N-CHANNEL 20V - 0.0018Ω - 160A PowerSO-10 STripFET™ POWER MOSFET
TYPE STV160NF02LA
s s s s s s s
STV160NF02LA
VDSS 20 V
RDS(on) < 0.0027 Ω
ID 160 A
TYPICAL RDS(on) = 0.0018 Ω LOW THRESHOLD DRIVE ULTRA LOW ON-RESISTANCE ULTRA FAST SWITCHING 100% AVALANCHE TESTED VERY LOW GATE CHARGE LOW PROFILE, VERY LOW PARASITIC INDUCTANCE PowerSO-10 PACKAGE
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PowerSO-10 INTERNAL SCHEMATIC DIAGRAM
DESCRIPTION The STV160NF02LA represents the second generation of Application Specific STMicroelectronics well established STripFET™ process based on a very unique strip layout design. The resulting MOSFET shows unrivalled high packing density with ultra low on-resistance and superior switching charactestics. Process simplification also translates into improved manufacturing reproducibility. This device is particularly suitable for high current, low voltage switching application where efficiency is crucial APPLICATIONS s BUCK CONVERTERS IN HIGH PERFORMANCE TELECOM AND VRMs DCDC CONVERTERS ABSOLUTE MAXIMUM RATINGS
Symbol VDS VDGR VGS ID(**) ID IDM (q) PTOT EAS (1) Tstg Tj Parameter Drain-source Voltage (VGS = 0) Drain-gate Voltage (RGS = 20 kΩ) Gate- source Voltage Drain Current (continuos) at TC = 25°C Drain Current (continuos) at TC = 100°C Drain Current (pulsed) Total Dissipation at TC = 25°C Derating Factor Single Pulse Avalanche Energy Storage Temperature Max. Operating Junction Temperature
CONNECTION DIAGRAM (TOP VIEW)
Value 20 20 ± 15 160 113 640 210 1.4 330 –65 to 175 175
Unit V V V A A A W W/°C mJ °C °C
(q) Pulse width limited by safe operating area Note: Marking will be STV160NF02AL
December 2000
(1) VDD = 35V, ID = 45A, RG = 22Ω , L = 330µH, Starting Tj=25°C (**)Limited only maximum junction temperature allowed by PowerSO-10
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STV160NF02LA
THERMAL DATA
Rthj-case Rthj-amb Tl Thermal Resistance Junction-case Max Thermal Resistance Junction-ambient Max Maximum Lead Temperature For Soldering Purpose 0.71 50 300 °C/W °C/W °C
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED) OFF
Symbol V(BR)DSS IDSS IGSS Parameter Drain-source Breakdown Voltage Zero Gate Voltage Drain Current (VGS = 0) Gate-body Leakage Current (VDS = 0) Test Conditions ID = 250 µA, VGS = 0 VDS = Max Rating VDS = Max Rating, TC = 125 °C VGS = ± 15 V Min. 20 1 10 ±100 Typ. Max. Unit V µA µA nA
ON (1)
Symbol VGS(th) RDS(on) Parameter Gate Threshold Voltage Static Drain-source On Resistance Test Conditions VDS = VGS, ID = 250µA VGS = 10 V, ID = 80 A VGS = 10 V, ID = 45 A VGS = 8 V, ID = 80 A VGS = 5 V, ID = 40 A VGS = 10 V, ID=80 A;Tj = 175 °C VGS = 8 V, ID=80 A; Tj = 175 °C VGS = 5 V, ID=40 A; Tj = 125 °C VDS > ID(on) x RDS(on)max, VGS = 10V 160 Min. 1 1.8 1.76 1.9 3.8 2.7 2.7 3.7 6.4 6 8 14 Typ. Max. Unit V mΩ mΩ mΩ mΩ mΩ mΩ mΩ A
ID(on)
On State Drain Current
DYNAMIC
Symbol gfs (1) Rg Ciss Coss Crss Ciss Coss Crss LS Parameter Forward Transconductance Gate resistance Input Capacitance Output Capacitance Reverse Transfer Capacitance Input Capacitance Output Capacitance Reverse Transfer Capacitance Internal Source Inductance Test Conditions VDS > ID(on) x RDS(on)max, ID = 80A VDS = 0 V, f = 1 MHz, VGS = 0 VDS = 15 V, f = 1 MHz, VGS = 0 Min. Typ. 210 1.1 5500 3210 750 8400 14500 5800 3 Max. Unit S Ω pF pF pF pF pF pF nH
VDS = 0 V, f = 1 MHz, VGS = 0
From the Lead End (6mm from Package Body) to the Die Center
LD
Internal Drain Inductance
Not Available on Surface Mounting Package
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STV160NF02LA
ELECTRICAL CHARACTERISTICS (CONTINUED) SWITCHING ON
Symbol td(on) tr Qg Qgs Qgd Parameter Turn-on Delay Time Rise Time Total Gate Charge Gate-Source Charge Gate-Drain Charge Test Conditions VDD = 15 V, ID = 80 A RG = 4.7Ω VGS = 10V (see test circuit, Figure 3) VDD = 16 V, ID = 160 A, VGS = 10 V Min. Typ. 30 650 130 20 54 175 Max. Unit ns ns nC nC nC
SWITCHING OFF
Symbol td(off) tf td(off) tr(Voff) tf tc Parameter Turn-off-Delay Time Fall Time Turn-off Delay Time Off-voltage Rise Time Fall Time Cross-over Time Test Conditions VDD = 15 V, ID = 80 A, RG = 4.7Ω, VGS = 10 V (see test circuit, Figure 5) Vclamp = 16 V, ID = 40 A RG = 4.7Ω, VGS = 10V Min. Typ. 105 200 90 45 125 180 Max. Unit ns ns ns ns ns ns
SOURCE DRAIN DIODE
Symbol ISD ISDM (1) VSD (2) trr Qrr IRRM Parameter Source-drain Current Source-drain Current (pulsed) Forward On Voltage Reverse Recovery Time Reverse Recovery Charge Reverse Recovery Current ISD = 160 A, VGS = 0 ISD = 160A, di/dt = 100A/µs, VDD = 15V, Tj = 25°C (see test circuit, Figure 5) 90 225 5 Test Conditions Min. Typ. Max. 160 640 1.5 Unit A A V ns nC A
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %. 2. Pulse width limited by safe operating area.
Safe Operating Area
Thermal Impedance
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Output Characteristics Tranfer Characteristics
Tranconductance
Static Drain-Source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
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STV160NF02LA
Normalized Gate Thereshold Voltage vs Temp. Normalized On Resistance vs Temperature
Source-drain Diode Forward Characteristics
Basic Schematic For Motherboard VRM Whith Synchronous Rectification
Basic Schematic Mosfets Switch Used In Secondary Side Of a Froward Convert
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STV160NF02LA
Fig. 1: Unclamped Inductive Load Test Circuit Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuit For Resistive Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching And Diode Recovery Times
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PowerSO-10 MECHANICAL DATA
DIM. MIN. A A1 B C D D1 e E E1 E2 E3 E4 F h H L q α 0o 13.80 1.20 1.70 8o 9.30 7.20 7.20 6.10 5.90 1.25 0.50 14.40 1.80 0.543 0.047 0.067 3.35 0.00 0.40 0.35 9.40 7.40 1.27 9.50 7.40 7.60 6.35 6.10 1.35 0.366 0.283 0.283 0.240 0.232 0.049 0.002 0.567 0.071 mm TYP. MAX. 3.65 0.10 0.60 0.55 9.60 7.60 MIN. 0.132 0.000 0.016 0.013 0.370 0.291 0.050 0.374 0.291 0.300 0.250 0.240 0.053 inch TYP. MAX. 0.144 0.004 0.024 0.022 0.378 0.300
B
0.10 A B
10
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H
E
=
E2
E3
E1
=
=
1
5
=
SEATING PLANE DETAIL "A" Q
e
0.25
M
B
A
C D
h
= A F A1
= D1 = = SEATING PLANE
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= = =
E4
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A1 L DETAIL "A" α
0068039-C
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STV160NF02LA
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics. The ST logo is a trademark of STMicroelectronics © 2000 STMicroelectronics – Printed in Italy – All Rights Reserved STMicroelectronics GROUP OF COMPANIES Australia - Brazil - China - Finland - France - Germany - Hong Kong - India - Italy - Japan - Malaysia - Malta - Morocco Singapore - Spain - Sweden - Switzerland - United Kingdom - U.S.A. http://www.st.com
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