TC74VHCT139AF

TC74VHCT139AF/AFN/AFT/AFK TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC74VHCT139AF,TC74VHCT139AFN,TC74VHCT139AFT,TC74VHCT139AFK Dual 2-to-4 Line Decoder Note: The TC74VHCT139A is an advanced high speed CMOS 2 to 4 LINE DECODER/DEMULTIPLEXER fabricated with silicon gate C2MOS technology. It achieves the high speed operation similar to equivalent Bipolar Schottky TTL while maintaining the CMOS low power dissipation. The active low enable input can be used for gating or it can be used as a data input for demultiplexing applications. When the enable input is held High, all four outputs are fixed at a high logic level independent of the other inputs. The input voltage are compatible with TTL output voltage. This device may be used as a level converter for interfacing 3.3 V to 5 V system. Input protection and output circuit ensure that 0 to 5.5 V can be applied to the input and output (Note) pins without regard to the supply voltage. These structure prevents device destruction due to mismatched supply and input/output voltages such as battery back up, hot board insertion, etc. Note: VCC = 0 V xxxFN (JEDEC SOP) is not available in Japan. TC74VHCT139AF TC74VHCT139AFN Features • • • • • • • High speed: tpd = 5.0 ns (typ.) at VCC = 5 V Low power dissipation: ICC = 4 μA (max) at Ta = 25°C Compatible with TTL outputs: VIL = 0.8 V (max) VIH = 2.0 V (min) Power down protection is provided on all inputs and outputs. ∼ Balanced propagation delays: tpLH − tpHL Low noise: VOLP = 0.8 V (max) Pin and function compatible with the 74 series (74AC/HC/F/ALS/LS etc.) 139 type. TC74VHCT139AFT TC74VHCT139AFK Weight SOP16-P-300-1.27A SOL16-P-150-1.27 TSSOP16-P-0044-0.65A VSSOP16-P-0030-0.50 : 0.18 g (typ.) : 0.13 g (typ.) : 0.06 g (typ.) : 0.02 g (typ.) 1 2007-10-01 TC74VHCT139AF/AFN/AFT/AFK Pin Assignment 1G 1 2 3 4 5 6 7 8 (top view) 16 15 14 13 12 11 10 9 VCC 1A 1B 1Y0 1Y1 1Y 2 2G 2A 2B 2Y0 2 Y1 2Y 2 2Y3 1Y3 GND IEC Logic Symbol (2) (3) (1) (14) (13) (15) X/Y 0 1 2 3 (4) (5) (6) (7) (12) (11) (10) (9) 1Y0 1A 1B 1G 2A 2B 2G 1 2 EN 1Y1 1Y 2 1Y3 2Y0 2Y1 2Y 2 2Y3 1A 1B 1G 2A 2B 2G (2) (3) (1) (14) (13) (15) DMUX 0 0 1G 3 0 1 2 3 (4) (5) (6) (7) (12) (11) (10) (9) 1Y0 1Y1 1Y 2 1Y3 2Y0 2Y1 2Y 2 2Y3 Truth Table Inputs Enable G Outputs Select B A Y0 Y1 H H L H H Y2 H H H L H Y3 H H H H L Selected Output None Y0 H L L L L X L L H H X L H L H H L H H H Y1 Y2 Y3 X: Don’t care System Diagram 4/12 Y0 A 2/14 5/11 Y1 B 3/13 6/10 Y2 G 1/15 7/9 Y3 2 2007-10-01 TC74VHCT139AF/AFN/AFT/AFK Absolute Maximum Ratings (Note 1) Characteristics Supply voltage range DC input voltage DC output voltage Input diode current Output diode current DC output current DC VCC/ground current Power dissipation Storage temperature Symbol VCC VIN VOUT IIK IOK IOUT ICC PD Tstg Rating −0.5 to 7.0 −0.5 to 7.0 −0.5 to 7.0 −0.5 to VCC + 0.5 −20 ±20 ±25 ±50 180 −65 to 150 (Note 4) (Note 2) (Note 3) Unit V V V mA mA mA mA mW °C Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: VCC = 0 V Note 3: High or low state. IOUT absolute maximum rating must be observed. Note 4: VOUT < GND, VOUT > VCC Operating Ranges (Note 1) Characteristics Supply voltage Input voltage Output voltage Operating temperature Input rise and fall time Symbol VCC VIN VOUT Topr dt/dV Rating 4.5 to 5.5 0 to 5.5 0 to 5.5 0 to VCC −40 to 85 0 to 20 (Note 2) (Note 3) Unit V V V °C ns/V Note 1: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND. Note 2: VCC = 0 V Note 3: High or low state 3 2007-10-01 TC74VHCT139AF/AFN/AFT/AFK Electrical Characteristics DC Characteristics Test Condition Characteristics Symbol VCC (V) ― 4.5 to 5.5 4.5 to 5.5 4.5 4.5 4.5 4.5 0 to 5.5 5.5 5.5 0 Min 2.0 Ta = 25°C Typ. ― Max ― Ta = −40 to 85°C Min 2.0 Max ― V Unit High-level input voltage Low-level input voltage High-level output voltage Low-level output voltage Input leakage current Quiescent supply current Output leakage current VIH VIL ― IOH = −50 μA VIN = VIH or IOH = −8 mA VIL IOL = 50 μA VIN = VIH or IOL = 8 mA VIL VIN = 5.5 V or GND VIN = VCC or GND Per input: VIN = 3.4 V Other input: VCC or GND VOUT = 5.5 V ― 4.40 3.94 ― ― ― ― ― ― ― 4.50 ― 0.0 ― ― ― ― ― 0.8 ― ― 0.1 0.36 ±1.0 4.0 1.35 0.5 ― 4.40 3.80 ― ― ― ― ― ― 0.8 ― ― 0.1 0.44 ±1.0 40.0 1.50 5.0 V VOH V VOL IIN ICC ICCT IOPD V μA μA mA μA AC Characteristics (input: tr = tf = 3 ns) Characteristics Propagation delay time (A, B- Y ) Symbol Test Condition VCC (V) CL (pF) 15 Min ― Ta = 25°C Typ. 5.0 Max 7.2 Ta = −40 to 85°C Min 1.0 Max 8.5 Unit tpLH tpHL tpLH tpHL CIN CPD ― 5.0 ± 0.5 50 15 ― ― ― ― 6.5 5.0 6.5 4 32 9.2 7.2 9.2 10 ― 1.0 1.0 1.0 ― ― 10.5 8.5 10.5 10 ― ns Propagation delay time (G -Y ) Input capacitance Power dissipation capacitance ― 5.0 ± 0.5 ― 50 ns pF pF (Note) ― Note: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPD·VCC·fIN + ICC/2 (per decoder) 4 2007-10-01 TC74VHCT139AF/AFN/AFT/AFK Package Dimensions Weight: 0.18 g (typ.) 5 2007-10-01 TC74VHCT139AF/AFN/AFT/AFK Package Dimensions (Note) Note: This package is not available in Japan. Weight: 0.13 g (typ.) 6 2007-10-01 TC74VHCT139AF/AFN/AFT/AFK Package Dimensions Weight: 0.06 g (typ.) 7 2007-10-01 TC74VHCT139AF/AFN/AFT/AFK Package Dimensions Weight: 0.02 g (typ.) 8 2007-10-01 TC74VHCT139AF/AFN/AFT/AFK RESTRICTIONS ON PRODUCT USE • The information contained herein is subject to change without notice. 20070701-EN GENERAL • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. 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Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 9 2007-10-01