RN2131MFV, RN2132MFV
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process) (Bias Resistor built-in Transistor)
RN2131MFV, RN2132MFV
Unit: mm
Switching Applications
Inverter Circuit Applications
Interface Circuit Applications
Driver Circuit Applications
Ultra-small package, suited to very high density mounting
Incorporating a bias resistor into the transistor reduces the number of parts, so
enabling the manufacture of ever more compact equipment and lowering assembly
cost.
A wide range of resistor values is available for use in various circuits.
Complementary to the RN1131MFV, RN1132MFV
Equivalent Circuit
VESM
JEDEC
―
JEITA
―
TOSHIBA
1-1Q1S
Weight: 1.5 mg (typ.)
Absolute Maximum Ratings (Ta = 25°C)
Characterisstic
Symbol
Rating
Unit
Collector-base voltage
VCBO
−50
V
Collector-emitter voltage
VCEO
−50
V
Emitter-base voltage
VEBO
−5
V
IC
−100
mA
PC (Note1)
150
mW
Tj
150
°C
Tstg
−55 to 150
°C
Collector current
Collector power dissipation
Junction temperature
Storage temperature range
Note:
1.BASE
2.EMITTER
3.COLLECTOR
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant
change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating
conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling
Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated
failure rate, etc).
Note1 : Mounted on FR4 board (25.4 mm × 25.4 mm × 1.6 mm)
Land Pattern Dimensions (for reference only)
Unit: mm
0.5
0.45
1.15
0.4
Start of commercial production
2005-04
0.45
0.4
0.4
© 2019
Toshiba Electronic Devices & Storage Corporation
1
2019-01-10
RN2131MFV, RN2132MFV
Electrical Characteristics (Ta = 25°C)
Symbol
Test
Circuit
Collector cut-off current
ICBO
―
Emitter cut-off current
IEBO
DC current gain
Characteristic
Collector-emitter saturation voltage
Collector output capacitance
Min
Typ.
Max
Unit
VCB = −50 V, IE = 0 A
―
―
−100
nA
―
VEB = −5 V, IC = 0 A
―
―
−100
nA
hFE
―
VCE = −5 V, IC = −1 mA
120
―
400
―
VCE (sat)
―
IC = −5 mA, IB = −0.5 mA
―
−0.1
−0.3
V
Cob
―
VCB = −10 V, IE = 0 A, f = 1 MHz
―
0.9
―
pF
―
―
70
100
130
R1
140
200
260
RN2131MFV
Input resistor
Test Condition
RN2132MFV
© 2019
Toshiba Electronic Devices & Storage Corporation
2
kΩ
2019-01-10
RN2131MFV, RN2132MFV
IC - VI(ON)
RN2131MFV
RN2131MFV
-10000
COMMON EMITTER
VCE = -0.2V
COLLECTOR CURRENT IC (μA)
COLLECTOR CURRENT IC (mA)
-100
-10
Ta = 100°C
-25
25
-1
-0.1
-0.1
-1000
-25
25
Ta = 100°C
-100
COMMON EMITTER
VCE = -5V
-10
-1
-10
-100
0-0
INPUT VOLTAGE VI(ON) ( V)
hFE - IC
RN2131MFV
-2
-3
-4
-5
VCE(sat) - IC
-1
1000
Ta = 100°C
-25
25
100
COMMON EMITTER
VCE = -5V
10
-0.1
-1
INPUT VOLTAGE VI(OFF) ( V)
COLLECTOR-EMITTER SATURATION
VOLTAGE VCE(sat) ( V)
RN2131MFV
DC CURRENT GAIN hFE
IC - VI(OFF)
-1
-10
-0.1
Ta = 100°C
-25
-0.01
-0.1
-100
COLLECTOR CURRENT IC (mA)
© 2019
Toshiba Electronic Devices & Storage Corporation
COMMON EMITTER
IC/IB = 10
-1
25
-10
-100
COLLECTOR CURRENT IC (mA)
3
2019-01-10
RN2131MFV, RN2132MFV
RN2132MFV
IC - VI(ON)
RN2132MFV
-10000
COMMON EMITTER
VCE = -0.2V
COLLECTOR CURRENT IC (μA)
COLLECTOR CURRENT IC (mA)
-100
-10
Ta = 100°C
-25
25
-1
-0.1
-0.1
-1000
-25
25
Ta = 100°C
-100
COMMON EMITTER
VCE = -5V
-10
-1
-10
-100
0 -0
INPUT VOLTAGE VI(ON) ( V)
hFE - IC
-4
-6
-8
-10
RN2132MFV
VCE(sat) - IC
-1
1000
Ta = 100°C
-25
25
100
COMMON EMITTER
VCE = -5V
10
-0.1
-2
INPUT VOLTAGE VI(OFF) ( V)
COLLECTOR-EMITTER SATURATION
VOLTAGE VCE(sat) ( V)
RN2132MFV
DC CURRENT GAIN hFE
IC - VI(OFF)
-1
-10
-0.1
Ta = 100°C
25
-25
-0.01
-0.1
-100
COLLECTOR CURRENT IC (mA)
© 2019
Toshiba Electronic Devices & Storage Corporation
COMMON EMITTER
IC/IB = 10
-1
-10
COLLECTOR CURRENT IC (mA)
4
2019-01-10
RN2131MFV, RN2132MFV
Marking
Type Name
Marking
RN2131MFV
RN2132MFV
© 2019
Toshiba Electronic Devices & Storage Corporation
5
2019-01-10
RN2131MFV, RN2132MFV
RESTRICTIONS ON PRODUCT USE
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Hardware, software and systems described in this document are collectively referred to as “Product”.
• TOSHIBA reserves the right to make changes to the information in this document and related Product without notice.
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written permission, reproduction is permissible only if reproduction is without alteration/omission.
• Though TOSHIBA works continually to improve Product's quality and reliability, Product can malfunction or fail. Customers are responsible for
complying with safety standards and for providing adequate designs and safeguards for their hardware, software and systems which
minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily injury or damage to
property, including data loss or corruption. Before customers use the Product, create designs including the Product, or incorporate the
Product into their own applications, customers must also refer to and comply with (a) the latest versions of all relevant TOSHIBA information,
including without limitation, this document, the specifications, the data sheets and application notes for Product and the precautions and
conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the instructions for the application with which the Product
will be used with or for. Customers are solely responsible for all aspects of their own product design or applications, including but not limited
to (a) determining the appropriateness of the use of this Product in such design or applications; (b) evaluating and determining the
applicability of any information contained in this document, or in charts, diagrams, programs, algorithms, sample application circuits, or any
other referenced documents; and (c) validating all operating parameters for such designs and applications. TOSHIBA ASSUMES NO
LIABILITY FOR CUSTOMERS' PRODUCT DESIGN OR APPLICATIONS.
• PRODUCT IS NEITHER INTENDED NOR WARRANTED FOR USE IN EQUIPMENTS OR SYSTEMS THAT REQUIRE
EXTRAORDINARILY HIGH LEVELS OF QUALITY AND/OR RELIABILITY, AND/OR A MALFUNCTION OR FAILURE OF WHICH MAY
CAUSE LOSS OF HUMAN LIFE, BODILY INJURY, SERIOUS PROPERTY DAMAGE AND/OR SERIOUS PUBLIC IMPACT
("UNINTENDED USE"). Except for specific applications as expressly stated in this document, Unintended Use includes, without limitation,
equipment used in nuclear facilities, equipment used in the aerospace industry, lifesaving and/or life supporting medical equipment,
equipment used for automobiles, trains, ships and other transportation, traffic signaling equipment, equipment used to control combustions or
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OF NONCOMPLIANCE WITH APPLICABLE LAWS AND REGULATIONS.
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© 2019
Toshiba Electronic Devices & Storage Corporation
6
2019-01-10