TC74HC191AP/AF
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC74HC191AP,TC74HC191AF
4-Bit Binary Up/Down Counter
The TC74HC191A are high speed CMOS 4-BIT UP/DOWN COUNTERs fabricated with silicon gate C2MOS technology. It achieves the high speed operation similar to equivalent LSTTL while maintaining the CMOS low power dissipation. The TC74HC191A is 4-bit binary up/down counter. They have an asynchronous load input (LOAD) which is active low. The direction of counting is determined by the level of DOWN/UP. When D/U is low, the counter counts up; when D/U is high, it counts down. Counting occurs on the positive going transition of the clock input. Enable input (ENABLE) and two carry inputs (RIPPLE CLOCK OUT, MAX/MIN) are provided to permit easy cascading of the counters, which facilitates easy implementation of N-bit counters without using external gates. All inputs are equipped with protection circuits against static discharge or transient excess voltage.
TC74HC191AP
TC74HC191AF
Features
• • • • • • • • High speed: fmax = 48 MHz (typ.) at VCC = 5 V Low power dissipation: ICC = 4 μA (max) at Ta = 25°C High noise immunity: VNIH = VNIL = 28% VCC (min) Output drive capability: 10 LSTTL loads Symmetrical output impedance: |IOH| = IOL = 4 mA (min) ∼ Balanced propagation delays: tpLH − tpHL Wide operating voltage range: VCC (opr) = 2~6 V Pin and function compatible with 74LS191 Weight DIP16-P-300-2.54A SOP16-P-300-1.27A : 1.00 g (typ.) : 0.18 g (typ.)
Pin Assignment
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TC74HC191AP/AF
IEC Logic Symbol
Truth Table
Inputs Outputs
LOAD
L H H H H
ENABLE X L L H X
D/ U X L H X X
CK X
QA a
QB b
QC c
QD d
Function Preset Data Up Count Down Count No Count No Count
Up Count Down Count No Change No Change
X: Don’t care a~d: Inputs level of A~D
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Timing Chart
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System Diagram
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Absolute Maximum Ratings (Note 1)
Characteristics Supply voltage range DC input voltage DC output voltage Input diode current Output diode current DC output current DC VCC/ground current Power dissipation Storage temperature Symbol VCC VIN VOUT IIK IOK IOUT ICC PD Tstg Rating
−0.5~7 −0.5~VCC + 0.5 −0.5~VCC + 0.5 ±20 ±20 ±25 ±50
Unit V V V mA mA mA mA mW °C
500 (DIP) (Note 2)/180 (SOP)
−65~150
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: 500 mW in the range of Ta = −40 to 65°C. From Ta = 65 to 85°C a derating factor of −10 mW/°C shall be applied until 300 mW.
Operating Ranges (Note)
Characteristics Supply voltage Input voltage Output voltage Operating temperature Symbol VCC VIN VOUT Topr Rating 2~6 0~VCC 0~VCC
−40~85
Unit V V V °C
0~1000 (VCC = 2.0 V) Input rise and fall time tr, tf 0~500 (VCC = 4.5 V) 0~400 (VCC = 6.0 V) ns
Note:
The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND.
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Electrical Characteristics
DC Characteristics
Characteristics Symbol Test Condition VCC (V) 2.0 High-level input voltage VIH
⎯
Ta = 25°C Min 1.50 3.15 4.20
⎯ ⎯ ⎯
Ta = −40~85°C Max
⎯ ⎯ ⎯
Typ.
⎯ ⎯ ⎯ ⎯ ⎯ ⎯
Min 1.50 3.15 4.20
⎯ ⎯ ⎯
Max
⎯ ⎯ ⎯
Unit
4.5 6.0 2.0
V
0.50 1.35 1.80
⎯ ⎯ ⎯ ⎯ ⎯
0.50 1.35 1.80
⎯ ⎯ ⎯ ⎯ ⎯
Low-level input voltage
VIL
⎯
4.5 6.0 2.0
V
1.9 4.4 5.9 4.18 5.68
⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯
2.0 4.5 6.0 4.31 5.80 0.0 0.0 0.0 0.17 0.18
⎯ ⎯
1.9 4.4 5.9 4.13 5.63
⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯
IOH = −20 μA High-level output voltage VOH VIN = VIH or VIL IOH = −4 mA IOH = −5.2 mA IOL = 20 μA Low-level output voltage VOL VIN = VIH or VIL IOL = 4 mA IOL = 5.2 mA Input leakage current Quiescent supply current IIN ICC VIN = VCC or GND VIN = VCC or GND
4.5 6.0 4.5 6.0 2.0 4.5 6.0 4.5 6.0 6.0 6.0
V
0.1 0.1 0.1 0.26 0.26
±0.1
0.1 0.1 0.1 0.33 0.33
±1.0 μA μA
V
4.0
40.0
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Timing Requirements (input: tr = tf = 6 ns)
Characteristics Symbol Test Condition VCC (V) Minimum pulse width (CK) tW (H) tW (L) 2.0
⎯
Ta = 25°C Typ.
⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯
Ta = −40 ~85°C Limit 125 25 21 95 19 16 190 38 33 65 13 11 0 0 0 0 0 0 65 13 11 4 20 24
Unit
Limit 100 20 17 75 15 13 150 30 26 50 10 9 0 0 0 0 0 0 50 10 9 5 25 29
4.5 6.0 2.0
ns
Minimum pulse width ( LOAD )
tW (L)
⎯
4.5 6.0 2.0
ns
Minimum set-up time ( ENABLE , D/ U )
ts
⎯
4.5 6.0 2.0
ns
Minimum set-up time (DATA- LOAD )
ts
⎯
4.5 6.0 2.0
ns
Minimum hold time ( ENABLE , D/ U )
th
⎯
4.5 6.0 2.0
ns
Minimum hold time (DATA- LOAD )
th
⎯
4.5 6.0 2.0
ns
Minimum removal time
trem
⎯
4.5 6.0 2.0
ns
Clock frequency
f
⎯
4.5 6.0
MHz
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AC Characteristics (CL = 15 pF, VCC = 5 V, Ta = 25°C, input: tr = tf = 6 ns)
Characteristics Output transition time Propagation delay time (CK-Q) Propagation delay time (CK- RCO ) Propagation delay time (CK-MAX/MIN) Propagation delay time ( LOAD -Q) Propagation delay time (DATA-Q) Propagation delay time ( ENABLE - RCO ) Propagation delay time (D/ U - RCO ) Propagation delay time (D/ U -MAX/MIN) Maximum clock frequency Symbol tTLH tTHL tpLH tpHL tpLH tpHL tpLH tpHL tpLH tpHL tpLH tpHL tpLH tpHL tpLH tpHL tpLH tpHL fmax Test Condition
⎯
Min
⎯
Typ. 4
Max 8
Unit ns
⎯
⎯
18
31
ns
⎯
⎯
10
20
ns
⎯
⎯
23
42
ns
⎯
⎯
21
35
ns
⎯
⎯
17
30
ns
⎯
⎯
11
17
ns
⎯
⎯
17
31
ns
⎯ ⎯
⎯
15 48
27
⎯
ns MHz
27
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TC74HC191AP/AF
AC Characteristics (CL = 50 pF, input: tr = tf = 6 ns)
Characteristics Symbol Test Condition VCC (V) 2.0
⎯
Ta = 25°C Min
⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯
Ta = −40~85°C Max 75 15 13 180 36 31 120 24 20 240 48 41 205 41 35 175 35 30 105 21 18 180 36 31 160 32 27
⎯ ⎯ ⎯
Typ. 30 8 7 88 22 19 52 13 11 108 27 23 100 25 22 84 21 18 56 14 12 84 21 18 72 18 15 11 44 52 5 101
Min
⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯
Max 95 19 16 225 45 38 150 30 26 300 60 51 255 51 43 220 44 37 130 26 22 225 45 38 200 40 34
⎯ ⎯ ⎯
Unit
Output transition time
tTLH tTHL
4.5 6.0 2.0
ns
Propagation delay time (CK-Q) Propagation delay time (CK- RCO ) Propagation delay time (CK-MAX/MIN) Propagation delay time ( LOAD -Q) Propagation delay time (DATA-Q) Propagation delay time ( ENABLE - RCO ) Propagation delay time (D/ U - RCO ) Propagation delay time (D/ U -MAX/MIN)
tpLH tpHL tpLH tpHL
⎯
4.5 6.0 2.0
ns
⎯
4.5 6.0 2.0
ns
tpLH tpHL
⎯
4.5 6.0 2.0
ns
tpLH tpHL
⎯
4.5 6.0 2.0
ns
tpLH tpHL
⎯
4.5 6.0 2.0
ns
tpLH tpHL
⎯
4.5 6.0 2.0
ns
tpLH tpHL
⎯
4.5 6.0 2.0
ns
tpLH tpHL
⎯
4.5 6.0 2.0
ns
5 25 29
⎯ ⎯
4 20 24
⎯ ⎯
Maximum clock frequency Input capacitance Power dissipation capacitance
fmax
⎯
4.5 6.0
MHz
CIN CPD (Note)
⎯ ⎯
10
⎯
10
⎯
pF pF
Note:
CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPD・VCC・fIN + ICC
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Package Dimensions
Weight: 1.00 g (typ.)
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Package Dimensions
Weight: 0.18 g (typ.)
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TC74HC191AP/AF
RESTRICTIONS ON PRODUCT USE
• The information contained herein is subject to change without notice.
20070701-EN GENERAL
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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