C3225X8L1H475K200AC

C3225X8L1H475K200AC TDK Item Description : C3225X8L1H475KT**** DC Bias Characteristic 10 Application & Main Feature 0 -10 Cap. Change/% Commercial Grade ( High Temperature Application ) ) Series C3225 [EIA 1210] -20 -30 -40 -50 -60 -70 -80 3.20mm 2.50mm 2.00mm 0.20mm +/-0.4mm +/-0.3mm +/-0.2mm Min. Temperature Characteristic X8L (-55 to 150 degC +15,-40%) 100 |Z|, ESR vs. Freq. Characteristics 30 40 50 60 10 Rated Voltage 1H(50Vdc) 0 -10 -20 1 -30 -40 0.1 -50 -60 0.01 -70 -80 0.001 0.001 Capacitance 0.01 0.1 1 10 100 1000 |Z| K (+/-10%) -60 -40 -20 100 ESR 5% Max. Cap. vs. Freq. Characteristic 1 Not Applicable 0.01 0.1 1 Frequency/MHz 20 60 80 100 120 140 160 180 10 100 1000 TCBias(1/2Rated) 20 15 10 5 0 0 1 2 3 4 Current/Arms 100kHz All specifications are subject to change without notice. 40 Ripple Temperature Rise Characteristics 25 10 0.1 0.001 0 Temp.Chara. Dissipation Factor AEC-Q200 -80 Temperature/degC Temperature Rise/degC Capacitance Tolerance 106Mohm Min. -90 Frequency/MHz 4.7uF Insulation Resistance Temperature Characteristics 20 10 Cap./uF Characterization Sheet ( Multilayer Ceramic Chip Capacitors ) 20 Cap. Change/% L W T B G 10 DC Bias/V |Z|, ESR/ohm Dimensions 0 500kHz 1MHz June 19, 2017