TC74AC299P/F
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC74AC299P,TC74AC299F
8-Bit PIPO Shift Register with Asynchronousclear
TC74AC299P
The TC74AC299 is an advanced high speed CMOS 8-BIT PIPO SHIFT REGISTER fabricated with silicon gate and double-layer metal wiring C2MOS technology. It achieves the high speed operation similar to equivalent Bipolar Schottky TTL while maintaining the CMOS low power dissipation. It has a four modes (HOLD, SHIFT LEFT, SHIFT RIGHT and LOAD DATA) controlled by the two selection inputs (S0, S1). When one or both enable ( G1 , G2 ) are high, the eight I/O outputs are forced to the high-impedance state; however, sequential operation or clearing of the register is not affected. All inputs are equipped with protection circuits against static discharge or transient excess voltage.
TC74AC299F
Features (Note 1)(Note 2)
• • • • High speed: fmax = 150 MHz (typ.) at VCC = 5 V Low power dissipation: ICC = 8 μA (max) at Ta = 25°C High noise immunity: VNIH = VNIL = 28% VCC (min) Symmetrical output impedance: |IOH| = IOL = 24 mA (min) Capability of driving 50 Ω • • • tansmission lines. Balanced propagation delays: tpLH ∼ tpHL − Wide operating voltage range: VCC (opr) = 2 to 5.5 V Pin and function compatible with 74F299 Note 1: Do not apply a signal to any bus terminal when it is in the output mode. Damage may result. Note 2: All floating (high impedance) bus terminals must have their input levels fixed by means of pull up or pull down resistors. Weight DIP20-P-300-2.54A SOP20-P-300-1.27A : 1.30 g (typ.) : 0.22 g (typ.)
Pin Assignment
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IEC Logic Symbol
Truth Table
Inputs Mode Function select S1 S0 Outputs Control Serial Inputs/ Outputs Outputs
CLR
G1 (Note) X L L L L L L L X
G2 (Note) X L L L L L L L X
CK SL X X X X X X X X X X H L X SR X X X X H L X X X
A/QA
H/QH
QA’
QH’
L Clear L L Hold Shift Right Shift Left Load H H H H H H
H L X L L L H H H
H X L L H H L L H
Z L L QA0 H L QBn QBn a
Z L L QH0 QGn QGn H L h
L L L QA0 H L QBn QBn a
L L L QH0 QGn QGn H L h
Note:
When one or both output controls are high, the eight input/output terminals are in the high-impedance state; however sequential or clearing of the register is not affected.
Z: High impedance Qn0: The level of Qn before the indicated steady-state input conditions were established. Qnn: The level of Qn before the most recent active transition indicated by ↓ or ↑. a, h: The level of the steady-state inputs A, H, respectively. X: Don’t care
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Timing Chart
System Diagram
(Note)
(Note)
(Note)
(Note)
(Note)
(Note)
Note:
Equivalent circuits
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Absolute Maximum Ratings (Note 1)
Characteristics Supply voltage range DC input voltage DC output voltage Input diode current Output diode current DC output current DC VCC/ground current Power dissipation Storage temperature Symbol VCC VIN VOUT IIK IOK IOUT ICC PD Tstg Rating
−0.5 to 7.0 −0.5 to VCC + 0.5 −0.5 to VCC + 0.5 ±20 ±50 ±50 ±250
Unit V V V mA mA mA mA mW °C
500 (DIP) (Note 2)/180 (SOP)
−65 to 150
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: 500 mW in the range of Ta = −40 to 65°C. From Ta = 65 to 85°C a derating factor of −10 mW/°C should be applied up to 300 mW.
Operating Ranges (Note)
Characteristics Supply voltage Input voltage Output voltage Operating temperature Input rise and fall time Symbol VCC VIN VOUT Topr dt/dV Rating 2.0 to 5.5 0 to VCC 0 to VCC
−40 to 85
Unit V V V °C ns/V
0 to 100 (VCC = 3.3 ± 0.3 V) 0 to 20 (VCC = 5 ± 0.5 V)
Note:
The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND.
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Electrical Characteristics
DC Characteristics
Test Condition Characteristics Symbol VCC (V) 2.0 High-level input voltage VIH
⎯
Ta = 25°C Min 1.50 2.10 3.85
⎯ ⎯ ⎯
Ta = −40 to 85°C Max
⎯ ⎯ ⎯
Unit
Typ.
⎯ ⎯ ⎯ ⎯ ⎯ ⎯
Min 1.50 2.10 3.85
⎯ ⎯ ⎯
Max
⎯ ⎯ ⎯
3.0 5.5 2.0
V
0.50 0.90 1.65
⎯ ⎯ ⎯ ⎯ ⎯ ⎯
0.50 0.90 1.65
⎯ ⎯ ⎯ ⎯ ⎯ ⎯
Low-level input voltage
VIL
⎯
3.0 5.5 2.0
V
1.9 2.9 4.4 2.58 3.94
⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯
2.0 3.0 4.5
⎯ ⎯ ⎯
1.9 2.9 4.4 2.48 3.80 3.85
⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯
IOH = −50 μA High-level output voltage VOH VIN = VIH or IOH = −4 mA VIL IOH = −24 mA IOH = −75 mA IOL = 50 μA Low-level output voltage VOL VIN = VIH or IOL = 12 mA VIL IOL = 24 mA IOL = 75 mA 3-state output off-state current Input leakage current Quiescent supply current IOZ IIN ICC VIN = VIH or VIL VOUT = VCC or GND VIN = VCC or GND VIN = VCC or GND (Note) (Note)
3.0 4.5 3.0 4.5 5.5 2.0 3.0 4.5 3.0 4.5 5.5 5.5 5.5 5.5
V
0.0 0.0 0.0
⎯ ⎯ ⎯ ⎯ ⎯ ⎯
0.1 0.1 0.1 0.36 0.36
⎯ ±0.5 ±0.1
0.1 0.1 0.1 0.44 0.44 1.65
±5.0 ±1.0 μA μA μA
V
8.0
80.0
Note:
This spec indicates the capability of driving 50 Ω transmission lines. One output should be tested at a time for a 10 ms maximum duration.
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Timing Recommended Operating Conditions (input: tr = tf = 3 ns)
Characteristics Symbol Test Condition VCC (V) Minimum pulse width (CK) Minimum pulse width ( CLR ) Minimum set-up time (SL, SR, A~H) Minimum set-up time (S0, S1) Minimum hold time (SL, SR, A~H) Minimum hold time (S0, S1) Minimum removal time ( CLR ) tW (L) tW (H) tW (L)
⎯
Ta = 25°C Limit 8.0 5.0 7.0 5.0 6.0 4.0 11.9 7.0 1.0 1.0 0.0 0.0 5.0 3.0
Ta = −40 to 85°C Limit 8.0 5.0 7.0 5.0 6.0 4.0 13.6 7.0 1.0 1.0 0.0 0.0 5.0 3.0
Unit
3.3 ± 0.3 5.0 ± 0.5 3.3 ± 0.3 5.0 ± 0.5 3.3 ± 0.3 5.0 ± 0.5 3.3 ± 0.3 5.0 ± 0.5 3.3 ± 0.3 5.0 ± 0.5 3.3 ± 0.3 5.0 ± 0.5 3.3 ± 0.3 5.0 ± 0.5
ns
⎯
ns
ts
⎯
ns
ts
⎯
ns
th
⎯
ns
th
⎯
ns
trem
⎯
ns
AC Characteristics (CL = 50 pF, RL = 500 Ω, input: tr = tf = 3 ns)
Characteristics Propagation delay time (CK-QA’, QH’) Propagation delay time ( CLR -QA’, QH’) Propagation delay time (CK-QA~QH) Propagation delay time ( CLR -QA~QH) Output enable time Symbol Test Condition VCC (V) tpLH tpHL tpLH tpHL tpLH tpHL tpLH tpHL tpZL tpZH tpLZ tpHZ fmax CIN CI/O CPD (Note)
⎯
Ta = 25°C Min
⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯
Ta = −40 to 85°C Max 18.4 10.5 14.0 9.2 19.3 10.5 16.7 10.9 17.5 9.6 14.0 9.6
⎯ ⎯
Unit
Typ. 10.6 6.8 8.1 6.1 10.9 7.3 9.8 6.7 9.9 6.6 8.1 6.4 90 140 5 13 137
Min 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 45 80
⎯ ⎯ ⎯
Max 21.0 12.0 16.0 10.5 22.0 12.0 19.0 12.4 20.0 11.0 16.0 11.0
⎯ ⎯
3.3 ± 0.3 5.0 ± 0.5 3.3 ± 0.3 5.0 ± 0.5 3.3 ± 0.3 5.0 ± 0.5 3.3 ± 0.3 5.0 ± 0.5 3.3 ± 0.3 5.0 ± 0.5 3.3 ± 0.3 5.0 ± 0.5 3.3 ± 0.3 5.0 ± 0.5
⎯ ⎯ ⎯
ns
⎯
ns
⎯
ns
⎯
ns
⎯
ns
Output disable time Maximum clock frequency Input capacitance Bus input capacitance Power dissipation capacitance
⎯
ns
⎯
45 80
⎯ ⎯ ⎯
MHz pF pF pF
10
⎯ ⎯
10
⎯ ⎯
Note:
CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPD・VCC・fIN + ICC
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Package Dimensions
Weight: 1.30 g (typ.)
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Package Dimensions
Weight: 0.22 g (typ.)
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RESTRICTIONS ON PRODUCT USE
• The information contained herein is subject to change without notice.
20070701-EN GENERAL
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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