STW37N60DM2AG
Automotive-grade N-channel 600 V, 0.094 Ω typ., 28 A
MDmesh™ DM2 Power MOSFET in a TO-247 package
Datasheet - production data
Features
Order code
VDS
RDS(on) max.
ID
PTOT
STW37N60DM2AG
600 V
0.110 Ω
28 A
210 W
3
2
1
TO-247
Designed for automotive applications and
AEC-Q101 qualified
Fast-recovery body diode
Extremely low gate charge and input
capacitance
Low on-resistance
100% avalanche tested
Extremely high dv/dt ruggedness
Zener-protected
Figure 1: Internal schematic diagram
Applications
Switching applications
Description
This high voltage N-channel Power MOSFET is
part of the MDmesh™ DM2 fast recovery diode
series. It offers very low recovery charge (Qrr)
and time (trr) combined with low RDS(on), rendering
it suitable for the most demanding high efficiency
converters and ideal for bridge topologies and
ZVS phase-shift converters.
Table 1: Device summary
Order code
Marking
Package
Packing
STW37N60DM2AG
37N60DM2
TO-247
Tube
August 2015
DocID028243 Rev 1
This is information on a product in full production.
1/12
www.st.com
Contents
STW37N60DM2AG
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 8
4
Package information ....................................................................... 9
4.1
5
2/12
TO-247 package information ............................................................. 9
Revision history ............................................................................ 11
DocID028243 Rev 1
STW37N60DM2AG
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
Value
Unit
Gate-source voltage
±25
V
Drain current (continuous) at Tcase = 25 °C
28
Drain current (continuous) at Tcase = 100 °C
17
IDM(1)
Drain current (pulsed)
112
A
PTOT
W
VGS
ID
Parameter
Total dissipation at Tcase = 25 °C
210
dv/dt(2)
Peak diode recovery voltage slope
50
dv/dt(3)
MOSFET dv/dt ruggedness
50
Tstg
Tj
Storage temperature
Operating junction temperature
A
V/ns
-55 to 150
°C
Value
Unit
Notes:
(1)
Pulse width is limited by safe operating area.
(2)
ISD ≤ 28 A, di/dt=800 A/μs; VDS peak < V(BR)DSS,VDD = 80% V(BR)DSS.
(3)
VDS ≤ 480 V.
Table 3: Thermal data
Symbol
Parameter
Rthj-case
Thermal resistance junction-case
0.6
Rthj-amb
Thermal resistance junction-amb
50
°C/W
Table 4: Avalanche characteristics
Symbol
IAR
EAS(1)
Parameter
Avalanche current, repetitive or not repetitive
Single pulse avalanche energy
Value
Unit
6
A
650
mJ
Notes:
(1)
starting Tj = 25 °C, ID = IAR, VDD = 50 V.
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Electrical characteristics
2
STW37N60DM2AG
Electrical characteristics
(Tcase = 25 °C unless otherwise specified)
Table 5: Static
Symbol
Parameter
Test conditions
V(BR)DSS
Drain-source breakdown
voltage
VGS = 0 V, ID = 1 mA
Min.
Typ.
Max.
600
Unit
V
VGS = 0 V, VDS = 600 V
10
VGS = 0 V, VDS = 600 V,
Tcase = 125 °C
100
Gate-body leakage
current
VDS = 0 V, VGS = ±25 V
±5
µA
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 250 µA
4
5
V
RDS(on)
Static drain-source onresistance
VGS = 10 V, ID = 14 A
0.094
0.11
Ω
Min.
Typ.
Max.
Unit
-
2400
-
-
110
-
-
2.8
-
IDSS
Zero gate voltage drain
current
IGSS
3
µA
Table 6: Dynamic
Symbol
Parameter
Test conditions
Ciss
Input capacitance
Coss
Output capacitance
Crss
Reverse transfer
capacitance
Coss eq.(1)
Equivalent output
capacitance
VDS = 0 to 480 V, VGS = 0 V
-
190
-
pF
RG
Intrinsic gate resistance
f = 1 MHz, ID = 0 A
-
4.3
-
Ω
Qg
Total gate charge
-
54
-
Qgs
Gate-source charge
-
14.6
-
Qgd
Gate-drain charge
VDD = 480 V, ID = 28 A,
VGS = 10 V (see Figure 15:
"Test circuit for gate charge
behavior")
-
24.2
-
VDS = 100 V, f = 1 MHz,
VGS = 0 V
pF
nC
Notes:
(1)
Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS
increases from 0 to 80% VDSS.
Table 7: Switching times
Symbol
td(on)
tr
td(off)
tf
4/12
Parameter
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Test conditions
Min.
Typ.
Max.
VDD = 300 V, ID = 14 A
RG = 4.7 Ω, VGS = 10 V (see
Figure 14: "Test circuit for
resistive load switching times"
and Figure 19: "Switching time
waveform")
-
21.2
-
-
17
-
-
68
-
-
10.7
-
DocID028243 Rev 1
Unit
ns
STW37N60DM2AG
Electrical characteristics
Table 8: Source-drain diode
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
ISD
Source-drain current
-
28
A
ISDM(1)
Source-drain current
(pulsed)
-
112
A
VSD(2)
Forward on voltage
VGS = 0 V, ISD = 28 A
-
1.6
V
trr
Reverse recovery time
-
120
ns
Qrr
Reverse recovery charge
-
572
nC
IRRM
Reverse recovery current
ISD = 28 A, di/dt = 100 A/µs,
VDD = 60 V (see Figure 16:
"Test circuit for inductive load
switching and diode recovery
times")
-
10.2
A
ISD = 28 A, di/dt = 100 A/µs,
VDD = 60 V, Tj = 150 °C (see
Figure 16: "Test circuit for
inductive load switching and
diode recovery times")
-
215
ns
-
1.89
µC
-
17.7
A
trr
Reverse recovery time
Qrr
Reverse recovery charge
IRRM
Reverse recovery current
Notes:
(1)
Pulse width is limited by safe operating area.
(2)
Pulse test: pulse duration = 300 µs, duty cycle 1.5%.
Table 9: Gate-source Zener diode
Symbol
V(BR)GSO
Parameter
Test conditions
Gate-source breakdown
voltage
IGS = ±250 µA, ID = 0 A
Min.
Typ.
Max.
Unit
±30
-
-
V
The built-in back-to-back Zener diodes are specifically designed to enhance the ESD
performance of the device. The Zener voltage facilitates efficient and cost-effective device
integrity protection, thus eliminating the need for additional external componentry.
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Electrical characteristics
2.1
STW37N60DM2AG
Electrical characteristics (curves)
Figure 3: Thermal impedance
Figure 2: Safe operating area
K
GC18460
10-1
10-2
10-3
10-5
6/12
10-4
10-3
10-2
10-1
tp(s)
Figure 4: Output characteristics
Figure 5: Transfer characteristics
Figure 6: Gate charge vs gate-source voltage
Figure 7: Static drain-source on-resistance
DocID028243 Rev 1
STW37N60DM2AG
Electrical characteristics
Figure 8: Capacitance variations
Figure 9: Normalized gate threshold voltage
vs temperature
Figure 10: Normalized on-resistance vs
temperature
Figure 11: Normalized V(BR)DSS vs
temperature
Figure 12: Output capacitance stored energy
Figure 13: Source-drain diode forward
characteristics
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Test circuits
3
8/12
STW37N60DM2AG
Test circuits
Figure 14: Test circuit for resistive load
switching times
Figure 15: Test circuit for gate charge
behavior
Figure 16: Test circuit for inductive load
switching and diode recovery times
Figure 17: Unclamped inductive load test
circuit
Figure 18: Unclamped inductive waveform
Figure 19: Switching time waveform
DocID028243 Rev 1
STW37N60DM2AG
4
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
4.1
TO-247 package information
Figure 20: TO-247 package outline
DocID028243 Rev 1
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Package information
STW37N60DM2AG
Table 10: TO-247 package mechanical data
mm.
Dim.
Min.
Max.
A
4.85
5.15
A1
2.20
2.60
b
1.0
1.40
b1
2.0
2.40
b2
3.0
3.40
c
0.40
0.80
D
19.85
20.15
E
15.45
15.75
e
5.30
L
14.20
14.80
L1
3.70
4.30
L2
10/12
Typ.
5.45
5.60
18.50
ØP
3.55
ØR
4.50
S
5.30
DocID028243 Rev 1
3.65
5.50
5.50
5.70
STW37N60DM2AG
5
Revision history
Revision history
Table 11: Document revision history
Date
Revision
25-Aug-2015
1
DocID028243 Rev 1
Changes
Initial version
11/12
STW37N60DM2AG
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DocID028243 Rev 1
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