TC4011BP_07

TC4011BP/BF/BFN/BFT TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC4011BP,TC4011BF,TC4011BFN,TC4011BFT TC4011B Quad 2 Input NAND Gate The TC4011B is 2-input positive logic NAND gate respectively. Since all the outputs of these gates are provided with the inverters as buffers, the input/output characteristics have been improved and the variation of propagation delay time due to the increase in load capacity is kept down to the minimum. Note: xxxFN (JEDEC SOP) is not available in Japan. TC4011BP Pin Assignment A1 B1 X1 X2 B2 A2 VSS 1 2 3 4 5 6 7 (top view) 14 13 12 11 10 9 8 VDD A4 B4 X4 X3 B3 A3 TC4011BF TC4011BFN Logic Diagram X = A･B A B X TC4011BFT Weight DIP14-P-300-2.54 SOP14-P-300-1.27A SOL14-P-150-1.27 TSSOP14-P-0044-0.65A : 0.96 g (typ.) : 0.18 g (typ.) : 0.12 g (typ.) : 0.06 g (typ.) 1 2007-10-01 TC4011BP/BF/BFN/BFT Absolute Maximum Ratings (Note) Characteristics DC supply voltage Input voltage Output voltage DC input current Power dissipation Operating temperature range Storage temperature range Symbol VDD VIN VOUT IIN PD Topr Tstg Rating VSS − 0.5 to VSS + 20 VSS − 0.5 to VDD + 0.5 VSS − 0.5 to VDD + 0.5 ±10 300 (DIP)/180 (SOIC) −40 to 85 −65 to 150 Unit V V V mA mW °C °C Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Operating Ranges (VSS = 0 V) (Note) Characteristics DC supply voltage Input voltage Symbol VDD VIN Test Condition ― ― Min 3 0 Typ. ― ― Max 18 VDD Unit V V Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VDD or VSS. 2 2007-10-01 TC4011BP/BF/BFN/BFT Static Electrical Characteristics (VSS = 0 V) Test Condition Characteristics Symbol VDD (V) |IOUT| < 1 μA VIN = VSS, VDD 5 10 15 5 10 15 5 5 10 15 −40°C Min 4.95 9.95 14.95 ― ― ― −0.61 −2.50 −1.50 −4.00 Max ― ― ― 0.05 0.05 0.05 ― ― ― ― Min 4.95 9.95 14.95 ― ― ― −0.51 −2.10 −1.30 −3.40 25°C Typ. 5.00 10.00 15.00 0.00 0.00 0.00 −1.0 −4.0 −2.2 −9.0 Max ― ― ― 0.05 0.05 0.05 ― ― ― ― Min 4.95 9.95 14.95 ― ― ― −0.42 −1.70 −1.10 −2.80 85°C Max ― ― ― 0.05 0.05 0.05 ― ― ― ― mA V V Unit High-level output voltage VOH Low-level output voltage VOL |IOUT| < 1 μA VIN = VSS, VDD VOH = 4.6 V VOH = 2.5 V Output high current IOH VOH = 9.5 V VOH = 13.5 V VIN = VSS, VDD VOL = 0.4 V 5 10 15 0.61 1.50 4.00 ― ― ― 0.51 1.30 3.40 1.2 3.2 12.0 ― ― ― 0.42 1.10 2.80 ― ― ― mA Output low current IOL VOL = 0.5 V VOL = 1.5 V VIN = VDD VOUT = 0.5 V 5 10 15 3.5 7.0 11.0 ― ― ― 3.5 7.0 11.0 2.75 5.50 8.25 ― ― ― 3.5 7.0 11.0 ― ― ― V Input high voltage VIH VOUT = 1.0 V VOUT = 1.5 V |IOUT| < 1 μA VOUT = 4.5 V 5 10 15 ― ― ― 1.5 3.0 4.0 ― ― ― 2.25 4.50 6.75 1.5 3.0 4.0 ― ― ― 1.5 3.0 4.0 V Input low voltage VIL VOUT = 9.0 V VOUT = 13.5 V |IOUT| < 1 μA “H” level Input current “L” level Quiescent supply current IIH IIL VIH = 18 V VIL = 0 V VIN = VSS, VDD (Note) 18 18 5 10 15 ― ― ― ― ― 0.1 −0.1 0.25 0.50 1.00 ― ― ― ― ― 10 −5 0.1 −0.1 0.25 0.50 1.00 ― ― ― ― ― 1.0 μA −1.0 7.5 15.0 30.0 μA −10 −5 0.001 0.001 0.002 IDD Note: All valid input combinations. 3 2007-10-01 TC4011BP/BF/BFN/BFT Dynamic Electrical Characteristics (Ta = 25°C, VSS = 0 V, CL = 50 pF) Characteristics Symbol Test Condition VDD (V) 5 Output transition time tTLH ― 10 15 5 Output transition time tTHL ― 10 15 5 Propagation delay time tpLH ― 10 15 5 Propagation delay time tpHL ― 10 15 Input capacitance CIN ― Min ― ― ― ― ― ― ― ― ― ― ― ― ― Typ. 70 35 30 70 35 30 65 30 25 65 30 25 5 Max 200 100 80 200 100 80 200 100 80 200 100 80 7.5 pF ns ns ns ns Unit Circuit and Waveform for Measurement of Dynamic Characteristics Circuit Waveform 20 ns 20 ns 90% 50% 10% VDD Input 90% 50% 10% tTHL 90% 50% 10% tpHL Output P.G. Input tTLH 90% 50% 10% tpLH CL = 50 pF VSS Output 4 2007-10-01 TC4011BP/BF/BFN/BFT Package Dimensions Weight: 0.96 g (typ.) 5 2007-10-01 TC4011BP/BF/BFN/BFT Package Dimensions Weight: 0.18 g (typ.) 6 2007-10-01 TC4011BP/BF/BFN/BFT Package Dimensions (Note) Note: This package is not available in Japan. Weight: 0.12 g (typ.) 7 2007-10-01 TC4011BP/BF/BFN/BFT Package Dimensions Weight: 0.06 g (typ.) 8 2007-10-01 TC4011BP/BF/BFN/BFT RESTRICTIONS ON PRODUCT USE • The information contained herein is subject to change without notice. 20070701-EN GENERAL • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 9 2007-10-01