TC75S56F/FU
TOSHIBA CMOS Linear Integrated Circuit Silicon Monolithic
TC75S56F, TC75S56FU
Single Comparator
TC75S56F
The TC75S56F/TC75S56FU is a CMOS generalpurpose single comparator. The device can operate off a single power supply
and draws a lower supply current than a conventional bipolar generalpurpose comparator. This device’s push-pull output stage can be directly
connected to TTL or CMOS logic ICs, among others.
Features
•
Low-current power supply
: IDD = 10 μA (typ.)
•
Single power supply operation : VDD = ±0.9 to ±3.5 V or 1.8 to 7 V
•
Wide common mode input voltage range : VSS to VDD − 0.9 V
•
Push-pull output circuit
•
Low input bias current
•
Small package
(SMV)
TC75S56FU
(USV)
Weight
SSOP5-P-0.95 : 0.014 g (typ.)
SSOP5-P-0.65A : 0.006 g (typ.)
Marking (top view)
5
Pin Connection (top view)
4
VDD
OUT
5
4
TC
1
2
1
IN (−)
3
2
VSS
3
IN (+)
Start of commercial production
1996-11
© 2019
Toshiba Electronic Devices & Storage Corporation
1
2019-09-11
TC75S56F/FU
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Symbol
Rating
Unit
VDD, VSS
±3.5 or 7
V
DVIN
±7
V
Input voltage
VIN
VSS to VDD
V
Output Current
IOUT
±35
mA
Power dissipation
PD
200
mW
Operating temperature
Topr
−40 to 85
°C
Storage temperature
Tstg
−55 to 125
°C
Supply voltage
Differential input voltage
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant
change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating
conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating
ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling
Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated
failure rate, etc).
Note: This device’s CMOS structure makes it prone to latch-up. To prevent latch-up, please take the following precautions:
•
Ensure that no I/O pin’s voltage level ever exceeds VDD or drops below VSS.
In addition, check the power-on timing.
•
Do not subject the device to excessive noise.
© 2019
Toshiba Electronic Devices & Storage Corporation
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2019-09-11
TC75S56F/FU
Electrical Characteristics (unless otherwise specified, VDD = 5 V, VSS = GND, Ta = 25°C)
Symbol
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
Input offset voltage
VIO
±1
±7
mV
Input offset current
IIO
1
pA
II
1
pA
Common mode input voltage
CMVIN
0
4.1
V
Supply current
IDD (Note)
Characteristics
Input bias current
11
22
µA
Voltage gain
GV
94
dB
Sink current
Isink
VOL = 0.5 V
13
25
mA
Isource
VOH = 4.5 V
9
21
mA
VOL
Isink = 5.0 mA
0.1
0.3
VOH
Isource = 5.0 mA
4.7
4.9
VDD
1.8
7.0
tPLH (1)
Over drive = 100 mV
680
tPLH (2)
TTL step input
500
tPHL (1)
Over drive = 100 mV
250
tPHL (2)
TTL step input
380
Over drive = 100 mV
60
Over drive = 100 mV
8
Source current
Output voltage
Operating supply voltage
Propagation delay time (turn on)
Propagation delay time (turn off)
Response time
tTLH
tTHL
V
V
ns
ns
ns
Electrical Characteristics (unless otherwise specified, VDD = 3 V, VSS = GND, Ta = 25°C)
Symbol
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
Input offset voltage
VIO
±1
±7
mV
Input offset current
IIO
1
pA
II
1
pA
Common mode input voltage
CMVIN
0
2.1
V
Supply current
IDD (Note)
10
20
µA
Characteristics
Input bias current
Sink current
Isink
VOL = 0.5 V
6
18
mA
Isource
VOH = 2.5 V
3
15
mA
VOL
Isink = 5.0 mA
0.15
0.35
VOH
Isource = 5.0 mA
2.65
2.85
Propagation delay time (turn on)
tPLH
Over drive = 100 mV
550
ns
Propagation delay time (turn off)
tPHL
Over drive = 100 mV
250
ns
tTLH
Over drive = 100 mV
30
Over drive = 100 mV
8
Source current
Output voltage
Response time
tTHL
V
ns
Note: This device’s current consumption increases as its operating frequency increases. Note that the power dissipation
should not exceed the allowable power dissipation.
© 2019
Toshiba Electronic Devices & Storage Corporation
3
2019-09-11
TC75S56F/FU
IDD – f
1000
VDD = 3 V
Supply current IDD
(µA)
VSS = GND
Ta = 25°C
100
10
1
0.001
0.01
0.1
1
Frequency f
10
100
1000
10
100
1000
(kHz)
IDD – f
1000
VDD = 5 V
Supply current IDD
(µA)
VSS = GND
Ta = 25°C
100
10
1
0.001
0.01
0.1
1
Frequency f
(kHz)
The above characteristics curves are presented for reference only and not guaranteed by production test,
unless otherwise noted.
© 2019
Toshiba Electronic Devices & Storage Corporation
4
2019-09-11
TC75S56F/FU
VOL – Isink
VOL – Isink
5.0
3.0
VDD = 3 V
2.5
(V)
Ta = 25°C
(V)
2.0
Output voltage VOL
Output voltage VOL
4.5
VSS = GND
1.5
1.0
0.5
4.0
VDD = 5 V
VSS = GND
Ta = 25°C
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0.0
0
5
10
15
20
Sink current
25
Isink
30
35
0.0
0
40
5
10
15
20
Sink current
(mA)
25
Isink
30
35
40
35
40
(mA)
VOH – Isource
VOH – Isource
5.0
3.0
4.5
2.5
(V)
2.0
Output voltage VOH
Output voltage VOH
(V)
4.0
1.5
1.0
VDD = 3 V
0.5
VSS = GND
Ta = 25°C
0.0
0
5
10
15
20
Source current
25
Isource
30
35
3.5
3.0
2.5
2.0
1.5
1.0
VDD = 5 V
0.5
Ta = 25°C
0.0
0
40
VSS = GND
5
10
15
Source current
(mA)
20
25
Isource
30
(mA)
PD – Ta
The above characteristics curves are presented for reference only and not guaranteed by production test,
unless otherwise noted.
© 2019
Toshiba Electronic Devices & Storage Corporation
5
2019-09-11
TC75S56F/FU
Package Dimensions
Weight: 0.014 g (typ.)
© 2019
Toshiba Electronic Devices & Storage Corporation
6
2019-09-11
TC75S56F/FU
Package Dimensions
Weight: 0.006 g (typ.)
© 2019
Toshiba Electronic Devices & Storage Corporation
7
2019-09-11
TC75S56F/FU
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complying with safety standards and for providing adequate designs and safeguards for their hardware, software and systems which
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including without limitation, this document, the specifications, the data sheets and application notes for Product and the precautions and
conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the instructions for the application with which the Product
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Toshiba Electronic Devices & Storage Corporation
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2019-09-11