TSLW1401R

r r TSLW1401R EXTENDED TEMPERATURE 128 × 1 LINEAR SENSOR ARRAY WITH HOLD TAOS044E − NOVEMBER 2004 D D D D D D D D D D D 128 × 1 Sensor-Element Organization 400 Dots-Per-Inch (DPI) Sensor Pitch High Linearity and Uniformity Wide Dynamic Range . . . 4000:1 (72 dB) Output Referenced to Ground Low Image Lag . . . 0.5% Typ Operation to 8 MHz Single 3-V to 5-V Supply Rail-to-Rail Output Swing (AO) No External Load Resistor Required Replacement for TSLW1401 (TOP VIEW) SI CLK AO VDD 1 2 3 4 8 7 6 5 GND GND GND GND Description The TSLW1401R linear sensor array consists of a 128 × 1 array of photodiodes, associated charge amplifier circuitry, and an internal pixel data-hold function that provides simultaneous-integration start and stop times for all pixels. The pixels measure 63.5 µm (H) by 55.5 µm (W) with 63.5-µm center-to-center spacing and 8-µm spacing between pixels. Operation is simplified by internal control logic that requires only a serial-input (SI) signal and a clock. Functional Block Diagram Pixel 1 Integrator Reset Pixel 2 Pixel 3 Pixel 128 Analog Bus Output Buffer Sample/ Output 3 AO 4 VDD _ + 5−8 GND Switch Control Logic Hold Q1 Q2 Q3 Q128 Gain Trim CLK SI 2 1 128-Bit Shift Register The LUMENOLOGY r Company Texas Advanced Optoelectronic Solutions Inc. 800 Jupiter Road, Suite 205 S Plano, TX 75074 S (972) 673-0759 r www.taosinc.com 1 r Copyright E 2004, TAOS Inc. TSLW1401R EXTENDED TEMPERATURE 128 × 1 LINEAR SENSOR ARRAY WITH HOLD TAOS044E − NOVEMBER 2004 Terminal Functions TERMINAL NAME AO CLK GND SI VDD NO. 3 2 5, 6, 7, 8 1 4 Analog output. Clock. The clock controls charge transfer, pixel output, and reset. Ground (substrate). All voltages are referenced to the substrate. Serial input. SI defines the start of the data-out sequence. Supply voltage. Supply voltage for both analog and digital circuits. DESCRIPTION Detailed Description The sensor consists of 128 photodiodes arranged in a linear array. Light energy impinging on a photodiode generates photocurrent, which is integrated by the active integration circuitry associated with that pixel. During the integration period, a sampling capacitor connects to the output of the integrator through an analog switch. The amount of charge accumulated at each pixel is directly proportional to the light intensity and the integration time. The output and reset of the integrators is controlled by a 128-bit shift register and reset logic. An output cycle is initiated by clocking in a logic 1 on SI. For proper operation, after meeting the minimum hold time condition, SI must go low before the next rising edge of the clock. An internal signal, called Hold, is generated from the rising edge of SI and transmitted to analog switches in the pixel circuit. This causes all 128 sampling capacitors to be disconnected from their respective integrators and starts an integrator reset period. As the SI pulse is clocked through the shift register, the charge stored on the sampling capacitors is sequentially connected to a charge-coupled output amplifier that generates a voltage on analog output AO. Simultaneously, during the first 18 clock cycles, all pixel integrators are reset, and the next integration cycle begins on the 19th clock. On the 129th clock rising edge, the SI pulse is clocked out of the shift register and the analog output AO assumes a high impedance state. Note that this 129th clock pulse is required to terminate the output of the 128th pixel, and return the internal logic to a known state. If a minimum integration time is desired, the next SI pulse may be presented after a minimum delay of tqt (pixel charge transfer time) after the 129th clock pulse. AO is an op amp-type output that does not require an external pull-down resistor. This design allows a rail-to-rail output voltage swing. With VDD = 5 V, the output is nominally 0 V for no light input, 2 V for normal white level, and 4.8 V for saturation light level. When the device is not in the output phase, AO is in a high-impedance state. The voltage developed at analog output (AO) is given by: Vout = Vdrk + (Re) (Ee)(tint) where: Vout Vdrk Re Ee tint is is is is is the analog output voltage for white condition the analog output voltage for dark condition the device responsivity for a given wavelength of light given in V/(µJ/cm2) the incident irradiance in µW/cm2 integration time in seconds A 0.1 µF bypass capacitor should be connected between VDD and ground as close as possible to the device. The TSLW1401R is intended for use in a wide variety of applications, including: image scanning, mark and code reading, optical character recognition (OCR) and contact imaging, edge detection and positioning, and optical linear and rotary encoding. Copyright E 2004, TAOS Inc. r r The LUMENOLOGY r Company 2 www.taosinc.com TSLW1401R EXTENDED TEMPERATURE 128 × 1 LINEAR SENSOR ARRAY WITH HOLD TAOS044E − NOVEMBER 2004 Absolute Maximum Ratings† Supply voltage range, VDD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.3 V to 6 V Input voltage range, VI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . − 0.3 V to VDD + 0.3V Input clamp current, IIK (VI < 0) or (VI > VDD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −20 mA to 20 mA Output clamp current, IOK (VO < 0 or VO > VDD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −25 mA to 25 mA Voltage range applied to any output in the high impedance or power-off state, VO . . . − 0.3 V to VDD + 0.3 V Continuous output current, IO (VO = 0 to VDD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −25 mA to 25 mA Continuous current through VDD or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −40 mA to 40 mA Analog output current range, IO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . − 25 mA to 25 mA Maximum light exposure at 638 nm . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 mJ/cm2 Operating free-air temperature range, TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . − 40°C to 85°C Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . − 40°C to 125°C Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C † Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “Recommended Operating Conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. Recommended Operating Conditions (see Figure 1 and Figure 2) MIN Supply voltage, VDD Input voltage, VI High-level input voltage, VIH Low-level input voltage, VIL Wavelength of light source, λ Clock frequency, fclock Sensor integration time, tint (see Note 1) Setup time, serial input, tsu(SI) Hold time, serial input, th(SI) (see Note 2) Operating free-air temperature, TA 3 0 2 0 400 5 0.03375 20 0 −40 85 NOM 5 MAX 5.5 VDD VDD 0.8 1000 8000 100 UNIT V V V V nm kHz ms ns ns °C NOTES: 1. Integration time is calculated as follows: tint = (128 − 18) y clock period + 20 ms where 128 is the number of pixels in series, 18 is the required logic setup clocks, and 20 ms is the pixel charge transfer time (tqt) 2. SI must go low before the rising edge of the next clock pulse. The LUMENOLOGY r Company r r www.taosinc.com Copyright E 2004, TAOS Inc. 3 TSLW1401R EXTENDED TEMPERATURE 128 × 1 LINEAR SENSOR ARRAY WITH HOLD TAOS044E − NOVEMBER 2004 Electrical Characteristics at fclock = 1 MHz, VDD = 5 V, TA = 25°C, λp = 640 nm, tint = 5 ms, RL = 330 Ω, Ee = 12.5 µW/cm2 (unless otherwise noted) (see Note 3) PARAMETER Vout Vdrk PRNU Analog output voltage (white, average over 128 pixels) Analog output voltage (dark, average over 128 pixels) Pixel response nonuniformity Nonlinearity of analog output voltage Output noise voltage Re Vsat SE DSNU IL IDD IIH IIL Ci Responsivity Analog output saturation voltage Saturation exposure Dark signal nonuniformity Image lag Supply current High-level input current Low-level input current Input capacitance TEST CONDITIONS See Note 4 Ee = 0 See Note 5 See Note 6 See Note 7 See Note 8 VDD = 5 V, RL = 330 Ω VDD = 3 V, RL = 330 Ω VDD = 5 V, See Note 9 VDD = 3 V, See Note 9 All pixels, Ee = 0, See Note 10 See Note 11 VDD = 5 V, Ee = 0 VDD = 3 V, Ee = 0 VI = VDD VI = 0 5 20 4.5 2.5 MIN 1.6 0 TYP 2 0.1 ± 4% ± 0.4% 1 30 4.8 2.8 155 89 0.02 0.5% 2.8 2.6 4.5 4.5 1 1 mA µA µA pF 0.05 V nJ/cm 2 V 40 MAX 2.4 0.2 ± 7.5% FS mVrms V/ (µJ/cm 2) UNIT V V NOTES: 3. All measurements made with a 0.1 µF capacitor connected between VDD and ground. 4. The array is uniformly illuminated with a diffused LED source having a peak wavelength of 640 nm. 5. PRNU is the maximum difference between the voltage from any single pixel and the average output voltage from all pixels of the device under test when the array is uniformly illuminated at the white irradiance level. PRNU includes DSNU. 6. Nonlinearity is defined as the maximum deviation from a best-fit straight line over the dark-to-white irradiance levels, as a percent of analog output voltage (white). 7. RMS noise is the standard deviation of a single-pixel output under constant illumination as observed over a 5-second period. 8. Re(min) = [Vout(min) − Vdrk(max)] ÷ (Ee × tint) 9. SE(min) = [Vsat(min) − Vdrk(min)] × 〈Ee × tint) ÷ [Vout(max) − Vdrk(min)] 10. DSNU is the difference between the maximum and minimum output voltage for all pixels in the absence of illumination. 11. Image lag is a residual signal left in a pixel from a previous exposure. It is defined as a percent of white-level signal remaining after a pixel is exposed to a white condition followed by a dark condition: IL + V out (IL) * V drk V out (white) * V drk 100 Timing Requirements (see Figure 1 and Figure 2) MIN tsu(SI) th(SI) tw tr, tf tqt Setup time, serial input (see Note 12) Hold time, serial input (see Note 12 and Note 13) Pulse duration, clock high or low Input transition (rise and fall) time Pixel charge transfer time 20 0 50 0 20 500 NOM MAX UNIT ns ns ns ns µs NOTES: 12. Input pulses have the following characteristics: tr = 6 ns, tf = 6 ns. 13. SI must go low before the rising edge of the next clock pulse. Dynamic Characteristics over recommended ranges of supply voltage and operating free-air temperature PARAMETER ts Analog output settling time to ± 1% r r 4 www.taosinc.com TEST CONDITIONS RL = 330 Ω, CL = 10 pF MIN TYP 120 MAX UNIT ns Copyright E 2004, TAOS Inc. The LUMENOLOGY r Company TSLW1401R EXTENDED TEMPERATURE 128 × 1 LINEAR SENSOR ARRAY WITH HOLD TAOS044E − NOVEMBER 2004 TYPICAL CHARACTERISTICS CLK SI tqt Internal Reset 18 Clock Cycles Integration Not Integrating tint Integrating 129 Clock Cycles AO Hi-Z tw CLK tsu(SI) SI AO The LUMENOLOGY r Company ÎÎÎÎÎÎÎÎ ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ ÎÎÎÎÎÎÎÎ ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ Hi-Z Figure 1. Timing Waveforms 1 2 128 129 2.5 V 5V 0V 5V 0V 50% th(SI) ts Pixel 1 Pixel 128 Figure 2. Operational Waveforms r r www.taosinc.com Copyright E 2004, TAOS Inc. 5 TSLW1401R EXTENDED TEMPERATURE 128 × 1 LINEAR SENSOR ARRAY WITH HOLD TAOS044E − NOVEMBER 2004 TYPICAL CHARACTERISTICS IDLE SUPPLY CURRENT vs FREE-AIR TEMPERATURE 4.0 VDD = 5 V 3.5 0.8 Relative Responsivity IDD — Idle Supply Current — mA 400 500 600 700 800 900 1000 1100 3.0 2.5 2.0 1.5 1.0 0.5 0 300 0 −40 PHOTODIODE SPECTRAL RESPONSIVITY 1 TA = 25°C 0.6 0.4 0.2 −15 10 35 60 85 λ − Wavelength − nm TA − Free-Air Temperature − °C Figure 3 AVERAGE ANALOG OUTPUT VOLTAGE, WHITE vs FREE-AIR TEMPERATURE 3.50 Average Analog Output Voltage, White — V 3.00 tint = 10 ms Average Analog Output Voltage, Dark — V 0.12 Figure 4 AVERAGE ANALOG OUTPUT VOLTAGE, DARK vs FREE-AIR TEMPERATURE 0.10 tint = 5 ms 0.08 2.50 2.00 tint = 5 ms 1.50 0.06 0.04 1.00 tint = 0.5 ms tint = 2.5 ms tint = 1 ms 0.50 0.02 0 −40 −15 10 35 60 TA − Free-Air Temperature − °C 85 0 −40 −15 10 35 60 TA − Free-Air Temperature − °C 85 Figure 5 Figure 6 Copyright E 2004, TAOS Inc. r r The LUMENOLOGY r Company 6 www.taosinc.com TSLW1401R EXTENDED TEMPERATURE 128 × 1 LINEAR SENSOR ARRAY WITH HOLD TAOS044E − NOVEMBER 2004 TYPICAL CHARACTERISTICS SETTLING TIME vs. LOAD 600 VDD = 3 V Vout = 1 V 500 Settling Time to 1% — ns Settling Time to 1% — ns 470 pF 400 220 pF 300 500 470 pF 400 220 pF 300 600 VDD = 5 V Vout = 1 V SETTLING TIME vs. LOAD 200 100 pF 100 10 pF 0 200 100 pF 100 10 pF 0 200 400 600 800 RL — Load Resistance − W 1000 0 0 200 400 600 800 RL — Load Resistance − W 1000 Figure 7 Figure 8 The LUMENOLOGY r Company r r www.taosinc.com Copyright E 2004, TAOS Inc. 7 TSLW1401R EXTENDED TEMPERATURE 128 × 1 LINEAR SENSOR ARRAY WITH HOLD TAOS044E − NOVEMBER 2004 MECHANICAL INFORMATION The integrated circuit is mounted in a window frame package with a clear, flat glass cover. 5 6 Pin Pin Pin Pin Pin Pin Pin Pin 1 2 3 4 5 6 7 8 SI CLK AO VDD GND GND GND GND 7 8 4 3 2 1 SECTION ’A−A’ 0.600 [15.240] 0.536 [13.614] 0.375 [9.512] 0.090 [2.286] 0.075 [1.905] 0.060 [1.524] 75 0.150 [3.810] A 0.040 [1.016] NOTE B 0.260 [6.610] 0.325 [8.255] 0.550 + 0.012 [13.97 + 0.3] 0.020 +0.004 /−0.008 [0.508 +0.1/−0.2] 0.025 [0.635] 0.100 [2.540] (TYP. 3 PLCS.) REF. C L 0.010 [0.254] (CHAMFER REF.) Pin 1 0.020 [0.508] C L A 0.135 [3.429] 0.115 [2.921] 0.135 + 0.008 [3.425 + 0.2] NOTES: A. All linear dimensions are in inches and parenthetically in [millimeters] ( ± 0.1 mm unless otherwise noted). B. Pixel 1 typical location aligns on leading edge of pin 1 and 0.71 mm above package centerline. C. Glass thickness nominally 1 mm with refraction index of 1.5186. Figure 9. Packaging Configuration Copyright E 2004, TAOS Inc. r r The LUMENOLOGY r Company 8 www.taosinc.com TSLW1401R EXTENDED TEMPERATURE 128 × 1 LINEAR SENSOR ARRAY WITH HOLD TAOS044E − NOVEMBER 2004 PRODUCTION DATA — information in this document is current at publication date. Products conform to specifications in accordance with the terms of Texas Advanced Optoelectronic Solutions, Inc. standard warranty. Production processing does not necessarily include testing of all parameters. NOTICE Texas Advanced Optoelectronic Solutions, Inc. (TAOS) reserves the right to make changes to the products contained in this document to improve performance or for any other purpose, or to discontinue them without notice. Customers are advised to contact TAOS to obtain the latest product information before placing orders or designing TAOS products into systems. TAOS assumes no responsibility for the use of any products or circuits described in this document or customer product design, conveys no license, either expressed or implied, under any patent or other right, and makes no representation that the circuits are free of patent infringement. TAOS further makes no claim as to the suitability of its products for any particular purpose, nor does TAOS assume any liability arising out of the use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. TEXAS ADVANCED OPTOELECTRONIC SOLUTIONS, INC. PRODUCTS ARE NOT DESIGNED OR INTENDED FOR USE IN CRITICAL APPLICATIONS IN WHICH THE FAILURE OR MALFUNCTION OF THE TAOS PRODUCT MAY RESULT IN PERSONAL INJURY OR DEATH. USE OF TAOS PRODUCTS IN LIFE SUPPORT SYSTEMS IS EXPRESSLY UNAUTHORIZED AND ANY SUCH USE BY A CUSTOMER IS COMPLETELY AT THE CUSTOMER’S RISK. LUMENOLOGY, TAOS, the TAOS logo, and Texas Advanced Optoelectronic Solutions are registered trademarks of Texas Advanced Optoelectronic Solutions Incorporated. The LUMENOLOGY r Company r r www.taosinc.com Copyright E 2004, TAOS Inc. 9 TSLW1401R EXTENDED TEMPERATURE 128 × 1 LINEAR SENSOR ARRAY WITH HOLD TAOS044E − NOVEMBER 2004 Copyright E 2004, TAOS Inc. r r The LUMENOLOGY r Company 10 www.taosinc.com