TLP512
TOSHIBA Photocoupler
IRED + Photo IC
TLP512
Digital Logic Ground Isolation
Line Receiver
Microprocessor System Interfaces
Switching Power Supply Feedback Control
Transistor Inverter
Unit: mm
The TLP512 consists of a high-output infrared emitting diode and a highspeed detector that contains a PN photodiode and an amplifier transistor
into a single chip.
•
Isolation voltage: 2500 Vrms (min)
•
Switching speed: tpHL = 0.8 μs, tpLH = 0.8 μs (max)
@RL = 1.9 kΩ
•
TTL compatible
•
UL-recognized: UL 1577, File No.E67349
JEDEC
―
JEITA
―
TOSHIBA
11-7A8S
Weight: 0.4 g (typ.)
Pin Configuration (top view)
1
Schematic
IF
1: Anode
6 2: Cathode
2
5
3
4
ICC
1
VF
3: NC
2
4: Emitter (GND)
5: Collector (OUT)
6: VCC
6
VCC
5
VO
4
GND
IO
Start of commercial production
1987-04
© 2019
Toshiba Electronic Devices & Storage Corporation
1
2019-06-24
TLP512
Absolute Maximum Ratings (Ta = 25°C)
LED
Characteristics
Symbol
Rating
Unit
DC forward current
(Note 1)
IF
25
mA
Pulse forward current
(Note 2)
IFP
50
mA
Peak transient forward current
(Note 3)
IFPT
1
A
VR
5
V
DC reverse voltage
PD
45
mW
Output current
IO
8
mA
Peak output current
IOP
16
mA
Output voltage
VO
−0.5 to 15
V
Supply voltage
VCC
−0.5 to 15
V
Po
100
mW
Operating temperature range
Topr
−55 to 100
°C
Storage temperature range
Tstg
−55 to 125
°C
Detector
Diode power dissipation
Output power dissipation
(Note 4)
(Note 5)
Soldering temperature (10 s)
(Note 6)
Tsol
260
°C
Isolation voltage (R.H. ≤ 60 %, AC 60 s)
(Note 7)
BVS
2500
Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Decreases at the rate of 0.8 mA/°C with the ambient temperature of 70 °C or higher.
Note 2: Duty cycle of 50 %, pulse width of 1 ms.
Decreases at the rate of 1.6 mA/°C with the ambient temperature of 70 °C or higher.
Note 3: Pulse width ≤ 1 µs, 300 pps
Note 4: Decreases at the rate of 0.9 mW/°C with the ambient temperature of 70 °C or higher.
Note 5: Decreases at the rate of 2 mW/°C with the ambient temperature of 70 °C or higher.
Note 6: Soldering is performed 2 mm from the bottom of the package.
Note 7: Device considered a two-terminal device: pins 1, 2 and 3 shorted together and pins 4, 5 and 6 shorted
together.
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Toshiba Electronic Devices & Storage Corporation
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TLP512
Electrical Characteristics (Ta = 25°C)
Characteristics
Symbol
Detector
LED
Forward voltage
Forward voltage temperature
coefficient
Test Condition
Min
Typ.
Max
Unit
VF
IF = 16 mA
1.65
1.85
V
∆VF/∆Ta
IF = 16 mA
−2
mV/°C
Reverse current
IR
VR = 5 V
10
µA
Pin-to-pin capacitance
CT
VF = 0 V, f = 1 MHz
45
pF
IOH (1)
IF = 0 mA, VCC = VO = 5.5 V
3
500
nA
IOH (2)
IF = 0 mA, VCC = VO = 15 V
5
IOH
IF = 0 mA, VCC = VO = 15 V
Ta = 70 °C
50
ICCH
IF = 0 mA, VCC = 15 V
0.01
1
µA
Min
Typ.
Max
Unit
IF = 16 mA, VCC = 4.5 V
VO = 0.4 V
20
40
IF = 16 mA, VCC = 4.5 V
VO = 0.4 V, Ta = 0 to 70 °C
15
IF = 16 mA, VCC = 4.5 V
IO = 2.4 mA
0.4
V
Min
Typ.
Max
Unit
0.8
pF
1014
Ω
Vrms
High-level output current
High-level supply current
µA
Coupled Electrical Characteristics (Ta = 25°C)
Characteristics
Symbol
Current transfer ratio
IO/IF
Low-level output voltage
VOL
Test Condition
%
Isolation Characteristics (Ta = 25°C)
Characteristics
Symbol
Test Condition
Capacitance input to output
CS
VS = 0 V, f = 1 MHz
(Note 7)
Isolation resistance
RS
R.H. ≤ 60 %, VS = 500 V
(Note 7) 5 × 1010
Isolation voltage
© 2019
Toshiba Electronic Devices & Storage Corporation
BVS
AC 60 s
3
2500
2019-06-24
TLP512
Switching Characteristics (Ta = 25°C, VCC = 5 V)
Characteristics
Test
Circuit
Symbol
Propagation delay time (H → L)
tpHL
Propagation delay time (L → H)
tpLH
Common mode transient immunity at
logic high output
(Note 8)
CMH
Common mode transient immunity at
logic low output
(Note 8)
CML
1
Test Condition
Min
Typ.
Max
Unit
IF = 0 → 16 mA, RL = 1.9 kΩ
0.8
µs
IF = 16 → 0 mA, RL = 1.9 kΩ
0.8
µs
IF = 0 mA, VCM = 200 VP−P
RL = 1.9 kΩ
1500
V/µs
IF = 16 mA, VCM = 200 VP−P
RL = 1.9 kΩ
−1500
V/µs
2
Note 8: Common mode transient immunity in logic high level is the maximum tolerable (positive) dVCM/dt on the
leading edge of the common mode pulse, VCM, to assure that the output will remain in a logic high state
(VOUT > 2.0 V).
Common mode transient immunity in logic low level is the maximum tolerable (negative) dVCM/dt on the
trailing edge of the common mode pulse, VCM, to assure that the output will remain in a logic low state (VOUT
< 0.8 V).
Test Circuit 1: Switching Time Test Circuit
IF
IF
100 Ω
Pulse input
1
PW = 100 µs
Duty ratio = 1/10
IF monitor
2
VCC = 5 V
0
VO
Output monitor
VO
6
RL
5
3
4
5V
1.5 V
tpHL
1.5 V
VOL
tpLH
Test Circuit 2: Common Mode Noise Immunity Test Circuit
IF
1
90%
VCC = 5 V
6
VCM
100 Ω
RL
2
5
3
4
VO
tr
Output monitor
VO
(IF = 0 mA)
VCM
Pulse generator
ZO = 50 Ω
10%
VO
(IF = 16 mA)
tf
200 V
0V
5V
2V
0.8 V
VOL
160 (V)
160 (V)
CMH =
, CML =
tr (µs)
t f (µs)
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Toshiba Electronic Devices & Storage Corporation
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TLP512
I F – VF
∆VF/∆Ta – IF
100
−2.6
Forward voltage temperature coefficient
∆VF/∆Ta (mV/°C)
Ta = 25°C
(mA)
10
Forward current IF
30
3
1
0.3
0.1
0.03
0.01
1.0
1.2
1.4
1.6
Forward voltage
VF
1.8
−2.4
−2.2
−2.0
−1.8
−1.6
−1.4
0.1
2.0
0.3
(V)
1
Forward current
IOH (1) – Ta
IF
10
30
(mA)
IO – IF
300
10
100
3
Output current IO (mA)
High-level output current IOH (μA)
3
30
10
3
VCC = 5 V
VO = 0.4 V
Ta = 25°C
1
0.3
0.1
0.03
1
0.6
0
40
80
120
0.01
0.1
160
0.3
Ambient temperature Ta (℃)
1
3
10
Forward current
IO/IF – IF
IF
30
100
(mA)
IO/IF – Ta
100
1.2
VCC = 5 V
1.0
Ta = −25ºC
25ºC
10
100ºC
IO/IF
30
0.8
Normalized
Current transfer ratio
IO/IF
(%)
VO = 0.4 V
0.6
0.4
3
IF = 16 mA
0.2
VCC = 4.5 V
VO = 0.4 V
1
0.1
0.3
1
3
Forward current
10
IF
(mA)
30
0
−40
−20
0
20
40
60
80
100
Ambient temperature Ta (℃)
NOTE: The above characteristics curves are presented for reference only and not guaranteed by production test,
unless otherwise noted.
© 2019
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Toshiba Electronic Devices & Storage Corporation
TLP512
I O – VO
VO – IF
5
(V)
IF = 25 mA
8
6
IF = 15 mA
4
IF = 10 mA
VO
IF = 20 mA
Output voltage
Output current IO (mA)
IF
IF = 30 mA
10
IF = 5 mA
2
VCC = 5 V
RL
4
VO
3
RL = 2 kΩ
2
Ta = 25°C
3.9 kΩ
10 kΩ
1
VCC = 5 V
Ta = 25°C
01
0
1
2
3
4
Output voltage
5
VO
6
0
0
7
(V)
4
8
12
Forward current
16
IF
20
24
(mA)
Propagation delay time tpLH, tpHL (µs)
tpHL, tpLH – RL
IF = 16 mA
3 VCC = 5 V
Ta = 25°C
tpLH
1
0.5
0.3
tpHL
0.1
1
3
10
Load resistance RL
30
100
(kΩ)
NOTE: The above characteristics curves are presented for reference only and not guaranteed by production test,
unless otherwise noted.
© 2019
Toshiba Electronic Devices & Storage Corporation
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2019-06-24
TLP512
RESTRICTIONS ON PRODUCT USE
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Hardware, software and systems described in this document are collectively referred to as “Product”.
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responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and
systems which minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily
injury or damage to property, including data loss or corruption. Before customers use the Product, create designs including the
Product, or incorporate the Product into their own applications, customers must also refer to and comply with (a) the latest versions of
all relevant TOSHIBA information, including without limitation, this document, the specifications, the data sheets and application notes
for Product and the precautions and conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the
instructions for the application with which the Product will be used with or for. Customers are solely responsible for all aspects of their
own product design or applications, including but not limited to (a) determining the appropriateness of the use of this Product in such
design or applications; (b) evaluating and determining the applicability of any information contained in this document, or in charts,
diagrams, programs, algorithms, sample application circuits, or any other referenced documents; and (c) validating all operating
parameters for such designs and applications. TOSHIBA ASSUMES NO LIABILITY FOR CUSTOMERS' PRODUCT DESIGN OR
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• PRODUCT IS NEITHER INTENDED NOR WARRANTED FOR USE IN EQUIPMENTS OR SYSTEMS THAT REQUIRE
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