TC74VCX02FT/FK
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC74VCX02FT,TC74VCX02FK
Low-Voltage Quad 2-Input NOR Gate with 3.6-V Tolerant Inputs and Outputs
The TC74VCX02FT/FK is a high-performance CMOS 2-input NOR gate which is guaranteed to operate from 1.2-V to 3.6-V. Designed for use in 1.5V, 1.8V, 2.5V or 3.3V systems, it achieves high-speed operation while maintaining the CMOS low power dissipation. It is also designed with overvoltage tolerant inputs and outputs up to 3.6 V. All inputs are equipped with protection circuits against static discharge.
TC74VCX02FT
Features
• • Low-voltage operation: VCC = 1.2~3.6 V High-speed operation : tpd = 2.8 ns (max) (VCC = 3.0~3.6 V) : tpd = 3.7 ns (max) (VCC = 2.3~2.7 V) : tpd = 7.4 ns (max) (VCC = 1.65~1.95 V) : tpd = 14.8 ns (max) (VCC = 1.4~1.6 V) : tpd = 37.0 ns (max) (VCC = 1.2 V) • Output current: IOH/IOL = ±24 mA (min) (VCC = 3.0 V) : IOH/IOL = ±18 mA (min) (VCC = 2.3 V) : IOH/IOL = ±6 mA (min) (VCC = 1.65 V) : IOH/IOL = ±2 mA (min) (VCC = 1.4 V) • • • • Latch-up performance: −300 mA ESD performance: Machine model ≥ ±200 V Human body model ≥ ±2000 V Package: TSSOP and VSSOP (US) Power-down protection provided on all inputs and outputs
TC74VCX02FK
Weight TSSOP14-P-0044-0.65A VSSOP14-P-0030-0.50
: 0.06 g (typ.) : 0.02 g (typ.)
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Pin Assignment (top view) IEC Logic Symbol
1A 1B 2A 2B 3A 3B 4A 4B 2 3 5 6 8 9 11 12
>1
1Y 1A 1B 2Y 2A 2B GND
1 2 3 4 5 6 7
14 13 12 11 10 9 8
VCC 4Y 4B 4A 3Y 3B 3A
1 4 10 13
1Y 2Y 3Y 4Y
Truth Table
Inputs A L L H H B L H L H Outputs Y H L L L
Absolute Maximum Ratings (Note 1)
Characteristics Power supply voltage DC input voltage DC output voltage Input diode current Output diode current DC output current Power dissipation DC VCC/ground current Storage temperature Symbol VCC VIN VOUT IIK IOK IOUT PD ICC/IGND Tstg Rating −0.5~4.6 −0.5~4.6 −0.5~4.6 (Note 2) Unit V V V mA (Note 4) mA mA mW mA °C
−0.5~VCC + 0.5(Note 3) −50 ±50 ±50 180 ±100 −65~150
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: VCC = 0 V Note 3: High or low state. IOUT absolute maximum rating must be observed. Note 4: VOUT < GND, VOUT > VCC
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Operating Ranges (Note 1)
Characteristics Power supply voltage Input voltage Output voltage Symbol VCC VIN VOUT Rating 1.2~3.6 −0.3~3.6 0~3.6 0~VCC ±24 Output current IOH/IOL ±18 ±6 ±2 Operating temperature Input rise and fall time Topr dt/dv −40~85 0~10 (Note 8) (Note 2) (Note 3) (Note 4) (Note 5) (Note 6) (Note 7) °C ns/V mA Unit V V V
Note 1: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND. Note 2: VCC = 0 V Note 3: High or low state Note 4: VCC = 3.0~3.6 V Note 5: VCC = 2.3~2.7 V Note 6: VCC = 1.65~1.95 V Note 7: VCC = 1.4~1.6 V Note 8: VIN = 0.8~2.0 V, VCC = 3.0 V
Electrical Characteristics
< DC Characteristics (Ta = −40 to 85°C, 2.7 V < VCC = 3.6 V)
Characteristics H-level L-level Symbol VIH VIL Test Condition ⎯ ⎯ IOH = −100 μA H-level VOH VIN = VIL IOH = −12 mA IOH = −18 mA Output voltage IOH = −24 mA IOL = 100 μA L-level VOL VIN = VIH or VIL IOL = 12 mA IOL = 18 mA IOL = 24 mA Input leakage current Power-off leakage current Quiescent supply current Increase in ICC per input IIN IOFF ICC ΔICC VIN = 0 to 3.6 V VIN, VOUT = 0 to 3.6 V VIN = VCC or GND VCC < VIN < 3.6 V = = VIH = VCC − 0.6 V VCC (V) 2.7~3.6 2.7~3.6 2.7~3.6 2.7 3.0 3.0 2.7~3.6 2.7 3.0 3.0 2.7~3.6 0 2.7~3.6 2.7~3.6 2.7~3.6 Min 2.0 ⎯ VCC − 0.2 2.2 2.4 2.2 ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ Max ⎯ 0.8 ⎯ ⎯ ⎯ ⎯ 0.2 0.4 0.4 0.55 ±5.0 10.0 20.0 ±20.0 750 μA μA μA V Unit
Input voltage
V
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< < DC Characteristics (Ta = −40 to 85°C, 2.3 V = VCC = 2.7 V)
Characteristics H-level L-level Symbol VIH VIL Test Condition ⎯ ⎯ IOH = −100 μA H-level Output voltage VOH VIN = VIL IOH = −6 mA IOH = −12 mA IOH = −18 mA IOL = 100 μA L-level VOL VIN = VIH or VIL IOL = 12 mA IOL = 18 mA Input leakage current Power-off leakage current Quiescent supply current IIN IOFF ICC VIN = 0 to 3.6 V VIN, VOUT = 0 to 3.6 V VIN = VCC or GND VCC < VIN < 3.6 V = = VCC (V) 2.3~2.7 2.3~2.7 2.3~2.7 2.3 2.3 2.3 2.3~2.7 2.3 2.3 2.3~2.7 0 2.3~2.7 2.3~2.7 Min 1.6 ⎯ VCC − 0. 2 2.0 1.8 1.7 ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ Max ⎯ 0.7 ⎯ ⎯ ⎯ ⎯ 0.2 0.4 0.6 ±5.0 10.0 20.0 ±20.0 μA μA μA V Unit
Input voltage
V
< DC Characteristics (Ta = −40 to 85°C, 1.65 V = VCC < 2.3 V)
Characteristics Symbol Test Condition ⎯ ⎯ IOH = −100 μA IOH = −6 mA L-level Input leakage current Power-off leakage current Quiescent supply current VOL IIN IOFF ICC VIN = VIH or VIL VIN = 0 to 3.6 V VIN, VOUT = 0 to 3.6 V VIN = VCC or GND VCC < VIN < 3.6 V = = IOL = 100 μA IOL = 6 mA VCC (V) 1.65~2.3 1.65~2.3 1.65~2.3 1.65 1.65~2.3 1.65 1.65~2.3 0 1.65~2.3 1.65~2.3 Min 0.65 × VCC ⎯ VCC − 0.2 1.25 ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ Max ⎯ 0.2 × VCC ⎯ ⎯ 0.2 0.3 ±5.0 10.0 20.0 ±20.0 μA μA μA V V Unit
H-level Input voltage L-level
VIH VIL
H-level Output voltage
VOH
VIN = VIL
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< DC Characteristics (Ta = −40 to 85°C, 1.4 V = VCC < 1.65 V)
Characteristics Symbol Test Condition ⎯ ⎯ IOH = −100 μA IOH = −2 mA L-level Input leakage current Power-off leakage current Quiescent supply current VOL IIN IOFF ICC VIN = VIH or VIL VIN = 0 to 3.6 V VIN, VOUT = 0 to 3.6 V VIN = VCC or GND VCC < VIN < 3.6 V = = IOL = 100 μA IOL = 2 mA VCC (V) 1.4~1.65 1.4~1.65 1.4~1.65 1.4 1.4~1.65 1.4 1.4~1.65 0 1.4~1.65 1.4~1.65 Min 0.65 × VCC ⎯ VCC − 0.2 1.05 ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ Max ⎯ 0.05 × VCC ⎯ ⎯ 0.05 0.35 ±5.0 10.0 20.0 ±20.0 μA μA μA V V Unit
H-level Input voltage L-level
VIH VIL
H-level Output voltage
VOH
VIN = VIL
< DC Characteristics (Ta = −40 to 85°C, 1.2 V = VCC < 1.4 V)
Characteristics Symbol Test Condition ⎯ ⎯ VIN = VIL VIN = VIH or VIL VIN = 0 to 3.6 V VIN, VOUT = 0 to 3.6 V VIN = VCC or GND VCC < VIN < 3.6 V = = IOH = −100 μA IOL = 100 μA VCC (V) 1.2~1.4 1.2~1.4 1.2 1.2 1.2 0 1.2 1.2 Min 0.8 × VCC ⎯ VCC − 0.1 ⎯ ⎯ ⎯ ⎯ ⎯ Max ⎯ 0.05 × VCC ⎯ 0.05 ±5.0 10.0 20.0 ±20.0 μA μA μA V Unit
H-level Input voltage L-level H-level L-level Input leakage current Power-off leakage current Quiescent supply current
VIH VIL VOH VOL IIN IOFF ICC
Output voltage
V
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AC Characteristics (Ta = −40 to 85°C, input: tr = tf = 2.0 ns) (Note 1)
Characteristics Symbol Test Condition VCC (V) 1.2 1.5 ± 0.1 1.8 ± 0.15 CL = 30 pF, RL = 500 Ω 2.5 ± 0.2 3.3 ± 0.3 CL = 15 pF, RL = 2 kΩ Output to output skew tosLH tosHL (Note 2) CL = 30 pF, RL = 500 Ω 1.2 1.5 ± 0.1 1.8 ± 0.15 2.5 ± 0.2 3.3 ± 0.3 Min 3.0 2.0 1.5 0.8 0.6 ⎯ ⎯ ⎯ ⎯ ⎯ Max 37.0 14.8 7.4 3.7 2.8 1.5 1.5 0.5 0.5 0.5 ns ns Unit
CL = 15 pF, RL = 2 kΩ Propagation delay time tpLH tpHL Figure 1, Figure 2
Note 1: For CL = 50 pF, add approximately 300 ps to the AC maximum specification. Note 2: Parameter guaranteed by design. (tosLH = |tpLHm − tpLHn|, tosHL = |tpHLm − tpHLn|)
Dynamic Switching Characteristics (Ta = 25°C, input: tr = tf = 2.0 ns, CL = 30 pF)
Characteristics Symbol Test Condition VIH = 1.8 V, VIL = 0 V Quiet output maximum dynamic VOL VOLP VIH = 2.5 V, VIL = 0 V VIH = 3.3 V, VIL = 0 V VIH = 1.8 V, VIL = 0 V Quiet output minimum dynamic VOL VOLV VIH = 2.5 V, VIL = 0 V VIH = 3.3 V, VIL = 0 V VIH = 1.8 V, VIL = 0 V Quiet output minimum dynamic VOH VOHV VIH = 2.5 V, VIL = 0 V VIH = 3.3 V, VIL = 0 V (Note) (Note) (Note) (Note) (Note) (Note) (Note) (Note) (Note) VCC (V) 1.8 2.5 3.3 1.8 2.5 3.3 1.8 2.5 3.3 Typ. 0.25 0.6 0.8 −0.25 −0.6 −0.8 1.5 1.9 2.2 V V V Unit
Note:
Parameter guaranteed by design.
Capacitive Characteristics (Ta = 25°C)
Characteristics Input capacitance Power dissipation capacitance Symbol CIN CPD fIN = 10 MHz Test Condition ⎯ VCC (V) 1.8, 2.5, 3.3 (Note) 1.8, 2.5, 3.3 Typ. 6 20 Unit pF pF
Note:
CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPD・VCC・fIN + ICC/4 (per gate)
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AC Test Circuit
Output CL RL VCC Symbol 3.3 ± 0.3 V 2.5 ± 0.2 V 1.8 ± 0.15 V 500 Ω 30 pF 1.5 ± 0.1 V 1.2V 2 kΩ 15 pF Measure
RL CL
Figure 1
AC Waveform
tf 2.0 ns Input (A) tr 2.0 ns 90% VM VIH
10%
Output (Y) tpLH
VOH VM tpHL VOL
Symbol VIH VM
VCC 3.3 ± 0.3 V 2.7 V 1.5 V 2.5 ± 0.2 V VCC VCC/2 1.8 ± 0.15 V VCC VCC/2 1.5 ± 0.1 V VCC VCC/2 1.2 V VCC VCC/2
Figure 2 tpLH, tpHL
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Package Dimensions
Weight: 0.06 g (typ.)
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Package Dimensions
Weight: 0.02 g (typ.)
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RESTRICTIONS ON PRODUCT USE
• The information contained herein is subject to change without notice.
20070701-EN GENERAL
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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