TLP351
TOSHIBA Photocoupler IRED + Photo IC
TLP351
Inverter for Air Conditioner
IGBT/Power MOS FET Gate Drive
Industrial Inverter
Unit: mm
The TOSHIBA TLP351 consists of an infrared emitting diode and an
integrated photodetector.
This unit is 8-lead DIP package.
TLP351 is suitable for gate driving circuit of IGBT or power MOS FET.
Especially TLP351 is capable of “direct” gate drive of lower Power IGBTs.
•
Peak output current: ±0.6 A (max)
•
Guaranteed performance over temperature: −40 to 100°C
•
Supply current: 2 mA (max)
•
Power supply voltage: 10 to 30 V
•
•
Threshold input current : IF = 5 mA (max)
Switching time (tpLH/tpHL) : 700 ns (max)
•
Common mode transient immunity: ±10 kV/μs
•
Isolation voltage: 3750 Vrms
TOSHIBA
•
UL-recognized: UL 1577, File No.E67349
•
cUL-recognized: CSA Component Acceptance Service No.5A
File No.E67349
•
VDE-approved: EN 60747-5-5 (Note 1)
11-10C4S
Weight: 0.54 g (typ.)
Note 1: When a VDE approved type is needed,
please designate the Option(D4).
Truth Table
Pin Configuration (top view)
Input
LED
Tr1
Tr2
Output
1
8
H
ON
ON
OFF
H
2
7
L
OFF
OFF
ON
L
3
6
4
5
Schematic
1: N.C.
2: Anode
3: Cathode
4: N.C.
5: GND
6: VO (output)
7: N.C.
8: VCC
ICC
IF
(Tr1)
8
VCC
2+
VF
3−
(Tr2)
IO
6
VO
GND
5
A 0.1 μF bypass capacitor must be connected
between pin 8 and 5.
© 2019
Toshiba Electronic Devices & Storage Corporation
Start of commercial production
2002-05
1
2019-06-24
TLP351
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Symbol
Rating
Unit
IF
20
mA
∆IF/∆Ta
−0.54
mA/°C
IFP
1
A
Reverse voltage
VR
5
V
Power Dissipation
PD
40
mW
∆PD /°C
-1.0
mW/°C
Tj
125
°C
Forward current
Forward current derating (Ta ≥ 85°C)
LED
Peak transient forward current
(Note 1)
Power Dissipation Derating (Ta ≥ 85°C)
Junction temperature
(Note 2)
IOPH
−0.6
A
“L” peak output current
(Note 2)
IOPL
0.6
A
Output voltage
VO
35
V
Supply voltage
VCC
35
V
Output Power Dissipation
PO
260
mW
∆PO /°C
-6.5
mW/°C
Tj
125
°C
f
25
kHz
Storage temperature range
Tstg
−55 to 125
°C
Operating temperature range
Topr
−40 to 100
°C
Detector
“H” peak output current
Output Power Dissipation Derating (Ta ≥ 85°C)
Junction temperature
Operating frequency
(Note 3)
Lead soldering temperature (10 s)
(Note 4)
Tsol
260
°C
Isolation voltage (AC, 60 s, R.H. ≤ 60 %)
(Note 5)
BVS
3750
Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Pulse width PW ≤ 1 μs, 300 pps
Note 2: Exponential waveform pulse width PW ≤ 10 μs, f ≤ 15 kHz
Note 3: Exponential waveform IOPH ≤ −0.4 A (≤ 2.0 μs), IOPL ≤ +0.4 A (≤ 2.0 μs), Ta = 100 °C
Note 4: It is 2 mm or more from a lead root.
Note 5: Device considered a two terminal device: pins 1, 2, 3 and 4 shorted together, and pins 5, 6, 7 and 8 shorted
together.
Recommended Operating Conditions
Characteristics
Input current, ON
Input voltage, OFF
Supply voltage
Peak output current
Operating temperature
(Note 7)
Symbol
Min
Typ.
Max
Unit
IF (ON)
7.5
―
10
mA
VF (OFF)
0
―
0.8
V
VCC
10
―
30
V
IOPH/IOPL
―
―
±0.2
A
Topr
−40
―
100
°C
Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the
device. Additionally, each item is an independent guideline respectively. In developing designs using this product,
please confirm specified characteristics shown in this document.
Note 7: Input signal rise time (fall time) < 0.5 μs
© 2019
Toshiba Electronic Devices & Storage Corporation
2
2019-06-24
TLP351
Electrical Characteristics (Ta = −40 to 100°C, unless otherwise specified)
Symbol
Test
Circuit
VF
―
∆VF/∆Ta
Input reverse current
Input capacitance
Characteristics
Forward voltage
Temperature coefficient of forward
voltage
“H” Level
Output current
(Note 8)
“L” Level
“H” Level
Min
Typ.*
Max
Unit
IF = 5 mA, Ta = 25 °C
―
1.55
1.70
V
―
IF = 5 mA
―
−2.0
―
mV/°C
IR
―
VR = 5 V, Ta = 25 °C
―
―
10
μA
CT
―
V = 0 V , f = 1 MHz,Ta = 25 °C
―
45
―
pF
1
VCC = 15 V
IF = 5 mA
V8-6 = 4 V
―
−0.4
−0.2
V8-6 = 10 V
―
−0.67
−0.4
2
VCC = 15 V
IF = 0 mA
V6-5 = 2 V
0.2
0.35
―
V6-5 = 10 V
0.4
0.63
―
IO = −100 mA,
IF = 5 mA
6.0
8.5
―
IO = 100 mA,
VF = 0.8 V
―
0.4
1.0
―
1.4
2.0
―
1.3
2.0
IOPH1
IOPH2
IOPL1
IOPL2
Test Condition
3
VOH
VCC = 10 V
Output voltage
A
V
“L” Level
VOL
4
“H” Level
ICCH
5
“L” Level
ICCL
6
VCC = 10 to 30 V IF = 10 mA
VO open
IF = 0 mA
Threshold input current
L → H
IFLH
―
VCC = 15 V, VO > 1 V
―
2.5
5
mA
Threshold input voltage
H → L
VFHL
―
VCC = 15 V, VO < 1 V
0.8
―
―
V
VCC
―
10
―
30
V
Supply current
Supply voltage
―
mA
*: All typical values are at Ta = 25°C
Note 8: Duration of IO time ≤ 50 μs
Note 9: This product is more sensitive than the conventional product to static electricity (ESD) because of a lowest
power consumption design.
General precaution to static electricity (ESD) is necessary for handling this component.
Isolation Characteristics (Ta = 25°C)
Characteristic
Symbol
Test Conditions
Min
Typ.
Max
Unit
―
1.0
―
pF
1014
―
Ω
―
―
Vrms
Capacitance input to output
CS
VS = 0V, f = 1MHz
(Note5)
Isolation resistance
RS
VS = 500 V, R.H. ≤ 60 %
(Note5) 1×1012
Isolation voltage
BVS
AC,60 s
© 2019
Toshiba Electronic Devices & Storage Corporation
3
3750
2019-06-24
TLP351
Switching Characteristics (Ta = −40 to 100°C, unless otherwise specified)
Characteristics
Symbol
L → H
tpLH
H → L
tpHL
Test
Circuit
VCC = 30 V
Propagation delay time
Propagation delay difference
between any two parts or channels
PDD
|tpHL-tpLH|
Output rise time (10-90%)
tr
Output fall time (90-10%)
tf
Test Condition
Cg = 3 nF
CML
IF = 0 → 5 mA
100
―
700
IF = 5 → 0 mA
100
―
700
−500
―
500
IF = 0 → 5 mA
―
50
―
IF = 5 → 0 mA
―
50
―
―
―
―
―
Rg = 47 Ω
Unit
ns
Cg = 3 nF
ns
Cg = 3 nF
Common mode transient immunity
at low level output
Max
VCC = 30 V,
7
Rg = 47 Ω
CMH
Typ.*
ns
Rg = 47 Ω
VCC = 30 V
Common mode transient immunity
at high level output
Min
8
IF = 5 mA
VCM = 1000 Vp-p VO (min) = 26 V −10000
Ta = 25 °C
IF = 0 mA
VCC = 30 V
10000
VO (max) = 1 V
V/μs
*: All typical values are at Ta = 25°C
Test Circuit 1: IOPH
1
Test Circuit 2: IOPL
8
1
8
V8-6
IOPL
A IOPH
IF
A
VCC
4
4
5
Test Circuit 3: VOH
1
8
VOH
1
8
V
VOL
VF
VCC
4
5
Test Circuit 5: ICCH
1
V6-5
5
Test Circuit 4: VOL
IF
4
VCC
VCC
V
5
Test Circuit 6: ICCL
8
ICCH
1
A
8
ICCL
A
IF
VCC
4
VCC
4
5
© 2019
Toshiba Electronic Devices & Storage Corporation
4
5
2019-06-24
TLP351
Test Circuit 7: tpLH, tpHL, tr, tf, PDD
8
0.1 μF
1
IF
IF
VO
Rg = 47 Ω
VCC
Cg = 3 nF
4
tr
tf
90%
50%
10%
VO
5
tpHL
tpLH
Test Circuit 8: CMH, CML
CML (CMH) is the maximum rate of rise (fall) of the common mode voltage that can be sustained with the
output voltage in the low (high) state.
A
VCM
0.1 μF
IF
SW
B
VO
4
−
tf
• SW A: IF = 5 mA
VO
VCM
© 2019
Toshiba Electronic Devices & Storage Corporation
10%
tr
VCC
5
+
1000 V
90%
8
1
1V
• SW B: IF = 0 mA
5
CML =
800 V
tr (μs)
CMH =
800 V
tf (μs)
CMH
26V
CML
2019-06-24
TLP351
I F ─ VF
-2.6
100
Ta = 25 °C
C o e f f i c i e n t ⊿ V F / ⊿ Ta ( m V / °C)
50
30
F o r w a r d C u r r e n t I F (mA)
⊿ VF/⊿ Ta- IF
10
5
3
1
0.5
0.3
0.1
0.05
0.03
0.01
1.0
1.4
1.2
1.8
1.6
-2.4
-2.2
-2.0
-1.8
-1.6
-1.4
0.1
2.0
0.3 0.5
F o r w a r d V o l t a g e VF (V)
5
(mA)
Threshold input current IFLH
F o r w a r d C u r r e n t I F (mA)
30
20
10
20
40
60
4
VO > 1V
2
1
-20
IO= 100mA , VCC=10V
High Level Output Voltage VOH [V]
Low Level Output Voltage VOL [V]
30
VF = 0.8V
0.4
0.2
-20
0
20
40
60
0
20
40
60
80
100
80
100
Ambient Temperature Ta (°C)
0.6
0
-40
30
3
0
-40
80 100 120
VOL - Ta
0.8
10
VCC = 15V
Ambient Temperature Ta (°C)
1
5
IFLH – Ta
40
0
3
F o r w a r d C u r r e n t I F (mA)
I F - Ta
0
-40 -20
1
80
25
VOH - Ta
IF = 5mA
Io = -100mA , VCC = 10V
20
15
10
5
0
-40 -20
100
Ambient Temperature Ta (°C)
0
20
40
60
Ambient Temperature Ta (°C)
NOTE: The above characteristics curves are presented for reference only and not guaranteed by production test,
unless otherwise noted.
© 2019
Toshiba Electronic Devices & Storage Corporation
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2019-06-24
TLP351
I C C L - Ta
I C C H - Ta
10
VCC=30V
High level supply current ICCH (mA)
Low
level supply current ICCL
(mA)
10
8
6
4
2
0
-40
-20
0
20
40
60
80
I F=5mA
VCC=30V
8
6
4
2
0
-40
100
-20
0
Ambient Temperature Ta(°C)
High level output current IOPH (A)
IF=0mA,VCC=15V
(Note:9)
V6-5=10.0V
0.4
V6-5=2.0V
0.2
-20
0
20
40
60
Ambient Temperature Ta (°C)
80
100
(V)
5.0
Ta=-100°C
Ta=25°C
Ta=-40°C
2.0
1.0
0.0
0.1
0.2
0.3
0
-0.2
100
0.4
0.5
Low Level Output Peak Current IOPL (A)
IF=5mA,VCC=15V
(Note:9)
V8-6=4.0V
-0.4
V8-6=10V
-0.6
-0.8
-1
-40 -20
6.0
IF=0mA, VCC=15V
3.0
80
0
20
40
60
80
100
Ambient Temperature Ta (°C)
IOPL – VOL
4.0
60
IOPH – Ta
0.6
6.0
Low level output voltage VOL (V)
IOPL – Ta
0.8
0
-40
40
Ambient Temperature Ta(°C)
High level output voltage VOH
Low level output current IOPL (A)
1
20
IF=5mA, VCC=15V,
Ta=-100°C
5.0
4.0
3.0
Ta=25°C
Ta=-40°C
2.0
1.0
0.0
0.6
IOPH – VOH
-0.1
-0.2
-0.3
-0.4
-0.5
-0.6
High Level Output Peak Current IOPH (A)
NOTE: The above characteristics curves are presented for reference only and not guaranteed by production test,
unless otherwise noted.
© 2019
Toshiba Electronic Devices & Storage Corporation
7
2019-06-24
TLP351
t p H L , t p L H - Ta
Propagation delay time tPLH, tPHL
(ns)
500
400
300
IF=5mA,VCC=30V
Rg=47Ω,Cg=3nF
tpLH
200
100
0
-40
tpHL
-20
0
20
40
60
80
100
Ambient Temperature Ta (°C)
NOTE: The above characteristics curves are presented for reference only and not guaranteed by production test,
unless otherwise noted.
© 2019
Toshiba Electronic Devices & Storage Corporation
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2019-06-24
TLP351
RESTRICTIONS ON PRODUCT USE
Toshiba Corporation and its subsidiaries and affiliates are collectively referred to as “TOSHIBA”.
Hardware, software and systems described in this document are collectively referred to as “Product”.
• TOSHIBA reserves the right to make changes to the information in this document and related Product without notice.
• This document and any information herein may not be reproduced without prior written permission from TOSHIBA. Even with
TOSHIBA's written permission, reproduction is permissible only if reproduction is without alteration/omission.
• Though TOSHIBA works continually to improve Product's quality and reliability, Product can malfunction or fail. Customers are
responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and
systems which minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily
injury or damage to property, including data loss or corruption. Before customers use the Product, create designs including the
Product, or incorporate the Product into their own applications, customers must also refer to and comply with (a) the latest versions of
all relevant TOSHIBA information, including without limitation, this document, the specifications, the data sheets and application notes
for Product and the precautions and conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the
instructions for the application with which the Product will be used with or for. Customers are solely responsible for all aspects of their
own product design or applications, including but not limited to (a) determining the appropriateness of the use of this Product in such
design or applications; (b) evaluating and determining the applicability of any information contained in this document, or in charts,
diagrams, programs, algorithms, sample application circuits, or any other referenced documents; and (c) validating all operating
parameters for such designs and applications. TOSHIBA ASSUMES NO LIABILITY FOR CUSTOMERS' PRODUCT DESIGN OR
APPLICATIONS.
• PRODUCT IS NEITHER INTENDED NOR WARRANTED FOR USE IN EQUIPMENTS OR SYSTEMS THAT REQUIRE
EXTRAORDINARILY HIGH LEVELS OF QUALITY AND/OR RELIABILITY, AND/OR A MALFUNCTION OR FAILURE OF WHICH
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limitation, equipment used in nuclear facilities, equipment used in the aerospace industry, lifesaving and/or life supporting medical
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© 2019
Toshiba Electronic Devices & Storage Corporation
9
2019-06-24