TC4538BP/BF
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC4538BP,TC4538BF
TC4538BP/TC4538BF Dual Precision Retriggerable/Resettable Monostable Multivibrator
The TC4538BP/BF is the retriggerable/resettable monostable multivibrator and the trigger operation can be made at either the leading or trailing edge by 2 inputs of A and B. Since the output monostable pulse width is decided by time constant of the external resistor (RX) and the external capacitor (CX), it becomes possible to set a broad range of output pulse widths.
TC4538BP
Features
• twOUT = 10 ms ± 5% (at RX = 100 kΩ CX = 0.1 μF, VDD = 10 V)
TC4538BF
Pin Assignment
Weight DIP16-P-300-2.54A SOP16-P-300-1.27A
: 1.00 g (typ.) : 0.18 g (typ.)
Truth Table (Note)
Inputs A B H L H L * * CD H H H H L L H L L H H Outputs Q
Q
Note Output Enable Inhibit Inhibit Output Enable Inhibit
*: Don’t care Note: In the case of using only one circuit, CD should be tied to GND, T2, T1, Q, Q should be tied to OPEN, and the other inputs should be tied to VCC or GND.
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Logic Diagram
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Timing Chart
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Absolute Maximum Ratings (Note)
Characteristics DC supply voltage Input voltage Output voltage DC input current Power dissipation Operating temperature range Storage temperature range Symbol VDD VIN VOUT IIN PD Topr Tstg Rating VSS − 0.5 to VSS + 20 VSS − 0.5 to VDD + 0.5 VSS − 0.5 to VDD + 0.5 ±10 300 (DIP)/180 (SOIC) −40 to 85 −65 to 150 Unit V V V mA mW °C °C
Note:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Operating Ranges (VSS = 0 V) (Note)
Characteristics DC supply voltage Input voltage External resistance External capacitance Symbol VDD VIN RX CX Test Condition ⎯ ⎯ ⎯ ⎯ Min 3 0 5 Typ. ⎯ ⎯ ⎯ No limits Max 18 VDD 1000 Unit V V kΩ μF
Note:
The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VDD or VSS.
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Static Electrical Characteristics (VSS = 0 V)
Characteristics Symbol Test Condition VDD (V) ⎪IOUT⎪< 1 μA VIN = VSS, VDD ⎪IOUT⎪ < 1 μA VIN = VSS, VDD VOH = 4.6 V VOH = 2.5 V Output high current IOH VOH = 9.5 V VOH = 13.5 V VIN = VSS, VDD VOL = 0.4 V Output low current IOL VOL = 0.5 V VOL = 1.5 V VIN = VSS, VDD VOUT = 0.5 V, 4.5 V Input high voltage VIH VOUT = 1.0 V, 9.0 V VOUT = 1.5 V, 13.5 V ⎪IOUT⎪ < 1 μA VOUT = 0.5 V, 4.5 V Input low voltage VIL VOUT = 1.0 V, 9.0 V VOUT = 1.5 V, 13.5 V ⎪IOUT⎪ < 1 μA Input current “H” level “L” level IIH IIL VIH = 18 V VIL = 0 V VIN = VSS, VDD (Note) 18 18 5 10 15 ⎯ ⎯ ⎯ ⎯ ⎯ 0.1 −0.1 5 10 20 ⎯ ⎯ ⎯ ⎯ ⎯ 10− −10
5
−40°C Min 4.95 9.95 14.95 ⎯ ⎯ ⎯ −0.61 −2.50 −1.50 −4.00 Max ⎯ ⎯ ⎯ 0.05 0.05 0.05 ⎯ ⎯ ⎯ ⎯ Min 4.95 9.95 14.95 ⎯ ⎯ ⎯ −0.51 −2.10 −1.30 −3.40
25°C Typ. 5.00 10.00 15.00 0.00 0.00 0.00 −1.0 −4.0 −2.2 −9.0 Max ⎯ ⎯ ⎯ 0.05 0.05 0.05 ⎯ ⎯ ⎯ ⎯ Min
85°C Max ⎯ ⎯ ⎯ 0.05 0.05 0.05 ⎯ ⎯ ⎯ ⎯ mA V V Unit
5 10 15 5 10 15 5 5 10 15
4.95 9.95 14.95 ⎯ ⎯ ⎯ −0.42 −1.70 −1.10 −2.80
High-level output voltage
VOH
Low-level output voltage
VOL
5 10 15
0.61 1.50 4.00
⎯ ⎯ ⎯
0.51 1.30 3.40
1.5 3.8 15.0
⎯ ⎯ ⎯
0.42 1.10 2.80
⎯ ⎯ ⎯ mA
5 10 15
3.5 7.0 11.0
⎯ ⎯ ⎯
3.5 7.0 11.0
2.75 5.50 8.25
⎯ ⎯ ⎯
3.5 7.0 11.0
⎯ ⎯ ⎯ V
5 10 15
⎯ ⎯ ⎯
1.5 3.0 4.0
⎯ ⎯ ⎯
2.25 4.50 6.75
1.5 3.0 4.0
⎯ ⎯ ⎯
1.5 3.0 4.0 V
0.1 −0.1 5 10 20
⎯ ⎯ ⎯ ⎯ ⎯
1.0 −1.0 150 300 600
−5
μA
0.005 0.010 0.015
Quiescent supply current
IDD
μA
Note: All valid input combinations.
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Dynamic Electrical Characteristics (Ta = 25°C, VSS = 0 V, CL = 50 pF)
Characteristics Symbol Test Condition VDD (V) 5 tTLH ⎯ 10 15 5 tTHL ⎯ 10 15 tpLH tpHL 5 ⎯ 10 15 5 ⎯ 10 15 5 ⎯ 10 15 5 tWL ⎯ 10 15 5 Min retrigger time trr ⎯ 10 15 RX = 100 kΩ CX = 0.002 μF RX = 100 kΩ CX = 0.1 μF RX = 100 kΩ CX = 10 μF 5 10 15 5 10 15 5 10 15 Min ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ 9.30 9.50 9.55 ⎯ ⎯ ⎯ Typ. 80 50 40 80 50 40 380 150 100 280 110 75 60 30 25 95 45 35 0 0 0 206 204 205 9.95 10.00 10.05 0.98 1.00 1.01 Max 200 100 80 200 100 80 760 300 220 560 250 190 120 60 50 190 90 70 ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ 10.40 10.50 10.65 ⎯ ⎯ ⎯ s ms μs ns ns ns ns ns ns ns Unit
Output transition time (low to high)
Output transition time (high to low)
Propagation delay time (A, B-Q, Q )
Propagation delay time (CD-Q, Q )
tpLH tpHL
Min input pulse width (A, B)
tWH tWL
Min pulse width (CD)
Output pulse width
twOUT
Pulse width match between circuits in the same package
ΔtwOUT
t wOUT (Q2) − t w (Q1) × 100 t wOUT (Q1) ⎯
5 10 15
⎯ ⎯ ⎯ ⎯
±1 ±1 ±1 5
⎯ ⎯ ⎯ 7.5 pF %
Input capacitance
CIN
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Waveform for Measurement of Dynamic Characteristics
Waveform
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Package Dimensions
Weight: 1.00 g (typ.)
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Package Dimensions
Weight: 0.18 g (typ.)
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RESTRICTIONS ON PRODUCT USE
• The information contained herein is subject to change without notice.
20070701-EN GENERAL
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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