SSM3J356R
MOSFETs
Silicon P-Channel MOS (U-MOS�)
SSM3J356R
1. Applications
•
Power Management Switches
2. Features
(1)
AEC-Q101 qualified (Please see the orderable part number list)
(2)
4 V gate drive voltage.
(3)
Low drain-source on-resistance
: RDS(ON) = 400 mΩ (max) (@VGS = -4.0 V)
RDS(ON) = 300 mΩ (max) (@VGS = -10 V)
3. Packaging and Pin Assignment
1: Gate
2: Source
3: Drain
SOT-23F
4. Orderable part number
Orderable part number
SSM3J356R,LF
AEC-Q101
Note
�
SSM3J356RLXGF
YES
SSM3J356R,LXHF
YES
General Use
(Note 1)
Unintended Use
(Note 1)
Automotive Use
Note 1: For more information, please contact our sales or use the inquiry form on our website.
Start of commercial production
2015-09
©2016-2021
Toshiba Electronic Devices & Storage Corporation
1
2021-01-15
Rev.5.0
SSM3J356R
5. Absolute Maximum Ratings (Note) (Unless otherwise specified, T a = 25 �)
Characteristics
Symbol
Rating
Unit
V
Drain-source voltage
VDSS
-60
Gate-source voltage
VGSS
-20/+10
Drain current (DC)
Drain current (pulsed)
Power dissipation
Power dissipation
(t ≤ 10 s)
(Note 1)
ID
-2
(Note 1), (Note 2)
IDP
-6
(Note 3)
PD
1
(Note 3)
A
W
2
Channel temperature
Tch
150
Storage temperature
Tstg
-55 to 150
�
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Ensure that the channel temperature does not exceed 150 �.
Note 2: Repetitive rating; pulse width limited by maximum channel temperature.
Note 3: Device mounted on a 25.4 mm × 25.4 mm × 1.6 mm FR4 glass epoxy board (Cu pad: 645 mm2)
Note:
Note:
Note:
This transistor is sensitive to electrostatic discharge and should be handled with care.
The MOSFETs in this device are sensitive to electrostatic discharge. When handling this device, the worktables,
operators, soldering irons and other objects should be protected against anti-static discharge.
The channel-to-ambient thermal resistance, Rth(ch-a), and the drain power dissipation, PD, vary according to
the board material, board area, board thickness and pad area. When using this device, be sure to take heat
dissipation fully into account.
©2016-2021
Toshiba Electronic Devices & Storage Corporation
2
2021-01-15
Rev.5.0
SSM3J356R
6. Electrical Characteristics
6.1. Static Characteristics (Unless otherwise specified, T a = 25 �)
Characteristics
Symbol
Gate leakage current
Drain cut-off current
Drain-source breakdown voltage
Drain-source breakdown voltage
Forward transfer admittance
IGSS
VGS = -16 V/+10 V, VDS = 0 V
IDSS
VDS = -60 V, VGS = 0 V
V(BR)DSS ID = -1 mA, VGS = 0 V
(Note 1) V(BR)DSX ID = -1 mA, VGS = 10 V
Typ.
Max
Unit
�
�
±10
µA
�
�
-10
µA
-60
�
�
V
-50
�
�
�
-2.0
V
RDS(ON) ID = -1.0 A, VGS = -4.0 V
�
280
400
mΩ
ID = -1.0 A, VGS = -4.5 V
�
270
360
ID = -1.0 A, VGS = -10 V
�
240
300
VDS = -10 V, ID = -1 A
�
4.7
�
Vth
(Note 2)
Min
-0.8
Gate threshold voltage
Drain-source on-resistance
Test Condition
(Note 2)
|Yfs|
VDS = -10 V, ID = -1 mA
S
Note 1: If a reverse bias is applied between gate and source, this device enters V(BR)DSX mode. Note that the drainsource breakdown voltage is lowered in this mode.
Note 2: Pulse measurement.
6.2. Dynamic Characteristics (Unless otherwise specified, T a = 25 �)
Characteristics
Symbol
Input capacitance
Ciss
Reverse transfer capacitance
Crss
Output capacitance
Coss
Switching time (turn-on time)
ton
Switching time (turn-off time)
toff
Test Condition
VDS = -10 V, VGS = 0 V,
f = 1 MHz
VDD = -30 V, ID = -1.0 A
VGS = 0 to -4.5 V, RG = 10 Ω
Duty ≤ 1 %, VIN: tr, tf < 5 ns,
Common source, See Chapter 5.3.
Min
Typ.
Max
Unit
�
330
�
pF
�
25
�
�
40
�
�
29
�
�
48
�
ns
6.3. Switching Time Test Circuit
Fig. 6.3.1
Switching Time Test Circuit
Fig. 6.3.2
Input Waveform/Output Waveform
6.4. Gate Charge Characteristics (Unless otherwise specified, T a = 25 �)
Characteristics
Total gate charge (gate-source plus gate-drain)
Symbol
Qg
Gate-source charge 1
Qgs1
Gate-drain charge
Qgd
©2016-2021
Toshiba Electronic Devices & Storage Corporation
Test Condition
VDD = -48 V, VGS = -10 V,
ID = -2.0 A
3
Min
Typ.
Max
Unit
�
8.3
�
nC
�
0.8
�
�
1.7
�
2021-01-15
Rev.5.0
SSM3J356R
6.5. Source-Drain Characteristics (Unless otherwise specified, T a = 25 �)
Characteristics
Diode forward voltage
Symbol
(Note 1)
VDSF
Test Condition
ID = 2.0 A, VGS = 0 V
Min
Typ.
Max
Unit
�
0.9
1.2
V
Note 1: Pulse measurement.
7. Marking
©2016-2021
Toshiba Electronic Devices & Storage Corporation
4
2021-01-15
Rev.5.0
SSM3J356R
8. Characteristics Curves (Note)
Fig. 8.1
Fig. 8.3
Fig. 8.5
I D - V DS
Fig. 8.2
R DS(ON) - V GS
Fig. 8.4
R DS(ON) - T a
©2016-2021
Toshiba Electronic Devices & Storage Corporation
I D - V GS
R DS(ON) - I D
Fig. 8.6
5
V th - T a
2021-01-15
Rev.5.0
SSM3J356R
Fig. 8.7
Fig. 8.9
I DR - V DS
Fig. 8.8
Dynamic Input Characteristics
Fig. 8.11
Fig. 8.10
r th - t w
©2016-2021
Toshiba Electronic Devices & Storage Corporation
Fig. 8.12
6
C - V DS
t - ID
Safe Operating Area
2021-01-15
Rev.5.0
SSM3J356R
Fig. 8.13
Note:
PD - Ta
The above characteristics curves are presented for reference only and not guaranteed by production test,
unless otherwise noted.
©2016-2021
Toshiba Electronic Devices & Storage Corporation
7
2021-01-15
Rev.5.0
SSM3J356R
Package Dimensions
Unit: mm
Weight: 0.011 g (typ.)
Package Name(s)
TOSHIBA: 2-3Z1S
Nickname: SOT-23F
©2016-2021
Toshiba Electronic Devices & Storage Corporation
8
2021-01-15
Rev.5.0
SSM3J356R
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©2016-2021
Toshiba Electronic Devices & Storage Corporation
9
2021-01-15
Rev.5.0