STW40N65M2
N-channel 650 V, 0.087 Ω typ., 32 A MDmesh™ M2
Power MOSFET in a TO-247 package
Datasheet - production data
Features
•
•
•
•
3
2
1
Order code
VDS
RDS(on) max.
ID
STW40N65M2
650 V
0.099 Ω
32 A
Extremely low gate charge
Excellent output capacitance (COSS) profile
100% avalanche tested
Zener-protected
Applications
TO-247
•
Figure 1: Internal schematic diagram
Switching applications
Description
This device is an N-channel Power MOSFET
developed using MDmesh™ M2 technology.
Thanks to its strip layout and an improved vertical
structure, the device exhibits low on-resistance
and optimized switching characteristics,
rendering it suitable for the most demanding high
efficiency converters.
Table 1: Device summary
Order code
Marking
Package
Packaging
STW40N65M2
40N65M2
TO-247
Tube
February 2015
DocID027443 Rev 1
This is information on a product in full production.
1/12
www.st.com
Contents
STW40N65M2
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.2
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 8
4
Package information ....................................................................... 9
4.1
5
2/12
TO-247 package information ............................................................. 9
Revision history ............................................................................ 11
DocID027443 Rev 1
STW40N65M2
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
VGS
Parameter
Gate-source voltage
Value
Unit
± 25
V
ID
Drain current (continuous) at TC = 25 °C
32
A
ID
Drain current (continuous) at TC= 100 °C
20
A
Drain current (pulsed)
128
A
IDM
(1)
Total dissipation at TC = 25 °C
250
W
dv/dt
(2)
Peak diode recovery voltage slope
15
V/ns
dv/dt
(3)
MOSFET dv/dt ruggedness
50
V/ns
PTOT
Tstg
Tj
Storage temperature
- 55 to 150
Max. operating junction temperature
150
°C
Notes:
(1)
Pulse width limited by safe operating area.
(2)
ISD ≤ 32 A, di/dt ≤ 400 A/µs; VDS peak < V(BR)DSS, VDD = 400 V
(3)
VDS ≤ 520 V
Table 3: Thermal data
Symbol
Parameter
Value
Unit
Rthj-case
Thermal resistance junction-case max
0.5
°C/W
Rthj-amb
Thermal resistance junction-ambient max
50
°C/W
Table 4: Avalanche characteristics
Symbol
Parameter
Value
Unit
IAR
Avalanche current, repetitive or not repetitive (pulse width
limited by Tjmax)
3
A
EAS
Single pulse avalanche energy (starting Tj = 25 °C,
ID = IAR, VDD = 50 V)
820
mJ
DocID027443 Rev 1
3/12
Electrical characteristics
2
STW40N65M2
Electrical characteristics
(TC= 25 °C unless otherwise specified)
Table 5: On/off states
Symbol
Parameter
Test conditions
V(BR)DSS
Drain-source breakdown
voltage
IDSS
Zero gate voltage Drain
current
IGSS
VGS = 0 V, ID = 1 mA
Min.
Typ.
Max.
650
Unit
V
VGS = 0 V, VDS = 650 V
1
µA
VGS = 0 V, VDS = 650 V,
TC = 125 °C
100
µA
Gate-body leakage current
VDS = 0 V, VGS = ± 25 V
±10
µA
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 250 µA
3
4
V
RDS(on)
Static drain-source onresistance
VGS = 10 V, ID = 16 A
0.087
0.099
Ω
Min.
Typ.
Max.
Unit
-
2355
-
pF
-
102
-
pF
-
2.7
-
pF
2
Table 6: Dynamic
Symbol
Parameter
Ciss
Input capacitance
Coss
Output capacitance
Crss
Reverse transfer
capacitance
Test conditions
VDS= 100 V, f = 1 MHz,
VGS = 0 V
Equivalent output
capacitance
VDS = 0 V to 520 V, VGS = 0 V
-
380
-
pF
RG
Intrinsic gate resistance
f = 1 MHz open drain
-
4.5
-
Ω
Qg
Total gate charge
-
56.5
-
nC
Qgs
Gate-source charge
-
8
-
nC
Qgd
Gate-drain charge
-
24
-
nC
Coss eq.
(1)
VDD = 520 V, ID = 32 A,
VGS = 10 V (see Figure 15:
"Gate charge test circuit")
Notes:
(1)
Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS
increases from 0 to 80% VDSS
Table 7: Switching times
Symbol
td(on)
tr
td(off)
tf
4/12
Parameter
Turn-on delay time
Rise time
Turn-off-delay time
Fall time
Test conditions
Min.
VDD = 325 V, ID = 16 A
RG = 4.7 Ω, VGS = 10 V (see
Figure 14: "Switching times
test circuit for resistive load"
and Figure 19: "Switching time
waveform")
-
DocID027443 Rev 1
Typ.
15
Max.
Unit
-
ns
-
10
-
ns
-
96.5
-
ns
-
12
-
ns
STW40N65M2
Electrical characteristics
Table 8: Source drain diode
Symbol
ISD
(1)
ISDM
VSD
(2)
Parameter
Test conditions
Min.
Typ.
Max.
Unit
Source-drain
current
-
32
A
Source-drain
current
(pulsed)
-
128
A
-
1.6
V
Forward on
voltage
trr
Reverse
recovery time
Qrr
Reverse
recovery
charge
IRRM
VGS = 0 V, ISD = 32 A
-
468
ns
-
8.7
µC
Reverse
recovery
current
-
37.5
A
trr
Reverse
recovery time
-
610
ns
Qrr
Reverse
recovery
charge
-
11.7
µC
IRRM
Reverse
recovery
current
-
39
A
ISD = 32 A, di/dt = 100 A/µs, VDD = 60 V
(see Figure 16: " Test circuit for inductive
load switching and diode recovery times")
ISD = 32 A, di/dt = 100 A/µs, VDD = 60 V,
Tj = 150 °C (see Figure 16: " Test circuit
for inductive load switching and diode
recovery times")
Notes:
(1)
(2)
Pulse width is limited by safe operating area
Pulse test: pulse duration = 300 µs, duty cycle 1.5%
DocID027443 Rev 1
5/12
Electrical characteristics
2.2
STW40N65M2
Electrical characteristics (curves)
Figure 2: Safe operating area
ID
(A)
Figure 3: Thermal impedance
GIPD030220151540ALS
δ=0.5
0.2
100
10µs
is
1
DS
(o
n)
O
p
lim era
ite tio
d ni
by n
m this
ax a
R r ea
10
0.1
0.1
10-1
1ms
10-2
10ms
Tj = 150 °C
Tc = 25 °C
Single pulse
Zth = K*Rthj-c
δ= tp/Ƭ
tp
10-3
10-5
VDS(V)
100
10
-4
10
-3
10
-2
Ƭ
10-1
tp (s)
Figure 5: Transfer characteristics
ID
(A)
GIPG300120151500ALS
VGS = 6,7,8,9,10 V
GIPG300120151715ALS
70
VGS = 5 V
60
0.01
Single pulse
Figure 4: Output characteristics
60
50
50
40
40
30
VGS = 20 V
30
VGS = 4 V
20
20
10
10
4
8
12
16
20
0
0
24 VDS (V)
Figure 6: Normalized gate threshold voltage
vs temperature
6/12
0.1
0.05
0.02
100µs
10
1
ID
(A)
70
0
0
GC18460
K
2
4
6
8
VGS (V)
Figure 7: Normalized V(BR)DSS vs temperature
DocID027443 Rev 1
STW40N65M2
Electrical characteristics
Figure 8: Static drain-source on-resistance
Figure 9: Normalized on-resistance vs.
temperature
Figure 10: Gate charge vs. gate-source
voltage
Figure 11: Capacitance variations
Figure 12: Output capacitance stored energy
DocID027443 Rev 1
Figure 13: Source-drain diode forward
characteristics
7/12
Test circuits
3
STW40N65M2
Test circuits
Figure 14: Switching times test circuit for resistive
load
Figure 15: Gate charge test circuit
VDD
47 k Ω
12 V
1 kΩ
100 nF
I G = CONST
Vi ≤ V GS
100 Ω
D.U.T.
2.7 k Ω
2200 μ F
VG
47 k Ω
PW
1 kΩ
AM01469v 1
Figure 16: Test circuit for inductive load
switching and diode recovery times
A
A
D.U.T.
FAST
DIODE
B
B
Figure 17: Unclamped inductive load test circuit
A
D
G
S
25 Ω
L=100 µH
3.3
µF
B
1000
µF
D
G
RG
VDD
D.U.T.
S
AM01470v1
Figure 18: Unclamped inductive waveform
Figure 19: Switching time waveform
toff
t on
V(BR)DSS
t d(on)
VD
tr
t d(off)
tf
90%
90%
I DM
10%
ID
VDD
10%
0
VDD
VGS
AM01472v 1
8/12
DocID027443 Rev 1
0
10%
VDS
90%
AM01473v 1
STW40N65M2
4
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
®
®
ECOPACK packages, depending on their level of environmental compliance. ECOPACK
specifications, grade definitions and product status are available at: www.st.com.
®
ECOPACK is an ST trademark.
4.1
TO-247 package information
Figure 20: TO-247 drawing
0075325_H
DocID027443 Rev 1
9/12
Package information
STW40N65M2
Table 9: TO-247 mechanical data
mm.
Dim.
Min.
Max.
A
4.85
5.15
A1
2.20
2.60
b
1.0
1.40
b1
2.0
2.40
b2
3.0
3.40
c
0.40
0.80
D
19.85
20.15
E
15.45
15.75
e
5.30
L
14.20
14.80
L1
3.70
4.30
L2
10/12
Typ.
5.45
5.60
18.50
ØP
3.55
3.65
ØR
4.50
5.50
S
5.30
DocID027443 Rev 1
5.50
5.70
STW40N65M2
5
Revision history
Revision history
Table 10: Document revision history
Date
Revision
09-Feb-2014
1
DocID027443 Rev 1
Changes
First release.
11/12
STW40N65M2
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12/12
DocID027443 Rev 1
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