TLP115
TOSHIBA Photocoupler GaAℓAs IRed & Photo−IC
TLP115
High Speed, Long Distance Isolated Line Receiver Microprocessor System Interfaces Digital Isolation For A / D, D / A Conversion Computer−Peripheral Interfaces Ground Loop Elimination
The TOSHIBA mini flat coupler TLP115 is small outline coupler, suitable for surface mount assembly. TLP115 consists of a GaAℓAs light emitting diode, optically coupled to an integrated high gain, high speed shielded photo detector whose output is an open collector schottky clamped transistor. The shield, which shunts capacitively coupled common noise to ground, provides a guaranteed transient immunity specification of 1000V / μs. • • • • • • Input current thresholds: IF=10mA (max.) Switching speed: 10MBd (typ.) Common mode transient immunity: ±1000V / μs (min.) Guaranteed performance over temp.: 0~70°C Isolation voltage: 2500Vrms (min.) UL recognized: UL1577, file no. E67349 TOSHIBA Weight: 0.09 g 11−4C2 Unit in mm
Schematic
IF 1 IO VF 5 VO ICC VCC 6
Pin Configuration(top view)
1 VCC 6 5 3 GND 4
GND 3 Shield 4
Note. A 0.1μF bypass capacitor must be connected between pins 4 and 6.
1 : Anode 3 : Cathode 4 : GND 5 : VO(Output) 6 : VCC
Truth Table(positive logic)
Input H L Output L H
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Absolute Maximum Ratings (Ta = 25°C)
Characteristic Forward current Pulse forward current
LED
Symbol IF (Note 1) (Note 2) IFP IFPT VR IO VO VCC Po Topr Tstg Tsol Note 4) BVS
Rating 20 40 1 5 25 7 7 40
−40~85 −55~125
Unit mA mA A V mA V V mW °C °C °C Vrms
Peak transient forward current Reverse voltage Output current
Detector
Output voltage Supply voltage (1 minute maximum) Output power dissipation
Operating temperature range Storage temperature range Lead solder temperature(10s) Isolation voltage (AC, 1min., RH ≤ 60%,
260 2500
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). (Note 1) (Note 2) 50% duty cycle, 1ms pulse width. Pulse width ≤ 1μs, 300pps.
Recommended Operating Conditions
Characteristic Input voltage, low level Input current, high level Supply voltage Fan out (TTL load, each channel) Operating temperature Symbol VFL IFH VCC N Topr Min.
−3
Typ. 0 16 5 ― ―
Max. 1.0 20 5.5 8 70
Unit V mA V ― °C
13 4.5 ― 0
Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document.
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Electrical Characteristics
Characteristic Forward voltage Forward voltage temperature coefficient Reverse current Capacitance between terminals High level output current Low level output voltage “H level output→ L level output" input current High level supply current Low level supply current Input−output insulation leakage current Isolation resistance Stray capacitance between input to output
(unless otherwise specified, Ta = 0~70°C, VCC = 4.5~5.5V, VFL ≤ 1.0V)
Symbol VF VF / Ta IR CT IOH VOL IFH ICCH ICCL IS RS CS Test Condition IF=10mA, Ta=25°C IF=10mA VR=5V, Ta=25°C VF=0, f=1MHz, Ta=25°C VF=1.0, VO=5.5V VF=1.0, VO=5.5V, Ta=25°C IF=10mA IOL=13mA(sinking) IOL=13mA(sinking) VOL=0.6V VCC=5.5V, IF=0 VCC=5.5V, IF=16mA VS=3540V, t=5s Ta=25°C (Note 4) Min. ― ― ― ― ― ― ― ― ― ― ― 5×10 ―
10
Typ.* 1.65
−2
Max. 1.80 ― 10 ― 250 10 0.6 10 15 18 100 ― ―
Unit V mV / °C μA pF μA V mA mA mA μA Ω pF
― 45 ― 0.5 0.4 ― 7 12 ― 10
14
R.H.≤ 60%, VS=500V DC Ta=25°C (Note 4) VS=0, f=1MHz Ta=25°C (Note 4)
0.8
*
All typical values are VCC=5V, Ta=25°C
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Switching Characteristics(VCC = 5V, Ta = 25°C)
Characteristic Propagation delay time (H→L) Propagation delay time (L→H) Output rise fall time (10−90%) Common mode transient immunity at high output level Common mode transient immunity at low output level Symbol tpHL tpLH tr, tf CMH Test Cir− cuit 1 1 2 Test Condition IF=0→ 16mA CL=15pF, RL=350Ω IF=16→ 0mA CL=15pF, RL=350Ω RL=350Ω, CL=15pF IF=0 16mA IF=0mA, VCM=400Vp−p VO(min)=2V, RL=350Ω IF=16mA, VCM=400Vp−p CML 2 VO(max)=0.8V, RL=350Ω
−1000
Min. ― ― ―
Typ. 60 60 30
Max. 120 120 ―
Unit ns ns ns
2
1000
―
―
V / μs
―
―
V / μs
(Note 4) Device considered a two−terminal device: Pins 1 and 3 shorted together, and pins 4, 5 and 6 shorted together. (Note 5) The VCC supply voltage to each TLP115 isolator must be bypassed by 0.1μF capacitor. This can be either a ceramic or solid tantalum capacitor with good high frequency characterstic and should be connected as close as possible to package VCC and GND pins of each device. (Note 6) Maximum electrostatic discharge voltage for any pins: 180V(C=200pF, R=0)
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Test Circuit 1: Switching Time Test Circuit
0.1μF 350Ω
IF Pulse input PW = 100μs Duty ratio = 1 / 10 IF monitor
100Ω
VCC = 5V VCC IF VO Output monitor VO tpHL tpLH tf tr
16mA 8mA 0mA 5V 4.5V
CL GND
1.5V 0.5V VOL
CL is approximately 15pF which includes probe and stray wiring capacitance.
Test Circuit 2: Common Mode Transient Immunity Test Circuit
5V
0.1μF
VCC
350Ω
IF
VCM tr VO (IF = 0mA)
90% 10%
400V
CL GND VCM Pulse generator ZO = 50Ω
VC Output monitor
0V
tf 5V 2V 0.8V
VO (IF = 10mA)
VOL
CMH =
320( V) 320(V) , CML = tr (μs) t f (μs)
CL is approximately 15pF which includes probe and stray wiring capacitance.
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IF – VF
100 - 4.0
ΔVF / ΔTa – IF Forward voltage temperature coefficient ΔVF / ΔTa (mV / °C )
(mA)
10
- 3.2 0 - 25°C -2.4 25 - 70°C -1.6
Forward current
IF
1
Ta = 70°C 0.1
25°C
0°C
0.01 1 1.2 1.4 1.6 1.8 2.0
- 0.8 0.1
0.3
0.5
1
3
5
10
30
Forward voltage
VF
(V)
Forward current
IF
(mA)
VO – IF
10 10 VCC = 5V Ta = 25°C 5
IOH - Ta
VF = 1V VCC = 5.5V VO = 5.5V
(V)
High level output current IOH (μA)
8
3
VO
6 RL = 350Ω 4 1 kΩ 4 kΩ 2
Output voltage
1 0.5 0.3
0.1 0 0 0.05 4 6 8 10 - 20 0
2
20
40
60
80
Forward current
IF
(mA)
Ambient temperature
Ta
(°C)
VO – IF
10 VCC = 5V RL = 350Ω 0.50
VO L – Ta
VOL (V)
IF = 10mA VCC = 5.5V 0.45
(V)
8
RL = 4kΩ
VO
6 Ta = 70°C 4 Ta = 0°C
Low level output voltage
Output voltage
0.40
IOL = 16mA 12.8mA
0.35
9.6mA 6.4mA
2
0.30
0
0
2
4
6
8
10
- 20
0
20
40
60
80
Forward current
IF
(mA)
Ambient temperature
Ta
(°C)
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tpHL, tpLH － IF
120 300 RL = 4kΩ
tr, tf – Ta
(ns)
(ns)
RL = 4kΩ 260 LF = 16mA VCC = 5V 220
tpHL, tpLH
100
tr, tf
80
Rise， fall time
tf tr
Propagation delay time
1kΩ 350Ω 60
120
RL = 350Ω 1 kΩ 4 kΩ 1kΩ
80
40
RL = 350Ω 1 kΩ 4 kΩ
Ta = 25°C VCC = 5V
tpHL tpLH
20
40
350Ω
20 10
0 12 14 16 18 - 20 0 20 40 60 80
Forward current
IF
(mA)
Ambient temperature
Ta
(°C)
tpHL, tpLH － Ta
120 RL = 4kΩ
(ns)
100
tpHL, tpLH
80
1kΩ 350Ω
Propagation delay time
60
40
RL = 350Ω 1 kΩ 4 kΩ IF = 16mA VCC = 5V
20
tpHL tpLH
0 - 20 0 20 40 60 80
Ambient temperature
Ta
(°C)
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RESTRICTIONS ON PRODUCT USE
• The information contained herein is subject to change without notice.
20070701-EN
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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