAT) is required (see Figure 7 and Table 2 on page 13). ● The SMBus time-out is maximum 50 ms. Since the voltage levels are specified only within 3.3 V ±10%, there are no compatibility concerns with the SMBus/I2C DC specifications. STTS424 Operation Figure 7. SMBus/I2C timing diagram tR tLOW tF SCL VIH VIL tSU:STA tHD:STA tHIGH tBUF tHD:DAT SDA tSU:STO tSU:DAT VIH VIL P S S P ) s ( ct A12266 Table 2. AC SMBus and I2C compatibility timings Symbol tBUF tHD:STA tSU:STA(1) 3.4 Max Units Bus free time between stop (P) and start (S) conditions 1.3 – µs Hold time after (repeated) start condition. After this period, the first clock cycle is generated. 0.6 – µs Repeated start condition setup time 1.3 – µs 0.6 – µs 1.3 – µs – 300 ns – 300 ns 100 – ns Clock high period tLOW Clock low period )- Clock/data fall time tR Clock/data rise time e t e ol s b O s ( t c tF u d o Data setup time Pr tHD:DAT Data hold time 300 – ns tSU:STO Stop condition setup time 0.6 – µs SMBUS/I2C clock frequency 10 400 kHz Bus timeout 25 50 ms e t e l fSCL b O Pr Min tHIGH tSU:DAT so Parameter u d o ttimeout 1. For a restart condition, or following a WRITE cycle SMBus timeout The STTS424 supports the SMBus timeout feature. If the host holds SCL low for more than 25 ms, the STTS424 resets and releases the bus. This feature is turned on by default. 13/36 Temperature sensor registers 4 STTS424 Temperature sensor registers The temperature sensor component is comprised of various user-programmable registers. These registers are required to write their corresponding addresses to the Pointer register. They can be accessed by writing to their respective addresses (see Table 3). Pointer register Bits 7-3 must always be written to '0' (see Table 4). This must be maintained, as not setting these bits to '0' may keep the device from performing to specifications. The main registers include: ● Capability register (read-only) ● Configuration register (read/write) ● Temperature register (read-only) ● Temperature trip point registers (r/w), including – Alarm temperature upper boundary, – Alarm temperature lower boundary, and – Critical temperature. ● Manufacturer ID register format ● Device ID and device revision ID register format ) s ( ct u d o r P e t e l o Note: See Table 5 on page 15 for pointer register selection bit details. Table 3. Temperature sensor registers summary Address (Hex) Not applicable Register name ) (s Address pointer t c u s b O Power-on default Undefined 00 Capability B-grade only 0x002F 01 Configuration 02 Alarm temperature upper boundary trip 0x0000 03 Alarm temperature lower boundary trip 0x0000 0x0000 od e t e ol Pr 04 Critical temperature trip 05 Temperature 06 Manufacturer’s ID 0x104A 07 Device ID/revision 0x0101 s b O Table 4. 0x0000 Undefined Pointer register format MSB LSB Bit7 Bit6 Bit5 Bit4 Bit3 Bit2 Bit1 Bit0 0 0 0 0 0 P2 P1 P0 Pointer/register select bits 14/36 STTS424 Table 5. Temperature sensor registers Pointer register select bits (type, width, and default values) Width (bits) Type (R/W) Default state (POR) 16 R 00 2F Configuration 16 R/W 00 00 UPPER Alarm temperature upper boundary 16 R/W 00 00 1 LOWER Alarm temperature lower boundary 16 R/W 00 00 0 0 CRITICAL Critical temperature 16 R/W 00 00 1 0 1 TEMP Temperature 16 R 00 00 1 1 0 MANU Manufacturer ID 16 R 1 1 1 ID Device ID/revision 16 R P2 P1 P0 0 0 0 CAPA Thermal sensor capabilities 0 0 1 CONF 0 1 0 0 1 1 4.1 Name Register description B-grade only u d o ) s ( ct 104A 01 01 r P e Capability register (read-only) This 16-bit register is read-only, and provides the TS capabilities which comply with the minimum JEDEC 424.4 specifications (see Table 6 and Table 7 on page 16). The STTS424 provides temperatures at 0.25 resolution (10-bit). 4.1.1 t e l o Alarm window trip ) (s s b O The device provides a comparison window with an upper temperature trip point in the alarm upper boundary register, and a lower trip point in the alarm lower boundary register. When enabled, the event output will be triggered whenever entering or exiting (crossing above or below) the alarm window. t c u d o r 4.1.2 Critical trip P e The device can be programmed in such a way that the event output is only triggered when the temperature exceeds the critical trip point. The critical temperature setting is programmed in the critical temperature register. When the temperature sensor reaches the critical temperature value in this register, the device is automatically placed in comparator mode, which means that the critical event output cannot be cleared by using software to set the clear event bit. s b O t e l o 15/36 Temperature sensor registers Table 6. STTS424 Capability register format Bit15 Bit14 Bit13 Bit12 Bit11 Bit10 Bit9 Bit8 RFU RFU RFU RFU RFU RFU RFU RFU Bit7 Bit6 Bit5 Bit4 Bit3 Bit2 Bit1 Bit0 RFU RFU VHV TRES1 TRES0 Wider range Higher precision Alarm and critical trips C Table 7. Capability register bit definitions Bit Definition Basic capability – 0 = Alarm and critical trips turned OFF. – 1 = Alarm and critical trips turned ON. 1 Accuracy – 0 = Accuracy ±2°C over the active range and ±3°C over the monitoring range (C - Grade). – 1 = High accuracy ±1°C over the active range and ±2°C over the monitoring range (B - Grade). 2 4:3 5 t e l o 16/36 s b O Range width – 0 = Values lower than 0°C will be clamped and represented as binary value '0'. – 1 = Temperatures below 0°C can be read and the Sign bit will be set accordingly. ) (s Temperature resolution – 01 = This 10-bit value is fixed for STTS424, providing temperatures at 0.25°C resolution (LSB). t c u (VHV) High voltage support for A0 (pin 1) – 1 = STTS424 supports a voltage up to 10 volts on the A0 pin (default). d o r P e t e l o u d o r P e Reserved 15:6 These values must be set to '0'. s b O ) s ( ct 0 STTS424 4.2 Temperature sensor registers Configuration register (read/write) The 16 bit Configuration register stores various configuration modes that are used to set up the sensor registers and configure according to application and JEDEC 42.4 requirements (see Table 8 on page 17 and Table 9 on page 18). 4.2.1 Event thresholds All event thresholds use hysteresis as programmed in register address 0x01 (bits 10 through 9) to be set when they de-assert. 4.2.2 Interrupt mode ) s ( ct The interrupt mode allows an event to occur where software may write a '1' to the clear event bit (bit 5) to de-assert the event Interrupt output until the next trigger condition occurs. 4.2.3 u d o Comparator mode r P e Comparator mode enables the device to be used as a thermostat. READs and WRITEs on the device registers will not affect the event output in comparator mode. The event signal will remain asserted until temperature drops outside the range or is re-programmed to make the current temperature “out of range”. 4.2.4 t e l o Shutdown mode s b O The STTS424 features a shutdown mode which disables all power-consuming activities (e.g. temperature sampling operations), and leaves the serial interface active. This is selected by setting shutdown bit (bit 8) to '1'. In this mode, the devices consume the minimum current (ISHDN), as shown in Table 22 on page 28. ) (s t c u Note: Bit 8 cannot be set to '1' while bits 6 and 7 (the lock bits) are set to '1'. d o r The device may be enabled for continuous operation by clearing bit 8 to '0'. In shutdown mode, all registers may be read or written to. Power recycling will also clear this bit and return the device to continuous mode as well. P e let Table 8. O o s b Configuration register format Bit15 Bit14 Bit13 Bit12 Bit11 Bit10 Bit9 Bit8 RFU RFU RFU RFU RFU Hysteresis Hysteresis Shutdown mode Bit7 Bit6 Bit5 Bit4 Bit3 Bit2 Bit1 Bit0 Critical lock bit Alarm lock bit Clear event Critical event only Event polarity Event mode Event output Event output status control 17/36 Temperature sensor registers Table 9. STTS424 Configuration register bit definitions Bit Definition 0 Event mode – 0 = Comparator output mode (this is the default) – 1 = Interrupt mode; when either of the lock bits is set, this bit cannot be altered until it is unlocked. 1 Event polarity – 0 = Active-low (this is the default). – 1 = Active-high; when either of the lock bits is set, this bit cannot be altered until it is unlocked. 2 Critical event only – 0 = Event output on alarm or critical temperature event (this is the default). – 1 = Event only if the temperature is above the value in the critical temperature register; when the alarm window lock bit is set, this bit cannot be altered until it is unlocked. 3 Event output control – 0 = Event output disabled (this is the default). – 1 = Event output enabled; when either of the lock bits is set, this bit cannot be altered until it is unlocked. 4 Event status (read-only)(1) – 0 = Event output condition is not being asserted by this device. – 1 = Event output condition is being asserted by this device via the alarm window or critical trip event. 5 Clear event (write-only)(2) – 0 = No effect – 1 = Clears the active Event in Interrupt mode. 6 Alarm window lock bit – 0 = Alarm trips are not locked and can be altered (this is the default). – 1 = Alarm trip register settings cannot be altered. This bit is initially cleared. When set, this bit returns a logic '1' and remains locked until cleared by an internal power-on reset. These bits can be written to with a single WRITE, and do not require double WRITEs. 7 Critical trip lock bit – 0 = Critical trip is not locked and can be altered (this is the default). – 1 = Critical trip register settings cannot be altered. This bit is initially cleared. When set, this bit returns a logic '1' and remains locked until cleared by an internal power-on reset. These bits can be written to with a single WRITE, and do not require double WRITEs. ) s ( ct u d o ) (s r P e t e l o s b O t c u d o r P e t e l o Shutdown mode – 0 = TS is enabled (this is the default). – 1 = Shutdown TS when the shutdown, device, and A/D converter are disabled in order to save power. No event conditions will be asserted; when either of the lock bits is set, this bit cannot be altered until it is unlocked. However, it can be cleared at any time. s b O 8 Hysteresis enable(3) (see Figure 8 and Table 10) – 00 = Hysteresis is disabled. 10:9 – 01 = Hysteresis is enabled at 1.5°C. – 10 = Hysteresis is enabled at 3°C. – 11 = Hysteresis is enabled at 6°C. 1. The actual incident causing the event can be determined from the read temperature register. Interrupt events can be cleared by writing to the clear event bit (writing to this bit will have no effect on overall device functioning. 2. Writing to this register has no effect on overall device functioning in comparator mode. When read, this bit will always return a logic '0' result. 3. Hysteresis is also applied to the EVENT pin functionality. When either of the lock bits is set, these bits cannot be altered. 18/36 STTS424 Temperature sensor registers Figure 8. Hysteresis TH TH - HYS TL TL - HYS Below Window bit ) s ( ct Above Window bit u d o AI12270 r P e 1. TU = Value stored in the alarm temperature upper boundary trip register. 2. TL = Value stored in the alarm temperature lower boundary trip register. t e l o 3. Hys = Absolute value of selected hysteresis. Table 10. Hysteresis as applied to temperature movement s b O Below alarm window bit )- Temperature slope s ( t c Sets Falling u d o Clears Rising Above alarm window bit Temperature threshold Temperature slope Temperature threshold TL - HYS Rising TH TL Falling TH - HYS r P e t e l o s b O 19/36 Temperature sensor registers 4.2.5 STTS424 Event output pin functionality The EVENT pin is an open drain output and requires a pull-up resistor to VDD on the system motherboard or incorporated into the master controller. Figure 9 shows the defined outputs of the EVENT correspondent to the temperature change. The event outputs can be programmed to be configured as either a comparator output or as an interrupt. This is done by enabling the output control bit (bit 3) and setting the event mode bit (bit 0). The output pin polarity can also be specified as active-high or active-low by setting the event polarity bit (bit 1). When the hysteresis bit (bits 10 and 9) is enabled, hysteresis may be used to sense temperature movement around trigger points. For example, when using the “above alarm window” bit (temperature register bit 14, see Table 12 on page 22) and hysteresis is set to 3°C, as the temperature rises, bit 14 is set (bit 14 = 1). The temperature is above the alarm window and the temperature register contains a value that is greater than the value set in the alarm temperature upper boundary register (see Table 15 on page 23). ) s ( ct u d o r P e If the temperature decreases, bit 14 will remain set until the measured temperature is less than or equal to the value in the alarm temperature upper boundary register minus 3°C (see Figure 8 on page 19 and Table 10 on page 19 for details. t e l o Similarly, when using the “below alarm window” bit (temperature register bit 13, see Table 12 on page 22) will be set to '0'. The temperature is equal to or greater than the value set in the alarm temperature lower boundary register (see Table 16 on page 24). As the temperature decreases, bit 13 will be set to '1' when the value in the temperature register is less than the value in the alarm temperature lower boundary register minus 3°C (see Figure 8 on page 19 and Table 10 on page 19 for details). ) (s s b O The device will retain the previous state when entering the shutdown mode. If the device enters the shutdown mode while the EVENT pin is low, the shutdown current will increase due to the additional event output pull-down current. t c u d o r If in interrupt mode and the temperature reaches the critical temperature, the EVENT pin remains asserted until the temperature drops below the critical limit minus hysteresis. Note: t e l o s b O 20/36 P e Hysteresis is also applied to the EVENT pin functionality. When either of the lock bits (bits 6 or 7) is set, these bits cannot be altered. STTS424 Temperature sensor registers Figure 9. Event output boundary timings TCRIT - THYS TCRIT TUPPER - THYS TUPPER - THYS TUPPER TA TLOWER - THYS TLOWER TLOWER - THYS Event Output (active-low) Comparator ) s ( ct Interrupt u d o r P e S/W Int. Clear t e l o Critical 1 Table 11. Note Note: s b O 35 7 6 4 2 AI12271 ) (s Event output TA bits ct du Comparator Interrupt Critical 15 14 13 TA ≥ TLOWER H L H 0 0 0 TA ≥ TLOWER - THYS L L H 0 0 1 TA > TUPPER L L H 0 1 0 4 TA ≥ TUPPER - THYS H L H 0 0 0 5 TA ≥ TCRIT L L L 1 1 0 6 TA < TCRIT - THYS L H H 0 1 0 ro P e 3 O 4 Event output boundary conditions 2 o s b 1 3 Legend for Figure 9: Event output boundary timings 1 let 2 7 When TA ≥ TCRIT and TA < TCRIT - THYS, the event output is in comparator mode and bit 0 of the configuration register (interrupt mode) is ignored. Systems that use the active high mode for event output must be wired pont-to-point between the STTS424 and the sensing controller. Wire-OR configurations should not be used with active high EVENT since any device pulling the event output signal low will mask the other devices on the bus. Also note that the normal state of EVENT in active high mode is a ‘0’ which will constantly draw power through the pull-up resistor. 21/36 Temperature sensor registers 4.3 STTS424 Temperature register (read-only) This 16-bit, read-only register stores the temperature measured by the internal band gap TS as shown inTable 12. The STTS424 meets the JEDEC JC42.4 mandatory 0.25°C resolution requirement. When reading this register, the MSBs (bit 15 to bit 8) are read first, and then the LSBs (bit 7 to bit 0) are read. The result is the current-sensed temperature. The data format is 2s complement with one LSB = 0.25°C. The MSB has a 128°C resolution. The trip status bits represent the internal temperature trip detection, and are not affected by the status of the event or configuration bits (e.g. event output control or clear event). If neither of the above or below values are set (i.e. both are 0), then the temperature is exactly within the user-defined alarm window boundaries. 4.3.1 ) s ( ct Temperature format The 16-bit value used in the trip point set and temperature read-back registers is 2s complement, with the LSB equal to 0.0625°C (see Table 13). For example: 1. a value of 019Ch will represent 25.75°C, 2. a value of 07C0h will represent 124°C, and 3. a value of 1E74h will represent –24.75°C u d o r P e t e l o The 0.0625°C resolution is optional. Supporting a resolution of at least 0.25°C is mandatory. All unused resolution bits will be set to zero. The MSB will have a resolution of 128°C. The STTS424 supports the 0.25°C/LSB only. s b O The upper 3 bits indicate trip status based on the current temperature, and are not affected by the event output status. Table 12. t c u Sign MSB Bit 15 Bit 14 Above critical input(1) Above alarm window(1) O d o r P e let o s b 0 ) (s Temperature register format Bit 13 Bit 12 Bit Bit Bit Bit Bit Bit Bit Bit Bit 11 10 9 8 7 6 5 4 3 Below alarm window(1) 0 0 Bit 0 0 0 0 0 1 1 1 1 1 0 0 0 0 0 0 07C0 h Example hex value of 1C00 corresponds to –40°C (10-bit) 0 1. See Table 13 for explanation. 22/36 Bit 1 Example hex value of 07C0 corresponds to 124°C (10-bit) Flag bits 0 Bit 2 Temperature Flag bits 0 LSB 1 1 1 0 1 1 0 0 0 0 0 0 0 1C00 h STTS424 Temperature sensor registers Table 13. Temperature register bit definitions Bit 4.4 Definition with hysteresis = 0 13 Below (temperature) alarm window – 0 = Temperature is equal to or above the alarm window lower boundary temperature. – 1 = Temperature is below the alarm window. 14 Above (temperature) alarm window – 0 = Temperature is equal to or below the alarm window upper boundary temperature. – 1 = Temperature is below the alarm window. 15 Above critical trip – 0 = Temperature is below the critical temperature setting. – 1 = Temperature is equal to or above the critical temperature setting. ) s ( ct u d o Temperature trip point registers (r/w) r P e The STTS424 alarm mode registers provide for 11-bit data in 2s compliment format. The data provides for one LSB = 0.25°C. All unused bits in these registers are read as '0'. t e l o The STTS424 has three temperature trip point registers (see Table 14): Note: ● Alarm temperature upper boundary threshold (Table 15), ● Alarm temperature lower boundary threshold (Table 16), and ● Critical temperature trip point value (Table 17). If the upper or lower boundary threshold values are being altered in-system, all interrupts should be turned off until a known state can be obtained to avoid superfluous interrupt activity. Table 14. let 0 o s b 0 ) (s 1 t c u Temperature trip point register format od r P e P2 O s b O Width (bits) Type (R/W) Default state (POR) Alarm temperature upper boundary 16 R/W 00 00 Alarm temperature lower boundary 16 R/W 00 00 16 R/W 00 00 P1 P0 1 0 UPPER 1 1 LOWER 0 0 CRITICAL Critical temperature Table 15. Name Register description Alarm temperature upper boundary register format Sign MSB Bit 15 Bit 14 Bit 13 0 0 0 Bit 12 LSB Bit 11 Bit 10 Bit 9 Bit 8 Bit 7 Bit 6 Bit 5 Bit 4 Alarm window upper boundary temperature Bit 3 Bit 2 Bit 1 Bit 0 0 0 23/36 Temperature sensor registers Table 16. STTS424 Alarm temperature lower boundary register format Sign MSB Bit 15 Bit 14 Bit 13 0 0 0 Table 17. Bit 12 LSB Bit 11 Bit 10 Bit 9 Bit 8 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Alarm window lower boundary temperature Bit 1 Bit 0 0 0 Critical temperature register format Sign MSB Bit 15 Bit 14 Bit 13 0 0 0 ) s ( ct Bit 12 LSB Bit 11 Bit 10 Bit 9 Bit 8 Bit 7 Bit 6 Bit 5 Critical temperature trip point e t e ol 4.5 Bit 2 Bit 4 Bit 3 Bit 2 u d o Pr Bit 1 Bit 0 0 0 Manufacturer ID register (read-only) s b O The manufacturer’s ID (programmed value 104Ah) in this register is the STMicroelectronics identification provided by the Peripheral Component Interconnect Special Interest Group (PCiSIG). Table 18. Bit15 o s b O 24/36 0 Bit13 Bit12 Bit11 Bit10 Bit9 Bit8 0 1 0 0 0 0 Bit6 Bit5 Bit4 Bit3 Bit2 Bit1 Bit0 1 0 0 1 0 1 0 u d o r P e let ct Bit14 0 Bit7 ) (s Manufacturer ID register format 0 STTS424 4.6 Temperature sensor registers Device ID and device revision ID register (read-only) The device IDs and device revision IDs are maintained in this register. The register format is shown in Table 19. The device IDs and device revision IDs are currently '0' and will be incremented whenever an update of the device is made. Table 19. Device ID and device revision ID register format Bit15 Bit14 Bit13 Bit12 Bit11 Bit10 Bit9 Bit8 0 0 0 0 0 0 0 1 Device ID Bit6 Bit5 Bit4 Bit3 Bit2 Bit1 0 0 0 0 0 0 du ) s ( ct Bit7 Device revision ID e t e ol ) (s 0 Bit0 1 o r P s b O t c u d o r P e t e l o s b O 25/36 Maximum ratings 5 STTS424 Maximum ratings Stressing the device above the ratings listed in the absolute maximum ratings table may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the operating sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality documents. Table 20. Absolute maximum ratings Symbol TSTG Parameter Value TSLD(1) Storage temperature Unit ) s ( t –60 to 150 Lead solder temperature for 10 seconds °C uc 260 od °C VIO Input or output voltage - all pins VDD Supply voltage VSS – 0.3 to 6.5 VOUT Output voltage VDD + 0.5 V IO Output current 10 mA PD Power dissipation 320 mW θJA Thermal resistance 130 °C/W VSS – 0.3 to VDD + 0.5 e t e l O ) o s b Pr V V 1. Reflow at peak temperature of 255°C to 260°C for < 30 seconds (total thermal budget not to exceed 180°C for between 90 to 150 seconds). s ( t c u d o r P e t e l o s b O 26/36 STTS424 6 DC and AC parameters DC and AC parameters This section summarizes the operating measurement conditions, and the dc and ac characteristics of the device. The parameters in the DC and AC characteristics tables that follow, are derived from tests performed under the measurement conditions summarized in Table 21: Operating and AC measurement conditions. Designers should check that the operating conditions in their circuit match the operating conditions when relying on the quoted parameters. Table 21. Operating and AC measurement conditions Parameter Conditions VDD supply voltage - temperature sensor 2.7 to 3.6 Operating temperature –40 to 125 Input rise and fall times ≤5 ) s ( ct u d o Pr Unit V °C ns Input pulse voltages 0.2 to 0.8VDD V Input and output timing reference voltages 0.3 to 0.7VDD V ) (s e t e ol s b O t c u d o r P e t e l o s b O 27/36 DC and AC parameters Table 22. DC and AC characteristics - temperature sensor Sym VDD STTS424 Test condition(1) Description Supply voltage Min Typ(2) Max Unit 2.7 3.3 3.6 V 100 200 µA VDD supply current, active temperature conversions IDD SCL/SDA = VDD VDD supply current, communication only (no conversions) 100 kHz 40 µA 400 kHz 100 µA IDD1 Shutdown mode supply current, serial port inactive DN package(3) at 125°C ISINK SMBUS output low sink current SDA forced to 0.6 V IIH, IIL Input/output leakage current VPOR Power on reset (POR) threshold 1.0 +40°C < TA < +125°C Conversion time THYS Hysteresis VOL1 Low level voltage EVENT VIL CIN )- s ( t c u d o r P e fSCL s b O ±1.0 °C ±1.0 ±2.0 °C ete ±2.0 ±3.0 °C 0.25 °C/L SB 10 bits 125 ms o r P 10-bit Default value 500 3.0 V ≤ VDD ≤ 3.6 V; EVENT; IOL = 2.1 mA Input logic high 3.0 V ≤ VDD ≤ 3.6 V; SCL, SDA Input logic low 3.0 V ≤ VDD ≤ 3.6 V; SCL, SDA t e l o s b O ±0.5 ol 10-bit temperature data tCONV VIH µA 2.0 –40°C < TA < +125°C SMBus/I2C interface ct du VDD falling edge: Resolution 2.1 SMBus/I C clock frequency tTIMEOUT SMBus timeout Allowable voltage on pin A0 LAO Leakage on pin A0 in overvoltage state VOL2 Low level voltage SDA 0.8 10 400 kHz 25 50 ms 10 V µA 0.6 1. Guaranteed operating temperature for DN package: TA = –40°C to 125°C; VDD = 2.7 V to 3.6 V (except where noted). 2. Typical numbers taken at VDD = 3.3 V, TA = 25°C. 3. TDFN package max 0.80 mm height. 28/36 V pF 500 IOL = 6 mA V V 5 2 V mV 0.4 SMBus/I2C Input capacitance VHV (s) mA ±2 Accuracy for corresponding range 2.7V ≤ VDD ≤ 3.6V µA 6 +75°C < TA < +95°C B-grade 3.0 V STTS424 7 Package mechanical data Package mechanical data In order to meet environmental requirements, ST offers these devices in different grades of ECOPACK® packages, depending on their level of environmental compliance. ECOPACK® specifications, grade definitions and product status are available at: www.st.com. ECOPACK® is an ST trademark. ) s ( ct u d o r P e t e l o ) (s s b O t c u d o r P e t e l o s b O 29/36 Package mechanical data STTS424 Figure 10. TDFN8 – 8-lead thin dual flat, no-lead (2 mm x 3 mm) package outline (DN)(a) ) s ( ct u d o r P e t e l o bs Table 23. O ) s ( t c Typ Max Min Typ Max 0.75 0.80 0.028 0.030 0.031 0.00 0.05 0.000 0.000 0.002 TDFN8 – 8-lead thin dual flat, no-lead (2 mm x 3 mm) mechanical data (DN)(1) u d o Sym Min Pr A 0.70 A1 0.00 e t e ol A3 mm inches 0.20 0.005 b 0.20 0.25 0.30 0.008 0.010 0.012 D 1.95 2.00 2.05 0.075 0.078 0.079 D2 1.35 1.40 1.45 0.053 0.055 0.057 E 2.95 3.00 3.05 0.116 0.118 0.120 E2 1.25 1.30 1.35 0.049 0.051 0.053 s b O e L 0.50 0.30 0.35 ddd 1. JEDEC MO-229, variation WCED-3 proposal a. JEDEC MO-229, variation WCED-3 proposal 30/36 DA_ME 0.020 0.40 0.08 0.012 0.014 0.016 0.003 STTS424 8 Part numbering Part numbering Table 24. Ordering information scheme Example: STTS424 B DN 3 F Device type STTS424 Grade ) s ( ct B: Maximum accuracy 75°C to 95°C = ± 1°C u d o Package DN = TDFN8 (2 mm x 3 mm) (0.80 mm max height) r P e t e l o Temperature range 3 = –40°C to 125°C Shipping method ) (s s b O F = ECOPACK® package, tape & reel packing E = ECOPACK® package, tube packing t c u d o r For other options, or for more information on any aspect of this device, please contact the ST sales office nearest you. P e t e l o s b O 31/36 Package marking information 9 STTS424 Package marking information Figure 11. Device topside marking information (TDFN-8L) 424B DN (1) PYWW (2) ai13910b u d o r P e 1. TDFN package identifier DN = 0.80 mm (package height) 2. Traceability codes P = Plant code Y = Year WW = Work Week ) (s t c u d o r P e t e l o s b O 32/36 s b O t e l o ) s ( ct STTS424 10 Landing pattern Landing pattern The landing pattern recommendations for the TDFN package (DN) are shown in Figure 12. The preferred implementation with wide corner pads enhances device centering during assembly, but a narrower option is defined for modules with tight routing requirements. Figure 12. Landing pattern - TDFN package (DN) e4 e2 e/2 e ) s ( ct e/2 u d o L r P e t e l o K s b O D2 E3 ) (s D2/2 D2/2 E2 t c u od r P e s b O t e l o E3 E2/2 E2/2 K L b2 b b K2 K2 K2 b4 ai14000 33/36 Landing pattern STTS424 Table 25 lists variations of landing pattern implementations, ranked as “preferred”, and minimum acceptable” based on the JEDEC proposal. Table 25. Parameters for landing pattern - TDFN package (DN) Dimension Parameter Description Min Nom Max D2 Heat paddle width 1.40 - 1.60 E2 Heat paddle height 1.40 - 1.60 E3 Heat paddle centerline to contact inner locus 1.00 - - L Contact length 0.70 K Heat paddle to contact keepout 0.20 K2 Contact to contact keepout Contact centerline to contact centerline pitch for inner contacts b Contact width for inner contacts e2 Landing pattern centerline to outer contact centerline, “minimum acceptable” option(1) b2 Corner contact width, “minimum acceptable option”(1) ete bs ol Landing pattern centerline to outer contact centerline, “preferred” option b4 Corner contact width, “preferred” option(2) ) s ( ct -O 1. Minimum acceptable option to be used when routing prevents preferred width contact. u d o r P e t e l o s b O 34/36 - - - - 0.50 - 0.25 - 0.30 - 0.50 - 0.25 - 0.30 - 0.60 - 0.45 - 0.50 u d o Pr e4 2. Preferred option to be used when possible. 0.80 0.20 e ) s ( ct - (2) - STTS424 11 Revision history Revision history Table 26. Document revision history Date Revision Changes 17-Apr-2007 1 Initial release. 09-May-2007 2 Updated Table 3, 5, 6, 7, 22, 23, and 24. 04-June-2007 3 Updated Table 22. 02-Jul-2007 4 Added POR threshold values to Table 22. 22-Oct-2008 5 Added TDFN package (cover page, Figure 10, Table 23) and landing pattern recommendations (Figure 12, Table 25); updated Section 1, Section 4.3.1; Table 2, 3, 5, 7, 11, 19, 20, 22, 25, and Figure 2, 4, 5, 11; added Figure 6; removed all TSSOP8 and DFN8 package references throughout datasheet. 01-Apr-2009 6 Updated Features on cover page, Section 3.1, Section 3.3, Section 4.2.5, Section 6, Table 3, 5, 9, 12, 22. ) s ( ct u d o r P e t e l o ) (s s b O t c u d o r P e t e l o s b O 35/36 STTS424 ) s ( ct Please Read Carefully: u d o Information in this document is provided solely in connection with ST products. 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