TLP109(IGM)
Photocouplers
Infrared LED & Photo IC
TLP109(IGM)
1. Applications
•
Intelligent Power Module Signal Isolation
•
High-Speed Digital Interfacing for Instrumentation and Control Devices
•
Industrial Inverters
2. General
The Toshiba TLP109(IGM) mini-flat coupler is a small-outline coupler suitable for surface-mount assembly. The
TLP109(IGM) consists of an infrared LED optically coupled to a high-speed photodiode-transistor chip. The
TLP109(IGM) is housed in the SO6 package and guarantees a creepage distance of ≥5.0 mm, a clearance of ≥5.0
mm and an insulation thickness of ≥0.4mm. Therefore, the TLP109(IGM) meets the reinforced insulation class
requirements of international safety standards. The TLP109(IGM) guarantees minimum and maximum of
propagation delay time, switching time dispersion, and high common mode transient immunity. Therefore TLP109
(IGM) is suitable for isolation interface between IPM(Intelligent Power Module) and control IC circuits in motor
control application.
3. Features
(1)
Isolation voltage: 3750 Vrms (min)
(2)
Common-mode transient immunity: 10 kV/µs (min)
(3)
Propagation delay time tpHL/tpLH = 0.1 µs (min)
@VCM = 1500 Vp-p
= 0.8 µs (max)
@ IF = 10 mA, VCC = 15 V,
RL = 20 kΩ, Ta = 25
(4)
Pulse width distortion: 0.7 µs (max) (|tpHL-tpLH|)
(5)
TTL compatible
(6)
Safety standards
UL-recognized: UL 1577, File No.E67349
cUL-recognized: CSA Component Acceptance Service No.5A File No.E67349
VDE-approved: EN 60747-5-5, EN 62368-1 (Note 1)
CQC-approved: GB4943.1, GB8898 Thailand Factory
Note 1: When a VDE approved type is needed, please designate the Option (V4)
(V4).
Start of commercial production
©2017-2019
Toshiba Electronic Devices & Storage Corporation
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2008-07
2019-09-20
Rev.2.0
TLP109(IGM)
4. Packaging and Pin Assignment
1: Anode
3: Cathode
4: GND
5: VO (Output)
6: VCC
11-4L1S
5. Internal Circuit
6. Principle of Operation
6.1. Mechanical Parameters
Characteristics
Min
Unit
Creepage distances
5.0
mm
Clearance distances
5.0
Internal isolation thickness
0.4
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Toshiba Electronic Devices & Storage Corporation
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2019-09-20
Rev.2.0
TLP109(IGM)
7. Absolute Maximum Ratings (Note) (Unless otherwise specified, Ta = 25 )
Characteristics
LED
Symbol
Input forward current
Input forward current derating
(Ta ≥ 95 )
Note
Rating
Unit
IF
20
mA
∆IF/∆Ta
-0.36
mA/
Input forward current (pulsed)
IFP
(Note 1)
40
mA
Peak transient input forward current
IFPT
(Note 2)
1
A
Input reverse voltage
VR
5
V
Input power dissipation
PD
40
mW
∆PD/∆Ta
-0.72
mW/
Tj
125
Input power dissipation derating
(Ta ≥ 95 )
Junction temperature
Detector Output current
Output current derating
(Ta ≥ 95 )
IO
8
mA
∆IO/∆Ta
-0.3
mA/
Peak output current
IOP
16
mA
Output voltage
VO
-0.5 to 20
V
Supply voltage
VCC
-0.5 to 30
V
Output power dissipation
PO
100
mW
∆PO/∆Ta
-1.8
mW/
Tj
125
Topr
-55 to 125
Tstg
-55 to 125
Output power dissipation derating
(Ta ≥ 95 )
Junction temperature
Common Operating temperature
Storage temperature
Lead soldering temperature
Isolation voltage
(10 s)
Tsol
(AC, 60 s, R.H. ≤ 60 %)
BVS
260
(Note 3)
3750
Vrms
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Pulse width (PW) ≤ 1 ms, duty = 50 %
Note 2: Pulse width (PW) ≤ 1 µs, 300 pps
Note 3: This device is considered as a two-terminal device: Pins 1 and 3 are shorted together, and pins 4, 5 and 6 are
shorted together.
8. Electrical Characteristics (Unless otherwise specified, Ta = 25 )
Characteristics
Input forward voltage
Input forward voltage
temperature coefficient
Symbol
Note
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
VF
IF = 16 mA
1.5
1.64
1.85
V
∆VF/∆Ta
IF = 16 mA
-1.8
mV/
Input reverse current
IR
VR = 3 V
10
µA
Input capacitance
Ct
V = 0 V, f = 1 MHz
60
pF
High-level output current
IOH
IF = 0 mA, VO = VCC = 5.5 V
3
500
nA
IF = 0 mA, VO = 20 V,
VCC = 30 V
5
µA
IF = 0 mA, VO = 20 V,
VCC = 30 V, Ta = 100
50
High-level supply current
ICCH
IF = 0 mA, VCC = 30 V
0.01
1
µA
Supply voltage
VCC
ICC = 0.01 mA
30
V
Output voltage
VO
IO = 0.5 mA
20
V
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Toshiba Electronic Devices & Storage Corporation
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2019-09-20
Rev.2.0
TLP109(IGM)
9. Coupled Electrical Characteristics (Unless otherwise specified, Ta = 25 )
Characteristics
Symbol
Current transfer ratio
IO/IF
Low-level output voltage
VOL
Test Condition
Min
Typ.
Max
Unit
IF = 10 mA, VCC = 4.5 V, VO = 0.4 V
25
35
75
%
IF = 10 mA, VCC = 4.5 V, VO = 0.4 V,
Ta = -25 to 100
15
IF = 16 mA, VCC = 4.5 V, IO = 2.4 mA
0.4
V
Min
Typ.
Max
Unit
0.8
pF
10. Isolation Characteristics (Unless otherwise specified, Ta = 25 )
Characteristics
Symbol
Total capacitance (input to output)
Isolation resistance
Isolation voltage
Note
Test Conditions
CS
(Note 1) VS = 0 V, f = 1 MHz
RS
(Note 1) VS = 500 V, R.H. ≤ 60 %
1012
1014
Ω
(Note 1) AC, 60 s
3750
Vrms
BVS
Note 1: This device is considered as a two-terminal device: Pins 1 and 3 are shorted together, and pins 4, 5 and 6 are
shorted together.
11. Switching Characteristics (Unless otherwise specified, Ta = 25 , VCC = 15 V)
Characteristics
Symbol
Propagation delay time (H/L)
tpHL
Propagation delay time (L/H)
Pulse width distortion
Note
tpLH
|tpHL-tpLH|
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
Fig.12.1.1 IF = 10 mA, RL = 20 kΩ
0.1
0.45
0.8
µs
IF = 10 mA, RL = 20 kΩ,
Ta = 0 to 85
0.1
0.45
0.9
IF = 10 mA, RL = 20 kΩ,
Ta = -25 to 100
0.1
0.45
1.0
Fig.12.1.1 IF = 10 mA, RL = 20 kΩ
0.1
0.45
0.8
IF = 10 mA, RL = 20 kΩ,
Ta = 0 to 85
0.1
0.45
0.9
IF = 10 mA, RL = 20 kΩ,
Ta = -25 to 100
0.1
0.45
1.0
Fig.12.1.1 IF = 10 mA, RL = 20 kΩ
0.15
0.7
IF = 10 mA, RL = 20 kΩ,
Ta = 0 to 85
0.25
0.8
IF = 10 mA, RL = 20 kΩ,
Ta = -25 to 100
0.25
0.9
µs
µs
High-level common-mode
transient immunity
CMH
(Note 1) Fig.12.1.2 VCM = 1500 Vp-p, IF = 0 mA,
RL = 20 kΩ
10
15
kV/µs
Low-level common-mode
transient immunity
CML
(Note 2)
-10
-15
kV/µs
VCM = 1500 Vp-p, IF = 10 mA,
RL = 20 kΩ
Note 1: CMH is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage
in the logic high state (VO > 4 V).
Note 2: CML is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in
the logic low state (VO < 1 V).
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2019-09-20
Rev.2.0
TLP109(IGM)
12. Test Circuits and Characteristics Curves
12.1. Test Circuits
Fig. 12.1.1 Switching Time Test Circuit and Waveform
Fig. 12.1.2 Common-Mode Transient Immunity Test Circuit and Waveform
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TLP109(IGM)
13. Soldering and Storage
13.1. Precautions for Soldering
The soldering temperature should be controlled as closely as possible to the conditions shown below, irrespective
of whether a soldering iron or a reflow soldering method is used.
•
When using soldering reflow.
The soldering temperature profile is based on the package surface temperature.
(See the figure shown below, which is based on the package surface temperature.)
Reflow soldering must be performed once or twice.
The mounting should be completed with the interval from the first to the last mountings being 2 weeks.
An Example of a Temperature Profile When Lead(Pb)-Free Solder Is Used
•
When using soldering flow
Preheat the device at a temperature of 150 (package surface temperature) for 60 to 120 seconds.
Mounting condition of 260 within 10 seconds is recommended.
Flow soldering must be performed once.
•
When using soldering Iron
Complete soldering within 10 seconds for lead temperature not exceeding 260 or within 3 seconds not
exceeding 350
Heating by soldering iron must be done only once per lead.
13.2. Precautions for General Storage
•
Avoid storage locations where devices may be exposed to moisture or direct sunlight.
•
Follow the precautions printed on the packing label of the device for transportation and storage.
•
Keep the storage location temperature and humidity within a range of 5 to 35 and 45 % to 75 %,
respectively.
•
Do not store the products in locations with poisonous gases (especially corrosive gases) or in dusty
conditions.
•
Store the products in locations with minimal temperature fluctuations. Rapid temperature changes during
storage can cause condensation, resulting in lead oxidation or corrosion, which will deteriorate the
solderability of the leads.
•
When restoring devices after removal from their packing, use anti-static containers.
•
Do not allow loads to be applied directly to devices while they are in storage.
•
If devices have been stored for more than two years under normal storage conditions, it is recommended
that you check the leads for ease of soldering prior to use.
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Toshiba Electronic Devices & Storage Corporation
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2019-09-20
Rev.2.0
TLP109(IGM)
14. Land Pattern Dimensions (for reference only)
Unit: mm
15. Marking
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2019-09-20
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TLP109(IGM)
16. EN 60747-5-5 Option (V4) Specification
•
Part number: TLP109 (Note 1)
•
The following part naming conventions are used for the devices that have been qualified according to
option (V4) of EN 60747.
Example: TLP109(V4IGMTL,E
V4: EN 60747 option
IGM: IGM spec
TL: Tape type
E: [[G]]/RoHS COMPATIBLE (Note 2)
Note 1: Use TOSHIBA standard type number for safety standard application.
e.g., TLP109(V4IGMTL,E → TLP109
Note 2: Please contact your Toshiba sales representative for details on environmental information such as the product's
RoHS compatibility.
RoHS is the Directive 2011/65/EU of the European Parliament and of the Council of 8 June 2011 on the
restriction of the use of certain hazardous substances in electrical and electronic equipment.
Fig. 16.1 EN 60747 Isolation Characteristics
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TLP109(IGM)
Fig. 16.2 Insulation Related Specifications (Note)
Note:
This photocoupler is suitable for safe electrical isolation only within the safety limit data.
Maintenance of the safety data shall be ensured by means of protective circuits.
Fig. 16.3 Marking on Packing
Fig. 16.4 Marking Example (Note)
Note:
The above marking is applied to the photocouplers that have been qualified according to option (V4) of EN 60747.
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2019-09-20
Rev.2.0
TLP109(IGM)
Fig. 16.5 Measurement Procedure
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Toshiba Electronic Devices & Storage Corporation
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2019-09-20
Rev.2.0
TLP109(IGM)
17. Ordering Information
When placing an order, please specify the part number, tape type and quantity as shown in the following example.
Example) TLP109(IGM-TPL,E 3000 pcs
Part number: TLP109
IGM spec: IGM
Tape type: TPL
[[G]]/RoHS COMPATIBLE: E (Note 1)
Quantity (must be a multiple of 3000): 3000 pcs
Note 1: Please contact your Toshiba sales representative for details on environmental information such as the product's
RoHS compatibility.
RoHS is the Directive 2011/65/EU of the European Parliament and of the Council of 8 June 2011 on the
restriction of the use of certain hazardous substances in electrical and electronic equipment.
©2017-2019
Toshiba Electronic Devices & Storage Corporation
11
2019-09-20
Rev.2.0
TLP109(IGM)
Package Dimensions
Unit: mm
Weight: 0.08 g (typ.)
Package Name(s)
TOSHIBA: 11-4L1S
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Toshiba Electronic Devices & Storage Corporation
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2019-09-20
Rev.2.0
TLP109(IGM)
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