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TDA7563

TDA7563

  • 厂商:

    STMICROELECTRONICS(意法半导体)

  • 封装:

    Flexiwatt27

  • 描述:

    IC AMP AUDIO 72W AB 27FLEXIWATT

  • 数据手册
  • 价格&库存
TDA7563 数据手册
TDA7563 MULTIFUNCTION QUAD POWER AMPLIFIER WITH BUILT-IN DIAGNOSTICS FEATURES ■ ■ ■ DMOS POWER OUTPUT NON-SWITCHING HI-EFFICIENCY HIGH OUTPUT POWER CAPABILITY 4x28W/ 4Ω @ 14.4V, 1KHZ, 10% THD, 4x40W EIAJ MAX. OUTPUT POWER 4x72W/2Ω MULTIPOWER BCD TECHNOLOGY MOSFET OUTPUT POWER STAGE ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O ■ ■ ■ ■ ■ ■ ■ ■ ■ FULL I2C BUS DRIVING: – ST-BY – INDEPENDENT FRONT/REAR SOFT PLAY/ MUTE – SELECTABLE GAIN 30dB – 16dB (FOR LOW NOISE LINE OUTPUT FUNCTION) – HIGH EFFICIENCY ENABLE/DISABLE – I2C BUS DIGITAL DIAGNOSTICS FULL FAULT PROTECTION DC OFFSET DETECTION FOUR INDEPENDENT SHORT CIRCUIT PROTECTION CLIPPING DETECTOR PIN WITH SELECTABLE THRESHOLD (2%/10%) ST-BY/MUTE PIN LINEAR THERMAL SHUTDOWN ESD PROTECTION FLEXIWATT27 ORDERING NUMBER: TDA7563 DESCRIPTION The TDA7563 is a new BCD technology Quad Bridge type of car radio amplifier in Flexiwatt27 package specially intended for car radio applications. Thanks to the DMOS output stage the TDA7563 has a very low distortion allowing a clear powerful sound. Among the features, its superior efficiency performance coming from the internal exclusive structure, makes it the most suitable device to simplify the thermal management in high power sets.The dissipated output power under average listening condition is in fact reduced up to 50% when compared to the level provided by conventional class AB solutions.This device is equipped with a full diagnostics array that communicates the status of each speaker through the I 2C bus. BLOCK DIAGRAM CLK DATA VCC1 VCC2 ST-BY/MUTE Thermal Protection & Dump I2CBUS Mute1 Mute2 IN RF Reference CD_OUT Clip Detector F OUT RF+ 16/30dB IN RR Short Circuit Protection & Diagnostic OUT RF- R OUT RR+ 16/30dB IN LF OUT RR- Short Circuit Protection & Diagnostic F OUT LF+ 16/30dB IN LR Short Circuit Protection & Diagnostic R OUT LFOUT LR+ 16/30dB Short Circuit Protection & Diagnostic SVR AC_GND RF RR LF LR OUT LR- TAB S_GND PW_GND May 2003 1/20 TDA7563 ABSOLUTE MAXIMUM RATINGS Symbol Value Unit Vop Operating Supply Voltage 18 V VS DC Supply Voltage 28 V Peak Supply Voltage (for t = 50ms) 50 V CK pin Voltage 6 V Vpeak VCK Parameter Data Pin Voltage 6 V IO Output Peak Current (not repetitive t = 100ms) 8 A IO Output Peak Current (repetitive f > 10Hz) 6 A VDATA Ptot Power Dissipation Tcase = 70°C 85 W -55 to 150 °C Value Unit 1 °C/W ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O Tstg, Tj Storage and Junction Temperature THERMAL DATA Symbol Rth j-case Parameter Max. Thermal Resistance Junction to case PIN CONNECTION (Top view) 27 TAB 26 DATA 25 PW_GND RR 24 OUT RR- 23 CK 22 OUT RR+ 21 VCC2 20 OUT RF- 19 PW_GND RF 18 OUT RF+ 17 AC GND 16 IN RF 15 IN RR 14 S_GND 13 IN LR 12 IN LF 11 SVR 10 OUT LF+ 9 PW_GND LF 8 OUT LF- 7 VCC1 6 OUT LR+ 5 CD-OUT 4 OUT LR- 3 PW_GND LR 2 STBY 1 TAB D00AU1230 2/20 TDA7563 Figure 1. Application Circuit C7 3300µF C8 0.1µF Vcc1 V(4V .. VCC) 2 DATA 26 CLK 23 Vcc2 7 21 18 + 19 20 I2C BUS 22 OUT RF + 25 C1 0.22µF IN RF 16 24 OUT RR ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O 10 C2 0.22µF IN RR 15 9 8 C3 0.22µF IN LF + 12 6 OUT LF + 3 C4 0.22µF IN LR 4 13 S-GND 14 17 11 5 1, 27 OUT LR - TAB 47K C5 1µF V C6 10µF D00AU1231A CD OUT 3/20 TDA7563 ELECTRICAL CHARACTERISTICS (Refer to the test circuit, VS = 14.4V; RL = 4Ω; f = 1KHz; GV = 30dB; Tamb = 25°C; unless otherwise specified.) Symbol Parameter Test Condition Min. Typ. Max. Unit 18 V 170 300 mA POWER AMPLIFIER VS Supply Voltage Range Id Total Quiescent Drain Current PO Output Power 8 EIAJ (VS = 13.7V) 35 40 W THD = 10% THD = 1% 25 28 22 W W RL = 2Ω; EIAJ (VS = 13.7V) RL = 2Ω; THD 10% RL = 2Ω; THD 1% RL = 2Ω; MAX POWER 55 40 62 46 35 72 W W W W ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O THD Total Harmonic Distortion CT Cross Talk RIN Input Impedance GV1 Voltage Gain 1 ∆GV1 GV2 PO = 1W to 10W; STD MODE HE MODE; PO = 1.5W HE MODE; PO = 8W 0.03 0.02 0.15 0.1 0.1 0.5 % % % PO = 1-10W, f = 10kHz 0.2 0.5 % GV = 16dB; STD Mode VO = 0.1 to 5VRMS 0.02 0.05 % f = 1KHz to 10KHz, Rg = 600Ω Voltage Gain Match 1 Voltage Gain Match 2 60 60 100 130 KΩ 29.5 30 30.5 dB 1 dB 16 16.5 dB 1 dB -1 Voltage Gain 2 ∆GV2 50 15.5 -1 dB EIN1 Output Noise Voltage 1 Rg = 600Ω 20Hz to 22kHz 50 100 mV EIN2 Output Noise Voltage 2 Rg = 600Ω; GV = 16dB 20Hz to 22kHz 15 30 mV SVR Supply Voltage Rejection f = 100Hz to 10kHz; Vr = 1Vpk; Rg = 600Ω 50 60 dB BW Power Bandwidth 100 ASB Stand-by Attenuation 90 110 KHz ISB Stand-by Current AM Mute Attenuation 80 100 VOS Offset Voltage -100 0 VAM Min. Supply Mute Threshold 7 7.5 8 V TON Turn ON Delay D2/D1 (IB1) 0 to 1 5 20 ms D2/D1 (IB1) 1 to 0 2 Mute & Play 20 µA dB 100 mV TOFF Turn OFF Delay 20 ms VSBY St-By/Mute pin for St-By 0 1.5 V VMU St-By/Mute pin for Mute 3.5 5 V VOP St-By/Mute pin for Operating IMU St-By/Mute pin Current VS V VSTBY/MUTE = 8.5V 7 20 40 µA VSTBY/MUTE < 1.5V 0 10 µA 0 15 CDLK Clip Det High Leakage Current CD off CDSAT Clip Det Sat. Voltage CD on; ICD = 1mA CDTHD Clip Det THD level D0 (IB1) = 1 4/20 5 dB 300 5 10 µA mV 15 % TDA7563 ELECTRICAL CHARACTERISTICS (continued) (Refer to the test circuit, VS = 14.4V; RL = 4Ω; f = 1KHz; GV = 30dB; Tamb = 25°C; unless otherwise specified.) Symbol Parameter Test Condition D0 (IB1) = 0 Min. Typ. Max. Unit 1 2 3 % 1.2 V TURN ON DIAGNOSTICS 1 (Power Amplifier Mode) Pgnd Short to GND det. (below this limit, the Output is considered in Short Circuit to GND) Pvs Short to Vs det. (above this limit, the Output isconsidered in Short Circuit to VS) Vs -1.2 Pnop Normal operation thresholds.(Within these limits, the Output is considered without faults). 1.8 Power Amplifier in st-by V Vs -1.8 V 0.5 Ω ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O Lsc Shorted Load det. Lop Open Load det. 130 Lnop Normal Load det. 1.5 Ω 70 Ω 1.2 V TURN ON DIAGNOSTICS 2 (Line Driver Mode) Pgnd Short to GND det. (below this limit, the Output is considered in Short Circuit to GND) Pvs Short to Vs det. (above this limit, the Output isconsidered in Short Circuit to VS) Vs -1.2 Pnop Normal operation thresholds.(Within these limits, the Output is considered without faults). 1.8 Lsc Power Amplifier in st-by V Shorted Load det. Lop Open Load det. 400 Lnop Normal Load det. 4.5 Vs -1.8 V 1.5 Ω Ω 200 Ω 1.2 V PERMANENT DIAGNOSTICS 2 (Power Amplifier Mode or Line Driver Mode) Pgnd Short to GND det. (below this limit, the Output is considered in Short Circuit to GND) Pvs Short to Vs det. (above this limit, the Output is considered in Short Circuit to VS) Vs -1.2 Pnop Normal operation thresholds. (Within these limits, the Output is considered without faults). 1.8 LSC Shorted Load Det. VO Offset Detection Power Amplifier in Mute or Play, one or more short circuits protection activated V Pow. Amp. mode Line Driver mode Power Amplifier in play, AC Input signals = 0 ±1.5 ±2 Vs -1.8 V 0.5 Ω 1.5 Ω ±2.5 V I2C BUS INTERFACE SCL Clock Frequency 400 KHz VIL Input Low Voltage 1.5 V VIH Input High Voltage 2.3 V 5/20 TDA7563 Figure 2. Quiescent Current vs. Supply Voltage Figure 5. Distortion vs. Output Power (4Ω, STD) THD (%) Id (mA) 10 250 230 STANDARD MODE Vs = 14.4 V RL = 4 Ohm Vin = 0 NO LOADS 210 1 190 170 f = 10 KHz 150 130 0.1 f = 1 KHz 110 ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O 90 70 8 10 12 14 16 18 0.01 0.1 1 10 Vs (V) Po (W) Figure 3. Output Power vs. Supply Voltage (4Ω) Figure 6. Distortion vs. Output Power (4Ω, HI-EFF) Po (W) THD (%) 70 10 65 Po-max HI-EFF MODE Vs = 14.4 V RL = 4 Ohm 60 RL = 4 Ohm f = 1 KHz 55 50 1 THD = 10 % 45 f = 10 KHz 40 0.1 35 30 f = 1 KHz 25 THD = 1 % 20 0.01 15 10 5 8 9 10 11 12 13 Vs (V) 14 15 16 17 18 Figure 4. Output Power vs. Supply Voltage (2Ω) 0.001 0.1 1 10 Po (W) Figure 7. Distortion vs. Output Power (2Ω, STD) Po (W) THD (%) 100 10 90 HI-EFF MODE Vs = 14.4 V RL = 2 Ohm Po-max 80 RL = 2 Ohm f = 1 KHz 70 1 THD = 10 % 60 f = 10 KHz 50 40 0.1 f = 1 KHz 30 THD = 1 % 20 10 8 6/20 9 10 11 12 Vs (V) 13 14 15 16 0.01 0.1 1 10 Po (W) TDA7563 Figure 11. Supply Voltage Rejection vs. Freq. Figure 8. Distortion vs. Frequency (4Ω) THD (%) SVR (dB) 10 90 80 STANDARD MODE Vs = 14.4 V RL = 4 Ohm Po = 4 W 1 70 60 50 0.1 STD & HE MODE Rg = 600 Ohm Vripple = 1 Vpk 40 ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O 30 0.01 10 100 1000 10000 20 10 100 1000 f (Hz) 10000 f (Hz) Figure 9. Distortion vs. Frequency (2Ω) Figure 12. Power Dissipation & Efficiency vs. Output Power (4Ω, STD, SINE) n (%) Ptot (W) 90 THD (%) 10 STANDARD MODE Vs = 14.4 V RL = 4 x 4 Ohm f = 1 KHz SINE 80 1 70 STANDARD MODE Vs = 14.4 V RL = 2 Ohm Po = 4 W 0.01 10 100 1000 10000 f (Hz) Figure 10. Crosstalk vs. Frequency 60 50 50 Ptot 30 20 20 10 10 0 0 2 4 6 8 0 10 12 14 16 18 20 22 24 26 28 30 Po (W) n (%) 90 HI-EFF MODE Vs = 14.4 V RL = 4 x 4 Ohm f = 1 KHz SINE 80 80 70 70 90 80 n 60 60 50 70 60 50 Ptot STANDARD MODE RL = 4 Ohm Po = 4 W Rg = 600 Ohm 30 20 10 40 30 Ptot (W) CROSSTALK (dB) 40 70 Figure 13. Power Dissipation & Efficiency vs. Output Power (4W, HI-EFF, SINE) 90 50 80 60 40 0.1 90 n 100 1000 f (Hz) 10000 40 40 30 30 20 20 10 10 0 0.1 0 1 10 Po (W) 7/20 TDA7563 Figure 15. Power Dissipation vs. Average Ouput Power (Audio Program Simulation, 2Ω) Figure 14. Power Dissipation vs. Average Ouput Power (Audio Program Simulation, 4Ω) Ptot (W) Ptot (W) 90 45 40 35 80 STD MODE Vs = 14 V RL = 4 x 4 Ohm GAUSSIAN NOISE 70 Vs = 14 V RL = 4 x 2 Ohm GAUSSIAN NOISE 60 30 CLIP START 25 20 STD MODE 50 CLIP START 40 HI-EFF MODE ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O 15 30 10 20 5 10 HI-EFF MODE 0 0 0 1 2 Po (W) 3 4 5 0 1 2 3 4 5 Po (W) 6 7 8 9 DIAGNOSTICS FUNCTIONAL DESCRIPTION: a) TURN-ON DIAGNOSTIC It is activated at the turn-on (stand-by out) under I2Cbus request. Detectable output faults are: – SHORT TO GND – SHORT TO Vs – SHORT ACROSS THE SPEAKER – OPEN SPEAKER To verify if any of the above misconnections are in place, a subsonic (inaudible) current pulse (fig. 16) is internally generated, sent through the speaker(s) and sunk back.The Turn On diagnostic status is internally stored until a successive diagnostic pulse is requested (after a I2C reading). If the "stand-by out" and "diag. enable" commands are both given through a single programming step, the pulse takes place first (power stage still in stand-by mode, low, outputs= high impedance). Afterwards, when the Amplifier is biased, the PERMANENT diagnostic takes place. The previous Turn On state is kept until a short appears at the outputs. Figure 16. Turn - On diagnostic: working principle Vs~5V Isource I (mA) Isource Isink CH+ CH- Isink ~100mS Measure time 8/20 t (ms) TDA7563 Fig. 17 and 18 show SVR and OUTPUT waveforms at the turn-on (stand-by out) with and without TURN-ON DIAGNOSTIC. Figure 17. SVR and Output behaviour (CASE 1: without turn-on diagnostic) Vsvr Out Permanent diagnostic acquisition time (100mS Typ) ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O t Diagnostic Enable (Permanent) Bias (power amp turn-on) I2CB DATA FAULT event Read Data Permanent Diagnostics data (output) permitted time Figure 18. SVR and Output pin behaviour (CASE 2: with turn-on diagnostic) Vsvr Out Turn-on diagnostic acquisition time (100mS Typ) Permanent diagnostic acquisition time (100mS Typ) t Diagnostic Enable (Turn-on) Turn-on Diagnostics data (output) permitted time Bias (power amp turn-on) permitted time Diagnostic Enable (Permanent) Read Data FAULT event Permanent Diagnostics data (output) permitted time I2CB DATA 9/20 TDA7563 The information related to the outputs status is read and memorized at the end of the current pulse top. The acquisition time is 100 ms (typ.). No audible noise is generated in the process. As for SHORT TO GND / Vs the fault-detection thresholds remain unchanged from 30 dB to 16 dB gain setting. They are as follows: S.C. to GND 0V x 1.2V Normal Operation 1.8V x VS-1.8V S.C. to Vs VS-1.2V D01AU1253 VS ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O Concerning SHORT ACROSS THE SPEAKER / OPEN SPEAKER, the threshold varies from 30 dB to 16 dB gain setting, since different loads are expected (either normal speaker's impedance or high impedance). The values in case of 30 dB gain are as follows: S.C. across Load 0V x 0.5Ω Normal Operation 1.5Ω x Open Load 130Ω 70Ω Infinite D01AU1254 If the Line-Driver mode (Gv= 16 dB and Line Driver Mode diagnostic = 1) is selected, the same thresholds will change as follows: S.C. across Load 0Ω 1.5Ω x Normal Operation 4.5Ω 200Ω x Open Load 400Ω infinite D01AU1252 b) PERMANENT DIAGNOSTICS. Detectable conventional faults are: – SHORT TO GND – SHORT TO Vs – SHORT ACROSS THE SPEAKER The following additional features are provided: – OUTPUT OFFSET DETECTION The TDA7563 has 2 operating statuses: 1 RESTART mode. The diagnostic is not enabled. Each audio channel operates independently from each other. If any of the a.m. faults occurs, only the channel(s) interested is shut down. A check of the output status is made every 1 ms (fig. 19). Restart takes place when the overload is removed. 2 DIAGNOSTIC mode. It is enabled via I2C bus and self activates if an output overload (such to cause the intervention of the short-circuit protection) occurs to the speakers outputs . Once activated, the diagnostics procedure develops as follows (fig. 20): 10/20 TDA7563 – To avoid momentary re-circulation spikes from giving erroneous diagnostics, a check of the output status is made after 1ms: if normal situation (no overloads) is detected, the diagnostic is not performed and the channel returns back active. – Instead, if an overload is detected during the check after 1 ms, then a diagnostic cycle having a duration of about 100 ms is started. – After a diagnostic cycle, the audio channel interested by the fault is switched to RESTART mode. The relevant data are stored inside the device and can be read by the microprocessor. When one cycle has terminated, the next one is activated by an I2C reading. This is to ensure continuous diagnostics throughout the car-radio operating time. – To check the status of the device a sampling system is needed. The timing is chosen at microprocessor level (over half a second is recommended). ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O Figure 19. Restart timing without Diagnostic Enable (Permanent) - Each 1mS time, a sampling of the fault is done Out 1-2mS 1mS 1mS 1mS 1mS t Overcurrent and short circuit protection intervention (i.e. short circuit to GND) Short circuit removed Figure 20. Restart timing with Diagnostic Enable (Permanent) 1-2mS 100/200mS 1mS 1mS t Overcurrent and short circuit protection intervention (i.e. short circuit to GND) Short circuit removed OUTPUT DC OFFSET DETECTION Any DC output offset exceeding +/- 2 V are signalled out. This inconvenient might occur as a consequence of initially defective or aged and worn-out input capacitors feeding a DC component to the inputs, so putting the speakers at risk of overheating. This diagnostic has to be performed with low-level output AC signal (or Vin = 0). The test is run with selectable time duration by microprocessor (from a "start" to a "stop" command): – START = Last reading operation or setting IB1 - D5 - (OFFSET enable) to 1 11/20 TDA7563 – STOP = Actual reading operation Excess offset is signalled out if persistent throughout the assigned testing time. This feature is disabled if any overloads leading to activation of the short-circuit protection occurs in the process. MULTIPLE FAULTS When more misconnections are simultaneously in place at the audio outputs, it is guaranteed that at least one of them is initially read out. The others are notified after successive cycles of I2C reading and faults removal, provided that the diagnostic is enabled. This is true for both kinds of diagnostic (Turn on and Permanent). The table below shows all the couples of double-fault possible. It should be taken into account that a short circuit with the 4 ohm speaker unconnected is considered as double fault. ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O Double fault table for Turn On Diagnostic S. GND (so) S. GND (sk) S. Vs S. Across L. S. GND (so) S. GND S. GND S. Vs + S. GND S. GND Open L. S. GND S. GND (sk) / S. GND S. Vs S. GND Open L. (*) S. Vs / / S. Vs S. Vs S. Vs S. Across L. / / / S. Across L. N.A. Open L. / / / / Open L. (*) S. GND (so) / S. GND (sk) in the above table make a distinction according to which of the 2 outputs is shorted to ground (test-current source side= so, test-current sink side = sk). More precisely, in Channels LF and RR, so = CH+, sk = CH-; in Channels LR and RF, so = CH-, sk = CH+ . In Permanent Diagnostic the table is the same, with only a difference concerning Open Load(*) , which is not among the recognisable faults. Should an Open Load be present during the device's normal working, it would be detected at a subsequent Turn on Diagnostic cycle (i.e. at the successive Car Radio Turn on). FAULTS AVAILABILITY All the results coming from I2Cbus, by read operations, are the consequence of measurements inside a defined period of time. If the fault is stable throughout the whole period, it will be sent out. To guarantee always resident functions, every kind of diagnostic cycles (Turn on, Permanent, Offset) will be reactivate after any I2C reading operation. So, when the micro reads the I2C, a new cycle will be able to start, but the read data will come from the previous diag. cycle (i.e. The device is in Turn On state, with a short to Gnd, then the short is removed and micro reads I2C. The short to Gnd is still present in bytes, because it is the result of the previous cycle. If another I2C reading operation occurs, the bytes do not show the short). In general to observe a change in Diagnostic bytes, two I2C reading operations are necessary. THERMAL PROTECTION Thermal protection is implemented through thermal foldback (fig. 21). Thermal foldback begins limiting the audio input to the amplifier stage as the junction temperatures rise above the normal operating range. This effectively limits the output power capability of the device thus reducing the temperature to acceptable levels without totally interrupting the operation of the device. The output power will decrease to the point at which thermal equilibrium is reached. Thermal equilibrium will be reached when the reduction in output power reduces the dissipated power such that the die temperature falls below the thermal foldback threshold. Should the device cool, the audio level will increase until a new thermal equilibrium is reached or the amplifier reaches full power. Thermal foldback will reduce the audio output level in a linear manner. 12/20 TDA7563 Figure 21. Thermal Foldback Diagram TH. WARN. ON Vout TH. SH. START Vout TH. SH. END Tj ( °C) ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O < TSD CD out > TSD (with same input signal) Tj ( °C) Tj ( °C) I2C PROGRAMMING/READING SEQUENCES A correct turn on/off sequence respectful of the diagnostic timings and producing no audible noises could be as follows (after battery connection): TURN-ON: PIN2 > 7V --- 10ms --- (STAND-BY OUT + DIAG ENABLE) --- 500 ms (min) --- MUTING OUT TURN-OFF: MUTING IN --- 20 ms --- (DIAG DISABLE + STAND-BY IN) --- 10ms --- PIN2 = 0 Car Radio Installation: PIN2 > 7V --- 10ms DIAG ENABLE (write) --- 200 ms --- I2C read (repeat until All faults disappear). OFFSET TEST: Device in Play (no signal) -- OFFSET ENABLE - 30ms - I2C reading (repeat I2C reading until high-offset message disappears). 13/20 TDA7563 I2C BUS INTERFACE Data transmission from microprocessor to the TDA7563 and viceversa takes place through the 2 wires I2C BUS interface, consisting of the two lines SDA and SCL (pull-up resistors to positive supply voltage must be connected). Data Validity As shown by fig. 22, the data on the SDA line must be stable during the high period of the clock. The HIGH and LOW state of the data line can only change when the clock signal on the SCL line is LOW. Start and Stop Conditions As shown by fig. 23 a start condition is a HIGH to LOW transition of the SDA line while SCL is HIGH. The stop condition is a LOW to HIGH transition of the SDA line while SCL is HIGH. Byte Format Every byte transferred to the SDA line must contain 8 bits. Each byte must be followed by an acknowledge bit. The MSB is transferred first. ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O Acknowledge The transmitter* puts a resistive HIGH level on the SDA line during the acknowledge clock pulse (see fig. 24). The receiver** the acknowledges has to pull-down (LOW) the SDA line during the acknowledge clock pulse, so that the SDAline is stable LOW during this clock pulse. * Transmitter – master (µP) when it writes an address to the TDA7563 – slave (TDA7563) when the µP reads a data byte from TDA7563 ** Receiver – slave (TDA7563) when the µP writes an address to the TDA7563 – master (µP) when it reads a data byte from TDA7563 Figure 22. Data Validity on the I2CBUS SDA SCL DATA LINE STABLE, DATA VALID CHANGE DATA ALLOWED D99AU1031 Figure 23. Timing Diagram on the I2CBUS SCL I2CBUS SDA D99AU1032 START STOP Figure 24. Acknowledge on the I2CBUS SCL 1 2 3 7 8 9 SDA MSB START 14/20 D99AU1033 ACKNOWLEDGMENT FROM RECEIVER TDA7563 SOFTWARE SPECIFICATIONS All the functions of the TDA7563 are activated by I2C interface. The bit 0 of the "ADDRESS BYTE" defines if the next bytes are write instruction (from µP to TDA7563) or read instruction (from TDA7563 to µP). Chip Address: D7 D0 1 1 0 1 1 0 0 X D8 Hex X = 0 Write to device X = 1 Read from device ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O If R/W = 0, the µP sends 2 "Instruction Bytes": IB1 and IB2. IB1 D7 X D6 Diagnostic enable (D6 = 1) Diagnostic defeat (D6 = 0) D5 Offset Detection enable (D5 = 1) Offset Detection defeat (D5 = 0) D4 Front Channel Gain = 30dB (D4 = 0) Gain = 16dB (D4 = 1) D3 Rear Channel Gain = 30dB (D3 = 0) Gain = 16dB (D3 = 1) D2 Mute front channels (D2 = 0) Unmute front channels (D2 = 1) D1 Mute rear channels (D1 = 0) Unmute rear channels (D1 = 1) D0 CD 2% (D0 = 0) CD 10% (D0 = 1) D7 X D6 used for testing D5 used for testing D4 Stand-by on - Amplifier not working - (D4 = 0)Stand-by off - Amplifier working - (D4 = 1) D3 Power amplifier mode diagnostic (D3 = 0)Line driver mode diagnostic (D3 = 1) D2 X D1 Right ChannelPower amplifier working in standard mode (D1 = 0)Power amplifier working in high efficiency mode (D1 = 1) D0 Left ChannelPower amplifier working in standard mode (D0 = 0)Power amplifier working in high efficiency mode (D0 = 1) IB2 15/20 TDA7563 If R/W = 1, the TDA7563 sends 4 "Diagnostics Bytes" to µP: DB1, DB2, DB3 and DB4. DB1 D7 Thermal warning active (D7 = 1) D6 Diag. cycle not activated or not terminated (D6 = 0) Diag. cycle terminated (D6 = 1) D5 X D4 Channel LF Turn-on diagnostic (D4 = 0) Permanent diagnostic (D4 = 1) ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O D3 Channel LF Normal load (D3 = 0) Short load (D3 = 1) D2 Channel LF Turn-on diag.: No open load (D2 = 0) Open load detection (D2 = 1) Offset diag.: No output offset (D2 = 0) Output offset detection (D2 = 1) D1 Channel LF No short to Vcc (D1 = 0) Short to Vcc (D1 = 1) D0 Channel LFNo short to GND (D1 = 0)Short to GND (D1 = 1) D7 Offset detection not activated (D7 = 0) Offset detection activated (D7 = 1) D6 X D5 X D4 Channel LR Turn-on diagnostic (D4 = 0) Permanent diagnostic (D4 = 1) D3 Channel LR Normal load (D3 = 0) Short load (D3 = 1) D2 Channel LR Turn-on diag.: No open load (D2 = 0) Open load detection (D2 = 1) Permanent diag.: No output offset (D2 = 0) Output offset detection (D2 = 1) D1 Channel LRNo short to Vcc (D1 = 0) Short to Vcc (D1 = 1) D0 Channel LRNo short to GND (D1 = 0) Short to GND (D1 = 1) DB2 16/20 TDA7563 B3 D7 Stand-by status (= IB1 - D4) D6 Diagnostic status (= IB1 - D6) D5 X D4 Channel RF Turn-on diagnostic (D4 = 0) Permanent diagnostic (D4 = 1) D3 Channel RF Normal load (D3 = 0) Short load (D3 = 1) ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O D2 Channel RF Turn-on diag.: No open load (D2 = 0) Open load detection (D2 = 1) Permanent diag.: No output offset (D2 = 0) Output offset detection (D2 = 1) D1 Channel RF No short to Vcc (D1 = 0) Short to Vcc (D1 = 1) D0 Channel RF No short to GND (D1 = 0) Short to GND (D1 = 1) D7 X D6 X D5 X D4 Channel RR Turn-on diagnostic (D4 = 0) Permanent diagnostic (D4 = 1) D3 Channel R RNormal load (D3 = 0) Short load (D3 = 1) D2 Channel RR Turn-on diag.: No open load (D2 = 0) Open load detection (D2 = 1) Permanent diag.: No output offset (D2 = 0) Output offset detection (D2 = 1) D1 Channel RR No short to Vcc (D1 = 0) Short to Vcc (D1 = 1) D0 Channel RR No short to GND (D1 = 0) Short to GND (D1 = 1) DB4 17/20 TDA7563 Examples of bytes sequence 1 - Turn-On diagnostic - Write operation Start Address byte with D0 = 0 ACK IB1 with D6 = 1 ACK IB2 ACK STOP 2 - Turn-On diagnostic - Read operation Start Address byte with D0 = 1 ACK DB1 ACK DB2 ACK DB3 ACK DB4 ACK STOP The delay from 1 to 2 can be selected by software, starting from T.B.D. ms 3a - Turn-On of the power amplifier with 30dB gain, mute on, diagnostic defeat, CD = 2%. ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O Start Address byte with D0 = 0 ACK IB1 ACK X0000000 IB2 ACK STOP ACK STOP ACK STOP XXX1XX11 3b - Turn-Off of the power amplifier Start Address byte with D0 = 0 ACK IB1 ACK X0XXXXXX IB2 XXX0XXXX 4 - Offset detection procedure enable Start Address byte with D0 = 0 ACK IB1 ACK XX1XX11X IB2 XXX1XXXX 5 - Offset detection procedure stop and reading operation (the results are valid only for the offset detection bits (D2 of the bytes DB1, DB2, DB3, DB4). Start ■ ■ Address byte with D0 = 1 ACK DB1 ACK DB2 ACK DB3 ACK DB4 ACK STOP The purpose of this test is to check if a D.C. offset (2V typ.) is present on the outputs, produced by input capacitor with anomalous leackage current or humidity between pins. The delay from 4 to 5 can be selected by software, starting from T.B.D. ms 18/20 TDA7563 DIM. MIN. 4.45 1.80 A B C D E F (1) G G1 H (2) H1 H2 H3 L (2) L1 L2 (2) L3 L4 L5 M M1 N O R R1 R2 R3 R4 V V1 V2 V3 0.75 0.37 0.80 25.75 28.90 22.07 18.57 15.50 7.70 mm TYP. 4.50 1.90 1.40 0.90 0.39 1.00 26.00 29.23 17.00 12.80 0.80 22.47 18.97 15.70 7.85 5 3.5 4.00 4.00 2.20 2 1.70 0.5 0.3 1.25 0.50 MAX. 4.65 2.00 MIN. 0.175 0.070 1.05 0.42 0.57 1.20 26.25 29.30 0.029 0.014 22.87 19.37 15.90 7.95 0.869 0.731 0.610 0.303 4.30 4.40 0.145 0.142 0.031 1.014 1.139 inch TYP. 0.177 0.074 0.055 0.035 0.015 0.040 1.023 1.150 0.669 0.503 0.031 0.884 0.747 0.618 0.309 0.197 0.138 0.157 0.157 0.086 0.079 0.067 0.02 0.12 0.049 0.019 MAX. 0.183 0.079 OUTLINE AND MECHANICAL DATA 0.041 0.016 0.022 0.047 1.033 1.153 0.904 0.762 0.626 0.313 ) s ( t c u d o ) r s ( P t c e t u e d l o o r s Flexiwatt27 (vertical) P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O 3.70 3.60 0.169 0.173 5˚ (Typ.) 3˚ (Typ.) 20˚ (Typ.) 45˚ (Typ.) (1): dam-bar protusion not included (2): molding protusion included V C B V H H1 V3 A H2 O H3 R3 L4 R4 V1 R2 L2 N L3 R L L1 V1 V2 R2 D R1 L5 Pin 1 R1 R1 E G G1 F FLEX27ME M M1 7139011 19/20 TDA7563 ) s ( t c u d o ) r s ( P t c e t u e d l o o r s P b e O t e l ) o s ( s t b c u O d o ) r s P ( t c e t u e l d o o r s P b O e t e l o s b O Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics. The ST logo is a registered trademark of STMicroelectronics  2003 STMicroelectronics - All Rights Reserved STMicroelectronics GROUP OF COMPANIES Australia - Brazil - Canada - China - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan -Malaysia - Malta - Morocco Singapore - Spain - Sweden - Switzerland - United Kingdom - United States. http://www.st.com 20/20
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