SCI1008HQ-22NF

WIREWOUND CHIP INDUCTORS 1. PART NO. EXPRESSION : SCI1008HQ SERIES SCI1008HQ-3N0JF (a) (b) (c) (d) (e)(f) (a) Series code (b) Dimension code (c) Type code : HQ ( High Q factor ) (d) Inductance code : 3N0 = 3.0nH (e) Tolerance code : G = ±2%, J = ±5%, K = ±10% (f) F : Lead Free 2. CONFIGURATION & DIMENSIONS : B E C D I J I A G F F PCB Pattern Unit:m/m A B C D 0.65 Ref. E 2.03 Ref. F 0.51 Ref. G 1.52 Ref. H 2.54 Ref. I 1.02 Ref. J 1.27 Ref. 2.92 Max. 2.79 Max. 2.03 Max. 3. SCHEMATIC : 4. MATERIALS : a (a) Core : Ceramic U core (b) Wire : Enamelled Copper Wire b (c) Terminal Metallization : Ag + Ni + Au c NOTE : Specifications subject to change without notice. Please check our website for latest information. H 15.01.2008 SUPERWORLD ELECTRONICS (S) PTE LTD PG. 1 WIREWOUND CHIP INDUCTORS 5. GENERAL SPECIFICATION : a) Storage temp. : -25°C to +80°C b) Operating temp. : -40°C to +125°C c) Temperature rise : 40°C Max. d) Rated current : Base on temp. rise & L/L0A=10% Max. e) Resistance to solder heat : 260°C.10sec SCI1008HQ SERIES 6. ELECTRICAL CHARACTERISTICS : Part No. SCI1008HQ-3N0 F SCI1008HQ-4N1 F SCI1008HQ-7N8 F SCI1008HQ-10N F SCI1008HQ-12N F SCI1008HQ-18N F SCI1008HQ-22N F SCI1008HQ-33N F SCI1008HQ-39N F SCI1008HQ-47N F SCI1008HQ-56N F SCI1008HQ-68N F SCI1008HQ-82N F SCI1008HQ-R10 F Inductance tolerance : : G : ±2% J : ±5% K : ±10% Tolerance Available K, J K, J K, J K, J, G K, J, G K, J, G K, J, G K, J, G K, J, G K, J, G K, J, G K, J, G K, J, G K, J, G L ( nH ) 3.0 4.1 7.8 10 12 18 22 33 39 47 56 68 82 100 Test Freq ( MHz ) 50 50 50 50 50 50 50 50 50 50 50 50 50 50 Q Min. 70 75 75 60 70 62 62 75 75 75 75 80 80 62 Q Test Freq ( MHz ) 1500 1500 500 500 500 350 350 350 350 350 350 350 350 350 SRF ( MHz ) Min. 6000 6000 3800 3600 2800 2700 2050 1700 1300 1450 1230 1150 1060 820 DCR () Max. 0.040 0.050 0.050 0.060 0.060 0.070 0.070 0.090 0.090 0.120 0.120 0.130 0.160 0.160 IDC (mA) Max. 1600 1600 1600 1600 1500 1400 1400 1300 1300 1200 1200 1100 1100 1000 NOTE : Specifications subject to change without notice. Please check our website for latest information. 15.01.2008 SUPERWORLD ELECTRONICS (S) PTE LTD PG. 2 WIREWOUND CHIP INDUCTORS 7. ELECTRICAL CHARACTERISTICS : CONFIGURATTION : SCI1008HQ SERIES COVER TAPE EMBOSSED CARRIER F±0.1 4±0.1 G±0.05 Ø1.5 I±0.05 A±0.2 E±0.05 C±0.1 B±0.1 Ø1.5 DIMENSION (unit: mm) SERIES SCI0402 SCI0603 SCI0805 SCI1008 A 8.0 8.0 8.0 8.0 B 0.71 1.10 1.88 2.73 C 2.0 4.0 4.0 4.0 D 1.16 1.75 2.38 2.88 E 3.5 3.5 3.5 3.5 F 1.75 1.75 1.75 1.75 G 0 2 2 2 H 0.65 1.15 1.48 2.33 I 0.23 0.25 0.20 0.20 PACKING QUANTITY INNER REEL SERIES Q'TY (PCS) 4000 4000 2000 2000 SCI0402 SCI0603 SCI0805 SCI1008 NOTE : Specifications subject to change without notice. Please check our website for latest information. D±0.1 H±0.05 15.01.2008 SUPERWORLD ELECTRONICS (S) PTE LTD PG. 3 WIREWOUND CHIP INDUCTORS 8. ENVIRONMENTAL CHARACTERISTICS : Electrical Performance Test : SCI1008HQ SERIES ITEM 1 Inductance SPECIFICATION TEST CONDITIONS / TEST METHODS HP4291B 2 Q Refer to Electrcal Characteristics List HP4291B 3 SRF HP8753D 4 DC Resistance Rdc Mico-Ohmmeter (GOM-801G) 5 Rated Current IDC The device should be REFLOW soldered (230±5°C for 10 seconds) to a tinned copper subs rate. A dynamiter 6 Over Load Test After test, inductors shall have no evidence of electrical and mechanical damage Applied 2 times of rated allowed DC current to inductor for a period of 5 minute. 7 Withstanding Voltage Test After test, inductors shall have no evidence of electrical and mechanical damage AC voltage of 500VAC applied between inductors terminal and case for 1 minute. 8 Insulation Resistance Test 1000 MOhm min. 100VDC applied between inductor terminal and case NOTE : Specifications subject to change without notice. Please check our website for latest information. 15.01.2008 SUPERWORLD ELECTRONICS (S) PTE LTD PG. 4 WIREWOUND CHIP INDUCTORS SCI1008HQ SERIES Mechanical Performance Test : ITEM 1 Vibration SPECIFICATION Appearance : No damage L change : within ±5% Q change : within ±10% TEST CONDITIONS / TEST METHODS Test device shall be soldered on the substrate Oscillation Frequency : 10 to 55 to 10Hz for 1 min. Amplitude : 1.5mm Time : 2hrs for each axis (X, Y, Z), total 6hrs. 2 Resistance to Soldering Heat Appearance : No damage L change : within ±5% Q change : within ±10% Pre-heating : 150°C, 1 min Solder Composition : Sn/Pb=63/67 Solder Temperature : 230±5°C Immersion Time : 20±2sec Solder Temperature : 260±5°C Immersion Time : 5±2sec 3 Component Adhesion (Push Test) 1 lbs. For 0402 2 lbs. For 0603 3 lbs. For the rest The device should be REFLOW soldered (230±5°C for 10 seconds) to a tinned copper subs rate. A dynamiter force gauge should be applied to the side of the conponent. The device must withstand a minimum force of 2 or 4 pounds without a failure of the termination attached to component. 3 Component Adhesion (Push Test) The electrodes shall be at least 90% covered with new solder coating. Pre-heating : 150°C, 1min Solder Composition : Sn/Pb=63/67 Solder Temperature : 230±5°C Immersion Time : 4±1sec 4 Drop Test After test, the chip inductor don't fell of broke on the P.C.Board Drop 1 time for each face and 1 time for each corner. Total drop 10 times. Drop Height : 100cm Drop Weight : 125g 5 Solderability Test The terminal should at least be 90% covered with solder after fluxing (alpha 100 or equiv), inductor shall be dipped in a melted solder bath at 232±5°C for 5 seconds. 6 Resistance to solvent test There shall be no case of deformation change in appearance of obliteration of marking MIL-STD202F, METHOD 215D NOTE : Specifications subject to change without notice. Please check our website for latest information. 15.01.2008 SUPERWORLD ELECTRONICS (S) PTE LTD PG. 5 WIREWOUND CHIP INDUCTORS SCI1008HQ SERIES Climatic Test : ITEM 1 Temperature Characteristics 2 Humidity Resistance SPECIFICATION TEST CONDITIONS / TEST METHODS -40°C ~ +125°C Temperature : 40±2°C Relative Humidity : 90~95% Time : 96hrs ±2hrs Measured after exposure in the room condition for 2hrs 3 Low Temperature Storage Test Appearance : No damage L change : within ±10% Q change : within ±20% Temperature : -40±2°C Time : 48±2hrs Inductors are to be tested after 1 hour at room temperature. 4 Thermal Shock Test One cycle : Step 1 2 3 4 Total : 5 cycles Temperature (°C) -25±3 25±2 85±3 25±2 Time (min) 30 15 30 15 5 High Temperature Storage Test Temperature : 125±2°C Time : 48±2hrs Load : Allowed DC current 6 High Temperature Load Life Test There should be no evidence of short of open circuit. Temperature : 85±2°C Time : 1000±12hrs Load : Allowed DC current Temperature : 40±2°C Relative Humidity : 90~95% Time : 1000±12hrs Load : Allowed DC current 7 Humidity Load Life NOTE : Specifications subject to change without notice. Please check our website for latest information. 15.01.2008 SUPERWORLD ELECTRONICS (S) PTE LTD PG. 6