TLP281_07

TLP281,TLP281-4 TOSHIBA PHOTOCOUPLER GaAs IRED & PHOTO-TRANSISTOR TLP281,TLP281-4 PROGRAMMABLE CONTROLLERS AC/DC-INPUT MODULE PC CARD MODEM(PCMCIA) TLP281 and TLP281-4 is a very small and thin coupler, suitable for surface mount assembly in applications such as PCMCIA Fax modem, programmable controllers. TLP281 and TLP281-4 consist of photo transistor, optically coupled to a gallium arsenide infrared emitting diode. Collector-Emitter Voltage Current Transfer Ratio Rank GB Isolation Voltage UL Recognized BSI Approved : 80 V (MIN) : 50% (MIN) : 100% (MIN) : 2500 Vrms (MIN) : UL1577 , File No. E67349 : BS EN 60065: 2002, : BS EN 60950-1: 2002 Certificate No. 8143, 8144 TOSHIBA Weight: 0.05 g ― Unit in mm Pin Configuration (top view) TLP281 1 2 4 3 1:ANODE 2:CATHODE 3:EMITTER 4:COLLECTOR 1 2 3 4 5 6 7 8 TLP281-4 16 15 14 13 12 11 10 9 TOSHIBA Weight: 0.19 g ― Unit in mm 1,3,5,7 :ANODE 2,4,6,8 :CATHODE 9,11,13,15 :EMITTER 10,12,14,16 :COLLECTOR 1 2007-10-01 TLP281,TLP281-4 TYPE ClassiFication(*1) Blank Rank Y Rank GR Rank BL Current Transfer Ration (%) (IC / IF) IF = 5 mA, VCE = 5 V, Ta = 25℃ Min Max 50 50 100 200 100 75 100 150 200 50 100 600 150 300 600 600 150 200 300 400 600 600 Marking of Classification ■ ■ Blank ,Y ,YE,G,G ,GR,B,BL,GB YE GR BL GB Y ■ TLP281 Rank GB Rank YH Rank GRL Rank GRH Rank BLL G G B Blank , GB GB ■ TLP281-4 Blank Rank GB *1: Ex. rank GB: TLP281 (GB) (Note): Application type name for certification test, please use standard product type name, i.e. TLP281 (GB): TLP281−1 , TLP281−4 (GB): TLP281−4 2 2007-10-01 TLP281,TLP281-4 Absolute Maximum Ratings (Ta = 25℃) CHARACTERISTIC Forward Current Forward Current Derating LED Pulse Forward Current Reverse Voltage Junction Temperature Collector-Emitter Voltage Emitter-Collector Voltage DETECTOR Collector Current Collector Power Dissipation (1 Circuit) Collector Power Dissipation Derating(Ta≥25°C) (1 Circuit) Junction Temperature Operating Temperature Range Storage Temperature Range Lead Soldering Temperature Total Package Power Dissipation (1 Circuit) Total Package Power Dissipation Derating (Ta≥25°C) (1 Circuit) Isolation Voltage (Note1) SYMBOL IF ∆IF /°C IFP VR Tj VCEO VECO IC PC ∆PC /°C Tj Topr Tstg Tsol PT ∆PT /°C BVS 200 −2.0 150 −1.5 125 −55~100 −55~125 260 (10s) 170 −1.7 −0.7 (Ta≥53°C) 1 5 125 80 7 50 100 −1.0 RATING TLP281 50 −0.5 (Ta≥25°C) TLP281−4 UNIT mA mA /°C A V °C V V mA mW mW /°C °C °C °C °C mW mW /°C Vrms 2500(AC,1min,R.H.≤60%) Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). (Note1) Device considered a two terminal device : LED side pins shorted together and DETECTOR side pins shorted together. Individual Electrical Characteristics (Ta = 25℃) CHARACTERISTIC Forward Voltage LED Reverse Current Capacitance Collector-Emitter Breakdown Voltage Emitter-Collector DETECTOR Breakdown Voltage SYMBOL VF IR CT V(BR) CEO TEST CONDITION IF = 10 mA VR = 5 V V = 0, f = 1 MHz IC = 0.5 mA MIN. 1.0 — — 80 TYP. 1.15 — 30 — MAX. 1.3 10 — — UNIT V μA pF V V(BR) ECO IE = 0.1 mA VCE = 48 V, Ambient Light Below (100 ℓx) VCE = 48 V, Ta = 85°C Ambient Light Below (100 ℓx) V = 0, f = 1 MHz 7 — 0.01 (2) 2 (4) 10 — 0.1 (10) 50 (50) — V Collector Dark Current (Note2) Capacitance (Collector to Emitter) — — — μA μA pF ICEO CCE (Note 2) Because of the construction,leak current might be increased by ambient light. Please use photocoupler with less ambient light. 3 2007-10-01 TLP281,TLP281-4 Coupled Electrical Characteristics (Ta = 25℃) CHARACTERISTIC Current Transfer Ratio SYMBOL IC / IF TEST CONDITION IF = 5 mA, VCE = 5 V Rank GB IF = 1 mA, VCE = 0.4 V Rank GB IC = 2.4 mA, IF = 8 mA VCE (sat) IC = 0.2 mA, IF = 1 mA Rank GB IC (off) VF = 0.7 V, VCE = 48 V MIN. 50 100 — 30 — — — — TYP. — — 60 — — 0.2 — — MAX. 600 600 — — 0.4 — 0.4 10 μA V UNIT % Saturated CTR IC / IF (sat) % Collector-Emitter Saturation Voltage Off-State Collector Current Isolation Characteristics (Ta = 25℃) CHARACTERISTIC Capacitance (Input to Output) Isolation Resistance SYMBOL CS RS TEST CONDITION VS = 0 V, f = 1 MHz VS = 500 V, R.H.≤60% AC , 1 minute Isolation Voltage BVS AC , 1 second,in OIL DC , 1 minute, in OIL MIN. — 5×10 10 TYP. 0.8 10 14 MAX. — — — — — UNIT pF Ω Vrms Vdc 2500 — — — 5000 5000 Switching Characteristics (Ta = 25℃) CHARACTERISTIC Rise Time Fall Time Turn-On Time Turn-Off Time Turn-On Time Storage Time Turn-Off Time SYMBOL tr tf ton toff tON ts tOFF RL = 1.9 kΩ (Fig.1) VCC = 5 V, IF = 16 mA VCC = 10 V, IC = 2 mA RL = 100Ω TEST CONDITION MIN. — — — — — — — TYP. 2 3 3 3 2 25 40 MAX. — — — — — — — μs μs UNIT (Fig.1)SWITCHING TIME TEST CIRCUIT 4 2007-10-01 TLP281,TLP281-4 TLP281 TLP281 TLP281-4 TLP281-4 5 2007-10-01 TLP281,TLP281-4 6 2007-10-01 TLP281,TLP281-4 7 2007-10-01 TLP281,TLP281-4 RESTRICTIONS ON PRODUCT USE • The information contained herein is subject to change without notice. 20070701-EN • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 8 2007-10-01