74HC132D
CMOS Digital Integrated Circuits
Silicon Monolithic
74HC132D
1. Functional Description
•
Quad 2-Input Schmitt NAND Gate
2. General
The 74HC132D is a high speed CMOS 2-INPUT NAND SCHMITT TRIGGER GATE fabricated with silicon gate
C2MOS technology.
It achieves the high speed operation similar to equivalent LSTTL while maintaining the CMOS low power
dissipation.
Pin configuration and function are the same as the 74HC00D but the inputs have 25% VCC hysteresis and with
its schmitt trigger inputs, the 74HC132D can be used as a line receiver for slow input signals.
All inputs are equipped with protection circuits against static discharge or transient excess voltage.
3. Features
(1)
High speed: tpd = 11 ns (typ.) at VCC = 5 V
(2)
Low power dissipation: ICC = 1.0 µA (max) at Ta = 25
(3)
High noise immunity: VH = 1.1 V (typ.) at VCC = 4.5 V
(4)
Balanced propagation delays: tPLH ≈ tPHL
(5)
Wide operating voltage range: VCC(opr) = 2.0 to 6.0 V
4. Packaging
SOIC14
Start of commercial production
©2016 Toshiba Corporation
1
2016-04
2016-05-25
Rev.2.0
74HC132D
5. Pin Assignment
6. Marking
7. IEC Logic Symbol
©2016 Toshiba Corporation
2
2016-05-25
Rev.2.0
74HC132D
8. Truth Table
A
B
Y
L
L
H
L
H
H
H
L
H
H
H
L
9. System Diagram, Waveform
10. Absolute Maximum Ratings (Note)
Characteristics
Supply voltage
Symbol
Rating
Unit
VCC
-0.5 to 7.0
V
Input voltage
VIN
-0.5 to VCC + 0.5
V
VOUT
-0.5 to VCC + 0.5
V
Input diode current
IIK
±20
mA
Output diode current
IOK
±20
mA
Output current
IOUT
±25
mA
VCC/ground current
ICC
±50
mA
Output voltage
Power dissipation
PD
500
mW
Storage temperature
Tstg
-65 to 150
Note:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even
destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
11. Operating Ranges (Note)
Characteristics
Symbol
Rating
Unit
Supply voltage
VCC
2.0 to 6.0
V
Input voltage
VIN
0 to VCC
V
Output voltage
VOUT
0 to VCC
V
Operating temperature
Topr
-40 to 85
Note:
The operating ranges are required to ensure the normal operation of the device. Unused
inputs must be tied to either VCC or GND.
©2016 Toshiba Corporation
3
2016-05-25
Rev.2.0
74HC132D
12. Electrical Characteristics
12.1. DC Characteristics (Unless otherwise specified, Ta = 25 )
Characteristics
Positive threshold voltage
Negative threshold voltage
Hysteresis voltage
High-level output voltage
Low-level output voltage
Symbol
Test Condition
VCC (V)
Min
Typ.
Max
Unit
VP
2.0
1.00
1.25
1.50
V
4.5
2.30
2.70
3.15
6.0
3.00
3.50
4.20
2.0
0.30
0.65
0.90
4.5
1.13
1.60
2.00
6.0
1.50
2.30
2.60
2.0
0.3
0.6
1.0
4.5
0.6
1.1
1.4
6.0
0.8
1.2
1.7
2.0
1.9
2.0
4.5
4.4
4.5
VN
VH
VOH
VOL
VIN = VIH or VIL
VIN = VIH
IOH = -20 µA
6.0
5.9
6.0
IOH = -4 mA
4.5
4.18
4.31
IOH = -5.2 mA
6.0
5.68
5.80
IOL = 20 µA
2.0
0.0
0.1
4.5
0.0
0.1
6.0
0.0
0.1
IOL = 4 mA
4.5
0.17
0.26
IOL = 5.2 mA
6.0
0.18
0.26
V
V
V
V
Input leakage current
IIN
VIN = VCC or GND
6.0
±0.1
µA
Quiescent supply current
ICC
VIN = VCC or GND
6.0
1.0
µA
12.2. DC Characteristics (Unless otherwise specified, Ta = -40 to 85 )
Characteristics
Positive threshold voltage
Negative threshold voltage
Hysteresis voltage
High-level output voltage
Low-level output voltage
Symbol
Test Condition
VCC (V)
Min
Max
Unit
VP
2.0
1.00
1.50
V
4.5
2.30
3.15
6.0
3.00
4.20
2.0
0.30
0.90
4.5
1.13
2.00
6.0
1.50
2.60
2.0
0.3
1.0
4.5
0.6
1.4
6.0
0.8
1.7
2.0
1.9
4.5
4.4
VN
VH
VOH
VOL
VIN = VIH or VIL
VIN = VIH
IOH = -20 µA
6.0
5.9
IOH = -4 mA
4.5
4.13
IOH = -5.2 mA
6.0
5.63
IOL = 20 µA
2.0
0.1
4.5
0.1
6.0
0.1
IOL = 4 mA
4.5
0.33
IOL = 5.2 mA
6.0
0.33
V
V
V
V
Input leakage current
IIN
VIN = VCC or GND
6.0
±1.0
µA
Quiescent supply current
ICC
VIN = VCC or GND
6.0
10.0
µA
©2016 Toshiba Corporation
4
2016-05-25
Rev.2.0
74HC132D
12.3. AC Characteristics
(Unless otherwise specified, CL = 15 pF, VCC = 5 V, Ta = 25 , Input: tr = tf = 6 ns)
Characteristics
Symbol
Test Condition
Min
Output transition time
tTLH,tTHL
Propagation delay time
tPLH,tPHL
Typ.
Max
Unit
4
8
ns
11
18
ns
12.4. AC Characteristics
(Unless otherwise specified, CL = 50 pF, Ta = 25 , Input: tr = tf = 6 ns)
Characteristics
Output transition time
Symbol
Note
tTLH,tTHL
Propagation delay time
tPLH,tPHL
Input capacitance
CIN
Power dissipation capacitance
CPD
(Note 1)
VCC (V)
Min
Typ.
Max
Unit
2.0
30
75
ns
4.5
8
15
6.0
7
13
2.0
42
110
4.5
14
22
6.0
12
19
5
pF
29
pF
ns
Note 1: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current
consumption without load. Average operating current can be obtained by the equation.
ICC(opr) = CPD × VCC × fIN + ICC/4 (per gate)
12.5. AC Characteristics
(Unless otherwise specified, CL = 50 pF, Ta = -40 to 85 , Input: tr = tf = 6 ns)
Characteristics
Output transition time
Propagation delay time
©2016 Toshiba Corporation
Symbol
VCC (V)
Min
Max
Unit
tTLH,tTHL
2.0
95
ns
4.5
19
6.0
16
2.0
140
4.5
28
6.0
24
tPLH,tPHL
5
ns
2016-05-25
Rev.2.0
74HC132D
Package Dimensions
Unit: mm
Weight: 0.13 g (typ.)
Package Name(s)
Nickname: SOIC14
©2016 Toshiba Corporation
6
2016-05-25
Rev.2.0
74HC132D
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©2016 Toshiba Corporation
7
2016-05-25
Rev.2.0