TLP350,TLP350F
Photocouplers
GaAℓAs Infrared LED & Photo IC
TLP350,TLP350F
1. Applications
•
Industrial Inverters
•
Air Conditioner Inverters
•
MOSFET Gate Drivers
•
IGBT Gate Drivers
•
Induction Cooktop and Home Appliances
2. General
The TLP350 is a photocoupler in a DIP8 package that consists of a GaAℓAs infrared light-emitting diode (LED)
optically coupled to an integrated high-gain, high-speed photodetector IC chip. It provides guaranteed performance
and specifications at temperatures up to 100 . The TLP350 has an internal Faraday shield that provides a
guaranteed Common-mode transient immunity of ±15 kV/µs. It has a totem-pole output that can both sink and
source current. The TLP350 is ideal for IGBT of small capacity to middle capacity and power MOSFET gate drive.
3. Features
(1)
Buffer logic type (totem pole output)
(2)
Output peak current: ±2.5 A (max)
(3)
Operating temperature: -40 to 100
(4)
Supply current: 2.0 mA (max)
(5)
Supply voltage: 15 to 30 V
(6)
Threshold input current: 5 mA (max)
(7)
Propagation delay time: 500 ns (max)
(8)
Common-mode transient immunity: ±15 kV/µs (min)
(9)
Isolation voltage: 3750 Vrms (min)
(10) Safety standards
UL-approved: UL1577, File No.E67349
cUL-approved: CSA Component Acceptance Service No.5A File No.E67349
VDE-approved: EN60747-5-5 (Note 1)
CQC-approved: GB4943.1, GB8898 Japan Factory
Note 1: When an EN60747-5-5 approved type is needed, please designate the Option (D4)
(D4).
Start of commercial production
©2016-2017
Toshiba Electronic Devices & Storage Corporation
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2005-05
2017-10-18
Rev.1.0
TLP350,TLP350F
4. Packaging (Note)
TLP350
TLP350(LF1,TP1)
11-10C401S
11-10C4S
TLP350F
11-10C405S
TLP350F(LF4,TP4)
11-10C402S
Note:
TLP350(LF5,TP5)
11-10C404S
Through-hole type: TLP350, TLP350F
Lead forming option: (LF1), (LF4), (LF5)
Taping option: (TP1), (TP4), (TP5)
5. Pin Assignment
1: N.C.
2: Anode
3: Cathode
4: N.C.
5: GND
6: VO (Output)
7: N.C.
8: VCC
©2016-2017
Toshiba Electronic Devices & Storage Corporation
2
2017-10-18
Rev.1.0
TLP350,TLP350F
6. Internal Circuit (Note)
Note:
A 0.1-µF bypass capacitor must be connected between pin 8 and pin 5.
7. Principle of Operation
7.1. Truth Table
Input
LED
M1
M2
Output
H
ON
ON
OFF
H
L
OFF
OFF
ON
L
7.2. Mechanical Parameters
7.62 mm Pitch
TLP350
10.16 mm Pitch
TLP350F
Unit
Creepage distances
7.0 (min)
8.0 (min)
mm
Clearance distances
7.0 (min)
8.0 (min)
Internal isolation thickness
0.4 (min)
0.4 (min)
Characteristics
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Toshiba Electronic Devices & Storage Corporation
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2017-10-18
Rev.1.0
TLP350,TLP350F
8. Absolute Maximum Ratings (Note) (Unless otherwise specified, Ta = 25 )
Characteristics
LED
Symbol
Input forward current
Input forward current derating
IF
20
mA
-0.54
mA/
1
A
(Ta ≥ 85 )
∆IFPT/∆Ta
-25
mA/
VR
5
V
IFPT
Input power dissipation
Peak low-level output current
(Note 1)
PD
40
mW
(Ta ≥ 85 )
∆PD/∆Ta
-1.0
mW/
125
(Ta = -40 to 100 )
IOPH
(Note 2)
-2.5
A
(Ta = -40 to 100 )
IOPL
(Note 2)
+2.5
Junction temperature
Detector Peak high-level output current
Unit
∆IF/∆Ta
Input reverse voltage
Input power dissipation derating
Rating
(Ta ≥ 85 )
Peak transient input forward current
Peak transient input forward current
derating
Note
Tj
Output voltage
VO
35
V
Supply voltage
(Ta < 95 )
VCC
35
Supply voltage derating
(Ta ≥ 95 )
∆VCC/∆Ta
-1.0
PO
260
mW
(Ta ≥ 110 )
∆PO/∆Ta
-6.5
mW/
Output power dissipation
Output power dissipation derating
Junction temperature
Tj
Common Operating frequency
f
Operating temperature
Topr
Storage temperature
Lead soldering temperature
Isolation voltage
(Note 3)
Tstg
V/
125
50
kHz
-40 to 100
-55 to 125
(10 s)
Tsol
(Note 4)
260
(AC, 60 s, R.H. ≤ 60 %)
BVS
(Note 5)
3750
Vrms
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note: A ceramic capacitor (0.1 µF) should be connected between pin 8 and pin 5 to stabilize the operation of a highgain linear amplifier. Otherwise, this photocoupler may not switch properly. The bypass capacitor should be
placed within 1 cm of each pin.
Note 1: Pulse width (PW) ≤ 1 µs, 300 pps
Note 2: Exponential waveform. Pulse width ≤ 0.3 µs, f ≤ 15 kHz
Note 3: If the rising slope of the supply voltage (VCC) for the detector is steep, stable operation of the internal circuits
cannot be guaranteed.
Be sure to set 3.0 V/µs or less for a rising slope of the VCC.
Note 4: ≥ 2 mm below seating plane.
Note 5: This device is considered as a two-terminal device: Pins 1, 2, 3 and 4 are shorted together, and pins 5, 6, 7
and 8 are shorted together.
©2016-2017
Toshiba Electronic Devices & Storage Corporation
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2017-10-18
Rev.1.0
TLP350,TLP350F
9. Recommended Operating Conditions (Note)
Characteristics
Symbol
Note
Min
Typ.
Max
Unit
Input on-state current
IF(ON)
(Note 1)
7.5
Input off-state voltage
VF(OFF)
0
10
mA
0.8
V
Supply voltage
VCC
(Note 2)
15
30
Peak high-level output current
IOPH
(Note 3)
-2.0
Peak low-level output current
IOPL
(Note 3)
+2.0
Operating temperature
Topr
-40
100
A
Note:
The recommended operating conditions are given as a design guide necessary to obtain the intended
performance of the device. Each parameter is an independent value. When creating a system design using
this device, the electrical characteristics specified in this data sheet should also be considered.
Note 1: The rise and fall times of the input on-current should be less than 0.5 µs.
Note 2: Denotes the operating range, not the recommended operating condition.
Note 3: Exponential waveform. IOPH ≥ -2.0 A (≤ 0.3 µs), IOPL ≤ 2.0 A (≤ 0.3 µs), Ta = 100
10. Electrical Characteristics (Note)
(Unless otherwise specified, Ta = -40 to 100 )
Characteristics
Input forward voltage
Symbol
Note
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
VF
IF = 10 mA, Ta = 25
1.6
1.8
V
∆VF/∆Ta
IF = 10 mA
-2.4
mV/
Input reverse current
IR
VR = 5 V, Ta = 25
10
µA
Input capacitance
Ct
V = 0 V, f = 1 MHz, Ta = 25
45
250
pF
VCC = 30 V, IF = 5 mA,
V8-6 = 3.5 V
-2.5
-1.0
A
VCC = 15 V, IF = 5 mA,
V8-6 = 7.0 V
-2.0
VCC = 30 V, IF = 0 mA,
V6-5 = 2.5 V
1.0
2.5
VCC = 15 V, IF = 0 mA,
V6-5 = 7.0 V
2.0
Input forward voltage
temperature coefficient
Peak high-level output current
Peak low-level output current
IOPH
IOPL
(Note 1)
(Note 1)
Fig.
13.1.1
Fig.
13.1.2
High-level output voltage
VOH
Fig.
13.1.3
VCC1 = +15 V,
VEE1 = -15 V,
RL = 200 Ω, IF = 5 mA
11.0
13.9
Low-level output voltage
VOL
Fig.
13.1.4
VCC1 = +15 V,
VEE1 = -15 V,
RL = 200 Ω, VF = 0.8 V
-14.9
-12.5
High-level supply current
ICCH
Fig.
13.1.5
VCC = 30 V, IF = 10 mA,
VO = Open
1.5
2.0
Low-level supply current
ICCL
Fig.
13.1.6
VCC = 30 V, IF = 0 mA,
VO = Open
1.5
2.0
Threshold input current (L/H)
IFLH
VCC = 15 V, VO > 1 V,
IO = 0 mA
1.2
5
Threshold input voltage (H/L)
VFHL
VCC = 15 V, VO < 1 V,
IO = 0 mA
0.8
V
Supply voltage
VCC
15
30
V
VUVLO+
Fig.
13.1.9
IF = 5 mA, VO > 2.5 V
11.0
12.5
13.5
VUVLO-
Fig.
13.1.9
IF = 5 mA, VO < 2.5 V
9.5
11.0
12.0
UVLOHYS
Fig.
13.1.9
1.5
UVLO threshold voltage
UVLO hysteresis
V
mA
Note: All typical values are at Ta = 25 .
Note : This device is designed for low power consumption, making it more sensitive to ESD than its predecessors.
Extra care should be taken in the design of circuitry and pc board implementation to avoid ESD problems.
Note 1: IO application time ≤ 50 µs; single pulse.
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Toshiba Electronic Devices & Storage Corporation
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2017-10-18
Rev.1.0
TLP350,TLP350F
11. Isolation Characteristics (Unless otherwise specified, Ta = 25 )
Characteristics
Symbol
Note
Test Conditions
Total capacitance (input to output)
CS
(Note 1) VS = 0 V, f = 1 MHz
Isolation resistance
RS
(Note 1) VS = 500 V, R.H. ≤ 60 %
Isolation voltage
BVS
(Note 1) AC, 60 s
Min
Typ.
Max
Unit
1.0
pF
1 × 1012
1014
Ω
Vrms
3750
AC, 1 s in oil
10000
DC, 60 s in oil
10000
Vdc
Note 1: This device is considered as a two-terminal device: Pins 1, 2, 3 and 4 are shorted together, and pins 5, 6, 7
and 8 are shorted together.
12. Switching Characteristics (Note) (Unless otherwise specified, Ta = -40 to 100 )
Characteristics
Symbol
Note
Propagation delay time
(L/H)
tpLH
(Note 1)
Propagation delay time
(H/L)
tpHL
Test
Circuit
Min
Typ.
Max
Unit
IF = 0 → 5 mA, VCC = 30 V,
Rg = 20 Ω, Cg = 10 nF
50
150
500
ns
(Note 1)
IF = 5 → 0 mA, VCC = 30 V,
Rg = 20 Ω, Cg = 10 nF
50
150
500
|tpHL-tpLH|
(Note 1)
IF = 0 ←→ 5 mA, VCC = 30 V,
Rg = 20 Ω, Cg = 10 nF
350
Rise time
tr
(Note 1)
IF = 0 → 5 mA, VCC = 30 V,
Rg = 20 Ω, Cg = 10 nF
15
Fall time
tf
(Note 1)
IF = 5 → 0 mA, VCC = 30 V,
Rg = 20 Ω, Cg = 10 nF
8
Common-mode transient
immunity at output high
CMH
(Note 2)
VCM = 1000 Vp-p, IF = 5 mA,
VCC = 30 V, Ta = 25 ,
VO(min) = 26 V
-15
Common-mode transient
immunity at output low
CML
(Note 3)
VCM = 1000 Vp-p, IF = 0 mA,
VCC = 30 V, Ta = 25 ,
VO(max) = 1 V
15
Pulse width distortion
Fig.
13.1.7
Fig.
13.1.8
Test Condition
kV/µs
Note: All typical values are at Ta = 25 .
Note 1: f = 25 kHz, duty = 50 %, input current tr = tf = 5 ns, CL is approximately 15 pF which includes probe and stray
wiring capacitance.
Note 2: CMH is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage
in the logic high state (VO > 26 V).
Note 3: CML is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in
the logic low state (VO < 1 V).
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2017-10-18
Rev.1.0
TLP350,TLP350F
13. Test Circuits and Characteristics Curves
13.1. Test Circuits
Fig. 13.1.1 IOPH Test Circuit
Fig. 13.1.2 IOPL Test Circuit
Fig. 13.1.3 VOH Test Circuit
Fig. 13.1.4 VOL Test Circuit
Fig. 13.1.5 ICCH Test Circuit
Fig. 13.1.6 ICCL Test Circuit
Fig. 13.1.7 Switching Time Test Circuit and Waveform
Fig. 13.1.8 Common-Mode Transient Immunity Test Circuit and Waveform
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2017-10-18
Rev.1.0
TLP350,TLP350F
Fig. 13.1.9 VCC-VO(VUVLO) Test Circuit
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Toshiba Electronic Devices & Storage Corporation
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2017-10-18
Rev.1.0
TLP350,TLP350F
13.2. Characteristics Curves (Note)
Fig. 13.2.1 IF - VF
Fig. 13.2.2 ∆VF/∆Ta - IF
Fig. 13.2.3 IF - Ta
Fig. 13.2.4 VCC - Ta
Fig. 13.2.5 IFLH - Ta
Fig. 13.2.6 VO(VUVLO) - VCC
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2017-10-18
Rev.1.0
TLP350,TLP350F
Fig. 13.2.7 ICCL - Ta
Fig. 13.2.8 ICCH - Ta
Fig. 13.2.9 VOL - Ta
Fig. 13.2.10 VOH - Ta
Fig. 13.2.11 VOL - IOPL
Fig. 13.2.12 (VOH-VCC) - IOPH
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TLP350,TLP350F
Fig. 13.2.13 tpLH,tpHL,|tpHL-tpLH| - Ta
Fig. 13.2.14 tpLH,tpHL,|tpHL-tpLH| - IF
Fig. 13.2.15 tpLH,tpHL,|tpHL-tpLH| - VCC
Note:
The above characteristics curves are presented for reference only and not guaranteed by production test,
unless otherwise noted.
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Toshiba Electronic Devices & Storage Corporation
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2017-10-18
Rev.1.0
TLP350,TLP350F
14. Soldering and Storage
14.1. Precautions for Soldering
The soldering temperature should be controlled as closely as possible to the conditions shown below, irrespective
of whether a soldering iron or a reflow soldering method is used.
•
When using soldering reflow.
The soldering temperature profile is based on the package surface temperature.
(See the figure shown below, which is based on the package surface temperature.)
Reflow soldering must be performed once or twice.
The mounting should be completed with the interval from the first to the last mountings being 2 weeks.
Fig. 14.1.1 An example of a temperature profile
when Sn-Pb eutectic solder is used
•
Fig. 14.1.2 An example of a temperature profile
when lead(Pb)-free solder is used
When using soldering flow (Applicable to both eutectic solder and Lead(Pb)-Free solder)
Preheat the device at a temperature of 150 (package surface temperature) for 60 to 120 seconds.
Mounting condition of 260 within 10 seconds is recommended.
Flow soldering must be performed once.
•
When using soldering Iron
Complete soldering within 10 seconds for lead temperature not exceeding 260 or within 3 seconds not
exceeding 350
Heating by soldering iron must be done only once per lead.
14.2. Precautions for General Storage
•
Avoid storage locations where devices may be exposed to moisture or direct sunlight.
•
Follow the precautions printed on the packing label of the device for transportation and storage.
•
Keep the storage location temperature and humidity within a range of 5 to 35 and 45 % to 75 %,
respectively.
•
Do not store the products in locations with poisonous gases (especially corrosive gases) or in dusty
conditions.
•
Store the products in locations with minimal temperature fluctuations. Rapid temperature changes during
storage can cause condensation, resulting in lead oxidation or corrosion, which will deteriorate the
solderability of the leads.
•
When restoring devices after removal from their packing, use anti-static containers.
•
Do not allow loads to be applied directly to devices while they are in storage.
•
If devices have been stored for more than two years under normal storage conditions, it is recommended
that you check the leads for ease of soldering prior to use.
©2016-2017
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2017-10-18
Rev.1.0
TLP350,TLP350F
15. Land Pattern Dimensions (for reference only)
Unit: mm
TLP350
TLP350F
Fig. 15.1 Lead forming and taping option
(LF1), (TP1), (LF5), (TP5)
Fig. 15.2 Lead forming and taping option
(LF4), (TP4)
16. Marking (Note)
TLP350
Note:
TLP350F
A different marking is used for photocouplers that have been qualified according to option (D4) of EN60747.
See Fig.17.4 and Fig.17.5.
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2017-10-18
Rev.1.0
TLP350,TLP350F
17. EN60747-5-5 Option (D4) Specification
•
Part number: TLP350, TLP350F (Note 1)
•
The following part naming conventions are used for the devices that have been qualified according to
option (D4) of EN60747.
Example: TLP350(D4-TP1,F)
D4: EN60747 option
TP1: Tape type
F: [[G]]/RoHS COMPATIBLE (Note 2)
Note 1: Use TOSHIBA standard type number for safety standard application.
e.g., TLP350(D4-TP1,F) → TLP350
Note 2: Please contact your Toshiba sales representative for details on environmental information such as the product's
RoHS compatibility.
RoHS is the Directive 2011/65/EU of the European Parliament and of the Council of 8 June 2011 on the
restriction of the use of certain hazardous substances in electrical and electronic equipment.
Fig. 17.1 EN60747 Isolation Characteristics
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TLP350,TLP350F
Fig. 17.2 Insulation Related Specifications (Note)
Note:
Note:
If a printed circuit is incorporated, the creepage distance and clearance may be reduced below this value. (e.
g., at a standard distance between soldering eye centers of 7.5 mm). If this is not permissible, the user shall
take suitable measures.
This photocoupler is suitable for safe electrical isolation only within the safety limit data.
Maintenance of the safety data shall be ensured by means of protective circuits.
Fig. 17.3 Marking on Packing for EN60747
Fig. 17.4 Marking Example (Note)
Note:
Fig. 17.5 Marking Example (Note)
The above marking is applied to the photocouplers that have been qualified according to option (D4) of EN60747.
©2016-2017
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2017-10-18
Rev.1.0
TLP350,TLP350F
Fig. 17.6 Measurement Procedure
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Toshiba Electronic Devices & Storage Corporation
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2017-10-18
Rev.1.0
TLP350,TLP350F
Package Dimensions
Unit: mm
TLP350
Weight: 0.54 g (typ.)
Package Name(s)
TOSHIBA: 11-10C4S
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2017-10-18
Rev.1.0
TLP350,TLP350F
Package Dimensions
Unit: mm
TLP350(LF1,TP1)
Weight: 0.53 g (typ.)
Package Name(s)
TOSHIBA: 11-10C401S
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2017-10-18
Rev.1.0
TLP350,TLP350F
Package Dimensions
Unit: mm
TLP350(LF5,TP5)
Weight: 0.53 g (typ.)
Package Name(s)
TOSHIBA: 11-10C405S
©2016-2017
Toshiba Electronic Devices & Storage Corporation
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2017-10-18
Rev.1.0
TLP350,TLP350F
Package Dimensions
Unit: mm
TLP350F
Weight: 0.54 g (typ.)
Package Name(s)
TOSHIBA: 11-10C402S
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2017-10-18
Rev.1.0
TLP350,TLP350F
Package Dimensions
Unit: mm
TLP350F(LF4,TP4)
Weight: 0.53 g (typ.)
Package Name(s)
TOSHIBA: 11-10C404S
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TLP350,TLP350F
RESTRICTIONS ON PRODUCT USE
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precautions and conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the instructions for the application
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AS A RESULT OF NONCOMPLIANCE WITH APPLICABLE LAWS AND REGULATIONS.
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