TC74HC7292AP/AF
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC74HC7292AP, TC74HC7292AF
Programmable Divider/Timer
The TC74HC7292A is a high speed CMOS PROGRAMMABLE
DIVIDER/TIMER fabricated with silicon gate C2MOS technology.
It achieves the high speed operation similar to equivalent LSTTL
while maintaining the CMOS low power dissipation.
The TC74HC7292A can divide from 22 to 231.
CK1 and CK2 are clock inputs, either one may be used for clock
gating.
It features an active-low clear input to initialize the state of all
flip-flops.
To facilitate incoming inspection, test points are provided. (TP1,
TP2 and TP3)
All inputs are equipped with protection circuits against static
discharge or transient excess voltage.
TC74HC7292AP
TC74HC7292AF
Features
High speed: fmax = 70 MHz (typ.) at VCC = 5 V
Low power dissipation: ICC = 4 μA (max) at Ta = 25°C
High noise immunity: VNIH = VNIL = 28% VCC (min)
Output drive capability: 10 LSTTL loads
Weight
DIP16-P-300-2.54A
SOP16-P-300-1.27A
Symmetrical output impedance: |IOH| = IOL = 4 mA (min)
∼ tpHL
Balanced propagation delays: tpLH −
: 1.00 g (typ.)
: 0.18 g (typ.)
Wide operating voltage range: VCC (opr) = 2 to 6 V
Pin and function compatible with 74LS292
Pin Assignment
Start of commercial production
1988-11
© 2001-2017
Toshiba Electronic Devices & Storage Corporation
1
2017-09-21
TC74HC7292AP/AF
IEC Logic Symbol
Truth Table
CLR
CK1
CK2
Q Output Mode
L
X
X
Cleared to L
H
L
H
L
H
H
X
H
X
H
Up Count
No Change
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Toshiba Electronic Devices & Storage Corporation
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2017-09-21
TC74HC7292AP/AF
Frequency Division
Programming
Inputs
Q
TP1
TP2
TP3
E
D
C
B
A Binary
Decimal Binary
Decimal Binary
Decimal Binary
Decimal
L
L
L
L
L Inhibit
Inhibit Inhibit
Inhibit Inhibit
Inhibit Inhibit
Inhibit
L
L
L
L
H Inhibit
Inhibit Inhibit
Inhibit Inhibit
Inhibit Inhibit
Inhibit
L
L
L
H
L 2
4 2
512 2
131,072 2
16,777,216
L
L
L
H
H 2
8 2
512 2
131,072 2
16,777,216
L
L
H
L
L 2
16 2
512 2
24
131,072 2
16,777,216
L
L
H
L
H 25
32 29
512 217
131,072 224
16,777,216
L
L
H
H
L 2
64 2
512 2
131,072 2
16,777,216
L
L
H
H
H 2
128 2
512 2
131,072 2
16,777,216
L
H
L
L
L 2
256 2
512 2
2
131,072 2
4
L
H
L
L
H 29
512 29
512 217
131,072 22
4
L
H
L
H
L 2
1,024 2
512 2
131,072 2
16
L
H
L
H
H 2
2,048 2
512 2
131,072 2
16
L
H
H
L
L 2
4,096 2
512 2
131,072 2
64
L
H
H
L
H 2
8,192 2
512 2
131,072 2
L
H
H
H
L 214
16,384 29
L
H
H
H
H 215
H
L
L
L
H
L
L
H
L
H
L
H
2
3
4
6
7
8
10
11
12
9
17
9
17
9
17
9
17
9
17
9
17
9
17
9
17
9
17
24
24
24
24
4
4
6
6
64
512 Disabled Low
28
256
32,768 29
512 Disabled Low
28
256
L 2
65,536 2
512 2
8 2
1,024
L
H 2
131,072 2
512 2
8 2
1,024
L
H
L 2
262,144 2
512 2
12
32 2
4,096
L
H
H 219
524,288 29
512 25
32 212
4,096
L
H
L
L 220
1,048,576 29
512 27
128 214
16,384
H
L
H
L
H 2
2,097,152 2
512 2
128 2
16,384
H
L
H
H
L 2
4,194,304 Disabled Low
2
512 2
65,536
H
L
H
H
H 2
8,388,608 Disabled Low
H
H
L
L
L 224
16,777,216 23
H
H
L
L
H 225
33,554,432 23
H
H
L
H
L 2
67,108,864 2
32 2
8,192 2
1,048,576
H
H
L
H
H 2
134,217,728 2
32 2
8,192 2
1,048,576
H
H
H
L
L 2
268,435,456 2
128 2
22
32,768 2
4,194,304
H
H
H
L
H 229
536,870,912 27
128 215
32,768 222
4,194,304
H
H
H
H
L 2
1,073,741,824 2
512 2
131,072 2
16,777,216
H
H
H
H
H 2
2,147,483,648 2
512 2
131,072 2
16,777,216
13
16
17
18
21
22
23
26
27
28
30
31
9
17
9
3
9
3
9
5
9
7
9
© 2001-2017
Toshiba Electronic Devices & Storage Corporation
512 2
65,536
2,048 218
262,144
8 211
2,048 218
262,144
15
9
17
9
17
3
16
2
13
7
14
8 211
13
5
10
16
9
5
10
20
20
24
24
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TC74HC7292AP/AF
System Diagram
© 2001-2017
Toshiba Electronic Devices & Storage Corporation
4
2017-09-21
TC74HC7292AP/AF
Absolute Maximum Ratings
Characteristics
Symbol
Rating
Unit
Supply voltage range
VCC
-0.5 to 7
V
DC input voltage
VIN
-0.5 to VCC + 0.5
V
DC output voltage
VOUT
-0.5 to VCC + 0.5
V
Input diode current
IIK
±20
mA
Output diode current
IOK
±20
mA
DC output current
IOUT
±25
mA
DC VCC/ground current
ICC
±50
mA
Power dissipation
PD
500 (DIP) (Note 1)/180 (SOP)
mW
Storage temperature
Tstg
-65 to 150
°C
Note:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even
destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant
change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating
conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the
operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
Note 1: 500 mW in the range of Ta = -40 to 65°C. From Ta = 65 to 85°C a derating factor of -10 mW/°C shall be applied
until 300 mW.
Operating Ranges
Characteristics
Symbol
Rating
Unit
Supply voltage
VCC
2 to 6
V
Input voltage
VIN
0 to VCC
V
VOUT
0 to VCC
V
Operating temperature
Topr
-40 to 85
°C
Input rise and fall time
tr, tf
0 to 1000 (VCC = 2.0 V)
0 to 500 (VCC = 4.5 V)
0 to 400 (VCC = 6.0 V)
ns
Output voltage
Note:
The operating ranges must be maintained to ensure the normal operation of the device.
Unused inputs must be tied to either VCC or GND.
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Toshiba Electronic Devices & Storage Corporation
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TC74HC7292AP/AF
Electrical Characteristics
DC Characteristics
Characteristics
Test Condition
Symbol
Ta =
-40 to 85°C
Ta = 25°C
VCC
(V)
Min
Typ.
Max
Min
Max
Unit
High-level input
voltage
VIH
2.0
4.5
6.0
1.50
3.15
4.20
1.50
3.15
4.20
V
Low-level input
voltage
VIL
2.0
4.5
6.0
0.50
1.35
1.80
0.50
1.35
1.80
V
IOH = -20 μA
2.0
4.5
6.0
1.9
4.4
5.9
2.0
4.5
6.0
1.9
4.4
5.9
IOH = -4 mA
IOH = -5.2 mA
4.5
6.0
4.18
5.68
4.31
5.80
4.13
5.63
IOL = 20 μA
2.0
4.5
6.0
0.0
0.0
0.0
0.1
0.1
0.1
0.1
0.1
0.1
4.5
6.0
0.17
0.18
0.26
0.26
0.33
0.33
High-level output
voltage (Q)
Low-level output
voltage (Q)
VOH
VOL
VIN
= VIH or VIL
VIN
= VIH or VIL
IOL = 4 mA
IOL = 5.2 mA
V
V
Input leakage
current
IIN
VIN = VCC or GND
6.0
±0.1
±1.0
μA
Quiescent supply
current
ICC
VIN = VCC or GND
6.0
4.0
40.0
μA
Ta = 25°C
Ta =
-40 to
85°C
Unit
Timing Requirements (input: tr = tf = 6 ns)
Characteristics
Symbol
Test Condition
VCC (V)
Typ.
Limit
Limit
Minimum pulse width
(CK)
tW (L)
tW (H)
2.0
4.5
6.0
75
15
13
95
19
16
ns
Minimum pulse width
( CLR )
tW (L)
2.0
4.5
6.0
175
35
30
220
44
37
ns
trem
2.0
4.5
6.0
5
5
5
5
5
5
ns
f
2.0
4.5
6.0
5
27
32
4
22
26
MHz
Minimum removal time
Clock frequency
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Toshiba Electronic Devices & Storage Corporation
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TC74HC7292AP/AF
AC Characteristics (CL = 15 pF, VCC = 5 V, Ta = 25°C, input: tr = tf = 6 ns)
Characteristics
Symbol
Test Condition
Min
Typ.
Max
Unit
Output transition time
(Q)
tTLH
tTHL
―
4
8
ns
Output transition time
(TP)
tTLH
tTHL
―
25
44
ns
Propagation delay time
(CK-Q)
tpLH
42
75
ns
tpHL
Propagation delay time
( CLR -Q)
tpHL
36
62
ns
Maximum clock frequency
fmax
30
70
MHz
AC Characteristics (CL = 50 pF, input: tr = tf = 6 ns)
Characteristics
Symbol
Output transition time
(Q)
tTLH
tTHL
Output transition time
(TP)
tTLH
tTHL
Propagation delay
time
(CK-Q)
tpLH
Test Condition
tpHL
Ta =
-40 to 85°C
Ta = 25°C
Unit
VCC
(V)
Min
Typ.
Max
Min
Max
2.0
4.5
6.0
27
9
8
75
15
13
95
19
16
ns
2.0
4.5
6.0
90
30
25
250
50
43
315
63
54
ns
2.0
4.5
6.0
150
48
41
425
85
72
530
106
90
ns
Propagation delay
time
( CLR -Q)
tpHL
2.0
4.5
6.0
130
42
36
350
70
60
440
88
75
ns
Maximum clock
frequency
fmax
2.0
4.5
6.0
5
27
32
20
64
75
4
22
26
MHz
Input capacitance
CIN
5
10
10
pF
Power dissipation
capacitance
CPD
22
pF
Note:
(Note)
CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current
consumption without load.
Average operating current can be obtained by the equation:
ICC (opr) = CPD･VCC･fIN + ICC
© 2001-2017
Toshiba Electronic Devices & Storage Corporation
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TC74HC7292AP/AF
Package Dimensions
Weight: 1.00 g (typ.)
© 2001-2017
Toshiba Electronic Devices & Storage Corporation
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2017-09-21
TC74HC7292AP/AF
Package Dimensions
Weight: 0.18 g (typ.)
© 2001-2017
Toshiba Electronic Devices & Storage Corporation
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2017-09-21
TC74HC7292AP/AF
RESTRICTIONS ON PRODUCT USE
Toshiba Corporation and its subsidiaries and affiliates are collectively referred to as “TOSHIBA”.
Hardware, software and systems described in this document are collectively referred to as “Product”.
• TOSHIBA reserves the right to make changes to the information in this document and related Product without notice.
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written permission, reproduction is permissible only if reproduction is without alteration/omission.
• Though TOSHIBA works continually to improve Product's quality and reliability, Product can malfunction or fail. Customers are responsible for
complying with safety standards and for providing adequate designs and safeguards for their hardware, software and systems which
minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily injury or damage to
property, including data loss or corruption. Before customers use the Product, create designs including the Product, or incorporate the
Product into their own applications, customers must also refer to and comply with (a) the latest versions of all relevant TOSHIBA information,
including without limitation, this document, the specifications, the data sheets and application notes for Product and the precautions and
conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the instructions for the application with which the Product
will be used with or for. Customers are solely responsible for all aspects of their own product design or applications, including but not limited
to (a) determining the appropriateness of the use of this Product in such design or applications; (b) evaluating and determining the
applicability of any information contained in this document, or in charts, diagrams, programs, algorithms, sample application circuits, or any
other referenced documents; and (c) validating all operating parameters for such designs and applications. TOSHIBA ASSUMES NO
LIABILITY FOR CUSTOMERS' PRODUCT DESIGN OR APPLICATIONS.
• PRODUCT IS NEITHER INTENDED NOR WARRANTED FOR USE IN EQUIPMENTS OR SYSTEMS THAT REQUIRE
EXTRAORDINARILY HIGH LEVELS OF QUALITY AND/OR RELIABILITY, AND/OR A MALFUNCTION OR FAILURE OF WHICH MAY
CAUSE LOSS OF HUMAN LIFE, BODILY INJURY, SERIOUS PROPERTY DAMAGE AND/OR SERIOUS PUBLIC IMPACT
("UNINTENDED USE"). Except for specific applications as expressly stated in this document, Unintended Use includes, without limitation,
equipment used in nuclear facilities, equipment used in the aerospace industry, medical equipment, equipment used for automobiles, trains,
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ACCURACY OF INFORMATION, OR NONINFRINGEMENT.
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the design, development, use, stockpiling or manufacturing of nuclear, chemical, or biological weapons or missile technology products (mass
destruction weapons). Product and related software and technology may be controlled under the applicable export laws and regulations
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use Product in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances, including
without limitation, the EU RoHS Directive. TOSHIBA ASSUMES NO LIABILITY FOR DAMAGES OR LOSSES OCCURRING AS A RESULT
OF NONCOMPLIANCE WITH APPLICABLE LAWS AND REGULATIONS.
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