TLP550
TOSHIBA Photocoupler IRED & Photo IC
TLP550
Microprocessor System Interfaces
Digital Logic Ground Isolation
Line Receiver
Switching Power Supply Feedback Control
Transistor Inverter
Unit: mm
TLP550 consists of a high-output infrared emitting diode and a one chip
photo diode− transistor.
TLP550 has no base connection, and is suitable for application at noisy
environmental condition.
This unit is 8−lead DIP package.
Isolation voltage : 2500 Vrms (min)
Propagation delay time (tpHL / tpLH):
tpHL = 0.5μs (typ.),
tpLH = 0.6μs (typ.)
(RL=1.9 kΩ)
TTL compatible
TOSHIBA
11−10C4S
Weight: 0.54 g (typ.)
UL-recognized: UL 1577, File No.E67349
cUL-recognized: CSA Component Acceptance Service No.5A
File No.E67349
Pin Configuration (top view)
1
2
8
7
3
6
4
5
1 : N.C.
2 : Anode
3 : Cathode
4 : N.C.
5 : Emitter
6 : Collector
7 : N.C.
8 : Cathode
Schematic
ICC
2
VF
3
IF
8
VCC
IO
6
5
VO
GND
Start of commercial production
1981-09
© 2019
Toshiba Electronic Devices & Storage Corporation
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TLP550
Current Transfer Ratio
Classification
Current Transfer Ratio (%)
(IC/IF)
Min
Marking of Classification
Max
(None)
10
―
Blank, O, Y
Rank O
19
―
O
Rank Y
35
―
Y
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
(Note 1)
IF
25
mA
Pulse forward current
(Note 2)
IFP
50
mA
Peak transient forward current
(Note 3)
IFPT
1
A
VR
5
V
PD
45
mW
Output current
IO
8
mA
Peak output current
IOP
16
mA
Supply voltage
VCC
−0.5 to 15
V
Output voltage
VO
−0.5 to 15
V
PO
100
mW
Operating temperature range
Topr
−55 to 100
°C
Storage temperature range
Tstg
−55 to 125
°C
Lead solder temperature (10 s)
Tsol
260
°C
BVS
2500
Vrms
LED
Forward current
Reverse voltage
Detector
Diode power dissipation
(Note 4)
Output power dissipation
(Note 5)
Isolation voltage (AC, 60 s, R.H. ≤ 60 %)
(Note 6)
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
(Note 1) Derate 0.8mA above 70 °C.
(Note 2) 50 % duty cycle, 1 ms pulse width. Derate 1.6 mA / °C above 70 °C.
(Note 3) Pulse width 1 μs, 300 pps.
(Note 4) Derate 0.9 mW / °C above 70 °C.
(Note 5) Derate 2 mW / °C above 70 °C.
(Note 6) Device considered two−terminal device: Pins 1, 2, 3 and 4 shorted together and pin 5, 6, 7 and 8 shorted
together.
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TLP550
Electrical Characteristics (Ta = 25°C)
Characteristic
Symbol
LED
Forward voltage
Forward voltage
temperature coefficient
Min
Typ.
Max
Unit
VF
IF = 16 mA
1.45
1.65
1.85
V
ΔVF / ΔTa
IF = 16 mA
―
−2
―
mV / °C
Reverse current
IR
VR = 5 V
―
―
10
μA
Capacitance between terminal
CT
VF = 0 V, f = 1 MHz
―
60
―
pF
IOH (1)
IF = 0 mA, VCC = VO = 5.5 V
―
3
500
nA
IOH (2)
IF = 0 mA, VCC = VO = 15 V
―
―
5
IOH
IF = 0 mA, VCC = 15 V
VO = 15 V, Ta = 70 °C
―
―
50
High level supply voltage
ICCH
IF = 0 mA, VCC = 15 V
―
0.01
1
μA
Supply voltage
VCC
ICC = 0.01 mA
15
―
―
V
Output voltage
VO
IO = 0.5 mA
15
―
―
V
Min
Typ.
Max
Unit
10
40
―
Rank O
19
40
―
Rank Y
35
50
―
5
―
―
15
―
―
―
―
0.4
V
Min
Typ.
Max
Unit
―
0.8
―
pF
5×1010
1014
―
Ω
2500
―
―
Vrms
High level output current
Detector
Test Condition
μA
Coupled Electrical Characteristics (Ta = 25°C)
Characteristics
Symbol
Test Condition
IF = 16 mA,
VCC = 4.5V,
VO = 0.4 V
Current transfer ratio
IO / IF
Low level output voltage
VOL
IF = 16 mA,
VCC = 4.5 V,
VO = 0.4 V,
Ta = 0 to 70°C
Rank O, Y
IF = 16 mA, VCC = 4.5 V,
IO = 1.1 mA
(Rank O: IO = 2.4 mA)
%
Isolation Characteristics (Ta = 25°C)
Characteristics
Capacitance (input-output)
Symbol
(Note 7)
CS
Test Condition
VS = 0 V, f = 1 MHz
Resistance (input-output)
(Note 7)
RS
R.H. ≤ 60 %, VS = 1 kVDC
Isolation voltage
(Note 7)
BVS
AC, 60 s
(Note 7) Device considered two−terminal device: Pins 1, 2, 3 and 4 shorted together and pin 5, 6, 7 and 8 shorted
together.
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Toshiba Electronic Devices & Storage Corporation
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TLP550
Switching Characteristics (Ta = 25°C、VCC = 5V)
Characteristic
Propagation delay time
(H→ L)
Symbol
Test
Circuit.
Test Condition
Min
Typ.
Max
Unit
IF = 0→ 16 mA, VCC = 5 V, RL = 4.1 kΩ
―
0.3
0.8
Rank O: RL = 1.9 kΩ
―
0.5
0.8
IF = 16→ 0 mA, VCC = 5 V, RL = 4.1 kΩ
―
1
2
Rank O: RL = 1.9 kΩ
―
0.6
1.2
IF = 0 mA, VCM = 200 Vp−p
RL = 4.1 kΩ (rank O: RL = 1.9 kΩ)
(Note 8)
―
1500
―
V /μs
IF = 16 mA, VCM = 200 Vp−p
RL = 4.1 kΩ (rank O: RL = 1.9 kΩ)
(Note 8)
―
−1500
―
V /μs
μs
tpHL
1
Propagation delay time
(L→ H)
tpLH
Common mode transient
immunity at high output level
CMH
μs
2
Common mode transient
immunity at low output level
CML
(Note 8) CML is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage
in the logic low state (VO < 0.8 V).
CMH is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage
in the logic high state (VO > 2.0 V).
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TLP550
Test Circuit 1: Switching Time Test Circuit
IF
Pulse input
51Ω
PW=100μs
Duty ratio=1 / 10
IF monitor
VCC = 5V
1
8
2
7
3
6
VO
4
5
Output
monitor
IF
0
RL
VO
5V
1.5V
1.5V
VOL
tpLH
tpHL
Test Circuit 2: Common Mode Noise Immunity Test Circuit
IF
VCC=5V
1
8
2
7
3
6
VO
4
5
Output
monitor
90%
VCM
RL
tr
VO
(IF=0mA)
VCM
VO
(IF=16mA)
Pulse generator
ZO=50Ω
CMH =
160(V)
t r ( µs)
, CML =
10%
tf
200V
0V
5V
2V
0.8V
VOL
160(V)
t f ( µs)
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TLP550
IF – VF
(mA)
10
Forward current IF
50
30
3
Ta = 25°C
5
1
0.5
0.3
0.1
0.05
0.03
0.01
1.0
ΔVF / ΔTa – IF
−2.6
Forward voltage temperature
coefficient ΔVF / ΔTa (mV / °C)
100
1.4
1.2
1.6
Forward voltage
VF
−2.2
−2.0
−1.8
−1.6
−1.4
0.1
2.0
1.8
−2.4
0.3
0.5
1
3
Forward current
(V)
30
(mA)
lO – I F
IOH (1) – Ta
10
300
Output current IO (mA)
100
High level output current
IOH (μA)
IF
10
5
50
30
10
5
3
VCC = 5V
5
VO = 0.4V
3
Ta = 25°C
1
0.5
0.3
0.1
0.05
0.03
1
0.6
0
40
80
120
0.01
0.1
160
0.3 0.5
1
10
IF
30 50 100
300
(mA)
IO / IF – Ta
IO / IF – IF
1.2
VCC = 5V
VO = 0.4V
50
1.0
30
IO / IF
Ta = –25°C
25°C
10
100°C
Normalized
Current transfer ratio
IO / IF (%)
5
Forward current
Ambient temperature Ta (°C)
100
3
5
0.8
0.6
Normalized To :
0.4
IF = 16mA
VCC = 4.5V
3
VO = 0.4V
0.2
Ta = 25°C
1
0.3
0.5
1
3
Forward current
5
IF
10
30
0
−40
50
−20
0
20
40
60
80
100
Ambient temperature Ta (°C)
(mA)
NOTE: The above characteristics curves are presented for reference only and not guaranteed by production test,
unless otherwise noted.
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Toshiba Electronic Devices & Storage Corporation
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TLP550
IO – VO
VO – IF
5
30mA VCC = 5V
Ta = 25°C
10
15mA
4
10mA
IF=5mA
2
0
1
2
3
4
Output voltage
5
VO
RL
(V)
VO
20mA
6
0
4
Output voltage
Output current IO (mA)
25mA
8
VCC =5V
IF
6
VO
3
Ta=25°C
2
3.9kΩ
(V)
10kΩ
1
0
7
RL=2kΩ
0
4
8
12
Forward current
16
IF
20
24
(mA)
tpHL, tpLH – RL
5
Propagation delay time
tpLH, tpHL (μs)
3
IF = 16mA
VCC = 5V
tpLH
Ta = 25°C
1
0.5
0.3
tpHL
0.1
1
3
5
10
30
50
100
Load resistance RL (kΩ)
NOTE: The above characteristics curves are presented for reference only and not guaranteed by production test,
unless otherwise noted.
© 2019
Toshiba Electronic Devices & Storage Corporation
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TLP550
RESTRICTIONS ON PRODUCT USE
Toshiba Corporation and its subsidiaries and affiliates are collectively referred to as “TOSHIBA”.
Hardware, software and systems described in this document are collectively referred to as “Product”.
• TOSHIBA reserves the right to make changes to the information in this document and related Product without notice.
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TOSHIBA's written permission, reproduction is permissible only if reproduction is without alteration/omission.
• Though TOSHIBA works continually to improve Product's quality and reliability, Product can malfunction or fail. Customers are
responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and
systems which minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily
injury or damage to property, including data loss or corruption. Before customers use the Product, create designs including the
Product, or incorporate the Product into their own applications, customers must also refer to and comply with (a) the latest versions of
all relevant TOSHIBA information, including without limitation, this document, the specifications, the data sheets and application notes
for Product and the precautions and conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the
instructions for the application with which the Product will be used with or for. Customers are solely responsible for all aspects of their
own product design or applications, including but not limited to (a) determining the appropriateness of the use of this Product in such
design or applications; (b) evaluating and determining the applicability of any information contained in this document, or in charts,
diagrams, programs, algorithms, sample application circuits, or any other referenced documents; and (c) validating all operating
parameters for such designs and applications. TOSHIBA ASSUMES NO LIABILITY FOR CUSTOMERS' PRODUCT DESIGN OR
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• PRODUCT IS NEITHER INTENDED NOR WARRANTED FOR USE IN EQUIPMENTS OR SYSTEMS THAT REQUIRE
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