STW50N65DM2AG
Datasheet
Automotive-grade N-channel 650 V, 70 mΩ typ., 38 A
Power MOSFET MDmesh DM2 in a TO-247 package
Features
1
2
3
TO-247
D(2, TAB)
•
•
•
•
•
•
•
Order code
VDS
RDS(on) max.
ID
STW50N65DM2AG
650 V
87 mΩ
38 A
AEC-Q101 qualified
Fast-recovery body diode
Extremely low gate charge and input capacitance
Low on-resistance
100% avalanche tested
Extremely high dv/dt ruggedness
Zener-protected
Applications
G(1)
•
Switching applications
Description
S(3)
NG1D2TS3Z
This high-voltage N-channel Power MOSFET is part of the MDmesh DM2 fastrecovery diode series. It offers very low recovery charge (Qrr) and time (trr) combined
with low RDS(on), rendering it suitable for the most demanding high-efficiency
converters and ideal for bridge topologies and ZVS phase-shift converters.
Product status link
STW50N65DM2AG
Product summary(1)
Order code
STW50N65DM2AG
Marking
50N65DM2
Package
TO-247
Packing
Tube
1. The HTRB test was performed at 80%
V(BR)DSS in compliance with AEC-Q101
rev. C. All the other tests were
performed according to rev. D.
DS11149 - Rev 3 - August 2020
For further information contact your local STMicroelectronics sales office.
www.st.com
STW50N65DM2AG
Electrical ratings
1
Electrical ratings
Table 1. Absolute maximum ratings
Symbol
Parameter
Value
Unit
Gate-source voltage (static)
±25
Gate-source voltage (dynamic AC (f > 1 Hz))
±30
Drain current (continuous) at TC = 25 °C
38
Drain current (continuous) at TC = 100 °C
24
IDM (1)
Drain current (pulsed)
152
A
PTOT
Total power dissipation at TC = 25 °C
300
W
dv/dt(2)
Peak diode recovery voltage slope
100
V/ns
di/dt(2)
Peak diode recovery current slope
1000
A/μs
dv/dt(3)
MOSFET dv/dt ruggedness
100
V/ns
-55 to 150
°C
Value
Unit
0.42
°C/W
50
°C/W
Value
Unit
Avalanche current, repetitive or not repetitive
7.5
A
Single pulse avalanche energy
850
mJ
VGS
ID
Tstg
TJ
Storage temperature
Operating junction temperature
V
A
1. Pulse width is limited by safe operating area.
2. ISD ≤ 38 A, VDS peak < V(BR)DSS, VDD = 80% V(BR)DSS.
3. VDS ≤ 520 V.
Table 2. Thermal data
Symbol
Parameter
Rthj-case
Thermal resistance junction-case
Rthj-amb
Thermal resistance junction-ambient
Table 3. Avalanche characteristics
Symbol
IAR
EAS (1)
Parameter
1. Starting TJ = 25 °C, ID = IAR, VDD = 50 V.
DS11149 - Rev 3
page 2/12
STW50N65DM2AG
Electrical characteristics
2
Electrical characteristics
(TC = 25 °C unless otherwise specified)
Table 4. Static
Symbol
V(BR)DSS
Parameter
Test conditions
Drain-source breakdown voltage
Min.
VGS = 0 V, ID = 1 mA
Typ.
650
Zero gate voltage drain current
IGSS
Gate-body leakage current
VDS = 0 V, VGS = ±25 V
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 250 µA
RDS(on)
Static drain-source on-resistance
VGS = 10 V, ID = 19 A
VGS = 0 V, VDS = 650 V, TC = 125
Unit
V
VGS = 0 V, VDS = 650 V
IDSS
Max.
10
°C(1)
100
µA
±5
µA
4
5
V
70
87
mΩ
Min.
Typ.
Max.
Unit
-
3200
-
pF
-
130
-
pF
-
3
-
pF
3
1. Defined by design, not subject to production test.
Table 5. Dynamic
Symbol
Parameter
Ciss
Input capacitance
Coss
Output capacitance
Crss
Test conditions
VDS = 100 V, f = 1 MHz, VGS = 0 V
Reverse transfer capacitance
(1)
Equivalent output capacitance
VDS = 0 to 520 V, VGS = 0 V
-
256
-
pF
RG
Intrinsic gate resistance
f = 1 MHz, ID = 0 A
-
4
-
Ω
Qg
Total gate charge
-
69
-
nC
Qgs
Gate-source charge
-
18
-
nC
Qgd
Gate-drain charge
-
34
-
nC
Coss eq.
VDD = 520 V, ID = 38 A, VGS = 0 to 10 V
(see Figure 14. Test circuit for gate
charge behavior)
1. Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases from 0
to 80% VDSS.
Table 6. Switching times
Symbol
td(on)
tr
td(off)
tf
DS11149 - Rev 3
Parameter
Test conditions
Min.
Typ.
Max.
Unit
Turn-on delay time
VDD = 325 V, ID = 19 A,
-
22.5
-
ns
Rise time
RG = 4.7 Ω, VGS = 10 V
-
21
-
ns
Turn-off delay time
(see Figure 13. Test circuit for resistive
load switching times and
Figure 18. Switching time waveform)
-
89
-
ns
-
10.5
-
ns
Fall time
page 3/12
STW50N65DM2AG
Electrical characteristics
Table 7. Source-drain diode
Symbol
ISD
Parameter
Test conditions
Min.
Typ.
Max.
Unit
Source-drain current
-
38
A
ISDM (1)
Source-drain current (pulsed)
-
152
A
VSD (2)
Forward on voltage
VGS = 0 V, ISD = 38 A
-
1.6
V
trr
Reverse recovery time
ISD = 38 A, di/dt = 100 A/µs,
-
150
ns
Qrr
Reverse recovery charge
VDD = 60 V
-
0.96
µC
Reverse recovery current
(see Figure 15. Test circuit for inductive
load switching and diode recovery times)
-
12.8
A
trr
Reverse recovery time
ISD = 38 A, di/dt = 100 A/µs,
-
245
ns
Qrr
Reverse recovery charge
VDD = 60 V, TJ = 150 °C
-
2.7
µC
IRRM
Reverse recovery current
(see Figure 15. Test circuit for inductive
load switching and diode recovery times)
-
22
A
IRRM
1. Pulse width is limited by safe operating area.
2. Pulse test: pulse duration = 300 µs, duty cycle 1.5%.
DS11149 - Rev 3
page 4/12
STW50N65DM2AG
Electrical characteristics (curves)
2.1
Electrical characteristics (curves)
Figure 2. Thermal impedance
Figure 1. Safe operating area
ID
(A)
K
GIPG090715FQFIWSOA
10 2
TO247EZx8
10 µs
10 0
10 -1
10 -1
10 0
S(
on
)
Zth=k*Rthj-c
100 µs
D
10 1
O
lim per
ite atio
d
by n in
m th
ax is
. R ar
e
a
is
10 -1
1 ms
10 ms
T j = 150 °C
T c = 25 °C
single pulse
10 1
10 2
V DS (V)
10 -2
10 -3
10 -5
Figure 3. Output characteristics
ID
(A)
10 -2
ID
(A)
GIPG090715FQFIWOCH
10 -1
tp (s)
GIPG090715FQFIWTCH
V DS = 15 V
100
V GS = 8 V
80
80
V GS = 7 V
60
60
40
40
V GS = 6 V
20
0
0
4
8
12
16
20
V DS (V)
Figure 5. Gate charge vs gate-source voltage
V GS
(V)
12
10 -3
Figure 4. Transfer characteristics
V GS = 9,10 V
100
10 -4
GIPG090715FQFIWQVG V DS
(V)
V DD = 520V
I D = 38 A
V DS
600
0
3
4
5
6
7
8
9
V GS (V)
Figure 6. Static drain-source on-resistance
R DS(on)
(Ω)
GIPG090715FQFIWRID
V GS = 10 V
0.085
10
500
8
400
6
300
4
200
2
100
0.065
0
Q g (nC)
0.060
0
0.080
0.075
0
0
DS11149 - Rev 3
10
20
30
40
50
60
70
0.070
5
10
15
20
25
30
35
I D (A)
page 5/12
STW50N65DM2AG
Electrical characteristics (curves)
Figure 8. Normalized gate threshold voltage vs
temperature
Figure 7. Capacitance variations
C
(pF)
GIPG090715FQFIWCVR
V GS(th)
(norm.)
10 4
GIPG090715FQFIWVTH
I D = 250 µA
1.1
C ISS
1.0
10 3
0.9
C OSS
10 2
0.8
10 1
C RSS
f = 1 MHz
10
10 -1
0
10 0
10 1
V DS (V)
10 2
Figure 9. Normalized on-resistance vs temperature
R DS(on)
(norm.)
GIPG090715FQFIWRON
V GS = 10 V
2.2
0.7
0.6
-75
-25
25
75
125
T j (°C)
Figure 10. Normalized V(BR)DSS vs temperature
V (BR)DSS
(norm.)
GIPG090715FQFIWBDV
I D = 1 mA
1.12
1.08
1.8
1.04
1.4
1.00
1.0
0.96
0.6
0.2
-75
0.92
-25
25
75
125
T j (°C)
Figure 11. Output capacitance stored energy
E OSS
(µJ)
GIPG090715FQFIWEOS
0.88
-75
-25
25
75
125
T j (°C)
Figure 12. Source-drain diode forward characteristics
V SD
(V)
GIPG090715FQFIWSDF
T j = -50 °C
24
1.0
20
T j = 25 °C
16
0.8
T j = 150 °C
12
8
0.6
4
0
0
DS11149 - Rev 3
100
200
300
400
500
600
V DS (V)
0.4
0
5
10
15
20
25
30
35
I SD (A)
page 6/12
STW50N65DM2AG
Test circuits
3
Test circuits
Figure 13. Test circuit for resistive load switching times
Figure 14. Test circuit for gate charge behavior
VDD
12 V
2200
+ μF
3.3
μF
VDD
VD
VGS
1 kΩ
100 nF
RL
IG= CONST
VGS
RG
47 kΩ
+
pulse width
D.U.T.
2.7 kΩ
2200
μF
pulse width
D.U.T.
100 Ω
VG
47 kΩ
1 kΩ
AM01469v1
AM01468v1
Figure 15. Test circuit for inductive load switching and
diode recovery times
D
G
A
D.U.T.
S
25 Ω
A
L
A
B
B
3.3
µF
D
G
+
VD
100 µH
fast
diode
B
Figure 16. Unclamped inductive load test circuit
RG
1000
+ µF
2200
+ µF
VDD
3.3
µF
VDD
ID
D.U.T.
S
D.U.T.
Vi
_
pulse width
AM01471v1
AM01470v1
Figure 18. Switching time waveform
Figure 17. Unclamped inductive waveform
ton
V(BR)DSS
td(on)
VD
toff
td(off)
tr
tf
90%
90%
IDM
VDD
10%
0
ID
VDD
AM01472v1
VGS
0
VDS
10%
90%
10%
AM01473v1
DS11149 - Rev 3
page 7/12
STW50N65DM2AG
Package information
4
Package information
In order to meet environmental requirements, ST offers these devices in different grades of ECOPACK packages,
depending on their level of environmental compliance. ECOPACK specifications, grade definitions and product
status are available at: www.st.com. ECOPACK is an ST trademark.
4.1
TO-247 package information
Figure 19. TO-247 package outline
0075325_9
DS11149 - Rev 3
page 8/12
STW50N65DM2AG
TO-247 package information
Table 8. TO-247 package mechanical data
Dim.
mm
Min.
Max.
A
4.85
5.15
A1
2.20
2.60
b
1.0
1.40
b1
2.0
2.40
b2
3.0
3.40
c
0.40
0.80
D
19.85
20.15
E
15.45
15.75
e
5.30
L
14.20
14.80
L1
3.70
4.30
L2
DS11149 - Rev 3
Typ.
5.45
5.60
18.50
ØP
3.55
3.65
ØR
4.50
5.50
S
5.30
5.50
5.70
page 9/12
STW50N65DM2AG
Revision history
Table 9. Document revision history
Date
Revision
09-Jul-2015
1
Changes
Initial release.
Modified Table 2: "Absolute maximum ratings", Table 4: "Avalanche characteristics" and Table
8: "Source-drain diode".
20-Dec-2017
2
Modified Figure 2: "Safe operating area".
Minor text changes.
31-Aug-2020
DS11149 - Rev 3
3
Updated Table 1. Absolute maximum ratings.
Minor text changes.
page 10/12
STW50N65DM2AG
Contents
Contents
1
Electrical ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2
2
Electrical characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
2.1
Electrical characteristics (curves) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
3
Test circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7
4
Package information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8
4.1
TO-247 package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10
DS11149 - Rev 3
page 11/12
STW50N65DM2AG
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DS11149 - Rev 3
page 12/12