TC74HC259AF

TC74HC259AP/AF/AFN TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC74HC259AP,TC74HC259AF,TC74HC259AFN 8-Bit Addressable Latch The TC74HC259A is a high speed CMOS ADDRESSABLE LATCH fabricated with silicon gate C2MOS technology. It achieve the high speed operation similar to equivalent LSTTL while maintaining the CMOS low power dissipation. The respective bits are controlled by address inputs A, B, and C. When CLEAR input is held high and enable input G is held low, the data is written into the bit selected by address inputs, the other bit hold their previous conditions. When both CLEAR and G held high, writing of all bits is inhibited regardless of adress inputs, and their previous condition are held. When CLEAR is held low and G is held high, all bits are resent to low regardless of the other inputs. When both of CLEAR and G held low, all bits which isn’t selected by adress inputs are resent to low. All inputs are equipped with protection circuits against static discharge or transient excess voltage. Note: xxxFN (JEDEC SOP) is not available in Japan. TC74HC259AP TC74HC259AF Features • • • • • • High speed: tpd = 15 ns (typ.) at VCC = 5 V Low power dissipation: ICC = 4 μA (max) at Ta = 25°C High noise immunity: VNIH = VNIL = 28% VCC (min) Output drive capability: 10 LSTTL loads Symmetrical output impedance: |IOH| = IOL = 4 mA (min) ∼ Balanced propagation delays: tpLH − tpHL Wide operating voltage range: VCC (opr) = 2~6 V Pin and function compatible with 74LS259 TC74HC259AFN • • Pin Assignment Weight DIP16-P-300-2.54A SOP16-P-300-1.27A SOL16-P-150-1.27 : 1.00 g (typ.) : 0.18 g (typ.) : 0.13 g (typ.) 1 2007-10-01 TC74HC259AP/AF/AFN IEC Logic Symbol Truth Table Inputs CLEAR G L H L H Output of Addressed Latch D QiO D L Each Other Output QiO QiO L L Function Addressable Latch Memory 8-Line Demultriplexer Clear All Bits to “L” H H L L Select Inputs C L L L L H H H H B L L H H L L H H A L H L H L H L H Latch Addressed Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7 D: The level at the data input. QiO: The level before the indicared steady-state input conditions were established (i = 0, 1, .... 7) 2 2007-10-01 TC74HC259AP/AF/AFN System Diagram Absolute Maximum Ratings (Note 1) Characteristics Supply voltage range DC input voltage DC output voltage Input diode current Output diode current DC output current DC VCC/ground current Power dissipation Storage temperature Symbol VCC VIN VOUT IIK IOK IOUT ICC PD Tstg Rating −0.5~7.0 −0.5~VCC + 0.5 −0.5~VCC + 0.5 ±20 ±20 ±25 ±50 Unit V V V mA mA mA mA mW °C 500 (DIP) (Note 2)/180 (SOP) −65~150 Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: 500 mW in the range of Ta = −40~65°C. From Ta = 65 to 85°C a derating factor of −10 mW/°C should be applied until 300 mW. 3 2007-10-01 TC74HC259AP/AF/AFN Operating Ranges (Note) Characteristics Supply voltage Input voltage Output voltage Operating temperature Symbol VCC VIN VOUT Topr Rating 2~6 0~VCC 0~VCC −40~85 Unit V V V °C 0~1000 (VCC = 2.0 V) Input rise and fall time tr, tf 0~500 (VCC = 4.5 V) 0~400 (VCC = 6.0 V) ns Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND. Electrical Characteristics DC Characteristics Test Condition Characteristics Symbol VCC (V) 2.0 High-level input voltage VIH ⎯ Ta = 25°C Min 1.50 3.15 4.20 ⎯ ⎯ ⎯ Ta = −40~85°C Max ⎯ ⎯ ⎯ Typ. ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ Min 1.50 3.15 4.20 ⎯ ⎯ ⎯ Max ⎯ ⎯ ⎯ Unit 4.5 6.0 2.0 V 0.50 1.35 1.80 ⎯ ⎯ ⎯ ⎯ ⎯ 0.50 1.35 1.80 ⎯ ⎯ ⎯ ⎯ ⎯ Low-level input voltage VIL ⎯ 4.5 6.0 2.0 V 1.9 4.4 5.9 4.18 5.68 ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ 2.0 4.5 6.0 4.31 5.80 0.0 0.0 0.0 0.17 0.18 ⎯ ⎯ 1.9 4.4 5.9 4.13 5.63 ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ High-level output voltage VOH VIN = VIH or VIL IOH = −20 μA IOH = −4 mA IOH = −5.2 mA IOL = 20 μA IOL = 4 mA IOL = 5.2 mA 4.5 6.0 4.5 6.0 2.0 V 0.1 0.1 0.1 0.26 0.26 ±0.1 0.1 0.1 0.1 0.33 0.33 ±1.0 μA μA Low-level output voltage VOL VIN = VIH or VIL 4.5 6.0 4.5 6.0 6.0 6.0 V Input leakage current Quiescent supply current IIN ICC VIN = VCC or GND VIN = VCC or GND 4.0 40.0 4 2007-10-01 TC74HC259AP/AF/AFN Timing Requirements (input: tr = tf = 6 ns) Characteristics Symbol Test Condition VCC (V) Minimum pulse width (G ) 2.0 tW (L) ⎯ Ta = 25°C Typ. ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ Ta = −40 ~85°C Limit 95 19 16 95 19 16 60 12 11 30 6 5 30 6 5 0 0 0 Unit Limit 75 15 13 75 15 13 50 10 9 25 5 5 25 5 5 0 0 0 4.5 6.0 2.0 ns Minimum pulse width ( CLEAR ) tW (L) ⎯ 4.5 6.0 2.0 ns Minimum set-up time (DATA) ts ⎯ 4.5 6.0 2.0 ns Minimum set-up time (A, B, C) ts ⎯ 4.5 6.0 2.0 ns Minimum hold time (DATA) th ⎯ 4.5 6.0 2.0 ns Minimum hold time (A, B, C) th ⎯ 4.5 6.0 ns AC Characteristics (CL = 15 pF, VCC = 5 V, Ta = 25°C, input: tr = tf = 6 ns) Characteristics Output transition time Propagation delay time (DATA-Q) Propagation delay time (A, B, C-Q) Propagation delay time ( G -Q) Propagation delay time ( CLEAR -Q) Symbol tTLH tTHL tpLH tpHL tpLH tpHL tpLH tpHL tpHL Test Condition ⎯ Min ⎯ Typ. 4 Max 8 Unit ns ⎯ ⎯ 15 22 ns ⎯ ⎯ 21 32 ns ⎯ ⎯ 16 28 ns ⎯ ⎯ 13 23 ns 5 2007-10-01 TC74HC259AP/AF/AFN AC Characteristics (CL = 50 pF, input: tr = tf = 6 ns) Test Condition Characteristics Symbol VCC (V) 2.0 ⎯ Ta = 25°C Min ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ Ta = −40~85°C Max 75 15 13 130 26 22 185 37 31 165 33 28 135 27 23 10 ⎯ Typ. 30 8 7 56 18 15 83 25 21 67 20 17 52 16 14 5 35 Min ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ Max 95 19 16 165 33 28 230 46 39 205 41 35 170 34 29 10 ⎯ Unit Output transition time tTLH tTHL 4.5 6.0 2.0 ns Propagation delay time (DATA-Q) Propagation delay time (A, B, C-Q) Propagation delay time ( G -Q) Propagation delay time ( CLEAR -Q) Input capacitance Power dissipation capacitance tpLH tpHL tpLH tpHL tpLH tpHL ⎯ 4.5 6.0 2.0 ns ⎯ 4.5 6.0 2.0 ns ⎯ 4.5 6.0 2.0 ns tpHL ⎯ 4.5 6.0 ns CIN CPD (Note) ⎯ ⎯ pF pF Note: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPD･VCC･fIN + ICC 6 2007-10-01 TC74HC259AP/AF/AFN Package Dimensions Weight: 1.00 g (typ.) 7 2007-10-01 TC74HC259AP/AF/AFN Package Dimensions Weight: 0.18 g (typ.) 8 2007-10-01 TC74HC259AP/AF/AFN Package Dimensions (Note) Note: This package is not available in Japan. Weight: 0.13 g (typ.) 9 2007-10-01 TC74HC259AP/AF/AFN RESTRICTIONS ON PRODUCT USE • The information contained herein is subject to change without notice. 20070701-EN GENERAL • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 10 2007-10-01