SiR876DP
Vishay Siliconix
N-Channel 100 V (D-S) MOSFET
FEATURES
PRODUCT SUMMARY
VDS (V)
ID (A)a
RDS(on) (Ω)
100
0.0108 at VGS = 10 V
40
0.0114 at VGS = 7.5 V
40
0.0145 at VGS = 4.5 V
40
Qg (Typ.)
16.9 nC
PowerPAK® SO-8
APPLICATIONS
S
6.15 mm
• DC/DC Primary Side Switch
• Telecom/Server 48 V, Full/Half-Bridge dc-to-dc
• Industrial
D
5.15 mm
1
• Halogen-free According to IEC 61249-2-21
Definition
• TrenchFET® Power MOSFET
• 100 % Rg Tested
• 100 % UIS Tested
• Compliant to RoHS Directive 2002/95/EC
S
2
S
3
G
4
D
8
D
7
G
D
6
D
5
Bottom View
S
N-Channel MOSFET
Ordering Information: SiR876DP-T1-GE3 (Lead (Pb)-free and Halogen-free)
ABSOLUTE MAXIMUM RATINGS (TA = 25 °C, unless otherwise noted)
Parameter
Drain-Source Voltage
Gate-Source Voltage
Continuous Drain Current (TJ = 150 °C)
Symbol
VDS
VGS
TC = 25 °C
TC = 70 °C
TA = 25 °C
TA = 70 °C
ID
IDM
Pulsed Drain Current
TC = 25 °C
TA = 25 °C
IS
Single Pulse Avalanche Current
Single Pulse Avalanche Energy
L = 0.1 mH
IAS
EAS
Maximum Power Dissipation
TC = 25 °C
TC = 70 °C
TA = 25 °C
TA = 70 °C
PD
Continuous Source-Drain Diode Current
Operating Junction and Storage Temperature Range
Soldering Recommendations (Peak Temperature)d, e
TJ, Tstg
Limit
100
± 20
Unit
V
40a
40a
15.2b, c
12.1b, c
80
A
40a
4.5b, c
25
31.2
62.5
40
5.0b, c
3.2b, c
- 55 to 150
260
mJ
W
°C
THERMAL RESISTANCE RATINGS
Parameter
Symbol
Typical
Maximum
Unit
RthJA
t ≤ 10 s
20
25
Maximum Junction-to-Ambientb, f
°C/W
RthJC
Steady State
Maximum Junction-to-Case (Drain)
1.6
2.0
Notes:
a. Package limited.
b. Surface mounted on 1" x 1" FR4 board.
c. t = 10 s.
d. See solder profile (www.vishay.com/doc?73257). The PowerPAK SO-8 is a leadless package. The end of the lead terminal is exposed copper
(not plated) as a result of the singulation process in manufacturing. A solder fillet at the exposed copper tip cannot be guaranteed and is not
required to ensure adequate bottom side solder interconnection.
e. Rework conditions: manual soldering with a soldering iron is not recommended for leadless components.
f. Maximum under steady state conditions is 65 °C/W.
Document Number: 65934
S10-2684-Rev. B, 22-Nov-10
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1
SiR876DP
Vishay Siliconix
SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)
Parameter
Symbol
Test Conditions
Min.
VDS
VGS = 0 V, ID = 250 µA
100
Typ.
Max.
Unit
Static
Drain-Source Breakdown Voltage
VDS Temperature Coefficient
ΔVDS/TJ
ΔVGS(th)/TJ
Gate-Source Threshold Voltage
VGS(th)
VDS = VGS, ID = 250 µA
IGSS
Gate-Source Leakage
Zero Gate Voltage Drain Current
IDSS
On-State Drain Currenta
ID(on)
Drain-Source On-State Resistancea
Forward Transconductancea
RDS(on)
gfs
47
ID = 250 µA
VGS(th) Temperature Coefficient
V
mV/°C
- 5.6
2.8
V
VDS = 0 V, VGS = ± 20 V
± 100
nA
VDS = 100 V, VGS = 0 V
1
VDS = 100 V, VGS = 0 V, TJ = 55 °C
10
VDS ≥ 5 V, VGS = 10 V
1.2
30
µA
A
VGS = 10 V, ID = 20 A
0.0087
0.0108
VGS = 7.5 V, ID = 15 A
0.0092
0.0114
VGS = 4.5 V, ID = 10 A
0.0115
0.0145
VDS = 10 V, ID = 20 A
57
Ω
S
Dynamicb
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
Total Gate Charge
Qg
Gate-Source Charge
Qgs
Gate-Drain Charge
Qgd
Gate Resistance
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Rg
1640
VDS = 50 V, VGS = 0 V, f = 1 MHz
pF
60
VDS = 50 V, VGS = 10 V, ID = 10 A
31.8
48
VDS = 50 V, VGS = 7.5 V, ID = 10 A
25
37.5
16.9
25.5
nC
3.6
7.2
Ω
11
22
9
18
VDS = 50 V, VGS = 4.5 V, ID = 10 A
4.8
7.9
f = 1 MHz
td(on)
tr
960
VDD = 50 V, RL = 5 Ω
ID ≅ 10 A, VGEN = 10 V, Rg = 1 Ω
0.8
36
70
tf
11
22
td(on)
12
24
td(off)
tr
td(off)
VDD = 50 V, RL = 5 Ω
ID ≅ 10 A, VGEN = 7.5 V, Rg = 1 Ω
tf
14
28
35
70
10
20
ns
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
IS
Pulse Diode Forward Currenta
ISM
Body Diode Voltage
VSD
Body Diode Reverse Recovery Time
trr
Body Diode Reverse Recovery Charge
Qrr
Reverse Recovery Fall Time
ta
Reverse Recovery Rise Time
tb
TC = 25 °C
40
80
IS = 4 A
IF = 10 A, dI/dt = 100 A/µs, TJ = 25 °C
A
0.76
1.1
V
52
100
ns
65
120
nC
22
30
ns
Notes:
a. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 65934
S10-2684-Rev. B, 22-Nov-10
SiR876DP
Vishay Siliconix
TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted)
80
10
VGS = 10 V thru 5 V
8
VGS = 4 V
ID - Drain Current (A)
ID - Drain Current (A)
64
48
32
6
TC = 25 °C
4
TC = - 55 °C
16
TC = 125 °C
2
VGS = 3 V
0
0
0.5
1.0
1.5
2.0
0
2.5
0
2
3
4
VGS - Gate-to-Source Voltage (V)
Output Characteristics
Transfer Characteristics
0.016
5
3000
0.014
2400
VGS = 4.5 V
C - Capacitance (pF)
RDS(on) - On-Resistance (Ω)
1
VDS - Drain-to-Source Voltage (V)
0.012
VGS = 7.5 V
0.010
VGS = 10 V
0.008
Ciss
1800
1200
Coss
600
Crss
0.006
0
16
32
48
64
0
80
0
40
60
80
VDS - Drain-to-Source Voltage (V)
On-Resistance vs. Drain Current and Gate Voltage
Capacitance
100
2.0
10
ID = 10 A
ID = 20 A
1.7
8
RDS(on) - On-Resistance
(Normalized)
VGS - Gate-to-Source Voltage (V)
20
ID - Drain Current (A)
VDS = 25 V
6
VDS = 50 V
4
VDS = 75 V
VGS = 10 V
1.4
VGS = 4.5 V
1.1
0.8
2
0
0
7
Document Number: 65934
S10-2684-Rev. B, 22-Nov-10
14
21
28
35
0.5
- 50
- 25
0
25
50
75
100
125
Qg - Total Gate Charge
TJ - Junction Temperature (°C)
Gate Charge
On-Resistance vs. Junction Temperature
150
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SiR876DP
Vishay Siliconix
TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted)
100
0.060
ID = 20 A
0.048
RDS(on) - On-Resistance (Ω)
IS - Source Current (A)
10
TJ = 150 °C
1
TJ = 25 °C
0.1
0.01
0.036
0.024
TJ = 125 °C
0.012
TJ = 25 °C
0.001
0.0
0.000
0.2
0.4
0.6
0.8
1.0
1.2
0
2
3
4
5
6
7
8
9
VGS - Gate-to-Source Voltage (V)
Source-Drain Diode Forward Voltage
On-Resistance vs. Gate-to-Source Voltage
0.4
10
200
0.2
160
0.0
Power (W)
VGS(th) - Variance (V)
1
VSD - Source-to-Drain Voltage (V)
ID = 5 mA
- 0.2
80
ID = 250 μA
- 0.4
40
- 0.6
- 0.8
- 50
120
- 25
0
25
50
75
100
125
0
0.001
150
0.01
0.1
1
TJ - Junction Temperature (°C)
Time (s)
Threshold Voltage
Single Pulse Power, Junction-to-Ambient
10
100
Limited by RDS(on)*
ID - Drain Current (A)
10
1 ms
10 ms
1
100 ms
1s
0.1
10 s
TA = 25 °C
Single Pulse
0.01
0.01
0.1
BVDSS Limited
1
10
DC
100
VDS - Drain-to-Source Voltage (V)
* VGS > minimum VGS at which RDS(on) is specified
Safe Operating Area, Junction-to-Ambient
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Document Number: 65934
S10-2684-Rev. B, 22-Nov-10
SiR876DP
Vishay Siliconix
TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted)
60
ID - Drain Current (A)
48
Package Limited
36
24
12
0
0
25
50
75
100
125
150
TC - Case Temperature (°C)
75
2.5
60
2.0
45
1.5
Power (W)
Power (W)
Current Derating*
30
15
1.0
0.5
0
0
0
25
50
75
100
125
150
0
25
50
75
100
125
TC - Case Temperature (°C)
TA - Ambient Temperature (°C)
Power, Junction-to-Case
Power, Junction-to-Ambient
150
* The power dissipation PD is based on TJ(max) = 150 °C, using junction-to-case thermal resistance, and is more useful in settling the upper
dissipation limit for cases where additional heatsinking is used. It is used to determine the current rating, when this rating falls below the package
limit.
Document Number: 65934
S10-2684-Rev. B, 22-Nov-10
www.vishay.com
5
SiR876DP
Vishay Siliconix
TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted)
1
Normalized Effective Transient
Thermal Impedance
Duty Cycle = 0.5
0.2
Notes:
0.1
0.1
PDM
0.05
t1
t2
t1
t2
2. Per Unit Base = RthJA = 65 °C/W
1. Duty Cycle, D =
0.02
(t)
3. TJM - TA = PDMZthJA
Single Pulse
0.01
10-4
10-3
10-2
4. Surface Mounted
10-1
1
10
100
1000
Square Wave Pulse Duration (s)
Normalized Thermal Transient Impedance, Junction-to-Ambient
1
Normalized Effective Transient
Thermal Impedance
Duty Cycle = 0.5
0.2
0.1
0.1
0.05
0.02
Single Pulse
0.01
10-4
10-3
10-2
10-1
1
Square Wave Pulse Duration (s)
Normalized Thermal Transient Impedance, Junction-to-Case
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see www.vishay.com/ppg?65934.
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Document Number: 65934
S10-2684-Rev. B, 22-Nov-10
Legal Disclaimer Notice
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Vishay
Disclaimer
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Revision: 01-Jan-2022
1
Document Number: 91000