STW23N85K5
N-channel 850 V, 0.2 Ω typ., 19 A MDmesh™ K5
Power MOSFET in a TO-247 package
Datasheet - production data
Features
Order code
VDS
RDS(on) max.
ID
PTOT
STW23N85K5
850 V
0.275 Ω
19 A
250 W
•
•
•
•
•
3
2
1
TO-247
Industry’s lowest RDS(on) x area
Industry’s best figure of merit (FoM)
Ultra low gate charge
100% avalanche tested
Zener-protected
Applications
•
Figure 1: Internal schematic diagram
Switching applications
Description
This very high voltage N-channel Power
MOSFET is designed using MDmesh™ K5
technology based on an innovative proprietary
vertical structure. The result is a dramatic
reduction in on-resistance and ultra-low gate
charge for applications requiring superior power
density and high efficiency.
Table 1: Device summary
Order code
Marking
Package
Packing
STW23N85K5
23N85K5
TO-247
Tube
August 2015
DocID023547 Rev 3
This is information on a product in full production.
1/13
www.st.com
Contents
STW23N85K5
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 9
4
Package information ..................................................................... 10
4.1
5
2/13
TO-247 package information ........................................................... 10
Revision history ............................................................................ 12
DocID023547 Rev 3
STW23N85K5
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
VGS
ID
(1)
IDM
PTOT
dv/dt
(2)
Tstg
Tj
Parameter
Value
Unit
Gate-source voltage
±30
V
Drain current (continuous) at Tcase = 25 °C
19
Drain current (continuous) at Tcase = 100 °C
12.4
Drain current (pulsed)
250
A
Total dissipation at Tcase = 25 °C
250
W
6
V/ns
-55 to 150
°C
Value
Unit
Peak diode recovery voltage slope
Storage temperature
Operating junction temperature
A
Notes:
(1)
(2)
Pulse width is limited by safe operating area.
ISD ≤ 19 A, di/dt=100 A/μs; VDS peak < V(BR)DSS, VDD = 80% V(BR)DSS.
Table 3: Thermal data
Symbol
Parameter
Rthj-case
Thermal resistance junction-case
0.5
Rthj-amb
Thermal resistance junction-ambient
45
°C/W
Table 4: Avalanche characteristics
Symbol
Parameter
(1)
IAR
Avalanche current, repetitive or not repetitive
(2)
EAS
Single pulse avalanche energy
Value
Unit
6
A
200
mJ
Notes:
(1)
(2)
Pulse width limited by Tjmax.
starting Tj = 25 °C, ID = IAR, VDD = 50 V.
DocID023547 Rev 3
3/13
Electrical characteristics
2
STW23N85K5
Electrical characteristics
(Tcase = 25 °C unless otherwise specified)
Table 5: Static
Symbol
V(BR)DSS
Parameter
Test conditions
Drain-source
breakdown voltage
VGS = 0 V, ID = 1 mA
Min.
Typ.
Max.
850
Unit
V
VGS = 0 V, VDS = 850 V
10
VGS = 0 V, VDS = 850 V,
Tcase = 125 °C
50
±10
µA
4
5
V
0.2
0.275
Ω
Min.
Typ.
Max.
Unit
-
1650
-
-
115
-
-
2
-
IDSS
Zero gate voltage
drain current
IGSS
Gate-body leakage
current
VDS = 0 V, VGS = ±20 V
VGS(th)
Gate threshold
voltage
VDS = VGS, ID = 100 µA
RDS(on)
Static drain-source
on-resistance
VGS = 10 V, ID = 9.5 A
3
µA
Table 6: Dynamic
Symbol
Parameter
Test conditions
Ciss
Input capacitance
Coss
Output capacitance
Crss
Reverse transfer
capacitance
VDS = 100 V, f = 1 MHz,
VGS = 0 V
pF
Equivalent output
capacitance
VDS = 0 to 680 V, VGS = 0 V
-
185
-
pF
RG
Intrinsic gate
resistance
f = 1 MHz, ID = 0 A
-
3.5
-
Ω
Qg
Total gate charge
-
38
-
Qgs
Gate-source charge
-
11
-
Qgd
Gate-drain charge
VDD = 520 V, ID = 60 A,
VGS = 10 V (see Figure 17:
"Gate charge test circuit")
-
20
-
Coss eq.
(1)
nC
Notes:
(1)
Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS
increases from 0 to 80% VDSS.
Table 7: Switching times
Symbol
td(on)
tr
td(off)
tf
4/13
Parameter
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Test conditions
Min.
Typ.
Max.
VDD = 400 V, ID = 9.5 A
RG = 4.7 Ω, VGS = 10 V (see
Figure 16: "Switching times
test circuit for resistive load"
and Figure 21: "Switching time
waveform")
-
22
-
-
14
-
-
55
-
-
8
-
DocID023547 Rev 3
Unit
ns
STW23N85K5
Electrical characteristics
Table 8: Source-drain diode
Symbol
ISD
Parameter
Test conditions
Min.
Typ.
Max.
Unit
Source-drain current
-
19
A
(1)
Source-drain current
(pulsed)
-
76
A
(2)
Forward on voltage
-
1.5
V
ISDM
VSD
trr
Reverse recovery time
Qrr
Reverse recovery
charge
IRRM
Reverse recovery
current
trr
Reverse recovery time
Qrr
Reverse recovery
charge
IRRM
Reverse recovery
current
VGS = 0 V, ISD = 19 A
ISD = 19 A, di/dt = 100 A/µs,
VDD = 60 V (see Figure 18:
"Test circuit for inductive load
switching and diode recovery
times")
ISD = 19 A, di/dt = 100 A/µs,
VDD = 60 V, Tj = 150 °C (see
Figure 18: "Test circuit for
inductive load switching and
diode recovery times")
-
510
ns
-
11
µC
-
43
A
-
684
ns
-
14
µC
-
41
A
Notes:
(1)
(2)
Pulse width is limited by safe operating area.
Pulse test: pulse duration = 300 µs, duty cycle 1.5%.
DocID023547 Rev 3
5/13
Electrical characteristics
2.1
6/13
STW23N85K5
Electrical characteristics (curves)
Figure 2: Safe operating area
Figure 3: Thermal impedance
Figure 4: Output characteristics
Figure 5: Transfer characteristics
Figure 6: Gate charge vs gate-source voltage
Figure 7: Static drain-source on-resistance
DocID023547 Rev 3
STW23N85K5
Electrical characteristics
Figure 8: Capacitance variations
Figure 9: Normalized gate threshold voltage
vs temperature
Figure 10: Normalized on-resistance vs
temperature
Figure 11: Normalized V(BR)DSS vs
temperature
Figure 12: Output capacitance stored energy
Figure 13: Source- drain diode forward
characteristics
DocID023547 Rev 3
7/13
Electrical characteristics
STW23N85K5
Figure 14: Maximum avalanche energy vs
temperature (ID = 3.5 A)
8/13
Figure 15: Maximum avalanche energy vs
temperature (ID = 5.0 A)
DocID023547 Rev 3
STW23N85K5
3
Test circuits
Test circuits
Figure 16: Switching times test circuit for resistive
load
Figure 17: Gate charge test circuit
Figure 18: Test circuit for inductive load switching
and diode recovery times
Figure 19: Unclamped inductive load test circuit
Figure 20: Unclamped inductive waveform
Figure 21: Switching time waveform
DocID023547 Rev 3
9/13
Package information
4
STW23N85K5
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
®
®
ECOPACK packages, depending on their level of environmental compliance. ECOPACK
specifications, grade definitions and product status are available at: www.st.com.
®
ECOPACK is an ST trademark.
4.1
TO-247 package information
Figure 22: TO-247 package outline
0075325_H
10/13
DocID023547 Rev 3
STW23N85K5
Package information
Table 9: TO-247 package mechanical data
mm.
Dim.
Min.
Typ.
Max.
A
4.85
5.15
A1
2.20
2.60
b
1.0
1.40
b1
2.0
2.40
b2
3.0
3.40
c
0.40
0.80
D
19.85
20.15
E
15.45
15.75
e
5.30
L
14.20
14.80
L1
3.70
4.30
L2
5.45
5.60
18.50
ØP
3.55
ØR
4.50
S
5.30
DocID023547 Rev 3
3.65
5.50
5.50
5.70
11/13
Revision history
5
STW23N85K5
Revision history
Table 10: Document revision history
Date
Revision
06-Aug-2012
1
First release.
21-Jan-2014
2
Document status promoted from preliminary to production data.
Added Figure 12: Maximum avalanche energy vs temperature.
3
Text and formatting changes throughout document.
On cover page:
- updated Title, Features and Description
Updated Section Electrical characteristics
Updated Section Electrical characteristics (curves)
Updated and renamed Section Package information (was Package
mechanical data)
13-Aug-2015
12/13
Changes
DocID023547 Rev 3
STW23N85K5
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© 2015 STMicroelectronics – All rights reserved
DocID023547 Rev 3
13/13
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