STW45NM50
N-channel 500 V, 0.08 Ω typ., 45 A MDmesh™
Power MOSFET in a TO-247 package
Datasheet - production data
Features
3
2
1
Order code
VDS
RDS(on) max
ID
STW45NM50
500 V
0.1 Ω
45 A
100% avalanche tested
High dv/dt and avalanche capabilities
Low input capacitance and gate charge
Low gate input resistance
Applications
TO-247
Switching applications
Description
Figure 1: Internal schematic diagram
This N-channel Power MOSFET is developed
using STMicroelectronics' revolutionary
MDmesh™ technology, which associates the
multiple drain process with the company's
PowerMESH™ horizontal layout. This device
offer extremely low on-resistance, high dv/dt and
excellent avalanche characteristics. Utilizing ST's
proprietary strip technique, this Power MOSFET
boasts an overall dynamic performance which is
superior to similar products on the market.
Table 1: Device summary
Order code
Marking
Package
Packaging
STW45NM50
W45NM50
TO-247
Tube
July 2016
DocID8477 Rev 6
This is information on a product in full production.
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www.st.com
Contents
STW45NM50
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 8
4
Package information ....................................................................... 9
4.1
5
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TO-247 package information ............................................................. 9
Revision history ............................................................................ 11
DocID8477 Rev 6
STW45NM50
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
VGS
Parameter
Value
Unit
Gate-source voltage
±30
V
ID
Drain current (continuous) at TC = 25 °C
45
A
ID
Drain current (continuous) at TC = 100 °C
28.4
A
Drain current (pulsed)
180
A
Total dissipation at TC = 25 °C
390
W
Peak diode recovery voltage slope
15
V/ns
-55 to 150
°C
IDM
(1)
PTOT
(2)
dv/dt
Tstg
Tj
Storage temperature range
Operating junction temperature range
Notes:
(1)Pulse
(2)I
SD
width limited by safe operating area.
≤ 45 A, di/dt ≤ 400 A/µs, VDS(peak) ≤ V(BR)DSS, VDD ≤ 80% V(BR)DSS
Table 3: Thermal data
Symbol
Parameter
Rthj-case
Thermal resistance junction-case
Rthj-amb
Thermal resistance junction-ambient
Value
Unit
0.32
°C/W
30
°C/W
Table 4: Avalanche characteristics
Symbol
Parameter
Value
Unit
IAR
Avalanche current, repetitive or not-repetitive
(pulse width limited by Tj max)
15
A
EAS
Single pulse avalanche energy
(starting TJ=25 °C, ID=IAR, VDD=50 V)
700
mJ
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Electrical characteristics
2
STW45NM50
Electrical characteristics
(TCASE = 25 °C unless otherwise specified)
Table 5: On/off states
Symbol
V(BR)DSS
Parameter
Test conditions
Drain-source
breakdown voltage
ID = 1 mA, VGS = 0 V
IDSS
Zero gate voltage drain
current
IGSS
Min.
Typ.
Max.
500
V
VGS = 0 V, VDS = 500 V
10
VGS = 0 V, VDS = 500 V,
TC= 125 °C (1)
100
Gate-body leakage current
VDS = 0 V, VGS = ±30 V
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 250 µA
RDS(on)
Static drain-source onresistance
VGS = 10 V, ID = 22.5 A
Unit
µA
±100
nA
4
5
V
0.08
0.1
Ω
Min.
Typ.
Max.
Unit
-
3290
-
pF
-
865
-
pF
-
140
-
pF
VGS = 0 V, VDS = 0 to 400 V
-
270
-
pF
-
113
-
nC
-
17
-
nC
-
82
-
nC
-
1.7
-
Ω
3
Notes:
(1)Defined
by design, not subject to production test.
Table 6: Dynamic
Symbol
Ciss
Parameter
Test conditions
Input capacitance
VDS = 25 V, f = 1 MHz,
VGS = 0 V
Coss
Output capacitance
Crss
Reverse transfer
capacitance
Coss eq. (1)
Equivalent output
capacitance
Qg
Total gate charge
Qgs
Gate-source charge
Qgd
Gate-drain charge
VDD = 400 V, ID = 45 A,
VGS = 10 V (see Figure 14:
"Test circuit for gate charge
behavior")
RG
Gate input resistance
f = 1 MHz, ID= 0 A
Notes:
(1)C
oss eq.
is defined as a constant equivalent capacitance giving the same charging time as C oss when VDS
increases from 0 to 80% VDS
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STW45NM50
Electrical characteristics
Table 7: Switching times
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
td(on)
Turn-on delay time
VDD = 250 V, ID = 22.5 A, RG = 4.7 Ω,
VGS = 10 V (see Figure 15: "Test
circuit for inductive load switching and
diode recovery times")
-
29.1
-
ns
-
73.6
-
ns
VDD = 400 V, ID = 45 A, RG = 4.7 Ω,
VGS = 10 V (see Figure 15: "Test
circuit for inductive load switching and
diode recovery times")
-
20.8
-
ns
-
58.3
-
ns
-
67.6
-
ns
Max.
Unit
tr
Rise time
Off-voltage rise
time
tr(Voff)
tf
Fall time
tc
Cross-over time
Table 8: Source-drain diode
Symbol
Parameter
Test conditions
Min.
Typ.
ISD
Source-drain current
-
45
A
ISDM(1)
Source-drain current
(pulsed)
-
180
A
VSD(2)
Forward on voltage
ISD = 45 A, VGS = 0 V
-
1.5
trr
Reverse recovery time
-
454
ns
Qrr
Reverse recovery
charge
-
9380
nC
IRRM
Reverse recovery
current
ISD = 45 A, di/dt = 100 A/µs
VDD = 60 V (see Figure 15: "Test
circuit for inductive load
switching and diode recovery
times")
-
41.3
A
ISD = 45 A, di/dt = 100 A/µs
VDD = 100 V, Tj = 150 °C (see
Figure 15: "Test circuit for
inductive load switching and
diode recovery times")
-
567
ns
-
12700
nC
-
44.8
A
trr
Reverse recovery time
Qrr
Reverse recovery
charge
IRRM
Reverse recovery
current
V
Notes:
(1)Pulse
width limited by safe operating area.
(2)Pulsed:
pulse duration = 300 µs, duty cycle 1.5%
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Electrical characteristics
2.1
STW45NM50
Electrical characteristics (curves)
Figure 2: Safe operating area
Figure 3: Thermal impedance
d
Figure 4: Output characteristics
Figure 5: Transfer characteristics
Figure 6: Gate charge vs gate-source voltage
Figure 7: Static drain-source on resistance
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STW45NM50
Electrical characteristics
Figure 8: Capacitance variations
Figure 9: Normalized gate threshold voltage vs
temperature
Figure 10: Normalized on-resistance vs temperature
Figure 11: Normalized V(BR)DSS vs temperature
Figure 12: Source-drain diode forward characteristics
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Test circuits
3
STW45NM50
Test circuits
Figure 13: Test circuit for resistive load
switching times
Figure 15: Test circuit for inductive load
switching and diode recovery times
Figure 17: Unclamped inductive waveform
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DocID8477 Rev 6
Figure 14: Test circuit for gate charge
behavior
Figure 16: Unclamped inductive load test
circuit
Figure 18: Switching time waveform
STW45NM50
4
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK ®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
4.1
TO-247 package information
Figure 19: TO-247 package outline
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Package information
STW45NM50
Table 9: TO-247 package mechanical data
mm
Dim.
Min.
Max.
A
4.85
5.15
A1
2.20
2.60
b
1.0
1.40
b1
2.0
2.40
b2
3.0
3.40
c
0.40
0.80
D
19.85
20.15
E
15.45
15.75
e
5.30
L
14.20
14.80
L1
3.70
4.30
L2
10/12
Typ.
5.45
5.60
18.50
ØP
3.55
ØR
4.50
S
5.30
DocID8477 Rev 6
3.65
5.50
5.50
5.70
STW45NM50
5
Revision history
Revision history
Table 10: Document revision history
Date
Revision
30-Mar-2005
4
Modified value on Source drain diode
23-Jul-2009
5
Modified values on Switching times
6
Modified: Table 2: "Absolute maximum ratings", Table 3: "Thermal
data", Table 4: "Avalanche characteristics", Table 5: "On/off
states", Table 6: "Dynamic", Table 7: "Switching times" and Table
8: "Source-drain diode"
Modified: Section 5.1: "Electrical characteristics (curves)"
Updated: Section 7.1: "TO-247 package information"
18-Jul-2016
Changes
DocID8477 Rev 6
11/12
STW45NM50
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