TA1274F

TA1274F TOSHIBA BIPOLAR LINEAR INTEGRATED CIRCUIT SILICON MONOLITHIC TA1274F PIF / SIF SYNCHRONOUS DEMODULATOR IC FEATURES · Compatible pin assignment to TA1267AF PIF CIRCUIT · True synchronous PIF demodulator · 3-stages gain controlled PIF amplifier · High speed response PIF AGC detector · Buzz reducer · Equalizer for video output · AFT detector without extra reference circuit SIF CIRCUIT · Wide range gain controlled SIF amplifier (control range : 70dB typ.) · Alignment-free PLL-FM demodulator Weight: 0.27 g (typ.) 1 2002-12-20 TA1274F BLOCK DIAGRAM 2 2002-12-20 TA1274F TERMINAL FUNCTION PIN No. NAME FUNCTION INTERFACE CIRCUIT 1 24 PIF input Differential type inputs. Typical input level is 85 dBµV. 2 RF AGC output Open collector (PNP) type output. Maximum output current is 0.5 mA. 3 AGC filter Connect a capacitor (0.47 µF) between GND. 4 5 EQ amplifier output EQ filter No.4 terminal is EQ amplifier output. Maximum output current of this terminal is 5 mA. No.5 terminal is for EQ filter. 6 N.C. ― 7 Bias filter Connect a capacitor (10 µF) between GND. 3 2002-12-20 TA1274F PIN No. NAME FUNCTION INTERFACE CIRCUIT 8 EQ amplifier input EQ amplifier inputs. 9 APC filter Connect a resister (330 Ω) and a capacitor (0.47 µF) between GND in series. And connect a capacitor (1000 pF) between this terminal and GND. Sensitivity of phase detector is 400 µA / rad (Typ.), and sensitivity of VCO is 1.8 MHz / V (Typ.). 10 Video output Connect a resister (1 kΩ) between GND. Maximum output current is 10 mA. 11 2 nd SIF output 2 nd SIF signal is outputted from this terminal. 12 FM demodulating filter Connect a capacitor (2.2 µF) between GND. 4 2002-12-20 TA1274F PIN No. NAME FUNCTION INTERFACE CIRCUIT 13 RF AGC delay adj. This terminal is for RF AGC delay point adjustment.100 µA current is outputted from this terminal. Connect a resister (5.6 kΩ) and a volume (10 kΩ) between GND in series. 14 AFT Defeat SW This terminal is AFT defeat switch. To open this terminal, AFT function is activate. To connect GND this terminal, AFT function is not activate. And terminal No.20 goes to 1 / 2 VCC. 15 (No function) This terminal must be connected to VCC. ― 16 2 nd SIF input This terminal 2nd SIF input. This terminal must be decoupled outer circuit on D.C. 17 AF output Output resistance of this terminal is 7.5 kΩ. 18 19 VCO tank Connect tank for VCO between these terminals. Capacitance of the VCO tank is 27 pF. 5 2002-12-20 TA1274F PIN No. NAME FUNCTION INTERFACE CIRCUIT 20 AFT output Push-pull type current output. Reverse type AFT. 21 VCC Operating voltage range is 9.0 V ± 10%. ― 22 SIF input In use inter-carrier application, connect this terminal to GND. In this condition, the SIF amplifier sets gain minimum. 23 GND ― ― 6 2002-12-20 TA1274F MAXIMUM RATINGS (Ta = 25°C) CHARACTERISTIC Supply Voltage Power Dissipation Operating Temperature Storage Temperature SYMBOL VCC PD max Topr Tstg RATING 13 1040 (Note 1) −20~75 −55~150 UNIT V mW °C °C Note 1: This value is on condition that the IC is mounted on PCB (50 mm × 50 mm). When using the device at Ta = 25°C, decrease the power dissipation by 8.3 mW for each increase of 1°C. OPERATING SUPPLY VOLTAGE PIN No. 21 PIN NAME VCC MIN 8.1 TYP. 9.0 MAX 9.9 UNIT V ELECTRICAL CHARACTERISTICS DC current characteristics (VCC = 9.0 V, Ta = 25°C) PIN No. 21 PIN NAME VCC SYMBOL ICC MIN 36 TYP. 45 MAX 60 UNIT mA DC voltage characteristics (VCC = 9.0 V, Ta = 25°C) PIN No. 1 4 5 7 10 11 14 15 16 17 18 19 20 22 24 SYMBOL V1 V4 V5 V7 V10 V11 V14 V15 V16 V17 V18 V19 V20 V22 V24 TEST CIRCUIT ― ― ― ― ― ― ― ― ― ― ― ― ― ― ― In AFT defeat ― ― No signal input ― ― ― ― 2nd SIF 4.5 MHz ― ― No signal input ― ― TEST CONDITION ― MIN 3.5 4.7 4.7 6.3 4.7 3.1 2.5 2.5 2.5 3.2 7.2 7.2 4.3 4.9 3.5 TYP. 4.0 5.2 5.2 7.0 5.2 3.5 3.1 3.1 3.1 3.7 7.6 7.6 4.5 5.3 4.0 MAX 4.5 5.7 5.7 7.7 5.7 3.9 3.7 3.7 3.7 4.2 7.9 7.9 4.7 5.7 4.5 V UNIT 7 2002-12-20 TA1274F AC CHARACTERISTICS (VCC = 9.0 V, Ta = 25°C) PIF section CHARACTERISTIC PIF Input Sensitivity PIF Maximum Input Signal PIF Gain Control Range RF AGC Maximum Output Voltage RF AGC Minimum Output Voltage PIF Input Resistance (*) PIF Input Capacitance (*) Differential Gain Differential Phase Intermodulation Video Output Signal Amplitude Video Output S / N Synchronous Signal Level Threshold Level of the Black Noise Inverter Clamp Level of the Black Noise Inverter Video Bandwidth (−3 dB) Capture Range of the PLL (Upper) Capture Range of the PLL (Lower) Hold Range of the PLL (Upper) Hold Range of the PLL (Lower) Control Steepness of the VCO Steepness of the AFT Detection AFT Maximum Output Voltage AFT Minimum Output Voltage AFT Output Voltage On Defeating SYMBOL vin min (p) vin max (p) RAGC (p) VAGC max VAGC min Zin R (p) Zin C (p) DG DP IM vDet (p) S / N (p) Vsync VthB VcpB fDet (p) fp (p) H fp (p) L fh (p) H fh (p) L β SAFT VAFT max VAFT min VAFT Def TEST CIRCUIT ― ― ― ― ― ― ― ― ― ― ― ― ― ― (Note 9) ― ― ― ― ― ― ― ― ― ― ― (Note 14) (Note 13) (Note 12) (Note 11) (Note 10) 3.3 6 1.8 ― 1.8 ― ― 20 8.5 ― 4.3 3.6 8 2.3 −2.0 2.3 −2.0 1.8 25 8.8 0.4 4.5 3.9 10 ― −1.5 ― −1.5 ― 30 ― 0.6 4.7 V MHz / V kHz / V MHz MHz (Note 2) (Note 1) TEST CONDITION MIN ― 105 68 8.5 ― ― ― ― ― 50 2.0 55 2.4 1.7 TYP. 40 113 73 8.9 0.0 1.2 3.6 1.0 3.0 55 2.2 60 2.7 2.0 MAX 45 ― ― ― 0.1 ― ― 3.0 5.0 ― 2.4 ― 3.0 2.3 V UNIT dBµV dB V V kΩ pF % deg dB V dB (Note 3) (Note 4) (Note 5) (Note 6) (Note 7) (Note 8) *: Not tested 8 2002-12-20 TA1274F SIF section CHARACTERISTIC SIF Maximum Input Signal SIF Gain Control Range SIF Input Resistance SIF Input Capacitance Limiting Sensitivity AM Reduction Ratio AF Output Signal Amplitude AF Output S / N Total Harmonics Distortion Hold Range of the FM Demodulator (Lower) Hold Range of the FM Demodulator (Upper) Capture Range of the FM Demodulator (Upper) Capture Range of the FM Demodulator (Lower) Ripple Rejection (*) (*) SYMBOL vin max (s) RAGC (s) Zin R (s) Zin C (s) vin lim AMR VDet (s) S / N (s) THD fh (s) L fh (s) H fp (s) H fp (s) L RR TEST CIRCUIT ― ― ― ― ― ― ― ― ― ― (Note 20) ― ― (Note 21) ― ― (Note 22) 5.2 ― ― ― ― −22 dB 5.3 ― ― ― ― 4.0 MHz (Note 19) TEST CONDITION MIN 105 55 ― ― ― 55 350 55 ― ― TYP. 118 75 10 2.8 40 68 500 63 0.2 ― MAX ― ― ― ― 45 ― 710 ― 1.0 3.9 MHz UNIT dBµV dB kΩ pF dBµV dB mVrms dB % (Note 15) (Note 16) (Note 17) (Note 18) *: Not tested 9 2002-12-20 TA1274F MEASUREMENTS PIF section TEST CONDITION VR13 ― OFF ON ON SW14 b SW17 SW22 · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV, 15 kHz sine wave / 30% AM) to J1. · Change amplitude of the input signal, and measure amplitude of the output signal at TP10. · Calculate RAGC (p) show as below. NOTE INPU TPOI NT MEAS .POIN T SW3 SW8 Note 1 J1 TP10 OFF ON Note 2 J1 TP2 OFF ON Min. Max. OFF ON ON · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV, 15 kHz sine wave / 30% AM) to J1. · Set VR13 to the minimum. · Measure voltage at TP 2 (VAGC max V.) · Set VR13 to the maximum. · Measure voltage at TP 2 (VAGC min V.) Note 3 ― TP1 TP24 OFF ON ― OFF ON ON · Remove all connections from terminal 1 and terminal 24. · Measure resistance (Zin R (p) kΩ) and capacitance (Zin C (p) pF) of TP1 and TP24 by the impedance meter. 10 2002-12-20 TA1274F TEST CONDITION VR13 ― · Measure DG and DP at TP4. ― OFF ON ON · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV, 15 kHz sine wave / 30% AM) from J1. · Measure the minimum voltage of the output signal at TP4 (Vmin). · Input the mixture of 3 signals (signal 1 Frequency : 45.75 MHz, Amplitude : 85 dBµV, signal 2 Frequency : 42.17 MHz, Amplitude : 75 dBµV, and signal 3 Frequency : 41.25 MHz, Amplitude : 75 dBµV ) to J1. · Apply DC voltage to TP3 and adjust it so that the bottom of the output signal at TP4 is equal to Vmin. · Measure frequency spectrum of the output signal at TP4. OFF ON ON SW14 b SW17 SW22 · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV, amplitude modulated by 10 step signal) to J1. NOTE INPUT MEAS POIN .POIN T T SW3 SW8 Note 4 J1 TP4 OFF ON Note 5 J1 TP4 OFF ON 11 2002-12-20 TA1274F TEST CONDITION VR13 ― OFF ON ON SW14 b SW17 SW22 · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV, amplitude modulated by 100 IRE white picture) to J1. · Measure amplitude of the output signal at TP4 (VDet (p) V). ― OFF ON ON · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV, amplitude modulated by black picture) to J1. · Measure video S / N at TP4 (HPF : 100 kHz, LPF : 4.2 MHz, CCIR Weighted) (S / N (p) dB). ― OFF ON ON · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV, amplitude modulated by 100 IRE white picture) to J1. · Measure voltage of the sync. tip at TP4 (vsync V) ― OFF ON ON · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV, 15 kHz triangle wave / 50% AM) to J1. · Apply DC voltage to TP3 and adjust it to get the waveform shown as below at TP4. · Measure VthB V and VcpB V at TP4. NOTE INPU TPOI NT MEAS .POIN T SW3 SW8 Note 6 J1 TP4 OFF ON Note 7 J1 TP4 OFF ON Note 8 J1 TP4 OFF ON Note 9 J1 TP4 OFF ON 12 2002-12-20 TA1274F TEST CONDITION VR13 ― OFF ON ON SW14 b SW17 SW22 · Input the mixture of 2 signals (signal 1 Frequency : 45.75 MHz, Amplitude : 82 dBµV, signal 2 Frequency : 45.65 MHz, Amplitude : 69 dBµV to J1. · Measure the minimum voltage of the output signal at TP4 (VoTP4). · Apply DC voltage to TP3 and adjust it so that the minimum voltage of the output signal at TP4 is equal to VoTP4. · Decrease frequency of the input signal at J1, and measure amplitude of the output signal at TP4. · Measure f Det (p) show as below. NOTE INPUT MEAS. POINT POINT SW3 SW8 Note 10 J1 TP4 OFF ON 13 2002-12-20 TA1274F TEST CONDITION VR13 ― OFF ON ON SW14 b SW17 SW22 · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV) to J1. · Sweep down the input signal frequency to 41.75 MHz, and sweep up to 49.75 MHz. Sweep down the input signal frequency to 45.75 MHz. · Measure the voltage at TP20. NOTE MEAS INPUT .POIN POINT T SW3 SW8 Note 11 J1 TP20 OFF ON Note 12 TP9 Pin 18 Pin 19 OFF ON ― OFF ON ON · Set the FET probe which connected to the spectrum analyzer near by pin 18 or pin 19 (Don’t touch the probe directly to pin 18 or to pin 19). · Apply 4.3 V to TP9, and measure frequency of the VCO oscillation by the spectrum analyzer (fLVCO MHz). · Apply 4.7 V to TP9, and measure frequency of the VCO oscillation by the spectrum analyzer (fHVCO MHz). · β MHz / V = (fHVCO − fLVCO) / 0.4 14 2002-12-20 TA1274F TEST CONDITION VR13 ― · Measure voltage at TP20 (VHTP20 V). · Input the signal (Frequency : 45.75 MHz + 20 kHz, Amplitude : 85 dBµV) to J1. · Measure voltage at TP20 (VLTP20 V). · S AFT kHz / V = 40 / (VHTP20 − VLTP20) · Input the signal (Frequency : 45.75 MHz − 500 kHz, Amplitude : 85 dBµV) to J1. · Measure voltage at TP20 (VAFT max V). · Input the signal (Frequency : 45.75 MHz + 500 kHz, Amplitude : 85 dBµV) to J1. · Measure voltage at TP20 (VAFT min V). ― ON ON ON · Measure voltage at TP20 (VAFT Def V ). OFF ON ON SW14 b SW17 SW22 · Input the signal (Frequency : 45.75 MHz − 20 kHz, Amplitude : 85 dBµV) to J1. NOTE INPU TPOI NT MEAS .POIN T SW3 SW8 Note 13 J1 TP20 OFF ON Note 14 ― TP20 OFF ON 15 2002-12-20 TA1274F SIF section TEST CONDITION VR13 ― OFF ON OFF SW14 b SW17 SW22 · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV ) to J1, and input the signal (Frequency : 41.25 MHz, Amplitude : 75 dBµV) to J2. · Change the amplitude of the signal at J2, and measure amplitude of the output signal at TP11. NOTE INPU TPOI NT MEAS .POIN T SW3 SW8 Note 15 J1 J2 TP11 OFF ON Note 16 ― TP22 ON ON ― OFF ON ― · Remove all connections from terminal 22. · Measure resistance (Zin R (s) kΩ and capacitance (Zin C (s) pF) of TP1 and TP24 by the impedance meter. Note 17 J3 TP17 ON ON ― OFF ON ON · Input the signal (Frequency : 4.5 MHz, Amplitude : 100 dBµV, 400 Hz sine wave / 25 kHz Devi FM) to J3. · Measure amplitude of the output signal at TP17 (voTP17). · Measure the input signal amplitude when the output amplitude from TP17 becomes −3 dB of voTP17, by decreasing the input signal amplitude to J3 (vin lim dBµV). 16 2002-12-20 TA1274F TEST CONDITION VR13 ― OFF ON ON SW14 b SW17 SW22 · Input the signal (Frequency : 4.5 MHz, Amplitude : 100 dBµV, 400 Hz sine wave / 25 kHz Devi FM) to J3. · Measure amplitude of the output signal at TP17 (vFMTP17 mVrms). · Input the signal (Frequency : 4.5 MHz, Amplitude : 100 dBµV, 400 Hz sine wave / 30% AM) to J3. · Measure amplitude of the output signal at TP17 (vAMTP17 mVrms). · AMR4.5 dB = 20ℓog (vFMTP17 / vAMTP17) · Input the signal (Frequency : 4.5 MHz, Amplitude : 100 dBµV, 400 Hz sine wave / 25 kHz Devi FM) to J3. · Measure amplitude of the output signal at TP17 (vDet (s) 4.5L mVrms). · Measure distortion of the TP17 output (THD4.5L %). · Input the signal (Frequency : 4.5 MHz, Amplitude : 100 dBµV to J3. · Measure amplitude of the output signal at TP17 (vNTP17 mVrms). · S / N4.5 = 20ℓog ( vDet (s) 4.5 / vNTP17) ― OFF ON ON · Input the signal (Frequency : 4.5 MHz, Amplitude : 100 dBµV to J3. · Change the frequency of the input signal, and measure voltage at TP12. NOTE INPU TPOI NT MEAS .POIN T SW3 SW8 Note 18 J3 TP17 ON ON Note 19 J3 TP17 ON ON ― OFF ON ON Note 20 J3 TP12 ON ON 17 2002-12-20 TA1274F TEST CONDITION VR13 ― · Increase frequency of the input signal. · Measure voltage of TP12 (VTP120 V). · Apply 5 V to TP12. · Stop appling 5 V to TP12. · Measure voltage of TP12 (VTP121 V). · Measure frequency of the input signal when VTP120 = VTP121 (fp (s) L MHz). · Input the signal (Frequency : 10 MHz, Amplitude : 100 dBµV) to J3. · Decrease frequency of the input signal. · Measure voltage of TP12 (VTP122 V). · Connect TP12 to GND. · Open TP12. · Measure voltage of TP12 (VTP123 V). · Measure frequency of the input signal when VTP122 = VTP123 (fp (s) H MHz). ― OFF ON ON · Input the signal (DC 9 V + AC Frequency : 60 Hz, Amplitude : 100 mVp-p) to VCC terminal. · Input the signal (Frequency : 1 MHz, Amplitude : 100 dBµV) to J3. · Measure amplitude of TP17 (vTP17 mVp-p). · RR dB = 20ℓog (vTP17 / 100) OFF ON ON SW14 b SW17 SW22 · Input the signal (Frequency : 1 MHz, Amplitude : 100 dBµV) to J3. NOTE INPU TPOI NT MEAS .POIN T SW3 SW8 Note 21 J3 TP12 ON ON Note 22 J3 TP17 ON ON 18 2002-12-20 TA1274F TEST CIRCUIT 19 2002-12-20 TA1274F APPLICATION CIRCUIT 20 2002-12-20 TA1274F PACKAGE DIMENSIONS Weight: 0.27 g (typ.) 21 2002-12-20 TA1274F RESTRICTIONS ON PRODUCT USE 000707EBA · TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc.. · The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer’s own risk. · The products described in this document are subject to the foreign exchange and foreign trade laws. · The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. · The information contained herein is subject to change without notice. 22 2002-12-20