TC74VCX16245FT
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC74VCX16245FT
Low-Voltage 16-Bit Bus Transceiver with 3.6-V Tolerant Inputs and Outputs
The TC74VCX16245FT is a high-performance CMOS 16-bit bus transceiver. Designed for use in 1.8-V, 2.5-V or 3.3-V systems, it achieves high-speed operation while maintaining the CMOS low power dissipation. It is also designed with overvoltage tolerant inputs and outputs up to 3.6 V. This 16-bit bus transceiver is controlled by direction control (DIR) inputs and output enable (OE) inputs which are common to each byte. It can be used as two 8-bit transceivers or one 16-bit transceiver. The direction of data transmission is determined by the level of the DIR inputs. The OE inputs can be used to disable the device so that the busses are effectively isolated. All inputs are equipped with protection circuits against static discharge.
Weight: 0.25 g (typ.)
Features (Note)
• • Low-voltage operation: VCC = 1.8 to 3.6 V High-speed operation: tpd = 2.5 ns (max) (VCC = 3.0 to 3.6 V) : tpd = 3.0 ns (max) (VCC = 2.3 to 2.7 V) : tpd = 5.0 ns (max) (VCC = 1.8 V) • Output current: IOH/IOL = ±24 mA (min) (VCC = 3.0 V) : IOH/IOL = ±18 mA (min) (VCC = 2.3 V) : IOH/IOL = ±6 mA (min) (VCC = 1.8 V) • • • • • Latch-up performance: −300 mA ESD performance: Machine model ≥ ±200 V Human body model ≥ ±2000 V Package: TSSOP Bidirectional interface between 2.5 V and 3.3 V signals. 3.6-V tolerant function and power-down protection provided on all inputs and outputs Note: Do not apply a signal to any bus pins when it is in the output mode. Damage may result. All floating (high impedance) bus pins must have their input level fixed by means of pull-up or pull-down resistors.
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Pin Assignment (top view) IEC Logic Symbol
1OE
1DIR 1B1 1B2 GND 1B3 1B4 VCC 1B5 1B6
1 2 3 4 5 6 7 8 9
48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25
1OE
1A1
1DIR
2OE
48 1 25 24
1A2 GND 1A3 1A4 VCC 1A5 1A6 GND 1A7 1A8 2A1 2A2 GND 2A3 2A4 VCC 2A5 2A6 GND 2A7 2A8
2DIR
G3 3 EN1 (BA) 3 EN2 (AB) G6 6 EN4 (BA) 6 EN5 (AB)
1A1 1A2 1A3 1A4 1A5 1A6 1A7 1A8 2A1 2A2 2A3 2A4 2A5 2A6 2A7 2A8
47 46 44 43 41 40 38 37 36 35 33 32 30 29 27 26
1 2
2 3 5 6 8 9 11 12 13 14 16 17 19 20 22 23
1B1 1B2 1B3 1B4 1B5 1B6 1B7 1B8 2B1 2B2 2B3 2B4 2B5 2B6 2B7 2B8
GND 10 1B7 11 1B8 12 2B1 13 2B2 14 GND 15 2B3 16 2B4 17 VCC 18 2B5 19 2B6 20 GND 21 2B7 22 2B8 23 2DIR 24
4 5
2OE
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Truth Table
Inputs 1OE L L H 1DIR L H X Function Bus 1A1-1A8 Output Input Z Bus 1B1-1B8 Input Output Outputs
A=B B=A Z
Inputs 2OE L L H 2DIR L H X
Function Bus 2A1-2A8 Output Input Z Bus 2B1-2B8 Input Output Outputs
A=B B=A Z
X: Don’t care Z : High impedance
System Diagram
1DIR 1OE 2OE 2DIR
1A1
1B1
2B1
2A1
1/8
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Absolute Maximum Ratings (Note 1)
Characteristics Power supply voltage DC input voltage (DIR, OE ) DC bus I/O voltage Input diode current Output diode current DC output current Power dissipation DC VCC/ground current per supply pin Storage temperature Symbol VCC VIN Rating
−0.5 to 4.6 −0.5 to 4.6 −0.5 to 4.6 (Note 2)
Unit V V
VI/O IIK IOK IOUT PD ICC/IGND Tstg
−0.5 to VCC + 0.5
V mA
(Note 3)
−50 ±50 ±50
(Note 4)
mA mA mW mA °C
400
±100 −65 to 150
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: OFF state Note 3: High or low state. IOUT absolute maximum rating must be observed.
Operating Ranges (Note 1)
Characteristics Power supply voltage Input voltage (DIR, OE ) Bus I/O voltage
Note 4: VOUT < GND, VOUT > VCC
Symbol VCC VIN VI/O
Rating 1.8 to 3.6 1.2 to 3.6
−0.3 to 3.6
Unit V V (Note 3) (Note 4) (Note 5) (Note 6) (Note 7) °C (Note 8) ns/V mA V
(Note 2)
0 to 3.6 0 to VCC
±24 ±18 ±6 −40 to 85
Output current Operating temperature Input rise and fall time
IOH/IOL Topr dt/dv
0 to 10
Note 1: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs and bus inputs must be tied to either VCC or GND. Please connect both bus inputs and the bus outputs with VCC or GND when the I/O of the bus terminal changes by the function. In this case, please note that the output is not short-circuited. Note 2: Data retention only Note 3: OFF state Note 4: High or low state Note 5: VCC = 3.0 to 3.6 V Note 6: VCC = 2.3 to 2.7 V Note 7: VCC = 1.8 V Note 8: VIN = 0.8 to 2.0 V, VCC = 3.0 V
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Electrical Characteristics
< DC Characteristics (Ta = −40 to 85°C, 2.7 V < VCC = 3.6 V)
Characteristics H-level L-level Symbol VIH VIL Test Condition
⎯ ⎯
VCC (V) 2.7 to 3.6 2.7 to 3.6
Min 2.0
⎯
Max
⎯
Unit
Input voltage
0.8
⎯ ⎯ ⎯ ⎯
V
IOH = −100 μA H-level VOH VIN = VIH or VIL IOH = −12 mA IOH = −18 mA Output voltage IOH = −24 mA IOL = 100 μA L-level VOL VIN = VIH or VIL IOL = 12 mA IOL = 18 mA IOL = 24 mA Input leakage current 3-state output OFF state current Power-off leakage current Quiescent supply current Increase in ICC per input IIN IOZ IOFF ICC
ΔICC
2.7 to 3.6 2.7 3.0 3.0 2.7 to 3.6 2.7 3.0 3.0 2.7 to 3.6 2.7 to 3.6 0 2.7 to 3.6 2.7 to 3.6 2.7 to 3.6
VCC − 0.2 2.2 2.4 2.2
⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯
V
0.2 0.4 0.4 0.55
±5.0 ±10.0 μA μA μA
VIN = 0 to 3.6 V VIN = VIH or VIL VOUT = 0 to 3.6 V VIN, VOUT = 0 to 3.6 V VIN = VCC or GND VCC < (VIN, VOUT) < 3.6 V = = VIH = VCC − 0.6 V
10.0 20.0
±20.0
μA
750
< < DC Characteristics (Ta = −40 to 85°C, 2.3 V = VCC = 2.7 V)
Characteristics H-level L-level Symbol VIH VIL Test Condition
⎯ ⎯
VCC (V) 2.3 to 2.7 2.3 to 2.7
Min 1.6
⎯
Max
⎯
Unit
Input voltage
0.7
⎯ ⎯ ⎯ ⎯
V
IOH = −100 μA H-level Output voltage VOH VIN = VIH or VIL IOH = −6 mA IOH = −12 mA IOH = −18 mA IOL = 100 μA L-level VOL VIN = VIH or VIL IOL = 12 mA IOL = 18 mA Input leakage current 3-state output OFF state current Power-off leakage current Quiescent supply current IIN IOZ IOFF ICC VIN = 0 to 3.6 V VIN = VIH or VIL VOUT = 0 to 3.6 V VIN, VOUT = 0 to 3.6 V VIN = VCC or GND VCC < (VIN, VOUT) < 3.6 V = =
2.3 to 2.7 2.3 2.3 2.3 2.3 to 2.7 2.3 2.3 2.3 to 2.7 2.3 to 2.7 0 2.3 to 2.7 2.3 to 2.7
VCC − 0.2 2.0 1.8 1.7
⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯
V
0.2 0.4 0.6
±5.0 ±10.0 μA μA μA μA
10.0 20.0
±20.0
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< DC Characteristics (Ta = −40 to 85°C, 1.8 V = VCC < 2.3 V)
Characteristics Symbol Test Condition
⎯ ⎯
VCC (V) 1.8 to 2.3 1.8 to 2.3
Min 0.7 × VCC
⎯
Max
⎯
Unit
H-level Input voltage L-level
VIH VIL
0.2 × VCC
⎯ ⎯
V
H-level Output voltage L-level Input leakage current 3-state output OFF state current Power-off leakage current Quiescent supply current
VOH
VIN = VIH or VIL
IOH = −100 μA IOH = −6 mA
1.8 1.8 1.8 1.8 1.8 1.8 0 1.8 1.8
VCC − 0.2 1.4
⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯
V
VOL IIN IOZ IOFF ICC
VIN = VIH or VIL VIN = 0 to 3.6 V VIN = VIH or VIL VOUT = 0 to 3.6 V VIN, VOUT = 0 to 3.6 V VIN = VCC or GND
IOL = 100 μA IOL = 6 mA
0.2 0.3
±5.0 ±10.0 μA μA μA μA
10.0 20.0
±20.0
VCC < (VIN, VOUT) < 3.6 V = =
AC Characteristics (Ta = −40 to 85°C, input: tr = tf = 2.0 ns, CL = 30 pF, RL = 500 Ω) (Note 1)
Characteristics Symbol Test Condition VCC (V) 1.8 Figure 1, Figure 2 2.5 ± 0.2 3.3 ± 0.3 1.8 Figure 1, Figure 3 2.5 ± 0.2 3.3 ± 0.3 1.8 Figure 1, Figure 3 2.5 ± 0.2 3.3 ± 0.3 1.8 (Note 2) 2.5 ± 0.2 3.3 ± 0.3 Min 1.5 1.0 0.8 1.5 1.0 0.8 1.5 1.0 0.8
⎯ ⎯ ⎯
Max 5.0 3.0 2.5 7.5 4.9 3.8 5.5 4.2 3.7 0.5 0.5 0.5
Unit
Propagation delay time
tpLH tpHL
ns
3-state output enable time
tpZL tpZH
ns
3-state output disable time
tpLZ tpHZ
ns
Output to output skew
tosLH tosHL
ns
Note 1: For CL = 50 pF, add approximately 300 ps to the AC maximum specification. Note 2: Parameter guaranteed by design. (tosLH = |tpLHm − tpLHn|, tosHL = |tpHLm − tpHLn|)
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Dynamic Switching Characteristics (Ta = 25°C, input: tr = tf = 2.0 ns, CL = 30 pF)
Characteristics Symbol Test Condition VCC (V) VIH = 1.8 V, VIL = 0 V Quiet output maximum dynamic VOL VOLP VIH = 2.5 V, VIL = 0 V VIH = 3.3 V, VIL = 0 V VIH = 1.8 V, VIL = 0 V Quiet output minimum dynamic VOL VOLV VIH = 2.5 V, VIL = 0 V VIH = 3.3 V, VIL = 0 V VIH = 1.8 V, VIL = 0 V Quiet output minimum dynamic VOH VOHV VIH = 2.5 V, VIL = 0 V VIH = 3.3 V, VIL = 0 V (Note) (Note) (Note) (Note) (Note) (Note) (Note) (Note) (Note) 1.8 2.5 3.3 1.8 2.5 3.3 1.8 2.5 3.3 0.25 0.6 0.8
−0.25 −0.6 −0.8
Typ.
Unit
V
V
1.5 1.9 2.2 V
Note:
Parameter guaranteed by design.
Capacitive Characteristics (Ta = 25°C)
Characteristics Input capacitance Bus I/O capacitance Power dissipation capacitance Symbol CIN CI/O CPD fIN = 10 MHz Test Condition VCC (V)
⎯ ⎯
Typ. 6 7 20
Unit pF pF pF
1.8, 2.5, 3.3 1.8, 2.5, 3.3 (Note) 1.8, 2.5, 3.3
Note:
CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPD・VCC・fIN + ICC/16 (per bit)
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AC Test Circuit
6.0 V or VCC × 2 Open GND Measure
CL RL
Switch
RL
Parameter tpLH, tpHL tpLZ, tpZL tpHZ, tpZH 6.0 V VCC × 2
Switch Open @VCC = 3.3 ± 0.3 V @VCC = 2.5 ± 0.2 V @VCC = 1.8 V GND
Output
CL = 30 pF RL = 500 Ω
Figure 1 AC Waveform
tr 2.0 ns Input (An, Bn) tf 2.0 ns 90% VM VIH 10% GND VOH VM tpLH tpHL VOL
Output (Bn, An)
Figure 2 tpLH, tpHL
tr 2.0 ns Output Enable Control ( OE ) tpLZ Output (An, Bn) Low to Off to Low tpHZ Output (An, Bn) High to Off to High Outputs enabled tf 2.0 ns 90% VM VIH 10% tpZL 3.0 V or VCC VM VX tpZH VOL VOH VM GND Outputs disabled Outputs enabled GND
VY
Figure 3 tpLZ, tpHZ, tpZL, tpZH
Symbol VIH VM VX VY VCC 3.3 ± 0.3 V 2.7 V 1.5 V VOL + 0.3 V VOH − 0.3 V 2.5 ± 0.2 V VCC VCC/2 VOL + 0.15 V VOH − 0.15 V 1.8 V VCC VCC/2 VOL + 0.15 V VOH − 0.15 V
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Package Dimensions
Weight: 0.25 g (typ.)
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RESTRICTIONS ON PRODUCT USE
• The information contained herein is subject to change without notice.
20070701-EN
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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