STW21N150K5
N-channel 1500 V, 0.7 Ω typ.,14 A MDmesh™ K5
Power MOSFET in a TO-247 package
Datasheet - production data
Features
Order code
VDS
RDS(on) max.
ID
PTOT
STW21N150K5
1500 V
0.9 Ω
14 A
446 W
3
2
1
TO-247
Industry’s lowest RDS(on) * area
Industry’s best figure of merit (FoM)
Ultra low gate charge
100% avalanche tested
Zener-protected
Applications
Figure 1: Internal schematic diagram
Switching applications
Description
This very high voltage N-channel Power
MOSFET is designed using MDmesh™ K5
technology based on an innovative proprietary
vertical structure. The result is a dramatic
reduction in on-resistance and ultra-low gate
charge for applications requiring superior power
density and high efficiency.
Table 1: Device summary
Order code
Marking
Package
Packing
STW21N150K5
21N150K5
TO-247
Tube
October 2015
DocID026818 Rev 3
This is information on a product in full production.
1/12
www.st.com
Contents
STW21N150K5
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 8
4
Package information ....................................................................... 9
4.1
5
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TO-247 package information ............................................................. 9
Revision history ............................................................................ 11
DocID026818 Rev 3
STW21N150K5
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
VGS
Parameter
Gate-source voltage
Value
Unit
± 30
V
ID
Drain current at TC = 25 °C
14
A
ID
Drain current at TC = 100 °C
8.7
A
IDM(1)
Drain current (pulsed)
56
A
PTOT
Total dissipation at TC = 25 °C
446
W
dv/dt
(2)
Peak diode recovery voltage slope
4.5
V/ns
dv/dt
(3)
MOSFET dv/dt ruggedness
50
V/ns
- 55 to 150
°C
Value
Unit
Tj
Operating junction temperature
Tstg
Storage temperature
Notes:
(1)Pulse
(2)I
SD
(3)V
width limited by safe operating area
≤ 14 A, di/dt ≤ 100 A/µs, VPeak ≤ V(BR)DSS
DS
≤ 1200 V
Table 3: Thermal data
Symbol
Parameter
Rthj-case
Thermal resistance junction-case
0.28
°C/W
Rthj-amb
Thermal resistance junction-amb
50
°C/W
Value
Unit
5
A
1100
mJ
Table 4: Avalanche characteristics
Symbol
Parameter
IAR(1)
Max current during repetitive or single pulse
avalanche
EAS(2)
Single pulse avalanche energy
Notes:
(1)Pulse
width limited by TJmax
(2)Starting
TJ = 25 °C, ID = IAS, VDD = 50 V
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Electrical characteristics
2
STW21N150K5
Electrical characteristics
(TCASE = 25 °C unless otherwise specified)
Table 5: Static
Symbol
V(BR)DSS
Parameter
Test conditions
Drain-source breakdown
voltage
VGS = 0 V, ID = 1 mA
Min.
Typ.
Max.
Unit
1500
V
VGS = 0 V, VDS = 1500 V
1
µA
VGS = 0 V, VDS = 1500 V,
Tc = 125 °C
50
µA
Gate body leakage current
VDS = 0, VGS = ± 20 V
±10
µA
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 100 µA
4
5
V
RDS(on)
Static drain-source onresistance
VGS = 10 V, ID = 7 A
0.7
0.9
Ω
IDSS
Zero gate voltage drain
current
IGSS
3
Table 6: Dynamic
Symbol
Parameter
Ciss
Input capacitance
Coss
Output capacitance
Crss
Reverse transfer
capacitance
Co(tr)(1)
Test conditions
VGS = 0 V, VDS = 100 V,
f = 1 MHz
Equivalent capacitance
time related
Min.
Typ.
Max.
Unit
-
3145
-
pF
-
172
-
pF
-
1
-
pF
-
161
-
pF
-
65
-
pF
VDS = 0 V to 1200 V, VGS = 0 V
Co(er)(2)
Equivalent capacitance
energy related
RG
Intrinsic gate resistance
f = 1 MHz, ID = 0 A
-
2.4
-
Ω
VDD = 1200 V, ID = 7 A
VGS = 10 V
(see Figure 15: "Test circuit for
gate charge behavior")
-
89
-
nC
-
16
-
nC
-
59
-
nC
Qg
Total gate charge
Qgs
Gate-source charge
Qgd
Gate-drain charge
Notes:
(1)Time
related is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS
increases from 0 to 80% VDSS
(2)Energy
related is defined as a constant equivalent capacitance giving the same stored energy as Coss when
VDS increases from 0 to 80% VDSS
Table 7: Switching times
Symbol
td(on)
tr
td(off)
tf
4/12
Parameter
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Test conditions
VDD = 750 V, ID = 3.5 A,
RG = 4.7 Ω VGS = 10 V
(see Figure 17: "Unclamped
inductive load test circuit")
DocID026818 Rev 3
Min.
Typ.
Max.
Unit
-
34
-
ns
-
14
-
ns
-
134
-
ns
-
26
-
ns
STW21N150K5
Electrical characteristics
Table 8: Source drain diode
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
ISD
Source-drain current
-
7
A
ISDM
Source-drain current
(pulsed)
-
28
A
VSD(1)
Forward on voltage
ISD = 7 A, VGS = 0 V
-
1.5
V
trr
Reverse recovery time
-
448
ns
Qrr
Reverse recovery charge
-
8.24
µC
IRRM
Reverse recovery current
ISD = 7 A, VDD = 60 V
di/dt = 100 A/µs,
(see Figure 16: "Test circuit for
inductive load switching and
diode recovery times")
-
36.8
A
ISD = 7 A,VDD = 60 V
di/dt = 100 A/µs,
Tj = 150 °C
(see Figure 16: "Test circuit for
inductive load switching and
diode recovery times")
-
564
ns
-
9.48
µC
-
33.6
A
trr
Reverse recovery time
Qrr
Reverse recovery charge
IRRM
Reverse recovery current
Notes:
(1)Pulsed:
pulse duration = 300µs, duty cycle 1.5%
Table 9: Gate-source Zener diode
Symbol
V(BR)GSO
Parameter
Test conditions
Gate-source breakdown
voltage
IGS = ±1 mA, ID = 0 A
Min.
30
Typ.
Max.
-
Unit
V
The built-in back-to-back Zener diodes are specifically designed to enhance the ESD
performance of the device. The Zener voltage facilitates efficient and cost-effective device
integrity protection, thus eliminating the need for additional external componentry.
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Electrical characteristics
2.1
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STW21N150K5
Electrical characteristics (curves)
Figure 2: Safe operating area
Figure 3: Thermal impedance
Figure 4: Output characteristics
Figure 5: Transfer characteristics
Figure 6: Gate charge vs gate-source voltage
Figure 7: Static drain-source on-resistance
DocID026818 Rev 3
STW21N150K5
Electrical characteristics
Figure 8: Capacitance variations
Figure 9: Normalized gate threshold voltage
vs temperature
Figure 10: Normalized on-resistance vs
temperature
Figure 11: Normalized V(BR)DSS vs
temperature
Figure 12: Maximum avalanche energy vs
temperature
Figure 13: Source-drain diode forward
characteristics
DocID026818 Rev 3
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Test circuits
3
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STW21N150K5
Test circuits
Figure 14: Test circuit for resistive load
switching times
Figure 15: Test circuit for gate charge
behavior
Figure 16: Test circuit for inductive load
switching and diode recovery times
Figure 17: Unclamped inductive load test
circuit
Figure 18: Unclamped inductive waveform
Figure 19: Switching time waveform
DocID026818 Rev 3
STW21N150K5
4
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK ®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
4.1
TO-247 package information
Figure 20: TO-247 package outline
DocID026818 Rev 3
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Package information
STW21N150K5
Table 10: TO-247 package mechanical data
mm.
Dim.
Min.
Max.
A
4.85
5.15
A1
2.20
2.60
b
1.0
1.40
b1
2.0
2.40
b2
3.0
3.40
c
0.40
0.80
D
19.85
20.15
E
15.45
15.75
e
5.30
L
14.20
14.80
L1
3.70
4.30
L2
10/12
Typ.
5.45
5.60
18.50
ØP
3.55
ØR
4.50
S
5.30
DocID026818 Rev 3
3.65
5.50
5.50
5.70
STW21N150K5
5
Revision history
Revision history
Table 11: Document revision history
Date
Revision
26-Aug-2015
1
First release.
2
Text and formatting changes throughout document.
Updated features on cover page.
Updated sections Electrical ratings and Electrical characteristics.
Added section Electrical characteristics (curves).
Updated section TO-247 package information.
3
On cover page:
- updated figure Internal schematic diagram
In section Electrical characteristics:
- updated and renamed table Static (was On/off states).
10-Sep-2015
01-Oct-2015
Changes
DocID026818 Rev 3
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STW21N150K5
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