ADAPT-100-185

WaveExpert ® 100H Wide Bandwidth Oscilloscopes for Next Generation Serial Data Standards The New WaveExpert 100H Sampling Oscilloscope — the Complete Workstation for Optimizing Serial Data Signal Integrity In recent years, the rates of serial data signals have increased steadily from 2.5 Gb/s to 40 Gb/s and beyond. All this speed, of course, pushes up the bandwidth requirements of oscilloscopes. However, simply providing this bandwidth is not sufficient for qualifying these high-speed links. High bandwidth oscilloscopes must have the detailed analysis capability required by next-generation standards. Adding to the measurement complexity is the emergence of receiver equalization which allows high-speed serial data links to operate error-free even when the signal is severely distorted. The WaveExpert 100H is the ideal signal integrity analysis solution for these applications. Ultra-High Bandwidth Signal Analysis Highly Accurate Jitter Analysis (Pages 6-7) Eye pattern analysis is the primary method of signal integrity testing for optical signals, and the WaveExpert performs this analysis over 20 times faster than conventional sampling oscilloscopes. The low jitter noise floor of the HCIS timebase along with LeCroy’s innovative Q-Scale jitter analysis provides over 3 times the accuracy of conventional sampling oscilloscope methods for all jitter types. A maximum bandwidth of 100 GHz along with a 230 fs rms noise floor enables measurements on the fastest optical signals. 2 Up to 20 GHz TDR with Full S-parameter Measurements (Pages 4-5) Eye Doctor™ Offers Virtual Probing and Equalized Signals (Pages 10-11) The standard TDR analysis package included with the The Virtual Probing and equalized receiver emulation WaveExpert 100H offers full reference plane calibration features in the Eye Doctor package provide full end-to- and one- and two-port differential S-parameter measure- end signal integrity analysis of serial data systems ment fully integrated into the instrument interface. employing equalization. 3 Integrated TDR Analysis and S-parameter Measurement TDR Analysis with S-parameter Measurement The TDR function in the WaveExpert • Single-ended and differential measurements is an essential tool for analyzing the response of backplanes, cables, pc • Fast step (20 ps rise time) boards and other devices. TDR analysis • Sub-millimeter measurement resolution with reference plane calibration and one- • Advanced OSL (Open Short Load) calibration removes effects of cables, fixtures, etc. and two-port differential S-parameter • TRUE differential TDR/TDT the WaveExpert 100H. The measure- • Automated deskew ments are integrated into the user • Accurate S-parameter measurements to 20 GHz interface along with a measurement • Data output in Voltage, Impedance, or S-parameter (SnP) format “wizard” that guides the user through • Fully integrated TDR analysis with S-parameter analysis The ST-20 sampling/TDR heads allow measurement is included standard in the set-up and calibration process. for true differential stimulus so both single-ended and differential impedance measurements are possible. More complete analysis is available using the built-in S-parameter measurements which feature full Short, Open, Step Generators (ST-20) Load, Through (SOLT) reference plane calibration for the highest accuracy possible. S-parameter results can be stored in industry-standard Touchstone format (SnP). One- and two-port S-parameters can be measured either single-ended or differential. For differential measure- DUT ments, the common mode and differential results are available. Many standards such as serial ATA require a specific rise time for the The WaveExpert 100H provides true differential TDR stimulus for TDR and TDT testing. The standard software provides impedance, return loss, and S-parameter measurements. TDR step to measure the differential impedance of cables or backplanes. Rise time controls are provided to enable this adjustment. 4 Differential return loss of a 24-inch backplane measured using the standard S-parameter software on the WaveExpert. Cursor reactance measurements are available which enable the display of equivalent inductance and capacitance of the TDR trace delimited by the cursors. The TDR measurement wizard guides the user through the set-up and calibration process ensuring the highest accuracy measurements. Full reference plane calibration and channel deskew is performed by the wizard. Calibrated impedance measurements are available with selectable rise time. This feature provides compliant impedance measurements of connectors, cables, and backplanes. 5 Highest Accuracy Jitter Analysis Jitter Analysis • 230 fs rms intrinsic timebase jitter • Accurate total jitter analysis at any data rate • Jitter breakdown using Q-Scale analysis ® Random jitter ® Data Dependent Jitter (DDj, DCD, and ISI) ® Bounded Uncorrelated Jitter (BUj) • Analysis of ALL edges in a waveform • One-button access to jitter measurements Normalized Q-Scale analysis is performed on each edge of the data pattern. The slope of the linear portion is a measure of the random jitter while the separation of the lines at Q=0 gives the amount of Bounded Uncorrelated Jitter (BUj). High Stability Coherent Interleaved Sampling (HCIS)— a Breakthrough in Acquisition Technology which relies on an accurate time delay timebase in the WaveExpert samples component to position the samples of at rates 100 times faster and with the waveform in time. In addition to 230 fs rms intrinsic jitter. being slow, this type of sampling has The technology behind HCIS employs Conventional sampling oscilloscopes high intrinsic jitter and requires a low a phase-locked loop in the timebase employ a sequential acquisition method jitter trigger signal. The patented HCIS which recovers the instrument’s sampling clock from the bit clock of the signal under test. The advantages of this approach are fast sampling, high linearity, and low jitter over a wide frequency range. The fast sampling rate and long waveform memory of the HCIS timebase are essential elements for jitter analysis using the normalized Q-Scale technique. The innovative normalized Q-Scale jitter analysis software used in the WaveExpert oscilloscope provides the most accurate measurements, regardless of the jitter scenario. Conventional oscilloscope-based jitter analysis relies Complete jitter measurements utilize the coherent interleaved sampling timebase. Analysis includes total jitter, random jitter, deterministic jitter, and the components of deterministic jitter; DDj, ISI, and DCD. 6 on the accurate measurement of the Jitter analysis uses all edges in the data pattern. The slope and mean displacement from nominal is used to measure the data dependent jitter. All individual edges can be separately viewed, as shown in the center of the eye above. The high stability coherent interleaved timebase (HCIS) provides a significantly lower jitter noise floor compared to a conventional sequential sampling timebase over a wide frequency range. The chart above shows the jitter performance of the standard and high stability coherent interleaved timebases over a range of bit rates. The HCIS timebase combined with normalized Q-Scale jitter analysis provides the highest accuracy jitter measurements regardless of the type of jitter present. This chart shows a set of jitter measurements on a calibrated jitter source comparing Q-Scale and the spectral method. The WaveExpert 100H gives the most accurate measurements even in cases where large SJ (sinusoidal jitter) and BUj (bounded, uncorrelated jitter) are present. The HCIS timebase has the lowest jitter noise floor, thus providing more accurate measurements than even a BERT. Jitter analysis uses a pattern-locked signal waveform and measures every edge in the pattern. The combined jitter histogram from all edges provides the random and uncorrelated jitter. jitter spectrum. This method can rely on the jitter spectrum but, instead, jitter can be removed from the jitter become inaccurate, and can over- uses the measured jitter distribution to measurement, resulting in the first estimate jitter in cases where there is determine the random and bounded instrument that can measure Bounded crosstalk or power supply noise. The jitter components. When a repeating Uncorrelated Jitter (BUj). normalized Q-Scale method does not data pattern is used, the data dependent 7 Optical Measurements at High Data Rates Optical Measurements Eye patterns remain one of the most • Fast eye pattern measurements important measures of signal quality in • Available 100 GHz sampling module for measurements beyond 40 Gb/s optical systems. In the past, designers were forced to use small statistical samples for this measurement, but the • Pattern locking feature of HCIS enables analysis of PRBS23 waveforms WaveExpert oscilloscope’s fast coherent • Channel equalization using Eye Doctor feature rivaled only by bit error rate test systems. • RZ and NRZ measurements • Built-in optical measurements such as Extinction Ratio, OMA, etc. (using external optical to electrical converter) timebase provides a level of throughput Eye patterns consisting of millions of samples can be measured in seconds, thus providing the highest level of accuracy and repeatability for a complete range of eye-based measurements such as extinction ratio, modulation amplitude, eye height and eye width. With its fast Fast eye pattern measurements acquire millions of samples in seconds compared to minutes or hours on conventional sampling oscilloscopes. WaveExpert comes standard with a complete set of compliance masks and measurements. Long test patterns are used to analyze the effects of channel distortions such as dispersion in optical fibers. The XXL memory option in the WaveExpert provides up to 510 M samples of waveform storage which can be viewed and analyzed on-screen. The fast acquisition rate provided by the HCIS timebase acquires a complete PRBS23 pattern in less than one minute. The analysis shown here is using the WaveScan feature to find the 20 fastest and slowest rise time edges in a PRBS23 pattern. 8 acquisition, the WaveExpert oscilloscope performs the most accurate eye jitter measurements, without the timebase drift problems present in standard equivalent-time scopes. Telecom and datacom technologies are at 40 Gb/s in deployed systems, and 80 Gb/s and beyond in the lab. Measuring signals at these rates is pushing the limits of test equipment technology. The WaveExpert oscilloscope with its industry-leading 100 GHz bandwidth is up to the challenge. The fast acquisition, deep memory, and low jitter of the HCIS timebase provide an unprecedented level of waveform The high measurement throughput of the HCIS timebase provides the highest analysis depth of any oscilloscope. This plot shows probability of capturing 10 mask violations as a function of measurement time. The WaveExpert requires less than 15 seconds to guarantee this measurement while a conventional sampling oscilloscope requires over 4 minutes. analysis. Complex measurements such as dispersion penalty, and processing functions such as equalization, are possible for the first time on pattern lengths as long as PRBS23. A complete set of electrical plug-in modules provides coverage of all current and emerging standards. WaveScan™ Advanced Search WaveScan is a powerful tool that provides the ability to locate unusual events in a single capture, or scan for an event in many acquisitions over a long period of time using more than 20 different search/scan modes. • Locate problems triggers won’t find • Use measurement-based scanning modes, like frequency, to show An available 100 GHz bandwidth electrical sampling module enables measurements beyond 40 Gb/s. This image shows the time domain pulse from a femto-second laser and the FFT of the pulse. The HHI C05-W-22 100 GHz photodiode was used with the SE-100 sampling head to acquire the signal. The right grid scale is 20 GHz/div horizontally and 6 dB/div (3 dB/div optical). statistical distribution of events • Overlay events for a quick and simple visual comparison 9 Eye Doctor™ – A Complete Interoperability Solution Eye Doctor™ This feature works by using S-parameter • Full signal integrity analysis of equalized receiver signal files of the various components • Real time co-simulation of measured signals and measured or modeled network characteristics in the system to derive a filter which relates the desired measured signal to the acquired waveform. For • Performance margin analysis in equalized systems example, measurements can be • De-embedding of fixture and probe responses made where the cleanest signal is • High accuracy far-end channel measurements available, usually at the transmitter, • Emulates any combination of DFE and FFE equalizers and the corrupted signal at the far-end • Automatic equalizer coefficient optimization of the channel (at the end of the backplane) can be simulated thus • Direct entry of FFE and DFE coefficients eliminating probe and instrument noise from the measurement. Eye doctor consists of two elements; Virtual Probing™ and equalized receiver emulation. Virtual Probing enhances the accuracy of measurements made on Transmitter Signal Integrity distorted waveforms while equalized Simulated Receiver Input receiver emulation allows measurements to be made from a “receiver’s eye view.” The ideal view of the signal within the receiver allows accurate total jitter and bit error rate measurements TX Channel RX that are representative of actual system performance. Virtual Probing Probes and fixtures are not perfect and their presence in the circuit impacts Channel Response Ideal Equalized Receiver both the loading on the DUT as well as the waveform seen by the oscilloscope. Virtual Probing is a powerful signal processing tool which enables the user to measure a signal anywhere within a system and then project a response at any other desired point. 10 Current generation serial data systems operating at bit rates beyond 5 Gb/s represent an interoperability testing challenge. The introduction of equalization to digital receiver designs means that systems with partially or fully closed eye patterns can operate error-free. The WaveExpert 100H addresses these challenges using a combination of measurement and simulation tools including jitter analysis, true differential TDR testing with S-parameter measurement, Virtual Probing, and equalized receiver emulation. The derived filter takes into account all of the interactions among the elements of the system and transmitter signal including differential to common mode conversion, nearend and far-end crosstalk. Virtual Probing can be used to de-embed probe and fixture responses from measurements thereby improving the accuracy of signal integrity measurements. Equalizer Emulation Eye Doctor features equalized receiver emulation which includes both Feed Forward Equalization (FFE) and Decision Feedback Equalization (DFE), along Equalizer emulation simulates the signal as viewed within the receiver. The component can automatically determine the optimum weighting coefficients for both FFE and DFE with the number of taps for each selected by the user. Coefficients can also be entered directly. Jitter and eye pattern analysis can be performed on the equalized signal using the SDA option. with clock recovery and a variable decision threshold. This ideal receiver reveals the signal as seen within a real System Definition File receiver at the detector where it is impossible to probe. The equalized Simulated Measured Signals (up to 8) signal can be measured using the powerful jitter and signal analysis software in the SDA, allowing the bit error rate, total jitter, and eye opening to be measured, thus giving a precise Probed Signals (up to 8) indication of the performance margin. Because the receiver emulation is ideal, the margins are measured independ- S-parameter Files ently of measurement system and receiver noise. Virtual Probing uses the measured characteristics of the elements of the system under test in terms of their S-parameters and the system definition file which describes how these elements are interconnected to build a digital filter which relates the waveform acquired by the oscilloscope to the desired measured waveform. Virtual Probing can be used to simulate receiver input signals as well as de-embedding fixtures and probes from measurements. 11 bi tr at e( Gb /s ST ) -2 0 SE -3 0 SE -5 0 SE -7 0 SE -1 00 ME -15 mo W du Ele S ex DA Vi ten rtu de al rc P ab Eq ro le be ua liz e W rE Em HC ula I tio S W n ECI S W EXX L WaveExpert Module and Option Selection Guide SATA 1.5 Gb/s 1.5 * * * * * SAS 150 1.5 * * * * * 1.65 1.65 2.125 * * * * * * * * * * * 2.2275 * 2.48832 * * * * HDMI 1.2 DVI Fibre Channel* HDMI 1.3 2.5 Gb SONET/SDH* InfiniBand PCIe Gen1 ATCA 2.5 2.5 2.5 * * * Serial ATA 3 Gb/s 3 * * * * * SAS 300 3 * * * * * 3.125 3.125 3.125 3.2 4.25 4.8 5 * * * * * * * * * * * * SAS Gen2 6 * SATA Gen3 6 * XAUI 10GBASE-LX4 Serial RapidIO FireWire Fibre Channel FB-DIMM I PCIe Gen2 Fibre Channel* * * * * * * * * * * * * * 9 9.953 * 10 * * * 802.3aq 10GBASE-LRM* 10.3 * * * High Accuracy Jitter 12.5 * * * 10G Ethernet* * * * * * * * * 8.5 FB-DIMM II 10G SONET/SDH* * * * * * * * * * * * * * * * * * * * * * 80 Gb/s Optical* 80 * * * * * 40 Gb/s Optical* up to 43 * * * * * *with external O/E module. * * * * TDR for cables and TX/RX. XXL memory measures long COMP pattern (81920 symbols) TDR for cables and TX/RX. XXL memory measures long COMP pattern (81920 symbols) TDR cable testing TDR cable testing Fast throughput eye measurement. Jitter on CJPAT with WE-SDA TDR cable testing Fast eye pattern measurement, XXL memory for pattern dependent analysis Jitter on CJPAT with WE-SDA, TDR cable testing Measure 640-bit compliance pattern jitter with WE-SDA Measure 640-bit compliance pattern jitter with WE-SDA, Eye Doctor provides interoperability testing on equalized backplanes, TDR measures S-parameters TDR for cables and TX/RX. XXL memory measures long COMP pattern (81920 symbols) TDR for cables and backplanes. XXL memory measures long COMP pattern (81920 symbols) Rj, Dj using WE-SDA Rj, Dj using WE-SDA Rj, Dj using WE-SDA Rj, Dj using WE-SDA Eye Doctor provides fixture de-embedding for TX compliance. WE-SDA enables jitter measurement on 640-bit compliance pattern Virtual Probe provides fixture de-embedding for TX compliance. Equalizer provides compliant receiver testing. WE-SDA enables jitter measurement on CJPAT Virtual Probe provides fixture de-embedding for TX compliance. WE-SDA enables jitter measurement on CJPAT Optical compliance testing with fast eye pattern, Tj Dj measurement with WE-SDA. XXL memory provides capture of PRBS23 for pattern dependent analysis. Equalizer allows emulation of dispersion compensation Tj and Dj with SDA option, dispersion compensation with Equalizer emulation, XXL provides pattern dependent analysis up to PRBS23 Tj and Dj with SDA option, TWDP with Equalize emulation, XXL provides pattern delendent analysis up to PRBS23 230 fs rms jitter noise floor with HCIS, jitter breakdown analysis up Analysis to 1M bits with XXL memory 230 fs rms jitter with HCIS, 90 GHz optical bandwidth with HHI C05-W-22 photodetector and SE-100, Eye Doctor for dispersion compensation 230 fs rms jitter with HCIS for eye pattern analysis, fast eye pattern measurement. XXL memory for pattern dependent analysis. 90 GHz optical bandwidth with HHI C05-W-22 photodetector and SE-100 Modular Acquisition Covers Bandwidths from 20 to 100 GHz The WaveExpert 100H mainframe accepts any combination of up to 4 modules. Electrical modules with ratings of 20, 50, 70, and 100 GHz are available. Module Extender Cable The ME-15 is a 1.5 meter extender cable which allows any of the available sampling modules to be remotely mounted from the mainframe. Remote mounting is important for maintaining signal integrity during TDR and high bandwidth measurements. Electrical Sampling, Clock Recovery and Pattern Generator Modules Trigger Prescaler The SDA-TPS prescaler extends the trigger input range to 40 GHz, allowing bit rate triggering of 40 Gb/s data streams. ME-15 – Module Extender Cable SDA-TPS – Trigger Prescaler 13 Specifications Timebase Parameter Sequential Sample Rate Frequency Range 1 MS/s DC to 5 GHz, using Trigger input 5 GHz–14 GHz, using CLK/Prescale input up to 40 GHz, using SDA-TPS accessory N/A 1 ps 100 fs rms 1 ps/div to 1 ms/div 25 ns–10 ms ±1 ps ±0.1% of reading ±5 ppm Pattern Lock Minimum Time Per Division Time Resolution Timebase Range Timebase Delay Time Range Time Interval Accuracy Long Term Stability Maximum Record Length Standard Optional Jitter 100k samples N/A 1 ps typical, 1.2 ps guaranteed With Coherent Timebase (WE-CIS and WE-HCIS) 10 MS/s 62.5 MHz–125 MHz, using Trigger input 125 MHz–14 GHz, using CLK/Prescale input up to 40 GHz, using SDA-TPS accessory YES, up to PRBS23 1 ps 100 fs rms 1 ps/div to 500 ns/div (4 M memory) ±1 pattern Determined by trigger signal Determined by trigger signal 64 M samples 1 Ch, 16 M samples 4 Ch 510 M / 1 Ch, 256 M / 2 Ch, 128 M / 4 Ch HCIS: 230 fs rms typical, 250 fs rms guaranteed CIS: 500 fs rms typical, 600 fs rms guaranteed (3 Gb/s–40 Gb/s) Trigger and Clock Inputs Parameter Connector Type Impedance Input Amplitude Max. Input Voltage Coupling Trigger Sensitivity Trigger Gating (Sequential mode only) Trigger Gating Delay (Sequential mode only) Trigger Input 2.92 mm 50 Ω nominal ±1 V ±2.5 V DC -10 dBm at 100 MHz, -5 dBm at 5 GHz Enable: 2.0–3.5 V Disable: 0–0.8 V Disable: 24 ns+ trigger period + time window setting Enable: 32 ns CLK/Prescale Input 2.92 mm 50 Ω nominal 0.0 dBm ±6 dBm ±2.5 V AC coupled -5 dBm at 14 GHz ST-20 (20 GHz) 2.92 mm 18 ps 20 GHz 2 Vp-p < 1% (800 mVp-p signal) First 40 ps: ±10%, 40 ps–200 ps: ±5%, 200 ps–10 ns ±2% 700 µV max. (500 µV typical) ±1 V SE-30 (30 GHz) 2.92 mm 12 ps 30 GHz 2 Vp-p < 1% (800 mVp-p signal) First 40 ps: ±10%, 40 ps–200 ps: ±5%, 200 ps–10 ns ±2% 1 mV (max.) ±1 V SE-70 (70 GHz) 1.85 mm 5 ps 70 GHz 2 Vp-p < 1% (800 mVp-p signal) First 40 ps: ±10%, 40 ps–200 ps: ±5%, 200 ps–10 ns ±2% 3 mV (max.) ±1 V SE-100 (100 GHz) 1 mm 4 ps 100 GHz 2 Vp-p < 1% (800 mVp-p signal) First 40 ps: ±10%, 40 ps–200 ps: ±5%, 200 ps–10 ns ±2% 3 mV (max.) ±1 V Electrical Sampling Modules Parameter Connector Type Rise Time Bandwidth Input Voltage Range DC Vertical Voltage Accuracy Aberrations RMS Noise Offset Range Parameter Connector Type Rise Time Bandwidth Input Voltage Range DC Vertical Voltage Accuracy Aberrations RMS Noise Offset Range 14 SE-50 (50 GHz) 2.4 mm 8 ps 50 GHz 2 Vp-p < 1% (800 mVp-p signal) First 40 ps: ±10%, 40 ps–200 ps: ±5%, 200 ps–10 ns ±2% 2 mV (max.), 1 mV (typical) ±1 V Specifications TDR Step Generator (ST-20) Parameter Step Rise Time TDR Step Voltage Resistance TDR Pulse Rate Offset Range Step Flatness Pulse Width Nominal 20 ps 250 mV 50 Ω 1 MHz ±1 V First 40 ps: ±10%, 40 ps–200 ps: ±5%, 200 ps–10 ns ±2% 300 ns ±15 ns Power Requirements 100–200 Vrms (±10%) at 50/60 Hz; 115 Vrms (±10%) at 400 Hz, Automatic AC Voltage Selection Installation Category: 300 V CAT II; Max. Power Consumption: 400 VA (400 W) Environmental Temperature (Operating) Temperature (Non-Operating) Humidity (Operating) Altitude (Operating) Altitude (Non-Operating) Random Vibration (Operating) Random Vibration (Non-Operating) Functional Shock +5 °C to +40 °C including CD-ROM drive -20 °C to +60 °C 5% to 80% relative humidity (non-condensing) up to +30 °C. Upper limit derates to 25% relative humidity (non-condensing) at +40 °C Up to 10,000 ft. (3048 m) at or below +25 °C Up to 40,000 ft. (12,192 m) 0.31 g rms 5 Hz–500 Hz, 15 minutes in each of three orthogonal axes 2.4 g rms 5 Hz to 500 Hz, 15 minutes in each of three orthogonal axes 20 gpeak, half sine, 11 ms pulse, 3 shocks (positive and negative) in each of three orthogonal axes, 18 shocks total Physical Dimensions Dimensions (HWD) Weight Shipping Weight 264 mm x 397 mm x 491 mm; 10.4" x 15.6" x 19.3" (height excludes feet) 40 lbs; 18 kg 52 lbs; 24 kg Certifications CE Compliant, UL and cUL listed; Conforms to EN 61326; EN 61010-1; UL 61010-1; and CSA C22.2 No. 61010-1 15 Ordering Information Product Description Product Code WaveExpert 100H Product Code Hardware Options and Accessories Standard 4-slot Mainframe Serial Data Package (Jitter Analysis) 510 M (1 Ch), 255 M (2 Ch), 128 M (4 Ch) Waveform Memory WE 100H WE-SDA WE-XXL Software Options Eye Doctor (Virtual probe and equalizer emulation bundle) Virtual Probe Equalizer Emulation EYEDR EYEDR-VP EYEDR-EQ Timebase Options CIS Timebase – 600 fs rms Jitter, Pattern Lock, 10 Ms/s HCIS Timebase – 250 fs rms Jitter, Pattern Lock, 10 Ms/s WE-CIS WE-HCIS Electrical Sampling Modules 100 GHz Electrical Sampling Module 70 GHz Electrical Sampling Module 50 GHz Electrical Sampling Module 30 GHz Electrical Sampling Module 20 GHz Electrical Sampling Module with TDR SE-100 SE-70 SE-50 SE-30 ST-20 Coaxial Adapters 2.92 mm F-F Adapter 2.92 mm – SMA F-F Adapter 1.85 mm F-F Adapter 1 mm F-F Adapter 1 mm – 1.85 mm F-F Adapter 1-800-5-LeCroy www.lecroy.com Product Description ADAPT-292 ADAPT-292-SMA ADAPT-185 ADAPT-100 ADAPT-100-185 40 GHz Trigger Prescaler (for clock frequencies to 40 GHz) 3.5 mm Coaxial Calibration Kit (includes Open, Short, and 50 ohm reference standards) 1.5 Meter Module Extender Cable Blank Cover Module IEEE-488 GPIB Remote Control Interface Dual Monitor Display Keyboard, USB Oscilloscope Cart with Extra Shelf and Drawer Oscilloscope Cart Rackmount Adapter with 25" (64 cm) Slides Rackmount Adapter with 30" (76 cm) Slides Removable Hard Drive Package Additional Removable Hard Drive (includes USB, CD-ROM and Spare Hard Drive) 4 in.-lb. Torque Wrench 8 in.-lb. Torque Wrench SDA-TPS CALKIT-OSL ME-15 WE-CM GPIB-1 DMD-1 KYBD-1 OC1024 OC1021 RMA-25 RMA-30 WE9K-RHD WE9K-RHD-02 TW-4 TW-8 Customer Service LeCroy oscilloscopes are designed, built, and tested to ensure high reliability. In the unlikely event you experience difficulties, the WaveExpert Series oscilloscope mainframes are warranted for a period of three years, and modules are warranted for a period of one year. Our probes are warranted for one year. This warranty includes: • No charge for return shipping • Long-term 7-year support • Upgrade to latest software at no charge Local sales offices are located throughout the world. Visit our website to find the most convenient location. © 2009 by LeCroy Corporation. All rights reserved. Specifications, prices, availability, and delivery subject to change without notice. Product or brand names are trademarks or requested trademarks of their respective holders. WEDSrevC-W1-25Mar09