TC7PZ07FU
CMOS Digital Integrated Circuits
Silicon Monolithic
TC7PZ07FU
1. Functional Description
•
Dual Non-Inverter (Open Drain)
2. Features
(1)
AEC-Q100 (Rev. H) (Note 1)
(2)
Wide operating temperature range: Topr = -40 to 125 (Note 2)
(3)
High output current: ±24 mA (min) at VCC = 3.0 V
(4)
Super high speed operation: tPZL = 2.3 ns (typ.) at VCC = 5.0 V, CL = 50 pF
(5)
Operation voltage range: VCC = 1.65 to 5.5 V
(6)
5.5 V tolerant inputs
(7) 5.5 V power down protection output
Note 1: This device is compliant with the reliability requirements of AEC-Q100. For details, contact your Toshiba sales
representative.
Note 2: For devices with the ordering part number ending in J(CT. Topr = -40 to 85 for the other devices.
3. Packaging
US6
Start of commercial production
©2015-2019
Toshiba Electronic Devices & Storage Corporation
1
2015-09
2019-08-07
Rev.4.0
TC7PZ07FU
4. Marking and Pin Assignment
Marking
Pin Assignment (Top view)
5. IEC Logic Symbol
6. Truth Table
Z:
A
Y
L
L
H
Z
High impedance
7. Absolute Maximum Ratings (Note) (Unless otherwise specified, Ta = 25 )
Characteristics
Symbol
Note
Rating
Unit
Supply voltage
VCC
-0.5 to 6.0
V
Input voltage
VIN
-0.5 to 6.0
V
DC output voltage
VOUT
Input diode current
IIK
(Note 1)
(Note 2)
-0.5 to 6.0
V
-20
mA
Output diode current
IOK
-20
mA
DC output current
IOUT
50
mA
VCC/ground current
ICC
±100
mA
Power dissipation
PD
200
mW
Storage temperature
Tstg
-65 to 150
Note:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even
destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
Note 1: IOUT absolute maximum rating must be observed.
Note 2: VOUT < GND
©2015-2019
Toshiba Electronic Devices & Storage Corporation
2
2019-08-07
Rev.4.0
TC7PZ07FU
8. Operating Ranges (Note)
Characteristics
Symbol
Supply voltage
Note
Test Condition
Rating
Unit
1.65 to 5.5
V
1.5 to 5.5
VCC
(Note 1)
Input voltage
VIN
0 to 5.5
V
Output voltage
VOUT
0 to 5.5
V
Operating temperature
Topr
(Note 2)
-40 to 125
(Note 3)
-40 to 85
Input rise and fall time
dt/dv
VCC = 1.8 ± 0.15 V, 2.5 ± 0.2 V
0 to 20
VCC = 3.3 ± 0.3 V
0 to 10
VCC = 5.0 ± 0.5 V
0 to 5
ns/V
Note:
The operating ranges must be maintained to ensure the normal operation of the device.
Unused inputs must be tied to either VCC or GND.
Note 1: Data retention only
Note 2: For devices with the ordering part number ending in J(CT.
Note 3: For devices except those with the ordering part number ending in J(CT.
9. Electrical Characteristics
9.1. DC Characteristics (Unless otherwise specified, Ta = 25 )
Characteristics
Symbol
Test Condition
VCC (V)
Min
Typ.
Max
Unit
V
High-level input voltage
VIH
1.65 to 1.95
VCC × 0.75
2.3 to 5.5
VCC × 0.7
Low-level input voltage
VIL
1.65 to 1.95
VCC × 0.25
2.3 to 5.5
VCC × 0.3
Low-level output voltage
VOL
1.65
0.0
0.1
2.3
0.0
0.1
3.0
0.0
0.1
3-state output OFF-state
leakage current
VIN = VIL
IOL = 100 µA
4.5
0.0
0.1
IOL = 4 mA
1.65
0.08
0.24
IOL = 8 mA
2.3
0.1
0.3
IOL = 16 mA
3.0
0.15
0.4
IOL = 24 mA
3.0
0.22
0.55
IOL = 32 mA
4.5
0.22
0.55
V
V
IOZ
VIN = VIH
VOUT = VCC or GND
5.5
±5
µA
Input leakage current
IIN
VIN = 5.5 V or GND
0 to 5.5
±1
µA
Power-OFF leakage
current
IOFF
VIN or VOUT = 5.5 V
0
1
µA
Quiescent supply current
ICC
VIN = 5.5 V or GND
1.65 to 5.5
1
µA
©2015-2019
Toshiba Electronic Devices & Storage Corporation
3
2019-08-07
Rev.4.0
TC7PZ07FU
9.2. DC Characteristics (Unless otherwise specified, Ta = -40 to 85 )
Characteristics
High-level input voltage
Low-level input voltage
Low-level output voltage
Symbol
Test Condition
VIH
Min
Max
Unit
1.65 to 1.95
VCC × 0.75
V
2.3 to 5.5
VCC × 0.7
1.65 to 1.95
VCC × 0.25
2.3 to 5.5
VCC × 0.3
1.65
0.1
2.3
0.1
3.0
0.1
4.5
0.1
IOL = 4 mA
1.65
0.24
IOL = 8 mA
2.3
0.3
IOL = 16 mA
3.0
0.4
IOL = 24 mA
3.0
0.55
IOL = 32 mA
VIL
VOL
VCC (V)
VIN = VIL
IOL = 100 µA
V
V
4.5
0.55
3-state output OFF-state
leakage current
IOZ
VIN = VIH
VOUT = VCC or GND
5.5
±10
µA
Input leakage current
IIN
VIN = 5.5 V or GND
0 to 5.5
±10
µA
Power-OFF leakage current
IOFF
VIN or VOUT = 5.5 V
0
10
µA
Quiescent supply current
ICC
VIN = 5.5 V or GND
1.65 to 5.5
10
µA
9.3. DC Characteristics (Note) (Unless otherwise specified, Ta = -40 to 125 )
Characteristics
Symbol
Test Condition
VCC (V)
Min
Max
Unit
V
High-level input voltage
VIH
1.65 to 1.95
VCC × 0.75
2.3 to 5.5
VCC × 0.7
Low-level input voltage
VIL
1.65 to 1.95
VCC × 0.25
2.3 to 5.5
VCC × 0.3
Low-level output voltage
VOL
1.65
0.1
2.3
0.1
3.0
0.1
3-state output OFF-state
leakage current
Input leakage current
VIN = VIL
IOL = 100 µA
V
V
4.5
0.1
IOL = 4 mA
1.65
0.7
IOL = 8 mA
2.3
0.45
IOL = 16 mA
3.0
0.6
IOL = 24 mA
3.0
0.8
IOL = 32 mA
4.5
0.8
±20
µA
IOZ
VIN = VIH
VOUT = VCC or GND
5.5
IIN
VIN = 5.5 V or GND
0 to 5.5
±20
µA
Power-OFF leakage current
IOFF
VIN or VOUT = 5.5 V
0
100
µA
Quiescent supply current
ICC
VIN = 5.5 V or GND
1.65 to 5.5
100
µA
Note:
For devices with the ordering part number ending in J(CT.
©2015-2019
Toshiba Electronic Devices & Storage Corporation
4
2019-08-07
Rev.4.0
TC7PZ07FU
9.4. AC Characteristics (Unless otherwise specified, Ta = 25 , Input: tr = tf = 3 ns)
Characteristics
Propagation delay time
Symbol
Note
tPZL
tPLZ
Input capacitance
Test
Condition
VCC (V)
CL (pF)
Min
Typ.
Max
Unit
RL = 500 Ω
1.8 ± 0.15
50
ns
RL = 500 Ω
1.8
5.5
9.5
2.5 ± 0.2
1.2
3.7
5.8
3.3 ± 0.3
0.8
2.9
4.4
5.0 ± 0.5
0.5
2.3
3.5
1.8 ± 0.15
1.8
4.3
9.5
2.5 ± 0.2
50
1.2
2.8
5.8
3.3 ± 0.3
0.8
2.1
4.4
5.0 ± 0.5
0.5
1.4
3.5
ns
CIN
0 to 5.5
4
pF
Output capacitance
COUT
0 to 5.5
3
pF
Power dissipation
capacitance
CPD
3.3
4
pF
8
(Note 1)
5.5
Note 1: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current
consumption without load. Average operating current can be obtained by the equation.
ICC(opr) = CPDVCCfIN + ICC/2 (per gate)
9.5. AC Characteristics
(Unless otherwise specified, Ta = -40 to 85 , Input: tr = tf = 3 ns)
Characteristics
Propagation delay time
Symbol
Test Condition
VCC (V)
CL (pF)
Min
Max
Unit
tPZL
RL = 500 Ω
1.8 ± 0.15
50
1.8
10.5
ns
2.5 ± 0.2
1.2
6.4
3.3 ± 0.3
0.8
4.8
5.0 ± 0.5
tPLZ
RL = 500 Ω
0.5
3.9
1.8
10.5
2.5 ± 0.2
1.2
6.4
3.3 ± 0.3
0.8
4.8
5.0 ± 0.5
0.5
3.9
1.8 ± 0.15
50
ns
9.6. AC Characteristics (Note)
(Unless otherwise specified, Ta = -40 to 125 , Input: tr = tf = 3 ns)
Characteristics
Propagation delay time
Symbol
Test Condition
VCC (V)
CL (pF)
Min
Max
Unit
tPZL
RL = 500 Ω
1.8 ± 0.15
50
1.8
12.0
ns
2.5 ± 0.2
1.2
7.5
3.3 ± 0.3
0.8
5.5
5.0 ± 0.5
tPLZ
Note:
RL = 500 Ω
0.5
4.5
1.8
12.0
2.5 ± 0.2
1.2
7.5
3.3 ± 0.3
0.8
5.5
5.0 ± 0.5
0.5
4.5
1.8 ± 0.15
50
ns
For devices with the ordering part number ending in J(CT.
©2015-2019
Toshiba Electronic Devices & Storage Corporation
5
2019-08-07
Rev.4.0
TC7PZ07FU
9.7. AC Characteristics Measurement Circuit and AC Waveform
AC Characteristics Measurement Circuit
©2015-2019
Toshiba Electronic Devices & Storage Corporation
AC Waveform
6
2019-08-07
Rev.4.0
TC7PZ07FU
Package Dimensions
Unit: mm
Weight: 0.007 g (typ.)
Package Name(s)
JEDEC: SOT-363
Nickname: US6
©2015-2019
Toshiba Electronic Devices & Storage Corporation
7
2019-08-07
Rev.4.0
TC7PZ07FU
RESTRICTIONS ON PRODUCT USE
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Hardware, software and systems described in this document are collectively referred to as "Product".
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for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and systems which
minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily injury or damage
to property, including data loss or corruption. Before customers use the Product, create designs including the Product, or incorporate
the Product into their own applications, customers must also refer to and comply with (a) the latest versions of all relevant TOSHIBA
information, including without limitation, this document, the specifications, the data sheets and application notes for Product and the
precautions and conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the instructions for the application
with which the Product will be used with or for. Customers are solely responsible for all aspects of their own product design or applications,
including but not limited to (a) determining the appropriateness of the use of this Product in such design or applications; (b) evaluating
and determining the applicability of any information contained in this document, or in charts, diagrams, programs, algorithms, sample
application circuits, or any other referenced documents; and (c) validating all operating parameters for such designs and applications.
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©2015-2019
Toshiba Electronic Devices & Storage Corporation
8
2019-08-07
Rev.4.0