TBD62502A series, TBD62503A series
TOSHIBA BiCD Integrated Circuit Silicon Monolithic
TBD62502APG, TBD62502AFG, TBD62502AFNG, TBD62502AFWG
TBD62503APG, TBD62503AFG, TBD62503AFNG, TBD62503AFWG
7channel sink type DMOS transistor array
TBD62502APG,TBD62503APG
TBD62502A series and TBD62503A series are DMOS
transistor array with 7 circuits. Please be careful about thermal
conditions during use.
Features
•
•
•
•
7 circuits built-in
High voltage
: VOUT = 50 V (MAX)
High current
: IOUT = 300 mA/ch (MAX)
Input voltage(output on) : TBD62502A series 14 V (MIN)
TBD62503A series 2.5 V (MIN)
• Input voltage(output off) : TBD62502A series 7.0 V (MAX)
TBD62503A series 0.6 V (MAX)
• Package
: PG type DIP16-P-300-2.54A
FG type SOP16-P-225-1.27
FNG type SSOP16-P-225-0.65B
FWG type P-SOP16-0410-1.27-002
DIP16-P-300-2.54A
TBD62502AFG,TBD62503AFG
SOP16-P-225-1.27
TBD62502AFNG,TBD62503AFNG
Pin connection (top view)
O1
O2
O3
O4
O5
O6
O7
NC
16
15
14
13
12
11
10
9
1
I1
2
I2
3
I3
4
I4
5
I5
6
I6
7
8
I7 GND
SSOP16-P-225-0.65B
TBD62502AFWG,TBD62503AFWG
Pin connection may be simplified for explanatory purpose.
P-SOP16-0410-1.27-002
Weight
DIP16-P-300-2.54A
: 1.11g (Typ.)
SOP16-P-225-1.27
: 0.16g (Typ.)
SSOP16-P-225-0.65B : 0.07g (Typ.)
P-SOP16-0410-1.27-002 : 0.15g (Typ.)
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Pin explanations
Pin No.
Pin name
Function
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
I1
I2
I3
I4
I5
I6
I7
GND
NC
O7
O6
O5
O4
O3
O2
O1
Input pin
Input pin
Input pin
Input pin
Input pin
Input pin
Input pin
GND pin
Non-connection pin
Output pin
Output pin
Output pin
Output pin
Output pin
Output pin
Output pin
Equivalent circuit (each driver)
OUTPUT
INPUT
Clamp
Equivalent circuit may be simplified for explanatory purpose.
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Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Symbol
Rating
Unit
Output voltage
Output current
Input voltage
PG (Note 1)
FG (Note 2)
Power
dissipation
FNG (Note 3)
FWG (Note 4)
Operating temperature
Storage temperature
VOUT
IOUT
VIN
50
300
−0.5 to 30
1.47
0.625
0.78
1.25
−40 to 85
−55 to 150
V
mA/ch
V
PD
Topr
Tstg
W
°C
°C
Note 1: Device alone. When Ta exceeds 25°C, it is necessary to do the derating with 11.8 mW/°C.
Note 2: On PCB (Size: 30 mm × 30 mm × 1.6 mm, Cu area: 50%, single-side glass epoxy).
When Ta exceeds 25°C, it is necessary to do the derating with 5 mW/°C.
Note 3: On PCB (Size: 50 mm × 50 mm × 1.6 mm, Cu area: 40%, single-side glass epoxy).
When Ta exceeds 25°C, it is necessary to do the derating with 6.24 mW/°C.
Note 4: On PCB (JEDEC 2s2p).
When Ta exceeds 25°C, it is necessary to do the derating with 10 mW/°C.
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Operating Ranges (Ta = −40 to 85 °C)
Characteristics
Symbol
Condition
Output voltage
VOUT
―
1 circuits ON, Ta = 25 °C
Duty = 10 %
tpw = 25 ms
7 circuits ON
Ta = 85 °C
Duty = 50 %
Tj = 120 °C
―
0
0
―
―
―
50
250
250
0
―
190
1 circuits ON, Ta = 25 °C
0
―
250
Duty = 10 %
0
―
250
Duty = 50 %
0
―
120
0
―
250
Duty = 10 %
0
―
250
Duty = 50 %
0
―
130
0
―
250
Duty = 10 %
0
―
250
Duty = 50 %
0
―
170
14
―
25
IOUT = 100 mA or upper, VOUT = 2 V 2.5
―
25
PG(Note 1)
tpw = 25 ms
7 circuits ON
Ta = 85 °C
Tj = 120 °C
FG(Note 2)
Output
current
IOUT
1 circuits ON, Ta = 25 °C
tpw = 25 ms
7 circuits ON
Ta = 85 °C
Tj = 120 °C
FNG(Note 3)
1 circuits ON, Ta = 25 °C
tpw = 25 ms
7 circuits ON
Ta = 85 °C
Tj = 120 °C
FWG(Note 4)
Input voltage
(Output on)
Input voltage
(Output off)
TBD62502A
series
TBD62503A
series
TBD62502A
series
TBD62503A
series
VIN
(ON)
VIN
(OFF)
IOUT = 100 mA or upper, VOUT = 2 V
Min Typ. Max
Unit
V
mA/ch
V
IOUT = 100 μA or less, VOUT = 2 V
0
―
7.0
IOUT = 100 μA or less, VOUT = 2 V
0
―
0.6
V
Note 1: Device alone.
Note 2: On PCB (Size: 30 mm × 30 mm × 1.6 mm, Cu area: 50%, single-side glass epoxy).
Note 3: On PCB (Size: 50 mm × 50 mm × 1.6 mm, Cu area: 40%, single-side glass epoxy).
Note 4: On PCB (JEDEC 2s2p).
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Electrical Characteristics (Ta = 25 °C unless otherwise noted)
Characteristics
Symbol
Test
Circuit
Output leakage current
Ileak
1
Condition
Min
Typ.
Max
Unit
VOUT = 50V, Ta = 85 °C
VIN = 0 V
―
―
1.0
μA
IOUT = 200 mA, VIN =14 V
―
0.4
(2.0)
0.65
(3.25)
IOUT = 100 mA, VIN =14 V
―
0.2
(2.0)
0.325
(3.25)
IOUT = 200 mA, VIN =5.0 V
―
0.4
(2.0)
0.65
(3.25)
IOUT = 100 mA, VIN =5.0 V
―
0.2
(2.0)
0.325
(3.25)
VIN = 14 V
―
―
1.0
VIN = 2.5 V
―
―
0.1
―
―
1.0
―
―
14
―
―
2.5
―
0.4
―
―
0.8
―
TBD62502A
series
Output voltage
(Output
ON-resistance)
VDS
(RON)
2
TBD62503A
series
Input current
(Output on)
TBD62502A
series
TBD62503A
series
Input current(Output off)
Input voltage
(Output on)
TBD62502A
series
TBD62503A
series
Turn−on delay
Turn−off delay
©2015 Toshiba Corporation
IIN
(ON)
3
IIN
(OFF)
4
VIN = 0 V, Ta = 85°C
VIN
5
IOUT = 100 mA, VOUT = 2 V
(ON)
tON
tOFF
6
VOUT = 50 V
RL = 200 Ω
CL = 15 pF
5
V
(Ω)
mA
μA
V
μs
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TBD62502A series, TBD62503A series
Test circuit
1. Ileak
2. VDS (RON)
OUTPUT
INPUT
OUTPUT
INPUT
Ileak
VOUT
IOUT
VDS
VIN
GND
GND
RON = VDS / IOUT
3. IIN (ON)
4. IIN (OFF)
OUTPUT
INPUT
IIN(ON)
OUTPUT
INPUT
IIN(OFF)
VIN
GND
GND
5. VIN (ON)
OUTPUT
INPUT
IOUT
VIN(ON)
VOUT
GND
Test circuit may be simplified for explanatory purpose.
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6. tON, tOFF
(注 1) 1)
(Note
(注 2) 2)
(Note
Note 1: Pulse width 50 μs, Duty cycle 10%
Output impedance 50 Ω, tr ≤ 5 ns, tf ≤ 10 ns
Please refer to the following table for the VIH condition.
Product
VIH
TBD62502A series
14.0 V
5.0 V
TBD62503A series
Note 2: CL includes the probe and the test board capacitance.
Test circuit and timing chart may be simplified for explanatory purpose.
Precautions for Using
This IC does not include built-in protection circuits for excess current or overvoltage.
If this IC is subjected to excess current or overvoltage, it may be destroyed.
Hence, the utmost care must be taken when systems which incorporate this IC are designed.
Utmost care is necessary in the design of the output line, COMMON and GND line since IC may be
destroyed due to short−circuit between outputs, air contamination fault, or fault by improper grounding.
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Package Dimensions
DIP16-P-300-2.54A
Unit: mm
Weight: 1.11 g (Typ.)
SOP16-P-225-1.27
Unit: mm
Weight: 0.16 g (Typ.)
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SSOP16-P-225-0.65B
Unit: mm
Weight: 0.07 g (Typ.)
P-SOP16-0410-1.27-002
Unit: mm
Weight: 0.15 g (Typ.)
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Notes on Contents
1. Pin connection
Pin connection may be simplified for explanatory purpose.
2. Equivalent Circuits
Equivalent circuit may be simplified for explanatory purpose.
3. Test circuit
Test circuit may be simplified for explanatory purpose.
4. Timing chart
Timing charts may be simplified for explanatory purposes.
IC Usage Considerations
Notes on handling of ICs
(1) The absolute maximum ratings of a semiconductor device are a set of ratings that must not be exceeded, even for
a moment. Do not exceed any of these ratings.Exceeding the rating(s) may cause device breakdown, damage or
deterioration, and may result in injury by explosion or combustion.
(2) Do not insert devices in the wrong orientation or incorrectly.Make sure that the positive and negative terminals
of power supplies are connected properly.Otherwise, the current or power consumption may exceed the absolute
maximum rating, and exceeding the rating(s) may cause device breakdown, damage or deterioration, and may
result in injury by explosion or combustion.In addition, do not use any device inserted in the wrong orientation
or incorrectly to which current is applied even just once.
(3) Use an appropriate power supply fuse to ensure that a large current does not continuously flow in the case of
overcurrent and/or IC failure. The IC will fully break down when used under conditions that exceed its absolute
maximum ratings, when the wiring is routed improperly or when an abnormal pulse noise occurs from the
wiring or load, causing a large current to continuously flow and the breakdown can lead to smoke or ignition. To
minimize the effects of the flow of a large current in the case of breakdown, appropriate settings, such as fuse
capacity, fusing time and insertion circuit location, are required.
(4) If your design includes an inductive load such as a motor coil, incorporate a protection circuit into the design to
prevent device malfunction or breakdown caused by the current resulting from the inrush current at power ON
or the negative current resulting from the back electromotive force at power OFF. IC breakdown may cause
injury, smoke or ignition.Use a stable power supply with ICs with built-in protection functions. If the power
supply is unstable, the protection function may not operate, causing IC breakdown. IC breakdown may cause
injury, smoke or ignition.
(5) Carefully select external components (such as inputs and negative feedback capacitors) and load components
(such as speakers), for example, power amp and regulator.If there is a large amount of leakage current such as
from input or negative feedback condenser, the IC output DC voltage will increase. If this output voltage is
connected to a speaker with low input withstand voltage, overcurrent or IC failure may cause smoke or ignition.
(The overcurrent may cause smoke or ignition from the IC itself.) In particular, please pay attention when using
a Bridge Tied Load (BTL) connection-type IC that inputs output DC voltage to a speaker directly.
Points to remember on handling of ICs
Heat Radiation Design
When using an IC with large current flow such as power amp, regulator or driver, design the device so that heat is
appropriately radiated, in order not to exceed the specified junction temperature (TJ) at any time or under any condition.
These ICs generate heat even during normal use. An inadequate IC heat radiation design can lead to decrease in IC life,
deterioration of IC characteristics or IC breakdown. In addition, when designing the device, take into consideration the
effect of IC heat radiation with peripheral components.
Back-EMF
When a motor rotates in the reverse direction, stops or slows abruptly, current flows back to the motor’s power supply
owing to the effect of back-EMF. If the current sink capability of the power supply is small, the device’s motor power
supply and output pins might be exposed to conditions beyond the absolute maximum ratings. To avoid this problem, take
the effect of back-EMF into consideration in system design.
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RESTRICTIONS ON PRODUCT USE
• Toshiba Corporation, and its subsidiaries and affiliates (collectively "TOSHIBA"), reserve the right to make changes to the information in
this document, and related hardware, software and systems (collectively "Product") without notice.
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written permission, reproduction is permissible only if reproduction is without alteration/omission.
• Though TOSHIBA works continually to improve Product's quality and reliability, Product can malfunction or fail. Customers are
responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and
systems which minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily injury
or damage to property, including data loss or corruption. Before customers use the Product, create designs including the Product, or
incorporate the Product into their own applications, customers must also refer to and comply with (a) the latest versions of all relevant
TOSHIBA information, including without limitation, this document, the specifications, the data sheets and application notes for Product
and the precautions and conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the instructions for the
application with which the Product will be used with or for. Customers are solely responsible for all aspects of their own product design or
applications, including but not limited to (a) determining the appropriateness of the use of this Product in such design or applications; (b)
evaluating and determining the applicability of any information contained in this document, or in charts, diagrams, programs, algorithms,
sample application circuits, or any other referenced documents; and (c) validating all operating parameters for such designs and
applications. TOSHIBA ASSUMES NO LIABILITY FOR CUSTOMERS' PRODUCT DESIGN OR APPLICATIONS.
• PRODUCT IS NEITHER INTENDED NOR WARRANTED FOR USE IN EQUIPMENTS OR SYSTEMS THAT REQUIRE
EXTRAORDINARILY HIGH LEVELS OF QUALITY AND/OR RELIABILITY, AND/OR A MALFUNCTION OR FAILURE OF WHICH MAY
CAUSE LOSS OF HUMAN LIFE, BODILY INJURY, SERIOUS PROPERTY DAMAGE AND/OR SERIOUS PUBLIC IMPACT
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limitation, equipment used in nuclear facilities, equipment used in the aerospace industry, medical equipment, equipment used for
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AS A RESULT OF NONCOMPLIANCE WITH APPLICABLE LAWS AND REGULATIONS.
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