TLP291-4
Photocouplers
Infrared LED & Photo Transistor
TLP291-4
1. Applications
•
Programmable Logic Controllers (PLCs)
•
Switching Power Supplies
•
Simplex/Multiplex Data Transmission
2. General
The Toshiba TLP291-4 consists of phototransistors optically coupled to an infrared LED. The TLP291-4
Photocoupler is housed in the very small and thin SO16 package.
Since the TLP291-4 is guaranteed over a wide operating temperature range (Ta = -55 to 110 ), it is suitable for
high-density surface mount applications such as programmable controllers.
3. Features
(1)
Collector-emitter voltage: 80 V (min)
(2)
Current transfer ratio: 50 % (min)
GB Rank: 100 % (min)
(3)
Isolation voltage: 2500 Vrms (min)
(4)
Operating temperature: -55 to 110
(5)
Safety standards
UL-recognized: UL 1577, File No.E67349
cUL-recognized: CSA Component Acceptance Service No.5A File No.E67349
VDE-approved: EN 60747-5-5 (Note 1)
CQC-approved: GB4943.1, GB8898 Thailand Factory
Note 1: When a VDE approved type is needed, please designate the Option (V4)
(V4).
4. Packaging and Pin Assignment
1, 3, 5, 7: Anode
2, 4, 6, 8: Cathode
9, 11, 13, 15: Emitter
10, 12, 14, 16: Collector
11-11F1
Start of commercial production
©2015-2019
Toshiba Electronic Devices & Storage Corporation
1
2012-03
2019-11-29
Rev.8.0
TLP291-4
5. Principle of Operation
5.1. Mechanical Parameters
Characteristics
Min
Unit
Creepage distances
5.0
mm
Clearance
5.0
Internal isolation thickness
0.1
6. Absolute Maximum Ratings (Note) (Unless otherwise specified, Ta = 25 )
Characteristics
LED
Symbol
Input forward current
Input forward current derating
(Ta ≥ 50 )
Note
Rating
Unit
IF
50
mA
∆IF/∆Ta
-0.67
mA/
Input forward current (pulsed)
IFP
1
A
Input reverse voltage
VR
5
V
Input power dissipation
PD
70
mW
∆PD/∆Ta
-0.93
mW/
Input power dissipation
derating (1 circuit)
(Ta ≥ 50 )
Tj
125
Detector Collector-emitter voltage
Junction temperature
VCEO
80
V
Emitter-collector voltage
VECO
7
V
IC
50
mA
Collector current
Collector power dissipation
Collector power dissipation
derating (1 circuit)
(Ta ≥ 25 )
Junction temperature
Common Operating temperature
Storage temperature
Lead soldering temperature
(10 s)
Total power dissipation
Isolation voltage
(AC, 60 s, R.H. ≤ 60 %)
PC
100
mW
∆PC/∆Ta
-1.0
mW/
Tj
125
Topr
-55 to 110
Tstg
-55 to 125
Tsol
260
PT
170
mW
2500
Vrms
BVS
(Note 2)
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Pulse width (PW) ≤ 100 µs, f = 100 Hz
Note 2: This device is considered as a two-terminal device: All pins on the LED side are shorted together, and all pin
on the photodetector side are shorted together.
©2015-2019
Toshiba Electronic Devices & Storage Corporation
2
2019-11-29
Rev.8.0
TLP291-4
7. Electrical Characteristics (Unless otherwise specified, Ta = 25 )
Characteristics
LED
Symbol
Note
Test Condition
Min
Typ.
Max
Unit
Input forward voltage
VF
IF = 10 mA
1.1
1.20
1.4
V
Input reverse current
IR
VR = 5 V
10
µA
Input capacitance
Ct
V = 0 V, f = 1 MHz
30
pF
Detector Collector-emitter breakdown
voltage
V(BR)CEO
IC = 0.5 mA
80
V
Emitter-collector breakdown
voltage
V(BR)ECO
IE = 0.1 mA
7
Dark Current
IDARK
VCE = 48 V
0.01
0.1
VCE = 48 V, Ta = 85
2
50
Collector-emitter capacitance
CCE
V = 0 V, f = 1 MHz
10
pF
µA
8. Coupled Electrical Characteristics (Unless otherwise specified, Ta = 25 )
Characteristics
Current transfer ratio
Symbol
IC/IF
Note
Test Condition
(Note 1) IF = 5 mA, VCE = 5 V
IF = 5 mA, VCE = 5 V, Rank GB
Saturated current transfer ratio
IC/IF(sat)
Collector-emitter saturation
voltage
VCE(sat)
OFF-state collector current
IC(off)
Min
Typ.
Max
Unit
50
400
%
100
400
IF = 1 mA, VCE = 0.4 V
60
IF = 1 mA, VCE = 0.4 V, Rank GB
30
IC = 2.4 mA, IF = 8 mA
0.4
IC = 0.2 mA, IF = 1 mA
0.2
IC = 0.2 mA, IF = 1 mA, Rank GB
0.4
VF = 0.7 V, VCE = 48 V
10
V
µA
Note 1: See Table 8.1 for current transfer ratio.
Table 8.1 Current transfer ratio (CTR) Rank (Note) (Unless otherwise specified, Ta = 25 )
Rank
Blank
Test Condition
IF = 5 mA, VCE = 5 V
GB
Note:
Current
transfer
ratio IC/IF
Min
Current
transfer
ratio IC/IF
Max
Marking of
Classification
Unit
50
400
Blank,GB
%
100
400
GB
Specify both the part number and a rank in this format when ordering.
Example: TLP291-4(GB,E
For safety standard certification, however, specify the part number alone.
Example: TLP291-4(GB,E: TLP291-4
9. Isolation Characteristics (Unless otherwise specified, Ta = 25 )
Characteristics
Symbol
Note
Test Conditions
Min
Typ.
Max
Unit
0.8
pF
Total capacitance (input to
output)
CS
(Note 1) VS = 0 V, f = 1 MHz
Isolation resistance
RS
(Note 1) VS = 500 V, R.H. ≤ 60 %
1012
1014
Ω
(Note 1) AC, 60 s
2500
Vrms
Isolation voltage
BVS
Note 1: This device is considered as a two-terminal device: All pins on the LED side are shorted together, and all pin
on the photodetector side are shorted together.
©2015-2019
Toshiba Electronic Devices & Storage Corporation
3
2019-11-29
Rev.8.0
TLP291-4
10. Switching Characteristics (Unless otherwise specified, Ta = 25 )
Characteristics
Symbol
Rise time
tr
Fall time
tf
Note
Test Condition
VCC = 10 V, IC = 2 mA,
RL = 100 Ω
Min
Typ.
Max
Unit
2
µs
3
Turn-on time
ton
3
Turn-off time
toff
3
Turn-on time
ton
2
Storage time
ts
25
Turn-off time
toff
60
See Figure 10.1
RL = 1.9 kΩ, VCC = 5 V,
IF = 16 mA
Fig. 10.1 Switching Time Test Circuit and Waveform
©2015-2019
Toshiba Electronic Devices & Storage Corporation
4
2019-11-29
Rev.8.0
TLP291-4
11. Characteristics Curves (Note)
Fig. 11.1 IF - Ta
Fig. 11.2 PC - Ta
Fig. 11.3 IFP - DR
Fig. 11.4 IF - VF
Fig. 11.5 ∆VF/∆Ta - IF
Fig. 11.6 IFP - VFP
©2015-2019
Toshiba Electronic Devices & Storage Corporation
5
2019-11-29
Rev.8.0
TLP291-4
Fig. 11.7 IC - VCEO
Fig. 11.8 IC - VCEO
Fig. 11.9 IC - IF
Fig. 11.10 IDARK - Ta
Fig. 11.11 IC/IF - IF
©2015-2019
Toshiba Electronic Devices & Storage Corporation
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2019-11-29
Rev.8.0
TLP291-4
Note:
Fig. 11.12 VCE(sat) - Ta
Fig. 11.13 IC - Ta
Fig. 11.14 Switching Time - RL
Fig. 11.15 Switching Time - Ta
The above characteristics curves are presented for reference only and not guaranteed by production test,
unless otherwise noted.
©2015-2019
Toshiba Electronic Devices & Storage Corporation
7
2019-11-29
Rev.8.0
TLP291-4
12. Soldering and Storage
12.1. Precautions for Soldering
The soldering temperature should be controlled as closely as possible to the conditions shown below, irrespective
of whether a soldering iron or a reflow soldering method is used.
•
When using soldering reflow.
The soldering temperature profile is based on the package surface temperature.
(See the figure shown below, which is based on the package surface temperature.)
Reflow soldering must be performed once or twice.
The mounting should be completed with the interval from the first to the last mountings being 2 weeks.
An Example of a Temperature Profile When Lead(Pb)-Free Solder Is Used
•
When using soldering flow
Preheat the device at a temperature of 150 (package surface temperature) for 60 to 120 seconds.
Mounting condition of 260 within 10 seconds is recommended.
Flow soldering must be performed once.
•
When using soldering Iron
Complete soldering within 10 seconds for lead temperature not exceeding 260 or within 3 seconds not
exceeding 350
Heating by soldering iron must be done only once per lead.
12.2. Precautions for General Storage
•
Avoid storage locations where devices may be exposed to moisture or direct sunlight.
•
Follow the precautions printed on the packing label of the device for transportation and storage.
•
Keep the storage location temperature and humidity within a range of 5 to 35 and 45 % to 75 %,
respectively.
•
Do not store the products in locations with poisonous gases (especially corrosive gases) or in dusty
conditions.
•
Store the products in locations with minimal temperature fluctuations. Rapid temperature changes during
storage can cause condensation, resulting in lead oxidation or corrosion, which will deteriorate the
solderability of the leads.
•
When restoring devices after removal from their packing, use anti-static containers.
•
Do not allow loads to be applied directly to devices while they are in storage.
•
If devices have been stored for more than two years under normal storage conditions, it is recommended
that you check the leads for ease of soldering prior to use.
©2015-2019
Toshiba Electronic Devices & Storage Corporation
8
2019-11-29
Rev.8.0
TLP291-4
13. Land Pattern Dimensions (for reference only)
Unit: mm
14. Marking
15. Ordering Information
When placing an order, please specify the part number, CTR rank, tape type and quantity as shown in the
following example.
Example) TLP291-4(GB-TP,E 2000 pcs
Part number: TLP291-4
CTR rank: (GB
Tape type: TP
[[G]]/RoHS COMPATIBLE: E (Note 1)
Quantity (must be a multiple of 2000): 2000 pcs
Note 1: Please contact your Toshiba sales representative for details on environmental information such as the product's
RoHS compatibility.
RoHS is the Directive 2011/65/EU of the European Parliament and of the Council of 8 June 2011 on the
restriction of the use of certain hazardous substances in electrical and electronic equipment.
©2015-2019
Toshiba Electronic Devices & Storage Corporation
9
2019-11-29
Rev.8.0
TLP291-4
Package Dimensions
Unit: mm
Weight: 0.19 g (typ.)
Package Name(s)
TOSHIBA: 11-11F1
©2015-2019
Toshiba Electronic Devices & Storage Corporation
10
2019-11-29
Rev.8.0
TLP291-4
RESTRICTIONS ON PRODUCT USE
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Hardware, software and systems described in this document are collectively referred to as "Product".
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for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and systems which
minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily injury or damage
to property, including data loss or corruption. Before customers use the Product, create designs including the Product, or incorporate
the Product into their own applications, customers must also refer to and comply with (a) the latest versions of all relevant TOSHIBA
information, including without limitation, this document, the specifications, the data sheets and application notes for Product and the
precautions and conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the instructions for the application
with which the Product will be used with or for. Customers are solely responsible for all aspects of their own product design or applications,
including but not limited to (a) determining the appropriateness of the use of this Product in such design or applications; (b) evaluating
and determining the applicability of any information contained in this document, or in charts, diagrams, programs, algorithms, sample
application circuits, or any other referenced documents; and (c) validating all operating parameters for such designs and applications.
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AS A RESULT OF NONCOMPLIANCE WITH APPLICABLE LAWS AND REGULATIONS.
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©2015-2019
Toshiba Electronic Devices & Storage Corporation
11
2019-11-29
Rev.8.0