TLP113

TLP113 TOSHIBA Photocoupler GaAℓAs IRed & Photo−IC TLP113 Isolated Line Receiver Simplex / Multiplex Data Transmission Computer−Peripheral Interface Microprocessor System Interface Digital Isolation For A / D, D / A Conversion The TOSHIBA mini flat coupler TLP113 is a small outline coupler, suitable for surface mount assembly. TLP113 consists of a GaAℓAs light emitting diode, optically coupled to an integrated high gain, high speed photodetector whose output is an open collector, schottky clamped transistor. Input current thresholds: IF=10mA(max.) Switching speed: 10MBd(typ.) TTL / LSTTL compatible: VCC=5V Guaranteed performance over temp.: 0~70°C Isolation voltage: 2500Vrms(min.) UL recognized: UL1577 file no. E67349 Unit in mm Schematic IF 1 IO VF 5 VO ICC VCC 6 1 TOSHIBA Weight: 0.09g 11−4C2 Pin Configuration(top view) VCC 6 5 GND 3 4 3 GND 4 (Note) A 0.1μF bypass capacitor must be connected between pins 4 and 6. 1 : Anode 3 : Cathode 4 : GND 5 : Output (Open collector) 6 : VCC TRUTH TABLE (Positive Logic) INPUT H L OUTPUT L H 1 2007-10-01 TLP113 Absolute Maximum Ratings (Ta = 25°C) Characteristic Forward current Pulse forward current LED Peak transient forward current Reverse voltage Output current Detector Output voltage Supply voltage (1 minute maximum) Output power dissipation Operating temperature range Storage temperature range Lead solder temperature (10s) Isolation voltage (AC, 1 min., RH ≤ 60%, Note 4) (Note 1) (Note 2) Symbol IF IFP IFPT VR IO VO VCC PO Topr Tstg Tsol BVS Rating 20 40 1 5 25 7 7 40 −40~85 −55~125 260 2500 Unit mA mA A V mA V V mW °C °C °C Vrms Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). (Note 1) 50% duty cycle, 1ms pulse width. (Note 2) Pulse width≤1μs, 300pps. Recommended Operating Conditions Characteristic Input voltage, low level Input current, high level Supply voltage** Fan out (TTL load, each channel) Operating temperature Symbol VFL IFH VCC N Topr Min. −3 13* 4.5 ― 0 Typ. 0 16 5 ― ― Max. 1.0 20 5.5 8 70 Unit V mA V ― °C Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document. * 13mA is a guard banded value which allows for at least 20% CTR degradation. Initial input current threshold value is 10mA or less. **This item denotes operating ranges, not meaning of recommended operating conditions. 2 2007-10-01 TLP113 Electrical Characteristics(unless otherwise specified, Ta=0~70°C, VCC=4.5~5.5V, VFL≤ 1.0V) Characteristic Forward voltage Forward voltage temperature coefficient Reverse current Capacitance between terminals High level output current Symbol VF VF / Ta IR CT Test Condition IF=10mA, Ta=25°C IF=10mA VR=5V, Ta=25°C VF=0, f=1MHz, Ta=25°C VF=1.0, VO=5.5V VF=1.0, VO=5.5V, Ta=25°C IF=10mA IOL=13mA(sinking) IOL=13mA(sinking) VOL=0.6V VCC=5.5V, IF=0 VCC=5.5V, IF=16mA VS=3540V, t=5s Ta=25°C R.H. ≤ 60%, VS=500V DC Ta=25℃ VS=0, f=1MHz Ta=25℃ (Note 4) (Note 4) (Note 4) Min. ― ― ― ― ― ― ― Typ. 1.65 −2 ― 45 ― 0.5 0.4 Max. 1.80 ― 10 ― 250 10 0.6 Unit V mV / °C μA pF IOH μA Low level output voltage "H level output→ L level output" input current High level supply current Low level supply current Input−output insulation leakage current Isolation resistance Stray capacitance between input to output VOL V IFH ICCH ICCL IS ― ― ― ― ― 7 12 ― 10 15 18 100 mA mA mA μA RS 5×10 10 10 14 ― Ω CS ― 0.8 ― pF * All typical values are VCC=5V, Ta=25°C 3 2007-10-01 TLP113 Switching Characteristics (VCC=5V, Ta=25°C) Characteristic Propagation delay time (H→L) Propagation delay time (L→H) Output rise−fall time (10−90%) Common mode transient imunity at high output level Common mode transient imunity at low output level CML 2 CMH 2 Symbol Test Cir− cuit 1 Test Condition IF=0→16mA CL=15pF, RL=350Ω IF=16→0mA CL=15pF, RL=350Ω RL=350Ω, CL=15pF IF=0 16mA Min. Typ. Max. Unit tpHL ― 60 120 ns tpLH 1 ― 60 120 ns tr, tf 2 ― 30 ― ns IF=0mA, VCM=200Vp−p VO(min)=2V, RL=350Ω IF=16mA, VCM=200Vp−p VO(max)=0.8V, RL=350Ω ― 200 ― V / μs ― −500 ― V / μs (Note 4) Device considered a two−terminal device: Pins 1 and 3 shorted together, and pins 4, 5 and 6 shorted together. (Note 5) The VCC supply voltage to each TLP113 isolator must be bypassed by 0.1μF capacitor, this can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible to package VCC and GND pins of each device. (Note 6) Maximum electrostatic discharge voltage for any pins: 180V(C=200pF, R=0) 4 2007-10-01 TLP113 Test Circuit 1: Switching Time Test Circuit VCC = 5V 0.1μF Pulse input PW = 100μs Duty ratio = 1 / 10 IF monitor VCC GND 350Ω IF tf VO tpHL tpLH tr 16mA 8mA 0mA 5V 4.5V 1.5V 0.5V VOL CL VO Output monitor CL is approximately 15pF which includes probe and stray wiring capacitance. Test Circuit 2: Common Mode Transient Immunity Test Circuit IF VCC = 5V VCC GND VCM Pulse gen ZO = 50Ω 0.1μF 350Ω VCM tr 90% 10% tf 200V 0V 5V 2V 0.8V VOL CL VO Output monitor VO (IF = 0mA) VO (IF = 10mA) CΜΗ = 160(V) 160(V) , CΜL = t f (μs) t r (μs) CL is approximately 15pF which includes probe and stray wiring capacitance. 5 2007-10-01 TLP113 IF − VF 100 −4.0 ΔVF / ΔTa − IF Forward voltage temperature coefficient ΔVF / ΔTa (mV / °C ) (mA) 10 −3.2 0−25°C −2.4 25−70°C −1.6 Forward current IF 1 Ta = 70°C 0.1 25°C 0°C 0.01 1 1.2 1.4 1.6 1.8 2.0 −0.8 0.1 0.3 0.5 1 3 5 10 30 Forward voltage VF (V) Forward current IF (mA) V O − IF 10 VCC = 5V Ta = 25°C 5 10 IOH − Ta VF = 1.0V VCC = 5.5V VO = 5.5V (V) High level output current IOH (μA) 8 3 VO 6 RL = 350Ω 4 1 kΩ 4 kΩ 2 Output voltage 1 0.5 0.3 0.1 0 0 0.05 4 6 8 10 2 −20 0 20 40 60 80 Forward current IF (mA) Ambient temperature Ta (°C) V O − IF 10 0.50 VCC = 5V 8 RL = 350Ω RL = 4kΩ VO L − Ta IF = 10mA VCC = 5.5V 0.45 (V) Low level output voltage VO 6 Ta = 70°C 4 Ta = 0°C VOL (V) 0.40 IOL = 16mA 12.8mA Output voltage 0.35 9.6mA 6.4mA 2 0.30 0 0 2 4 6 8 10 −20 0 20 40 60 80 Forward current IF (mA) Ambient temperature Ta (°C) 6 2007-10-01 TLP113 tpHL , tpLH − IF 120 RL = 4kΩ 300 tr, tf − Ta (ns) RL = 4kΩ (ns) 100 260 IF=16mA VCC = 5V 220 tf tr 120 RL = 350Ω 1kΩ 4 kΩ 80 1 kΩ tpHL, tpLH Propagation delay time 1kΩ 350Ω 60 40 RL = 350Ω 1 kΩ 4 kΩ Ta = 25°C VCC = 5V 40 Rise, fall time 80 tr, tf 350Ω tpHL tpLH 0 16 18 20 −20 0 20 40 60 80 20 10 12 14 Forward current IF (mA) Ambient temperature Ta (°C) tpHL , tpLH − Ta 120 RL = 4kΩ (ns) 100 tpHL, tpLH 80 1kΩ 350Ω Propagation delay time 60 40 RL = 350Ω 1 kΩ 4kΩ IF = 16mA VCC = 5V 20 tpHL tpLH 0 −20 0 20 40 60 80 Ambient temperature Ta (°C) 7 2007-10-01 TLP113 RESTRICTIONS ON PRODUCT USE • The information contained herein is subject to change without notice. 20070701-EN • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 8 2007-10-01