WIREWOUND CHIP INDUCTORS
1. PART NO. EXPRESSION :
SCI0805LP SERIES
SCI0805LP-1N8KF
(a) (b) (c) (d) (e)(f)
(a) Series code (b) Dimension code (c) Type code : LP ( Low Profile )
(d) Inductance code : 1N8 = 1.8nH (e) Tolerance code : G = ±2%, J = ±5%, K = ±10% (f) F : Lead Free
2. CONFIGURATION & DIMENSIONS :
B E
C D I J I
A
G
F
F
PCB Pattern Unit:m/m A 2.29 Max. B C D 0.51 Ref. E 1.27 Ref. F 0.44 Ref. G 1.02 Ref. H 1.78 Ref. I 1.02 Ref. J 0.76 Ref.
1.73 Max. 1.03 Max.
3. SCHEMATIC :
4. MATERIALS : a (a) Core : Ceramic U core (b) Wire : Enamelled Copper Wire b (c) Terminal Metallization : Ag + Ni + Au
c
NOTE : Specifications subject to change without notice. Please check our website for latest information.
H
15.01.2008
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 1
WIREWOUND CHIP INDUCTORS
5. GENERAL SPECIFICATION : a) Storage temp. : -25°C to +80°C b) Operating temp. : -40°C to +125°C c) Temperature rise : 40°C Max. d) Rated current : Base on temp. rise & L/L0A=10% Max. e) Resistance to solder heat : 260°C.10sec
SCI0805LP SERIES
6. ELECTRICAL CHARACTERISTICS : Part No. SCI0805LP-1N8 F SCI0805LP-3N9 F SCI0805LP-4N7 F SCI0805LP-6N8 F SCI0805LP-8N2 F SCI0805LP-10N F SCI0805LP-12N F SCI0805LP-15N F SCI0805LP-18N F SCI0805LP-22N F SCI0805LP-27N F SCI0805LP-33N F SCI0805LP-39N F SCI0805LP-47N F SCI0805LP-56N F SCI0805LP-68N F SCI0805LP-82N F SCI0805LP-R10 F SCI0805LP-R12 F SCI0805LP-R15 F SCI0805LP-1R0 F Inductance tolerance : : G : ±2% J : ±5% K : ±10% Tolerance Available K K, J K, J K, J K, J K, J, G K, J, G K, J, G K, J, G K, J, G K, J, G K, J, G K, J, G K, J, G K, J, G K, J, G K, J, G K, J, G K, J, G K, J, G K, J, G L ( nH ) 1.8 3.9 4.7 6.8 8.2 10 12 15 18 22 27 33 39 47 56 68 82 100 120 150 1000 Test Freq ( MHz ) 250 250 250 250 250 250 250 250 250 250 250 250 250 200 200 200 150 150 150 150 25 Q Min. 55 50 50 50 50 55 55 50 50 50 50 50 50 50 50 50 50 50 40 40 16 Q Test Freq ( MHz ) 1500 1000 1000 1000 1000 750 750 500 500 500 500 500 500 500 500 500 500 500 250 250 50 SRF ( MHz ) Min. 9400 6100 5500 5500 4800 3300 3800 2950 3100 2900 2450 2350 2200 2000 1850 1500 1500 1200 1150 1050 80 DCR () Max. 0.030 0.060 0.060 0.080 0.080 0.080 0.100 0.100 0.130 0.150 0.230 0.280 0.330 0.390 0.390 0.400 0.440 0.640 0.680 0.800 2.000 IDC (mA) Max. 800 800 800 800 800 800 800 800 800 800 600 600 600 600 500 500 500 400 300 300 220
NOTE : Specifications subject to change without notice. Please check our website for latest information.
15.01.2008
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 2
WIREWOUND CHIP INDUCTORS
7. PACKAGING INFORMATION : CONFIGURATTION :
SCI0805LP SERIES
COVER TAPE
EMBOSSED CARRIER F±0.1
4±0.1
G±0.05
Ø1.5
1±0.05
A±0.2
E±0.05
C±0.1
B±0.1
Ø1.5
DIMENSION (unit: mm) SERIES SCI0402 SCI0603 SCI0805 SCI1008 A 8.0 8.0 8.0 8.0 B 0.71 1.10 1.88 2.73 C 2.0 4.0 4.0 4.0 D 1.16 1.75 2.38 2.88 E 3.5 3.5 3.5 3.5 F 1.75 1.75 1.75 1.75 G 0 2 2 2 H 0.65 1.15 1.48 2.33 I 0.23 0.25 0.20 0.20
PACKING QUANTITY INNER REEL SERIES Q'TY (PCS) 4000 4000 2000 2000
SCI0402 SCI0603 SCI0805 SCI1008
NOTE : Specifications subject to change without notice. Please check our website for latest information.
D±0.1 H±0.05
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SUPERWORLD ELECTRONICS (S) PTE LTD
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WIREWOUND CHIP INDUCTORS
8. ENVIRONMENTAL CHARACTERISTICS : Electrical Performance Test :
SCI0805LP SERIES
ITEM
1 Inductance
SPECIFICATION
TEST CONDITIONS / TEST METHODS
HP4291B
2
Q Refer to Electrcal Characteristics List
HP4291B
3
SRF
HP8753D
4
DC Resistance Rdc
Mico-Ohmmeter (GOM-801G)
5
Rated Current IDC
The device should be REFLOW soldered (230±5°C for 10 seconds) to a tinned copper subs rate. A dynamiter
6
Over Load Test
After test, inductors shall have no evidence of electrical and mechanical damage
Applied 2 times of rated allowed DC current to inductor for a period of 5 minute.
7
Withstanding Voltage Test
After test, inductors shall have no evidence of electrical and mechanical damage
AC voltage of 500VAC applied between inductors terminal and case for 1 minute.
8
Insulation Resistance Test
1000 MOhm min.
100VDC applied between inductor terminal and case
NOTE : Specifications subject to change without notice. Please check our website for latest information.
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PG. 4
WIREWOUND CHIP INDUCTORS
SCI0805LP SERIES
Mechanical Performance Test :
ITEM
1 Vibration
SPECIFICATION
Appearance : No damage L change : within ±5% Q change : within ±10%
TEST CONDITIONS / TEST METHODS
Test device shall be soldered on the substrate Oscillation Frequency : 10 to 55 to 10Hz for 1 min. Amplitude : 1.5mm Time : 2hrs for each axis (X, Y, Z), total 6hrs.
2
Resistance to Soldering Heat
Appearance : No damage L change : within ±5% Q change : within ±10%
Pre-heating : 150°C, 1 min Solder Composition : Sn/Pb=63/67 Solder Temperature : 230±5°C Immersion Time : 20±2sec Solder Temperature : 260±5°C Immersion Time : 5±2sec
3
Component Adhesion (Push Test)
1 lbs. For 0402 2 lbs. For 0603 3 lbs. For the rest
The device should be REFLOW soldered (230±5°C for 10 seconds) to a tinned copper subs rate. A dynamiter force gauge should be applied to the side of the conponent. The device must withstand a minimum force of 2 or 4 pounds without a failure of the termination attached to component.
3
Component Adhesion (Push Test)
The electrodes shall be at least 90% covered with new solder coating.
Pre-heating : 150°C, 1min Solder Composition : Sn/Pb=63/67 Solder Temperature : 230±5°C Immersion Time : 4±1sec
4
Drop Test
After test, the chip inductor don't fell of broke on the P.C.Board
Drop 1 time for each face and 1 time for each corner. Total drop 10 times. Drop Height : 100cm Drop Weight : 125g
5
Solderability Test
The terminal should at least be 90% covered with solder
after fluxing (alpha 100 or equiv), inductor shall be dipped in a melted solder bath at 232±5°C for 5 seconds.
6
Resistance to solvent test
There shall be no case of deformation change in appearance of obliteration of marking
MIL-STD202F, METHOD 215D
NOTE : Specifications subject to change without notice. Please check our website for latest information.
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PG. 5
WIREWOUND CHIP INDUCTORS
SCI0805LP SERIES
Climatic Test :
ITEM
1 Temperature Characteristics 2 Humidity Resistance
SPECIFICATION
TEST CONDITIONS / TEST METHODS
-40°C ~ +125°C
Temperature : 40±2°C Relative Humidity : 90~95% Time : 96hrs ±2hrs Measured after exposure in the room condition for 2hrs
3
Low Temperature Storage Test
Appearance : No damage L change : within ±10% Q change : within ±20%
Temperature : -40±2°C Time : 48±2hrs Inductors are to be tested after 1 hour at room temperature.
4
Thermal Shock Test
One cycle : Step 1 2 3 4 Total : 5 cycles Temperature (°C) -25±3 25±2 85±3 25±2 Time (min) 30 15 30 15
5
High Temperature Storage Test
Temperature : 125±2°C Time : 48±2hrs Load : Allowed DC current
6
High Temperature Load Life Test
There should be no evidence of short of open circuit.
Temperature : 85±2°C Time : 1000±12hrs Load : Allowed DC current Temperature : 40±2°C Relative Humidity : 90~95% Time : 1000±12hrs Load : Allowed DC current
7
Humidity Load Life
NOTE : Specifications subject to change without notice. Please check our website for latest information.
15.01.2008
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PG. 6