TK7R7P10PL
MOSFETs
Silicon N-channel MOS (U-MOS�-H)
TK7R7P10PL
1. Applications
•
High-Efficiency DC-DC Converters
•
Switching Voltage Regulators
•
Motor Drivers
2. Features
(1)
High-speed switching
(2)
Small gate charge: QSW = 13 nC (typ.)
(3)
Small output charge: Qoss = 47 nC (typ.)
(4)
Low drain-source on-resistance: RDS(ON) = 6.5 mΩ (typ.) (VGS = 10 V)
(5)
Low leakage current: IDSS = 10 µA (max) (VDS = 100 V)
(6)
Enhancement mode: Vth = 1.5 to 2.5 V (VDS = 10 V, ID = 0.5 mA)
3. Packaging and Internal Circuit
1: Gate
2: Drain (heatsink)
3: Source
DPAK
Start of commercial production
2018-01
©2017-2021
Toshiba Electronic Devices & Storage Corporation
1
2021-01-27
Rev.2.0
TK7R7P10PL
4. Absolute Maximum Ratings (Note) (T a = 25 � unless otherwise specified)
Characteristics
Symbol
Rating
Unit
Drain-source voltage
VDSS
100
V
Gate-source voltage
VGSS
±20
Drain current (DC)
(Tc = 25 �)
(Note 1)
ID
55
Drain current (DC)
(Silicon limit)
(Note 1), (Note 2)
ID
79
A
Drain current (pulsed)
(t = 100 µs)
(Note 1)
IDP
230
Power dissipation
(Tc = 25 �)
PD
93
W
Single-pulse avalanche energy
(Note 3)
EAS
27
mJ
Single-pulse avalanche current
(Note 3)
IAS
55
A
Channel temperature
Tch
175
�
Storage temperature
Tstg
-55 to 175
�
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
5. Thermal Characteristics
Characteristics
Channel-to-case thermal resistance
(Tc = 25 �)
Symbol
Max
Unit
Rth(ch-c)
1.60
�/W
Note 1: Ensure that the channel temperature does not exceed 175 �.
Note 2: Limited by silicon chip capability.
Note 3: VDD = 80 V, Tch = 25 � (initial), L = 7.1 µH, IAS = 55 A
Note:
This transistor is sensitive to electrostatic discharge and should be handled with care.
6. Electrical Characteristics
6.1. Static Characteristics (T a = 25 � unless otherwise specified)
Characteristics
Symbol
Test Condition
Min
Typ.
Max
Unit
µA
Gate leakage current
IGSS
VGS = ±20 V, VDS = 0 V
�
�
±0.1
Drain cut-off current
IDSS
VDS = 100 V, VGS = 0 V
�
�
10
V(BR)DSS
ID = 10 mA, VGS = 0 V
100
�
�
V(BR)DSX
ID = 10 mA, VGS = -20 V
65
�
�
Vth
VDS = 10 V, ID = 0.5 mA
1.5
�
2.5
VGS = 4.5 V, ID = 16 A
�
8.2
11.5
VGS = 10 V, ID = 27.5 A
�
6.5
7.7
Drain-source breakdown voltage
Drain-source breakdown voltage
(Note 4)
Gate threshold voltage
Drain-source on-resistance
RDS(ON)
V
mΩ
Note 4: If a reverse bias is applied between gate and source, this device enters V(BR)DSX mode. Note that the drainsource breakdown voltage is lowered in this mode.
©2017-2021
Toshiba Electronic Devices & Storage Corporation
2
2021-01-27
Rev.2.0
TK7R7P10PL
6.2. Dynamic Characteristics (T a = 25 � unless otherwise specified)
Characteristics
Symbol
Input capacitance
Ciss
Reverse transfer capacitance
Crss
Output capacitance
Coss
Gate resistance
Test Condition
VDS = 50 V, VGS = 0 V, f = 1 MHz
rg
�
Typ.
Max
Unit
�
2800
�
pF
�
25
�
�
450
�
�
1.8
�
Ω
ns
Switching time (rise time)
tr
�
8
�
Switching time (turn-on time)
ton
�
22
�
tf
�
18
�
toff
�
62
�
Switching time (fall time)
Switching time (turn-off time)
See Fig. 6.2.1
Min
VDD ≈ 50 V
VGS = 0 V/ 10 V
ID = 27.5 A
RL = 1.82 Ω
RGG = 4.7 Ω
RGS = 4.7 Ω
Duty ≤ 1 %, tw = 10 µs
Fig. 6.2.1
Switching Time Test Circuit
6.3. Gate Charge Characteristics (T a = 25 � unless otherwise specified)
Characteristics
Symbol
Total gate charge (gate-source plus
gate-drain)
Test Condition
Qg
Gate-source charge 1
Qgs1
Min
Typ.
Max
Unit
VDD ≈ 50 V, VGS = 10 V, ID = 27.5 A
�
44
�
nC
VDD ≈ 50 V, VGS = 4.5 V, ID = 27.5 A
�
21
�
VDD ≈ 50 V, VGS = 10 V, ID = 27.5 A
�
11
�
Gate-drain charge
Qgd
�
8
�
Gate switch charge
QSW
�
13
�
Output charge
Qoss
�
47
�
VDS = 50 V, VGS = 0 V, f = 1 MHz
6.4. Source-Drain Characteristics (T a = 25 � unless otherwise specified)
Characteristics
Reverse drain current (pulsed)
Symbol
(Note 5)
Test Condition
Min
Typ.
Max
Unit
�
230
A
IDRP
(t = 100 µs)
�
Diode forward voltage
VDSF
IDR = 55 A, VGS = 0 V
�
�
-1.5
V
Reverse recovery time
trr
�
50
�
ns
Reverse recovery charge
Qrr
IDR = 13.8 A, VGS = 0 V,
-dIDR/dt = 100 A/µs
�
68
�
nC
Note 5: Ensure that the channel temperature does not exceed 175 �.
7. Marking
Fig. 7.1
©2017-2021
Toshiba Electronic Devices & Storage Corporation
3
Marking
2021-01-27
Rev.2.0
TK7R7P10PL
8. Characteristics Curves (Note)
Fig. 8.1
I D - V DS
Fig. 8.3
I D - V GS
Fig. 8.4
V DS - V GS
R DS(ON) - I D
Fig. 8.6
I DR - V DS
Fig. 8.5
©2017-2021
Toshiba Electronic Devices & Storage Corporation
Fig. 8.2
4
I D - V DS
2021-01-27
Rev.2.0
TK7R7P10PL
Fig. 8.7
V (BR)DSS - T a
Fig. 8.9
R DS(ON) - T a
Fig. 8.11
Fig. 8.8
Fig. 8.10
Capacitance - V DS
©2017-2021
Toshiba Electronic Devices & Storage Corporation
Dynamic Input/Output Characteristics
Fig. 8.12
5
V th - T a
Q oss - V DS
2021-01-27
Rev.2.0
TK7R7P10PL
Fig. 8.13 r th - t w
(Guaranteed Maximum)
Fig. 8.14 P D - T c
(Guaranteed Maximum)
Note:
Fig. 8.15 Safe Operating Area
(Guaranteed Maximum)
The above characteristics curves are presented for reference only and not guaranteed by production test,
unless otherwise noted.
©2017-2021
Toshiba Electronic Devices & Storage Corporation
6
2021-01-27
Rev.2.0
TK7R7P10PL
Package Dimensions
Unit: mm
Weight: 0.33 g (typ.)
Package Name(s)
TOSHIBA: 2-7N1S
Nickname: DPAK
©2017-2021
Toshiba Electronic Devices & Storage Corporation
7
2021-01-27
Rev.2.0
TK7R7P10PL
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©2017-2021
Toshiba Electronic Devices & Storage Corporation
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2021-01-27
Rev.2.0