STW75N60M6-4
Datasheet
N-channel 600 V, 32 mΩ typ., 72 A, MDmesh™ M6 Power MOSFET
in a TO247-4 package
Features
1
2
4
3
TO247-4
Drain(1, TAB)
Order code
V DS
RDS(on) max.
ID
STW75N60M6-4
600 V
36 mΩ
72 A
•
•
Reduced switching losses
Lower RDS(on) per area vs previous generation
•
•
•
•
Low gate input resistance
100% avalanche tested
Zener-protected
Excellent switching performance thanks to the extra driving source pin
Applications
•
•
•
Gate(4)
Driver
source (3)
Power
source (2)
AM10177v2Z
Switching applications
LLC converters
Boost PFC converters
Description
The new MDmesh™ M6 technology incorporates the most recent advancements to
the well-known and consolidated MDmesh family of SJ MOSFETs.
STMicroelectronics builds on the previous generation of MDmesh devices through its
new M6 technology, which combines excellent RDS(on) per area improvement with
one of the most effective switching behaviors available, as well as a user-friendly
experience for maximum end-application efficiency.
Product status link
STW75N60M6-4
Product summary
Order code
STW75N60M6-4
Marking
75N60M6
Package
TO247-4
Packing
Tube
DS12411 - Rev 2 - December 2018
For further information contact your local STMicroelectronics sales office.
www.st.com
STW75N60M6-4
Electrical ratings
1
Electrical ratings
Table 1. Absolute maximum ratings
Symbol
Value
Unit
Gate-source voltage
±25
V
Drain current (continuous) at TC = 25 °C
72
A
Drain current (continuous) at TC = 100 °C
45
A
IDM(1)
Drain current (pulsed)
288
A
PTOT
Total power dissipation at TC = 25 °C
446
W
dv/dt(2)
Peak diode recovery voltage slope
15
dv/dt(3)
MOSFET dv/dt ruggedness
100
Tstg
Storage temperature range
VGS
ID
TJ
Parameter
Operating junction temperature range
V/ns
-55 to 150
°C
Value
Unit
0.28
°C/W
50
°C/W
Value
Unit
1. Pulse width is limited by safe operating area.
2. ISD ≤ 72 A, di/dt = 400 A/µs, VDS(peak) < V(BR)DSS, VDD = 400 V
3. VDS ≤ 480 V
Table 2. Thermal data
Symbol
Parameter
Rthj-case
Thermal resistance junction-case
Rthj-amb
Thermal resistance junction-ambient
Table 3. Avalanche characteristics
Symbol
DS12411 - Rev 2
Parameter
IAR
Avalanche current, repetitive or not repetitive (pulse width limited by TJmax)
11
A
EAS
Single pulse avalanche energy (starting TJ = 25 °C, ID = IAR, VDD = 50 V)
1.4
J
page 2/12
STW75N60M6-4
Electrical characteristics
2
Electrical characteristics
(TC = 25 °C unless otherwise specified)
Table 4. On/off-states
Symbol
V(BR)DSS
IDSS
IGSS
Parameter
Test conditions
Drain-source breakdown voltage
VGS = 0 V, ID = 1 mA
Min.
Typ.
600
1
VGS = 0 V, VDS = 600 V,
drain current
TC = 125
100
°C(1)
Gate-body leakage current
VDS = 0 V, VGS = ±25 V
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 250 µA
RDS(on)
Static drain-source on-resistance
VGS = 10 V, ID = 36 A
Unit
V
VGS = 0 V, VDS= 600 V
Zero-gate voltage
Max.
µA
±5
µA
4
4.75
V
32
36
mΩ
Min.
Typ.
Max.
Unit
-
4850
-
pF
-
380
-
pF
-
3.5
-
pF
3.25
1. Defined by design, not subject to production test.
Table 5. Dynamic
Symbol
Parameter
Test conditions
Ciss
Input capacitance
Coss
Output capacitance
Crss
Reverse transfer capacitance
Coss eq. (1)
Equivalent output capacitance
VGS = 0 V, VDS = 0 to 480 V
-
851
-
pF
RG
Intrinsic gate resistance
f = 1 MHz open drain
-
1.5
-
Ω
Qg
Total gate charge
VDD = 480 V, ID = 72 A,
-
106
-
nC
Qgs
Gate-source charge
VGS = 0 to 10 V
-
32
-
nC
Qgd
Gate-drain charge
(see Figure 2)
-
45
-
nC
VGS = 0 V, VDS = 100 V, f = 1 MHz
1. Coss eq. is defined as the constant equivalent capacitance giving the same charging time as Coss when VDS increases from 0
to 80% VDSS.
Table 6. Switching times
Symbol
td(on)
tr
td(off)
tf
DS12411 - Rev 2
Parameter
Test conditions
Turn-on delay time
Rise time
Turn-off delay time
Fall time
VDD = 300 V, ID = 36 A,
RG = 4.7 Ω, VGS = 10 V
(see Figure 1 and Figure 6)
Min.
Typ.
Max.
Unit
-
TBD
-
ns
-
TBD
-
ns
-
TBD
-
ns
-
TBD
-
ns
page 3/12
STW75N60M6-4
Electrical characteristics
Table 7. Source-drain diode
Symbol
ISD
ISDM (1)
(2)
Parameter
Test conditions
Min.
Typ.
Max.
Unit
Source-drain current
-
72
A
Source-drain current (pulsed)
-
288
A
1.6
V
Forward on voltage
VGS = 0 V, ISD = 72 A
-
trr
Reverse recovery time
ISD = 72 A, di/dt = 100 A/µs,
-
367
ns
Qrr
Reverse recovery charge
VDD = 60 V
-
6.4
µC
IRRM
Reverse recovery current
(see Figure 3)
-
35
A
trr
Reverse recovery time
ISD = 72 A, di/dt = 100 A/µs,
-
552
ns
Qrr
Reverse recovery charge
VDD = 60 V, TJ = 150 °C
-
13.7
µC
IRRM
Reverse recovery current
(see Figure 3)
-
49.6
A
VSD
1. Pulse width is limited by safe operating area.
2. Pulse test: pulse duration = 300 µs, duty cycle 1.5%.
DS12411 - Rev 2
page 4/12
STW75N60M6-4
Electrical characteristics (curves)
2.1
Electrical characteristics (curves)
Figure 2. Thermal impedance
Figure 1. Safe operating area
ID
(A)
GADG211120181126SOA
d=0.5
tp=1 μs
Operation in this area
is limited by RDS(on)
10 2
0.2
tp =10 µs
0.1
tp =100 µs
10 1
10
AM09125v1
K
tp =1 ms
0.05
10
-1
0.02
0.01
Single pulse, TC = 25 °C,
TJ ≤ 150 °C, VGS = 10 V
Zth =k *Rthj-c
d=t p /t
tp =10 ms
Single pulse
0
tp
t
-2
10 -1
10 -1
10 0
10 1
VDS (V)
10 2
10 -4
10
10
-3
10
-2
10
-1
t p (s)
Figure 3. Output characteristics
Figure 4. Transfer characteristics
Figure 5. Gate charge vs gate-source voltage
Figure 6. Static drain-source on-resistance
VDS
(V)
GADG211120181125QVG VGS
(V)
VDD = 480 V, ID = 72 A
600
12
Qg
500
400
10
VDS
8
Qgd
Qgs
300
6
200
4
100
2
0
0
DS12411 - Rev 2
20
40
60
80
100
120
0
Qg (nC)
page 5/12
STW75N60M6-4
Electrical characteristics (curves)
Figure 7. Normalized on-resistance vs temperature
RDS(on)
(norm.)
Figure 8. Normalized V(BR)DSS vs temperature
V(BR)DSS
(norm.)
GADG051220171032RON
2.5
GADG051220171032BDV
1.10
2.0
1.05
VGS = 10 V
1.5
1.00
1.0
0.95
0.5
0.90
0
-75
-25
25
75
125
Tj (°C)
0.85
-75
-25
25
75
125
Tj (°C)
Figure 10. Normalized gate threshold voltage vs
temperature
Figure 9. Capacitance variations
C
(pF)
ID = 1 mA
GADG051220171033CVR
VGS(th)
(norm.)
10 4
GADG051220171030VTH
1.1
CISS
1.0
10 3
COSS
f = 1 MHz
10 2
0.9
ID = 250 µA
0.8
CRSS
10 1
0.7
10 0
10 -1
10 0
10 1
VDS (V)
10 2
Figure 11. Output capacitance stored energy
EOSS
(µJ)
GADG051220171034EOS
0.6
-75
-25
25
75
Tj (°C)
Figure 12. Source-drain diode forward characteristics
VSD
(V)
GADG051220171033SDF
1.1
50
125
Tj = -50 °C
1.0
40
Tj = 25 °C
0.9
30
0.8
20
0.7
10
0
0
DS12411 - Rev 2
Tj = 150 °C
0.6
100
200
300
400
500
600
VDS (V)
0.5
0
10
20
30
40
50
60
70
ISD (A)
page 6/12
STW75N60M6-4
Test circuits
3
Test circuits
Figure 13. Switching times test circuit for resistive load
Figure 14. Test circuit for gate charge behavior
VDD
RL
RL
+
VD
VGS
3.3
µF
2200
µF
VDD
IG= CONST
VGS
RG
+
pulse width
D.U.T.
2200
μF
PW
D.U.T.
100 Ω
2.7 kΩ
VG
47 kΩ
GND1
(driver signal)
GND2
(power)
1 kΩ
GND1
AM15855v1
GND2
GADG180720181011SA
Figure 15. Test circuit for inductive load switching and
diode recovery times
A
A
D.U.T.
FAST
DIODE
Figure 16. Unclamped inductive load test circuit
A
L
D
G
S
L=100µH
B
B
D
25Ω
VD
3.3
µF
B
+
1000
µF
2200
µF
3.3
µF
+
VDD
VDD
ID
G
S
RG
D.U.T.
Vi
D.U.T.
Pw
GND2
GND1
GND1
GND2
AM15858v1
AM15857v1
Figure 18. Switching time waveform
Figure 17. Unclamped inductive waveform
ton
V(BR)DSS
td(on)
VD
toff
td(off)
tr
tf
90%
90%
IDM
VDD
10%
0
ID
VDD
AM01472v1
VGS
0
VDS
10%
90%
10%
AM01473v1
DS12411 - Rev 2
page 7/12
STW75N60M6-4
Package information
4
Package information
In order to meet environmental requirements, ST offers these devices in different grades of ECOPACK®
packages, depending on their level of environmental compliance. ECOPACK® specifications, grade definitions
and product status are available at: www.st.com. ECOPACK® is an ST trademark.
4.1
TO247-4 package information
Figure 19. TO247-4 package outline
8405626_2
DS12411 - Rev 2
page 8/12
STW75N60M6-4
TO247-4 package information
Table 8. TO247-4 mechanical data
Dim.
mm
Min.
Typ.
Max.
A
4.90
5.00
5.10
A1
2.31
2.41
2.51
A2
1.90
2.00
2.10
b
1.16
b1
1.15
b2
0
0.20
c
0.59
0.66
c1
0.58
0.60
0.62
D
20.90
21.00
21.10
D1
16.25
16.55
16.85
D2
1.05
1.20
1.35
D3
24.97
25.12
25.27
E
15.70
15.80
15.90
E1
13.10
13.30
13.50
E2
4.90
5.00
5.10
E3
2.40
2.50
2.60
e
2.44
2.54
2.64
e1
4.98
5.08
5.18
L
19.80
19.92
20.10
P
3.50
3.60
3.70
1.29
1.20
P1
7.40
P2
2.40
Q
5.60
S
DS12411 - Rev 2
1.25
2.50
2.60
6.00
6.15
T
9.80
10.20
U
6.00
6.40
page 9/12
STW75N60M6-4
Revision history
Table 9. Document revision history
Date
Revision
11-Dec-2017
1
Changes
Initial version
Removed maturity status indication from cover page. The document status is
production data.
Updated schematic diagram on cover page.
07-Dec-2018
2
Updated Table 1. Absolute maximum ratings, Table 5. Dynamic and
Table 7. Source-drain diode.
Updated Section 2.1 Electrical characteristics (curves).
Minor text changes
DS12411 - Rev 2
page 10/12
STW75N60M6-4
Contents
Contents
1
Electrical ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2
2
Electrical characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
2.1
Electrical characteristics (curves) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
3
Test circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7
4
Package information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8
4.1
TO247-4 package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10
DS12411 - Rev 2
page 11/12
STW75N60M6-4
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© 2018 STMicroelectronics – All rights reserved
DS12411 - Rev 2
page 12/12