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RN2909

RN2909

  • 厂商:

    TOSHIBA(东芝)

  • 封装:

  • 描述:

    RN2909 - Silicon PNP Epitaxial Type (PCT Process)Switching, Inverter Circuit, Interface Circuit And ...

  • 数据手册
  • 价格&库存
RN2909 数据手册
RN2907~RN2909 TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process) RN2907,RN2908,RN2909 Switching, Inverter Circuit, Interface Circuit And Driver Circuit Applications Including two devices in US6 (ultra super mini type with 6 leads) With built-in bias resistors Simplify circuit design Reduce a quantity of parts and manufacturing process Complementary to RN1907~1909 Unit in mm Equivalent Circuit and Bias Resistor Values Type No. RN2907 RN2908 RN2909 R1 (kΩ) 10 22 47 R2 (kΩ) 47 47 22 ― JEDEC ― JEITA 2-2J1A TOSHIBA Weight: 6.8 mg(typ.) Equivalent Circuit (Top View) 1 2007-11-01 RN2907~RN2909 Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 Common) Characteristic Collector-base voltage Collector-emitter voltage RN2907~2909 RN2907 Emitter-base voltage RN2908 RN2909 Collector current Collector power dissipation Junction temperature Storage temperature range RN2907~2909 IC PC* Tj Tstg VEBO Symbol VCBO VCEO Rating −50 −50 −6 −7 −15 −100 200 150 −55~150 mA mW °C °C V Unit V V Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). * : Total rating Electrical Characteristics (Ta = 25°C) (Q1, Q2 Common) Characteristic Collector cut-off current Symbol ICBO ICEO Test Circuit ― ― ― IEBO ― ― ― hFE ― ― VCE (sat) ― ― VI (ON) ― ― ― VI (OFF) ― ― fT Cob ― ― ― R1 ― ― ― R1/R2 ― ― ― ― VCE = −10V, IC = −5mA VCB = −10V, IE = 0, f = 1MHz VCE = −5V, IC = −0.1mA VCE = −0.2V, IC = −5mA IC = −5mA, IB = −0.25mA VCE = −5V, IC = −10mA Test Condition VCB = −50V, IE = 0 VCE = −50V, IB = 0 VEB = −6V, IC = 0 VEB = −7V, IC = 0 VEB = −15V, IC = 0 Min ― ― −0.081 −0.078 −0.167 80 80 70 ― −0.7 −1.0 −2.2 −0.5 −0.6 −1.5 ― ― 7 15.4 32.9 0.191 0.421 1.92 Typ. ― ― ― ― ― ― ― ― −0.1 ― ― ― ― ― ― 200 3 10 22 47 0.213 0.468 2.14 Max −100 −500 −0.15 −0.145 −0.311 ― ― ― −0.3 −1.8 −2.6 −5.8 −1.0 −1.16 −2.6 ― 6 13 28.6 61.1 0.232 0.515 2.35 ― kΩ MHz pF V V V ― mA Unit nA nA RN2907~2909 RN2907 Emitter cut-off current RN2908 RN2909 RN2907 DC current gain RN2908 RN2909 Collector-emitter saturation voltage RN2907~2909 RN2907 Input voltage (ON) RN2908 RN2909 RN2907 Input voltage (OFF) RN2908 RN2909 Translation frequency Collector output capacitance RN2907~2909 RN2907~2909 RN2907 Input resistor RN2908 RN2909 RN2907 Resistor ratio RN2908 RN2909 2 2007-11-01 RN2907~RN2909 (Q1, Q2 Common) 3 2007-11-01 RN2907~RN2909 (Q1, Q2 Common) 4 2007-11-01 RN2907~RN2909 Type Name Marking RN2907 RN2908 RN2909 5 2007-11-01 RN2907~RN2909 RESTRICTIONS ON PRODUCT USE • The information contained herein is subject to change without notice. 20070701-EN GENERAL • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 6 2007-11-01
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