TLP532

TLP531,TLP532 TOSHIBA Photocoupler GaAs IRed & Photo−Transistor TLP531,TLP532 Programmable Controllers AC / DC−Input Module Solid State Relay The TOSHIBA TLP531 and TLP532 consist of a photo−transistor optically coupled to a gallium arsenide infrared emitting diode in a six lead plastic DIP. TLP532 is no−base internal connection for high−EMI environments. • • • • Collector−emitter voltage: 55 V (min.) Current transfer ratio: 50% (min.) Rank GB: 100% (min.) Isolation voltage: 2500 Vrms (min.) UL recognized: UL1577, file no. E67349 Unit in mm Pin Configurations (top view) TOSHIBA Weight: 0.4g 11−7A8 1 2007-10-01 TLP531,TLP532 Absolute Maximum Ratings (Ta = 25°C) Characteristic Forward current Forward current derating (Ta ≥ 50°C) LED Peak forward current (100 μs pulse, 100pps) Reverse voltage Junction temperature Collector−emitter voltage Collector−base voltage (TLP531) Emitter−collector voltage Detector Emitter−base voltage (TLP531) Collector current Power dissipation Power dissipation derating (Ta ≥ 25°C) Junction temperature Storage temperature range Operating temperature range Lead soldering temperature (10s) Total package power dissipation Total package power dissipation derating (Ta ≥ 25°C) Isolation voltage (AC, 1min., R.H.≤ 60%) Symbol IF Δ IF / °C IFP VR Tj VCEO VCBO VECO VEBO IC PC ΔPC / °C Tj Tstg Topr Tsol PT ΔPT / °C BVS Rating 70 0.93 1 5 125 55 80 7 7 50 150 −1.5 125 −55~125 −55~100 260 250 −2.5 2500 Unit mA mA / °C A V °C V V V V mA mW mW / °C °C °C °C °C mW mW / °C Vrms Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Recommends Operating Conditions Characteristic Supply voltage Forward current Collector current Operating temperature Symbol VCC IF IC Topr Min. ― ― ― −25 Typ. 5 16 1 ― Max. 24 25 10 85 Unit V mA mA °C Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document. 2 2007-10-01 TLP531,TLP532 Individual Electrical Characteristics (Ta = 25°C) Characteristic Forward voltage LED Reverse current Capacitance Collector−emitter breakdown voltage Emitter−collector breakdown voltage Detector Collector−base breakdown voltage Emitter−base breakdown voltage Collector dark current Capacitance (collector to emitter) (TLP531) (TLP531) Symbol VF IR CT V (BR) CEO V (BR) ECO V (BR) CBO V (BR) EBO ICEO CCE IF = 10mA VR = 5V V = 0, f = 1MHz IC = 0.5mA IE = 0.1mA IC = 0.1mA IE = 0.1mA VCE = 24V VCE = 24V, Ta = 85°C V = 0, f = 1MHz Test Condition Min. 1.0 ― ― 55 7 80 7 ― ― ― Typ. 1.15 ― 30 ― ― ― ― 10 2 10 Max. 1.3 10 ― ― ― ― ― 100 50 ― Unit V μA pF V V V V nA μA pF Coupled Electrical Characteristics (Ta = 25°C) Characteristic Symbol Test Condition IF = 5mA, VCE = 5V Rank Y Current transfer ratio IC / IF Rank YG Rank GR Rank GB Rank BL Collector−emitter saturation voltage VCE (sat) IC = 2.4mA, IF = 8mA Min. 50 50 50 100 100 200 ― Typ. 200 ― ― ― ― ― ― Max. 600 150 300 300 600 600 0.4 V % Unit 3 2007-10-01 TLP531,TLP532 Isolation Characteristics (Ta = 25°C) Characteristic Capacitance (input to output) Isolation resistance Isolation voltage Symbol CS RS BVS Test Condition VS = 0, f = 1MHz VS = 500V, R.H.≤ 60% AC, 1 minute Min. ― 5 × 10 10 Typ. 0.8 10 14 Max. ― ― ― Unit pF Ω Vrms 2500 ― Switching Characteristics (Ta = 25°C) Characteristic Rise time Fall time Turn−on time Turn−off time Turn−on time Storage time Turn−off time Turn−on time Storage time Turn−off time Symbol tr tf tON tOFF tON ts tOFF tON ts tOFF RL = 1.9kΩ RBE = open VCC = 5V, IF = 16mA RL = 1.9Ω RBE = 220kΩ (TLP531) VCC = 5V, IF = 16mA (Fig.1) VCC = 10V IC = 2mA RL = 100Ω Test Condition Min. ― ― ― ― ― ― ― (Fig.1) ― ― ― Typ. 2 3 3 3 2 15 25 2 12 20 Max. ― ― ― ― ― ― ― ― ― ― μs μs μs Unit Fig. 1 Switching time test circuit 4 2007-10-01 TLP531,TLP532 5 2007-10-01 TLP531,TLP532 6 2007-10-01 TLP531,TLP532 7 2007-10-01 TLP531,TLP532 8 2007-10-01 TLP531,TLP532 RESTRICTIONS ON PRODUCT USE • The information contained herein is subject to change without notice. 20070701-EN • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 9 2007-10-01